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The X-ray system of crystallographic programs for any computer having a PIDGIN FORTRAN ... PDF

284 Pages·2008·9.98 MB·English
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https://ntrs.nasa.gov/search.jsp?R=19730005010 2018-01-30T04:59:26+00:00Z TECHNICAL REPORT TR-igZ JUNE 1972 THE X-RAy SYSTEM ,OF CRYSTALUOGRAPHIC PROGRAMS FOR ANY COMPUTER HAVING A PIDGIN* FORTRAN COMPILER VERSION OF JUNE 1972 EDITED By j. M. STEWART* ' vo f+ tf to sa G. J, KRUGER* H. L, AMMON, -J (D < K > C. DICKINSON, AND S. R. HALL to « H (/) C/) £b 5; j*3 S^ to rt f* O OD » {» t^ EO U) O I TJ rf H £0 N) O SB* (^> 0* O <T3 VD H H KB O 25 H CD P O fX3 H TO w H ^< 1-3 O EC t-1 to a w P> > » t^ ??i J-** ^*^ fij n w^3 tJd I GO > P 3 H)K H- H3 O <i H RJ to • f1 K K fcq n c. to e n p CU O • O O t-* • ts cs >Td G o t-* Hft3) to UNIVERSITY OF MARYLAND <n u> COMPUTER SCIENCE CENTER cr, COLLEGE PARK, MARYLAND cn a O £3 co O Ui Cu M I t\) p» 01 UJ TITLE 1 1 04/22/72 TECHNICAL REPORT TR-lg2 JUNE 1972 THE X-RAy SYSTEM ,,OF CRYSTALLOGRAPHIC PROGRAMS FOR ANY COMPUTER HAVING A PIDGIN* FORTRAN COMPILER VERSION OF JUNE 1972 EDITED BY J. M. STEWARTf 6, J. KRuGER, M. L. AMMON, C. DICKINSON, AND S. R. HALL COMPUTER SCIENCE CENTER UNIVERSITY OF MARYLAND *PiDGIN FORTR»N IS A NEUTRAL SUBSET OF FORTRAN I,V AND IS DESCRIBED IN DETAIL IN AN APPENDIX THE UNivtHsirTY OF MARYLAND CONTRIBUTION TO THIS WORK WAS IN PART SUPPORTED BY tHE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION UNDER GRANT NGL-21-002-008 TO THE COMPUTER SCIENCE CENTER AND IN PART BY THE ARPA GKANT TO THE UNIVERSITY OF MARYLAND v-' TITLE 2 2 04/22/72 IN COLLABORATION WITH - DEPARTMENT OF ENERGY, MINES AND RESOURCES MINISTERE DE L'ENEKGIE DES MINES ET DES RESSOURcES CANADA AND SCIENCK RESEARCH COUNCIL (U.K.) ************ I SHALL TRY TO CORRECT ERRORS WHERE SHOWN TO BE ERRORS. AND SHALL ADOPT NEW VIEWS AS> FAST AS THEY APPEAR To BE THuE VIEWS ABRAHAM LINCOLN...,. ************ TITLE 3 3 OH/22/72 ABSTRACT THIS REPORT IS A MANUAL FOR THP USE OF A LIBRARY OF CRYSTALLOGRAPHIC PROGRAMS. THIS LlBRARYf CALLED THE X-RAY SYSTEM, IS DESIGNED TO CARRY OUT THE CALCULATIONS REQUIRtO TO SOLVE THE STRUCTURE OF CRYSTALS BY DIFFRACTION TECHNIQUES. IT HAS BEEN IMPLEMhNTED AT THE UNIVERSITY OF MARYLAND ON THE UNIVAC 1108 UNDER EXEC.yHI. H HAS» HOWEVER, BEEN DEVELOPED AND RUN ON