Surface Science Tools for Nanomaterials Characterization

653 Pages·2015·28.174 MB·English

by  Challa S.S.R. Kumar (eds.)

Challa S. S. R. Kumar Editor
Surface Science
Tools for
Nanomaterials
Characterization
Surface Science Tools for Nanomaterials
Characterization

Challa S. S. R. Kumar
Editor
Surface Science Tools
for Nanomaterials
Characterization
With293Figuresand10Tables
Editor
ChallaS.S.R.Kumar
CenterforAdvancedMicrostructuresandDevices
BatonRouge,LA,USA
ISBN978-3-662-44550-1 ISBN978-3-662-44551-8(eBook)
DOI10.1007/978-3-662-44551-8
SpringerHeidelbergNewYorkDordrechtLondon
LibraryofCongressControlNumber:2015930198
#Springer-VerlagBerlinHeidelberg2015
Thisworkissubjecttocopyright.AllrightsarereservedbythePublisher,whetherthewholeorpartof
the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations,
recitation,broadcasting,reproductiononmicrofilmsorinanyotherphysicalway,andtransmissionor
informationstorageandretrieval,electronicadaptation,computersoftware,orbysimilarordissimilar
methodologynowknownorhereafterdeveloped.Exemptedfromthislegalreservationarebriefexcerpts
inconnectionwithreviewsorscholarlyanalysisormaterialsuppliedspecificallyforthepurposeofbeing
enteredandexecutedonacomputersystem,forexclusiveusebythepurchaserofthework.Duplication
ofthispublicationorpartsthereofispermittedonlyundertheprovisionsoftheCopyrightLawofthe
Publisher’s location, in its current version, and permission for use must always be obtained from
Springer.PermissionsforusemaybeobtainedthroughRightsLinkattheCopyrightClearanceCenter.
ViolationsareliabletoprosecutionundertherespectiveCopyrightLaw.
The use of general descriptive names, registered names, trademarks, service marks, etc. in this
publicationdoesnotimply,evenintheabsenceofaspecificstatement,thatsuchnamesareexempt
fromtherelevantprotectivelawsandregulationsandthereforefreeforgeneraluse.
While the advice and information in this book are believed to be true and accurate at the date of
publication,neithertheauthorsnortheeditorsnorthepublishercanacceptanylegalresponsibilityfor
anyerrorsoromissionsthatmaybemade.Thepublishermakesnowarranty,expressorimplied,with
respecttothematerialcontainedherein.
Printedonacid-freepaper
SpringerispartofSpringerScience+BusinessMedia(www.springer.com)
Contents
1 ScanningElectrochemicalPotentialMicroscopy(SECPM)and
ElectrochemicalSTM(EC-STM) .......................... 1
MaxHerpich,JochenFriedl,andUlrichStimming
2 RecoveringTime-ResolvedImagingForcesinSolutionby
ScanningProbeAccelerationMicroscopy:
TheoryandApplication ................................. 69
MaxmoreChaibva,NicoleShamitko-Klingensmith,and
JustinLegleiter
3 ScanningProbeMicroscopyforNanolithography ............. 91
C.B.Samantaray
4 KelvinProbeForceMicroscopyinNanoscienceand
Nanotechnology ........................................ 117
DaLuo,HaoSun,andYanLi
5 FieldIonMicroscopyfortheCharacterizationof
ScanningProbes ....................................... 159
WilliamPaulandPeterGr€utter
6 ScanningConductiveTorsionModeMicroscopy ............. 199
LingSunandElmarBonaccurso
7 FieldIonandFieldDesorptionMicroscopy:Principlesand
Applications .......................................... 227
