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X-Ray Spectroscopy: An Introduction PDF

421 Pages·1991·9.37 MB·English
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Springer Series in Optical Sciences Volume 15 SpringerSeries in Optical Sciences EditorialBoard:A.L.Schawlow K.Shimoda A.E.Siegman T.Tamir ManagingEditor:H.K.V.Lotsch 42 PrinciplesofPhaseConjugation 55 LaserSpectroscopyVIII ByB.Ya.Zel'dovich,N.F.Pilipetsky, Editors:W.PerssonandS.Svanberg v.v. and Shkunov 56 X-RayMicroscopyII 43 X-RayMicroscopy Editors:D.Sayre,M.Howells,J.Kirz,and Editors:G.SchmahlandD.Rudolph H.Rarback 44 IntroductiontoLaserPhysics ByK.Shimoda 2ndEdition 57 Single-ModeFibers Fundamentals ByE.-G.Neumann 45 ScanningElectronMicroscopy PhysicsofImageFormationandMicroanalysis 58 PhotoacousticandPhotothermalPhenomena ByL.Reimer Editors:P.Hessand1Pelzl 46 HolographyandDeformationAnalysis ByW.Schumann,l-P.ZUrcher,andD.Cuche 59 PhotorefractiveCrystals inCoherentOpticalSystems 47 TunabelSolidStateLasers ByM.P.Petrov,S.I.Stepanov, Editors:P.Hammerling,A.B.Budgor, andA.V.Khomenko andA.Pinto 48 IntegratedOptics 60 HolographicInterferometry Editors:H.P.NoltingandR.Ulrich inExperimentalMechanics ByYu.I.Ostrovsky,V.P.Shchepinov, 49 LaserSpectroscopyVII andV.V.Yakovlev Editors:T.w.HanschandY.R.Shen 50 Laser-InducedDynamicGratings 61 MillimetreandSubmillimetreWavelenght ByH.J.Eichler,P.GUnter,andD.W.Pohl Lasers ByN.G.Douglas 51 TunableSolidStateLasersforRemoteSensing 62 PhotoacousticandPhotothermalPhenomenaII Editors:R.L.Byer,E.K.Gustafson, Editors:1C.Murphy,J.w.MaclachlanSpicer, andR.Trebino L.C.Aamodt,andB.S.H.Royce 52 TunableSolid-StateLasersII Editors:A.B.Budgor,K,Esterowitz, 63 ElectronEnergyLossSpectrometers andL.G.DeShazer TheTechnologyofHighPerformance ByH.Ibach 53 TheCOzLaser ByW.1Witteman 54 Lasers,SpectroscopyandNewIdeas 64 HandbookofNonlinearOpticalCrystals ATributetoArthur1.Schawlow ByV.G.Dmitriev,G.G.Gurzadyan,and Editors:W.M.YenandM.D.Levenson D.N.Nikogosyan Volumes1-41arelistedonthebackinsidecover B.K. Agarwal X-Ray Spectroscopy An Introduction Second Edition With 239Figures Springer-Verlag Berlin Heidelberg GmbH Professor BIPIN K. AGARWAL, Ph. D. (deceased) Formerly Headofthe Physics Department, Dean ofthe Faculty ofScience University ofAllahabad, Allahabad 211001, India Editorial Board ARTIIUR L. SCHAWLOW, Ph. D. ProfessorANTIIONYE. SIEGMAN,Ph. D. Department ofPhysics Electrical Engineering Stanford University E. L. Ginzton Laboratory Stanford, CA 94305, USA Stanford University Stanford, CA94305, USA Professor KOICHI SHIMODA THEODOR TAMIR, Ph. D. Faculty ofScienceand Technology Polytechnic University Keio University, 3-14-1 Hiyoshi, Kohoku-ku, 333 Jay Street Yokohama223, Japan Brooklyn, NY 11201, USA Managing Editor: Dr. HELMUT K. V.LOTSCH ISBN978-3-540-50719-2 ISBN978-3-540-38668-1(eBook) DOI 10.1007/978-3-540-38668-1 LibraryofCongressCataloging-in-PublicationData Agarwal,B.K.(BipinKumar),1931- X-rayspectroscopy:anintroduction /B.K.Agarwal.- 2nded. p.em,- (Springerseriesinopticalsciences;v.15) Bibliography:p. Includesindexes. 1.X-rayspectroscopy.I.Title.II.Series. [DNLM: 1.SpectrumAnalysis.2.X-Rays.QC482.S6A261x] QC482.S6A341991537.5'352-dcI9DNLM/DLC forLibraryofCongress Thisworkissubjecttocopyright.Allrightsarereserved,whetherthewholeor part ofthematerialis concerned,specificallytherightsoftranslation,reprinting,reuseofillustrations,recitation,broadcasting, reproductiononmicrofilmsorinotherways,andstorageindatabanks.Duplicationofthispublicationor partsthereofisonlypermittedundertheprovisionsoftheGermanCopyrightLawofSeptember9,1965,in itscurrentversion,andacopyrightfeemustalwaysbepaid.Violationsfallundertheprosecutionactofthe German CopyrightLaw. ©Springer-VerlagBerlinHeidelberg1979and 1991 OriginallypublishedbySpringer-VerlagBerlinHeidelbergNewYorkin1991. Theuseofregisterednames,trademarks,etc.inthispublicationdoesnotimply,evenintheabsenceofa specificstatement,that suchnamesareexemptfromtherelevantprotectivelawsand regulationsand thereforefreeforgeneraluse. 