A VARIETY- OF MACHINES UNDER VARIOUS OPERATING SYSTEMS. HENCE WE CONSIDER IT TO BE AN ESSENTIALLY MACHINE INDEPENDENT LIBRARY OF APPLICATIONS PROGRAMS. THE REPORT INCLUDES DEFINITION OF CRYSTALLOGRAPHIC COMPUTING TERMS, PROGRAM DESCRIPTIONS, WITH iOME TEXT TO SHOW THEIR APPLICATION TO SPECIFIC CRYSTAL : PROBLEMS. DETAILED CARD INPUT DESCRIPTIONS, MASS STORAGE FILE STRUCTURE AND SOME EXAMPLE RUN STKEAMS. NO PROGRAMS ARE SHOWN. THEY ARE SUPPLIED SEPARATELY AS CA. 60000 CARDS UN A BLOCKED TAPE APPROPRIATE TO THE MACHINE ON WHICH ~ THEY ARE TO BE COMPILED AND RUN. l.TOC Ot/22/72 OF CONTENTS THE wKITt-U^ OF EACH PROGRAM IS GIVEN IN TWO PARTS, THE FIRST IS DESCRIPTIVE. THE SECOND IS « CARD ORDER SUMMARY. FILE HANDLING SUMMARY, AND CARD FORMAT DESCRIPTION. IN EACH CAf£. THE WRITE-UP APPEARS ALPHABETICALLY BY PKOGRAM CALLING CARD MNEMONIC. THE APPENDICES PROVIDE FURTHER DETAILS ABOUT THE STRUCTURE OF THE SYSTEM. GENERL GENERAL DESCRIPTION OF THE SYSTEM ABSORB DIFFRACrOMETER ABSORPTION CORRECTION APHASE SEARCH OF SIGMA-TWO RELATIONSHIPS FOR A SET OF POSSIBLE PHASES BONDAT GENERA I ION OF BONUED ATOM POSITIONS BONDLA DETERMINATION OF CONTACT AND BOND DISTANCES AND ANGLES WITH ESTIMATED ERRORS CRYLSQ GENERAL CRYSTALLOGHAPHIC LEAST SQUARES PROGRAM DATC05 TREATMENT OF DIFFR«CTOMETER DA A T DATRDN PREPARAIION OF BINARY DATA FILE AND PRELIMINARY TREATMENT OF DATA ANU SYMMETRY DIFPCH PREPARAI10N OF SORTED DIFFRACTQMETER SETTING CARDS DIFSET GENERATION OF SETTINGS FOR GATHERING DATA ON AN AUTOMATED DIFFRACIOMETER OUMCOP DUMP OR COPY THE BINARY DATA FILE FC STRUCTURE FACTOR C»LCULATION FOURR FOURIER TRANSFORMATIONS TO GIVE PATTERSON, VECTOR, ELECTRON DENSITY. DIFFERENCt, OR E MAPS LISTFC LISTS SIRUCTURE FACTORS FOR PUBLICATION ' LOADAT LOAD ATOMIC PARAMETERS INTO THE BINARY DATA FILE LSOPL CALCULAIION OF EQUATIONS OF 3-DIMENSIONAL PLANES AND LINES MODIFY BINARY UATA FILE EDITING AND GENERATION OF PSEUDO DATA l.TOC 2 5 0<t/22/72 NORMsF PRELIMINARY DATA SCALING, CALCULATION OF QUASI-NORMALIZED STRUCTURE FACTORS (E>, AND ESTIMATION OF OVERALL TEMPERATURE FACTOR PARAw LEAST SUUARES REFINEMENT OF CELL PARAMETERS FROM TwO THETA DATA PEKPIK SEARCH COURIER MAPS FOR PEAKS PHASE SEARCH UF SIGMA-TWO RELATIONSHIPS FOR A SET OF POSSIBLE PHASES (CENTRIC CASE) REVIEW EVALUATION OF DIRECT PHASE DETERMINATION RLIST LISTS R VALUES FOR VARIOUS ZONES AND OTHER REFLECTION