YuriSuchorski
8 NoncontactAtomicForceMicroscopyforAtomic-Scale
CharacterizationofMaterialSurfaces ...................... 273
MehmetZ.Baykara
9 ApplicationsofSynchrotron-BasedX-RayPhotoelectron
SpectroscopyintheCharacterizationofNanomaterials ........ 317
W.H.Doh,V.Papaefthimiou,andS.Zafeiratos
v
vi Contents
10 ExplorationintotheValenceBandStructuresofOrganic
SemiconductorsbyAngle-ResolvedPhotoelectron
Spectroscopy .......................................... 367
YasuoNakayamaandHisaoIshii
11 BandBendingatMetal-SemiconductorInterfaces,Ferroelectric
SurfacesandMetal-FerroelectricInterfacesInvestigatedby
PhotoelectronSpectroscopy .............................. 405
NicoletaGeorgianaApostolandCristian-MihailTeodorescu
12 HigherResolutionScanningProbeMethodsfor
MagneticImaging ...................................... 463
S.N.PiramanayagamandBinniVarghese
13 ImagingandCharacterizationofMagneticMicro-and
NanostructuresUsingForceMicroscopy .................... 489
StephanBlock
14 CombiningMicromanipulation,KerrMagnetometryand
MagneticForceMicroscopyforCharacterizationof
Three-DimensionalMagneticNanostructures ................ 531
AmalioFernández-Pacheco,RussellP.Cowburn,
LuisE.Serrano-Ramo´n,M.RicardoIbarra,andJose´ M.DeTeresa
15 HighResolutionSTMImaging ............................ 561
AlexanderN.Chaika
16 NumericalandFiniteElementSimulationsofNanotipsfor
FIM/FEM ............................................ 621
Moh’dRezeq,AhmedE.Ali,andDirarHomouz
Index ................................................ 645
Contributors
Ahmed E. Ali Department of Electrical and Computer Engineering,
KhalifaUniversityofScience,TechnologyandResearch(KUSTAR),AbuDhabi,
UAE
Nicoleta Georgiana Apostol National Institute of Materials Physics,
Magurele-Ilfov,Romania
Mehmet Z. Baykara Department of Mechanical Engineering and UNAM (cid:1)
Institute of Materials Science and Nanotechnology, Bilkent University, Ankara,
Turkey
Stephan Block Department of Physics, Ernst–Moritz–Arndt University of
Greifswald,Greifswald,Germany
AppliedPhysics,ChalmersUniversityofTechnology,Gothenburg,Sweden
Elmar Bonaccurso Center of Smart Interfaces, Technische Universit€at
Darmstadt,Darmstadt,Germany
AirbusGroupInnovations,MetallicTechnologiesandSurfaceEngineering–TX2,
Munich,Germany
MaxmoreChaibva TheC.EugeneBennettDepartmentofChemistry,WestVirginia
University,Morgantown,WV,USA
WVNanoSAFE,WestVirginiaUniversity,Morgantown,WV,USA
Alexander N. Chaika Institute of Solid State Physics, Russian Academy of
Sciences,Chernogolovka,MoscowDistrict,Russia
Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN),
SchoolofPhysics,TrinityCollegeDublin,Dublin,Ireland
Russell P. Cowburn Cavendish Laboratory, University of Cambridge,
Cambridge,UK
vii
viii Contributors
Jose´ M. De Teresa Instituto de Ciencia de Materiales de Arago´n (ICMA),
Departamento de F´ısica de la Materia Condensada, Universidad de Zaragoza–
CSIC,Zaragoza,Spain
Laboratorio de Microscopias Avanzadas (LMA), Instituto de Nanociencia de
Arago´n(INA),UniversidaddeZaragoza,Zaragoza,Spain
W. H. Doh Institut de chimie et proce´de´s pour l’e´nergie, l’environnement et la
sante´ (ICPEES), UMR 7515 du CNRS-Universite´ de Strasbourg, ECPM,