54/3020- 54310- Printedonacid-freepaper To my Mami Ji memory in Preface to the Second Edition Anattempthas beenmade inthisedition ofthebook to retain theappeal ofthe first edition even after the addition of new material and the deletion of other matter which no longer appears essential. Major revisions have been made in almost all the chapters to include new developments.Thematerial on EXAFS has beenupdatedand putinaseparate chapter. Thechapteronexperimental methods has beenconsiderably expanded to includeenergydispersivetechniques. New topics likeheavy-ion bremsstrah lung, X-ray lasers, resonant emission, appearance potential spectroscopy, and EXAFS ofhigh-Tcsuperconductingmaterials havebeenadded. Itishoped that readers willfind the newedition more useful and attractive. Iam grateful to Professor R. H; Pratt, University ofPittsburgh,for reading therevisedversionofthefirstchapter,toDr.H.Lotsch,ofSpringer-Verlag,for encouraging metorevisethebook,and toPrashantand Seemaforhelpingmein preparing the manuscript. Allahabad, B.K.Agarwal July 1989 Preface to the First Edition Rontgen's discoveryofX-rays in1895launched asubjectwhichbecamecentral to the development of modem physics. The verification of many of the predictions of quantum theory by X-ray spectroscopy in the early part of the twentieth century stimulated great interest in this area,whichhas subsequently influencedfieldsasdiverseaschemicalphysics,nuclearphysics,and thestudyof theelectronicpropertiesofsolids,and ledtothedevelopmentoftechniquessuch as Auger, Raman, and X-ray photoelectron spectroscopy. Theimprovement ofthetheoretical understandingofthe physicsunderlying X-ray spectroscopy has beenaccompanied byadvances inexperimental techni ques,and the subject provides an instructive example of how progress on both these fronts can be mutually beneficial. This book strikes a balance between historicaldescription,whichillustratesthissymbiosis,and thediscussionofnew developments. The application of X-ray spectroscopic methods to the investi gationofchemicalbonding receivesspecialattention,and anup-to-dateaccount is given of the use of extended X-ray absorption fine structure (EXAFS) in determining interatomic distances, which has attracted much attention during the last decade. Thismonographisintended tobeusedasabasictextforaone-yearcourseat postgraduatelevel,and aimsto provide thegeneralbackgroundthatisessential to enable the reader to participate fruitfully in the growing research activity in this field. SriArvind Agarwaland Dr. ChitraDarhavehelpedmeinmanywaysinthe preparation of the manuscript. My whole familyjoined me in preparing and checking the index. Allahabad, B.K.Agarwal April 1979 Contents 1. Continuous X-Rays . . . . . . . . . . . . . . . . . . . . . . 1 1.1 Field ofa Point Charge Moving with Uniform Velocity . . . . 1 1.2 Radiation from an Accelerated or Decelerated Charged Particle. 3 1.3 Transverse Radiation Field due to the Acceleration ofan Electron to Low Velocity (fJ<IA) 5 1.4 Maxwell's Equations 6 1.5 Coulomb Potential . . 7 1.6 Retarded Potentials . . 