CLASSES SIN&FN FORMS TRIPLES FOR PHASE DETERMlNATION(CENTRlC OR ACENTRIC) STEPRF STEP REFINEMENT TANGEN USE OF IANGENT FORMULA TO CALCULATE PHASES WRITEU GENERATION OF WRITt-UP WTANAL ANALYSIS OF LEAST SQUARES WEIGHTING SCHEMES WTLSSQ REVISION OF LEAST SQUARES WEIGHTING SCHEMES APENDX-1 CONTRIBUTORS TO THfe SYSTEM APENDX-2 EXAMPLE DATA DECKS. APENDX-3 DISTRIBUTION OF THP SYSTEM APENDX-I+ PIDGIN I-OKTRAN APENDX-5 THE STRUCTURE OF THE SYSTEM APENDX-6 THE FORMAT OF THE BINARY DATA FILE APENDX-7 INFORMAIION REQUIRED IN REPORT OF SUSPECTED ERRORS l.GENERL- 1 6 0<*/22/72 PREFACE THE X-RAY SYSTtM COMPRISES A COLI_EXTI N OF INTER-RELATED FORTRAN P PROGRAMS FOR THE STKUCTyRAL ANALYSIS OK CRYSTALS FROM DIFFRACTION DATA. IT PROVIDES ROUTINES AT ALL LEVELS OF THE ANALYSIS - EXAMPLES ARE UIFFRACTOMETEH SETTING PROGRAMS, PROGRAMS FOR APPLYING DIRECT METHODS OF PHASE DETERMINATION IN THE PRODUCTION OF A TRIAL STRUCTURE* FOURIER TRANSFORMS AND LEASI SQUARES RFFlNEMENTSt AND ALSO PROGRAMS TO AID IN THE INTERPRETATION AND PUBLICATION OF THE REFINED RESULTS. IT OPERATES UNDER ITS OWN FORTRAN SUB-SYSTKM MONITOR - THE 'NUCLEUS' - WHICH PERMITS THE READY ADDITION OF EXTRA PROGRAMS INTO THE SYSTEM. THE COURSE OF A JOB RUN ON THE SYSTEM IS DETERMINED BY THE INPUT - DATA CARDS WHICH CALL THE APPROPRIATE PROGRAMS INTO THE STORE 0? THE COMPUTER AS REOUIREU. AT THE SAME TIME, A 'BINARY DATA FILE' (WHICH IS FULLY DESCRIBED LATtR) is CONTINUOUSLY UPDATED AS THE SOLUTION PROGRESSES, THUS KEEPING THE SI^E OF AN IN^UT DATA DECK TO A MINIMUM. WHENEVER POSSIBLE. THE SYSTEM WILL CONTINUE WITH A CALCULATION BUT, IN THE EVENT OF AN IRRECOVERABLE SITUATION, IT WILL ABANDON ITS EFFORTS *ND CHASTISE THE USER WITH AN EPIGRAMMATIC OUOTATION. THIS WRITE-UP Ib DIVIDED I"TO THREE SECTIONS - 1. A DESCKIPT10N OF THE CALCULATIONS PERFORMED BY EACH PROGRAM 2. DETAILtO INSTRUCTIONS FOR THE PREPARATION OF INPUT DATA 3. A SERItS OF APPENDICES PROVIDING NECESSARY INFORMATION FOR THOSE WHO REQUIRE A DETAILED KNOWLEDGE OF THE STRUCTURE OF THE SYSTEM, KQK EXAMPLE IN ITS IMPLEMENTATION ON ANY GIVEN COMPUTER. DISCLAIMER ALTHOUGH EACH PROGRAM OF THE X-RAY SYSTEM AND THE NUCLEUS HAS BEEN TESTED BY ITS CONTRIBUTORS AND FURTHER TEStED ON A NUMBER OF DIFFERENT COMPUTFRS, NO WARRANTY, EXPRESSED OR IMPLIED, IS MADE BY THE CONTRIBUTORS OR THE SYSTEM'S PKOUKAMMEHS AS TO THE ACCURACY AND FUNCTIONING OF