Strasbourg,France
Amalio Fernández-Pacheco Cavendish Laboratory, University of Cambridge,
Cambridge,UK
Jochen Friedl TUM CREATE, 1 CREATE Way, CREATE Tower, Singapore,
Singapore
DepartmentofPhysicsE19,TechnischeUniversit€atM€unchen,Garching,Germany
PeterGru€tter PhysicsDepartment,McGillUniversity,Montre´al,QC,Canada
Max Herpich TUM CREATE, 1 CREATE Way, CREATE Tower, Singapore,
Singapore
DepartmentofPhysicsE19,TechnischeUniversit€atM€unchen,Garching,Germany
Dirar Homouz Department of Applied Mathematics and Sciences, Khalifa
UniversityofScience,TechnologyandResearch(KUSTAR),AbuDhabi,UAE
M. Ricardo Ibarra Departamento de F´ısica de la Materia Condensada,
UniversidaddeZaragoza,Zaragoza,Spain
Laboratorio de Microscopias Avanzadas (LMA), Instituto de Nanociencia de
Arago´n(INA),UniversidaddeZaragoza,Zaragoza,Spain
HisaoIshii GraduateSchoolofAdvancedIntegrationScience,ChibaUniversity,
Chiba,Japan
CenterforFrontierScience,ChibaUniversity,Chiba,Japan
JustinLegleiter TheC.EugeneBennettDepartmentofChemistry,WestVirginia
University,Morgantown,WV,USA
WVNanoSAFE,WestVirginiaUniversity,Morgantown,WV,USA
TheCenterforNeurosciences,WestVirginiaUniversity,Morgantown,WV,USA
Yan Li Beijing National Laboratoryfor Molecular Sciences, Key Laboratory for
the Physics and Chemistry of Nanodevices, College of Chemistry and Molecular
Engineering,PekingUniversity,Beijing,China
Contributors ix
DaLuo BeijingNationalLaboratoryforMolecularSciences,KeyLaboratoryfor
the Physics and Chemistry of Nanodevices, College of Chemistry and Molecular
Engineering,PekingUniversity,Beijing,China
Yasuo Nakayama Graduate School of Advanced Integration Science, Chiba
University,Chiba,Japan
V.Papaefthimiou Institutdechimieetproce´de´spourl’e´nergie,l’environnement
et la sante´ (ICPEES), UMR 7515 du CNRS-Universite´ de Strasbourg, ECPM,
Strasbourg,France
William Paul IBM Research Division, Almaden Research Center, San Jose,
CA,USA
S. N. Piramanayagam Data Storage Institute, A*STAR (Agency for Science,
TechnologyandResearch),Singapore,Singapore
Moh’dRezeq DepartmentofAppliedMathematicsandSciencesandDepartment
of Electrical and Computer Engineering, Khalifa University of Science, Technol-
ogyandResearch(KUSTAR),AbuDhabi,UAE
C.B.Samantaray CollegeofEngineering&Technology,VirginiaStateUniver-
sity,Petersburg,VA,USA
Luis E. Serrano-Ramo´n Instituto de Ciencia de Materiales de Arago´n (ICMA),
DepartamentodeF´ısicadelaMateriaCondensada,UniversidaddeZaragoza-CSIC,
Zaragoza,Spain
NicoleShamitko-Klingensmith TheC.EugeneBennettDepartmentofChemistry,
WestVirginiaUniversity,Morgantown,WV,USA
WVNanoSAFE,WestVirginiaUniversity,Morgantown,WV,USA
Ulrich Stimming School of Chemistry, Bedson Building, Newcastle University,
NewcastleuponTyne,UK
FakultaetfuerInformatik,TechnischeUniversit€atM€unchen,Garching,Germany
YuriSuchorski InstituteofMaterialsChemistry,ViennaUniversityofTechnology,
Vienna,Austria
Hao Sun Nano Surfaces Division, Bruker (Beijing) Scientific Technology Co.,
Ltd,Beijing,China
Ling Sun Department of Micro- and Nanotechnology, Technical University of
Denmark,Kgs.Lyngby,Denmark
Cristian-Mihail Teodorescu National Institute of Materials Physics,
Magurele-Ilfov,Romania