8 1.7 Lienard-Wiechert Potentials 11 1.8 Radiation from an Accelerated Charge 12 1.9 Radiation at Low Velocities . . . . . 14 1.10 Polarization of Continuous X-Rays. . 16 1.11 The Case of IiParallel to v (Relativistic) . 18 1.12 Sommerfeld's Theory for the Spatial Distribution ofContinuous X-Rays. . . . . . . . . . . . . . . . . . 18 1.13 Frequency Spectrum ofContinuous X-Rays . . 21 1.14 Experimental Spectral and Spatial Distributions 23 1.15 Shortcomings of Classical Theory . . 25 1.16 Kramers' Semiclassical Theory . . . 27 1.17 Quantum Mechanical Considerations 38 1.17.1 Born Approximation 39 1.17.2 Sommerfeld's Result 40 1.17.3 Polarization . . . . 43 1.17.4 Screening . . . . . 46 1.18 Bremsstrahlung in Other Processes 46 2. Characteristic X-Rays 51 2.1 Line Emission . . . . . . 51 2.2 Moseley Law . . . . . . 53 2.3 Classical Oscillator Model . 54 2.4 Quantum Theory . . . 56 2.5 Ionization Function. . . 57 2.5.1 Classical Theory . 57 2.5.2 Quantum Theory . 59 2.5.3 Heavy Projectiles . 62 2.5.4 Intensity . . . . 63 2.5.5 Molecular-orbital X-Rays . 66 XII Contents 2.6 Ratio of Characteristics to Continuous Radiation. . . . . . 66 2.7 X-Ray Terms . . . . . . . . . . . . . . . . . . . . . 67 2.8 Energies of Atomic X-Ray Levelsand Energy-LevelDiagrams 70 2.9 Electric-Dipole Selection Rules. . . . . . . . . . 75 2.10 Relative Intensities of Emission Linesin a Multiplet. . . . . 77 2.11 Screeningand Spin Doublets. . . . . . . . . . . . . . . 79 2.12 Quantum Theory of Spontaneous Emission of X-Ray Lines and Multipoles . . . . . . . . . . . . . . . . . . 89 2.12.1 Spontaneous Electric-Dipole Transition . . 90 2.12.2 Spontaneous Higher-Multipole Transitions . 91 2.13 Parity Selection Rules and Forbidden Lines 92 2.14 Absorption Discontinuities. . . . . . . . 96 2.15 Comparison of Optical and X-Ray Spectra. 101 2.16 Nomenclature of X-Ray Lines 102 3. Interaction ofX-Rays withMatter . 105 3.1 Free, Damped Oscillator. . 105 3.2 Form and Width of Lines . . 106 3.3 Forced, Damped Oscillator . 109 3.4 Complex Dielectric Constant . 110 3.5 Refractive Index . . . . . . 112 3.6 Correction of the Bragg Equation. 114 3.7 Measurement of Refractive Index. 116 3.7.1 The Method of Critical Angle of Reflection 116 3.7.2 The Method of Symmetrical Reflection . 117 3.7.3 The Method of Unsymmetrical Reflection 117 3.7.4 The Method of Refraction in a Prism. . 119 3.8 Absorption of X-Rays and Dispersion Theory . 120 3.8.1 Absorption by an Undamped Oscillator. 120 3.8.2 Absorption by a Damped Oscillator. . . 122 3.9 Kramers-Kallmann-Mark Theory of Refractive Index 126 3.10 Quantum Theory of Dispersion. 129 3.10.1 Oscillator Strength . . . . . . . . . . . . 129 3.10.2 Honl Theory. . . . . . . . . . . . . . . 134 3.10.3 Variation ofX-Ray AtomicScattering FactorintheRegion of Anomalous Dispersion . . . . . . . . . . . . . . 137 3.11 QuantumTheory ofLineShapeand PhotoabsorptionCurveShape 140 3.12 Absorption Coefficients . . . . . . . . . 144 3.12.1 Quantum Theory of Photoabsorption 148 3.12.2 Various Attenuation Processes 149 3.13 Absorption-Jump Ratios. 150 3.14 Total Reflection . . . . . 151 3.15 X-Ray Interferometry . . . 153 4. Secondary Spectra and Satellites . 155 4.1 Photoelectric Effect. . . . 155

Description:
X-ray spectroscopy has emerged as a powerful tool in research and in industrial laboratories. It is used in the study of metals, semiconductors, amorphous solids, liquids and gases. This comprehensive presentation develops the subject from its basic principles and relates the theory to experimental
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