THE PROGRAMS, THEIR SUBPROGRAMS, T^E RELATED PROGRAM MATERIAL, OR wRITE-UP. NO RESPONSIBILITY Ib ASSUMED BY THE CONTRIBUTORS OR BY ANY MEMBER OF THE X-RAY SYSTEM (iROUP UR SUPPORTERS OF THESE pERSONS IN CONNECTION WITH THE USE OR ATTEMPTED USt OR APPLICATION OF THESE PROGRAMS. l.GENERL- 2 7 04/22/72 NOTE TO USFRS THE USUAL JOURNAL REFERENCE TO CALCULATIONS DONE WITH THE X-RAY SYSTEM IS AS FOLLOWS THE X-KAY SYSTEM - VERSION OF JUNE 1972. TECHNICAL REPORT TR-192 OF THE COMPUTER SCItNCE CENTER, UNIVERSITY OF MARYLAND, JUNE 1972. l.GENERL- 3 8 OU/22/72 INTRODUCTION THE OVERALL PLAN OF THE X-RAY SYSTEM iS SUCH THAT THE USER SHOULD UNDERSTAND SEVERAL IOPICS, NAMhLY - 1. PREAMBLE CARDS NEtDED FOR THE LOCAL IMPLEMENTATION OF THE SYSTEM 2. X-RAY SYSTEM CARD FORMAT CONVENTIONS AND FUNCTIONS 3. FORTRAN FORMAT CONVENTIONS H. THE CONCEPT AND USE OF THE BINARY DATA FILE 5. THE STKUCTURE OF »N X-RAY SYSTEM DATA DECK 6. SYSTEM TERMINOLOGY. PKEAMBLE CARL'S REQUIRED BUT NOT DESCRIBED IT IS NOT POSSIBLE HERE T» TREAT ALL THE LOCAL LORE (EVEN IF IT .WERE KNOWN) CONCERNING THE PREAMBLE CARDS REQUIRED TO GET A JOB RUN ON ANY GIVtN COMPUTEK. APHtNL>IX 2 GIVES SEVERAL EXAMPLES OF RUNS OF VARYING COMPLEXITY IN SYSTEM U^E. WHhN THE SYSTEM IS IMPLEMENTED ON A SPECIFIC MACHINE. I I IS SUGGESTED THAT EACH OF THE EXAMPLES BE PREFACED bY THE APPROPRIATE JOB CONTROL DECK REQUIRED FOR THAT MACHINE. THE FOLLOWING UISCUSSION WILL ONLY BE CONCERNED WITH HOW THE USER MUST PREPARE HIS DAI A FROM THE POINT AT WHICH THE SYSTEM ASSUMES CONTROL OF THE JOB. X-RAY bYSTEM CARD FORMAT CONVENTIONS AND FUNCTIONS X-RAY SYSTEM UTILIZES 1-OUR TYPES OF INPUT DATA CARDS. EVERY CARDr REGARDLESS OF TYPE, IS IDENTIFIED BY ITS FiRST SIX COLUMNS. THE FOUR TYPES OF CARD ARfe AS FOLLOWS ... i. PROGRAM CALLING C«RDS (WHICH ARE READ BOTH BY THE SYSTEM AND BY THE CALLED PROGRAM) - E.G. =OATRDN=, =BONDLA=, =TANGEN=» l.GENERL- 4 <» 04/22/72 =FC=, =CRYLSQ= CARDS ACTUALLY CONTAINING CRYsTALLOGRAPHIC OR OTHER DATA (READ WITHIN THE APPROPRIATE. PROGRAM) - E.G. =ATOM=, =CELL=> =HKL=, = 3. THE =END= CARD, WHICH MARKS THE END OF A DATA SET FOR THE SELECTED PROGRAM «ND USUALLY INITIATES THE ACTUAL CALCULATION H, • OPERATION CARDS, ".'HICH ARE REcOGNIZtD AND ACTED UPON BY THE SYSTEM. THESE ACHIEVE HOUSEKEEPING FUNCTIONS SUCH AS PROVIDING A =TITLf= TO BE PRINTED AT THE TOP OF EACH PAGE OF PRINTED OUTPUT, 0" =FINISH= WHICH TERMINATES THE RUN. OTHER EXAMPLES ARE =REM"RK=, =S<WE=, =RESTART= ( AS ONLY THE FIRST 6 COLUMNS ARE CHECKED, THE FINAL T IS OPTIONAL), IN ADDITION TO ITS IDENTIFICATION COLyMNSr EACH CARD HAS A FIXED FORMAT WHICH IS SET IN THE PROGRAMS. EVERY CARD IS READ AT LEAST TWICE, ONCE To IDENTIFY ITi> FUNCTION PND ONCE TO OPCODE IT ACCORDING TO ITS FORMAT AND THE LIST OF ITEMS WHICH IT SHOULD CONTAIN. THIS DOUBLE READING MAKES POSSIBLE FAIRLY FLEXIBLE CARD ORDERS AMD GIVES THE USER CONTROL OF THE CALCULATIONS BY MEANS OF THE STRUCTURE OF HIS DATA DECK. THE WHOLE PROCESS OF CONTROL LS BASED UPON THESE CARDS AND THEIR ORDER so THAT THE UTMOST CARE SHOULD BE EXtRMSED IN THEIR PUNCHING AND ORDERING. AS LONG AS NO 'INVALID' PUNCHING IS CONTAINED IN THE CARD, CHECKING AND DIAGNOSTIC PRINT OUI ARE POSSIBLE WHEN UNA CEPTABLE CARD ORDER SEQUENCES C ARE ENCOUNTERED. 1H1S DIAGNOSTIC WHKH, UNFORTUNATELY' WILL BECOME FAMILIAR TO MOST X-KAY SYSTEM USERS STATES - CARD JUST RtAD.... (IMOGE OF CARD N QUESTION) CARD i.D. EXPECTED.... xxxxxx TYYYYYY zzzzzz WHERE XXXXXX=, =YYTYYY=, AND =ZZZZZZ= ARE THE ONLY ACCEPTABLE CARD = IDENTIFICATIONS EXPtCTED AT THF POINT AT WHICH THE 'CONDEMNED' CARD WAS ENCOUNTERED. MANY TIMES THIS ERROR IS CA(jS£D BY SIMPLY NOT PUNCHING WHAT IS SHOWN IN THt INSTRUCTIONS, E.G. =DATRON= FOR =OATRDN=, OR, MORE COMMONLY, A CONFUSION BETWEEN THE LETTER 0 AND THE DIGIT 0. THE 'INVALID' HUNCHING REt-ERRED TO ABOVE IS THE PLACING OF CHARACTERS IN FIELDS WHICH DO NOT BELONG THERE UNU£R THE RULES OF FORTRAN. EXAMPLES ARE THE PLACING OF « DECIMAL POINT WITHIN AN 'I' FIELD, OR A LETTER WITHIN AN «F» FIELD. FORTRAN FORMAT CONVENTIONS THE FOLLOWING UISCUSSION IS NOT INTENDED TO BE EXHAUSTIVE, BUT RATHER TO EMPHASIZE THE RULES OF FORTPAN FORMAT STATEMENTS WHICH ARE USUALLY TROUBLESOME TO THE CRYSTALLOGRnPHER USING THE X-RAY SYSTEM WITH NO PREVIOUS FORTRAN PROGRAMMING EXPERIENCE. SOME OF THE FOLLOWING MATERIAL WILL REPRESENT AN OVERSIMPLIFICATION BUT HOPEFULLY WILL BE SUFFICIENT TO INSURE FEWER TERMINATIONS DUE TO 'BAD' CARDS IN THE CRYSTALLOGRAPHIC

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SUPPORTED BY tHE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION UNDER .. TH£SE BECAME PHYSICAL UNITS flO TO Ag, BO TO faRAVAIb LATTICE TYPE AND WHETHER THE CELL IS CENTRIC OR.
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