Surface science MASTER INDEX Editor: Charlies B. Duke, Webster, NY Associate Editors: Joel Kubby, Webster, NY Joe Mort, Webster, NY Regional Editors: Richard M. Lambert, UK; Yoshitada Murata, Japan; Klaus Wandelt, Germany 7 Master Index to Volumes 411-440, pp. 1-272 | December 1999 | ELECTRONIC ACCESS SURFACE SCIENCE A journal devoted to the physics and chemistry of interfaces Founding Editor: Harry C. Gatos Editor Dr. Charles B. Duke, Xerox Webster Research Center, 800 Phillips Road, Bldg. 0114-38D, Webster, NY 14580, USA Telefax: + 1-716-265-5080; Electronic mail: surface.science(@ crt.xerox.com Associate Editors Dr. Joel Kubby and Dr. Joe Mort, Xerox Webster Research Center, 800 Phillips Road, Bidg. 0114-38D. Webster. NY 14580, USA Telefax: + 1-716-265-5080; Electronic mail: surface.science(@ crt.xerox.com Regional Editors Dr. Richard M. Lambert Professor Yoshitada Murata Professor Klaus Wandelt Department of Chemistry Surtace Science Institut far Physikalische und Theore- University of Cambridge Department of Physics tische Chemie der Universitit Bonn Lensfield Road Division of Natural Sciences Wegelerstrabe 12 Cambridge CB2 [EW University of Electro-Communications D-53115 Bonn UK Tokyo 182-8585, Japan Germany Fax: +44-1223-336362 Fax: +81-424-82-7346 Fax: +49-228-732515 E-mail: rmil(@cus.cam.ac.uk E-mail: murata(@e-one.uec.ac.jp E-mail: unt!03a@ uni-bonn.de Advisory Editorial Board fustria D.M. Kolb, Ulm D.P. Woodruff, Coventry K.D. Rendulic, Graz J. Pollmann, Minster Ukraine Canada lal A.G. Naumovets, Kiev H.J. Kreuzer, Halifax G. Benedek, Milan USA K. Mitchell, Vancouver Japan E.A. Carter, Los Angeles, CA China A. Oki, Osaka PJ. Feibelman, Albuquerque, NM Xun Wang, Shanghai K. Yagi, Tokyo W. Goodman, College Station, TX Croatia A. Yoshimori, Okayama Tr. Gustafsson, Piscataway, NJ B. Gumhalter, Zagreb The Netherlands J. Krim, Raleigh, N¢ Denmark A. Kleyn, Amsterdam M.G. Lagally. Madison, WI I.K. Norskov, Lyngby Russia J. Tully, New Haven, CT France V.P. Zhdanov, Novosibirsk E.D. Williams, College Park, MD C.A. Sebenne, Paris Sweden J.T. Yates. Jr.. Pittsburgh, PA Germany B. Kasemo, Goteborg E. Bauer, Clausthal-Zellerfeld UK Aims and Scope imsterdam: Elsevier Science, P.O. Box 211, 1000 Al Surface Science deals exclusively with fundamental theoretical Amsterdam, The Netherlands. Tel.: (+31) 20-485-3757; and experimental studies in the physics and chemistry of surfaces fax: (+ 31) 20-485-3432: e-mail: nlinfo-fia elsevier.nl It covers topics contributing to a better understanding of basic Tokyo: Elsevier Science, 9-15 Higashi-Azabu |-chome, Minato- phenomena occurring on surfaces; the word “surface” being ku. Tokyo 106-0044. Japan. Tel.: (+81) 3-5561-5033 interpreted to include free surfaces as well as interfaces generally fax: (+81) 3-5561-5047; e-mail: [email protected] A special feature of the journal is the periodic inclusion of proceedings of symposia and conferences on aspects relevant to Singapore: Elsevier Science, No. | Temasek Avenue, #17-01 the study of the physics and chemistry of interfaces Millenia Tower, Singapore 039192. Tel.: (+65) 434-3727 fax: (+65) 337-2230; e-mail: asiainfo@ elsevier.com.sg Abstracted/indexed in: Aluminium Industry Abstracts; Chemical Abstracts: Current Rio de Janeiro: Elsevier Science, Rua Sete de Setembro 111 16 Contents: Physical, Chemical and Earth Sciences; El Andar, 20050-002 Centro, Rio de Janeiro-RJ, Brazil. Tel Compendex Plus; INSPEC; Metals Abstracts (+55) (21) S09 5340; fax: (+55) (21) 507 1991; e-mail [email protected] [Note (Latin America): for orders, Subscription Information 1999 claims and helpdesk information, please contact the Regional Volumes 418-443 of Surface Science (ISSN 0039-6028) are Sales Office in New York as listed above] scheduled for publication. ( Frequency: three times per month.) Prices are available from the publishers upon request. A com- Claims for issues not received should be made within six months bined subscription to Surface Science volumes 418 443, of our publication (mailing) date Applied Surface Science volumes 134-149, and Surface Science Reports volumes 33-36 is available at a reduced rate Advertising Information Subscriptions are accepted on a prepaid basis only. Issues are Advertising orders and inquiries can be sent to: USA, Canada sent by SAL (Surface Air Lifted) mail wherever this service is and South Americas Mr Tino de Carlo, The Advertising available. Airmail rates are available upon request Department, Elsevier Science Inc., 655 Avenue of the Americas, New York, NY 10010-5107, USA; phone: (+ 1) (212) 633 3815; Orders, claims, and product enquiries: please contact the fax: (+1) (212) 633 3820; e-mail: [email protected] Customer Support Department at the regional Sales Office near- Japan: The Advertising Department, Elsevier Science K.K., 9- est to you 15 Higashi-Azabu |-chome, Minato-ku, Tokyo 106-0044, Japan: New York: Elsevier Science, P.O. Box 945, New York, NY phone: (+81) (3) 5561 5033; fax: (+81) (3) 5561 5047 10159-0945, USA. Tel.: (+ 1) 212-633-3730 [Toll Free number Europe and ROW: Rachel Leveson-Gower, The Advertising for North American customers: 1-888-4ES-INFO (437-4636 )}: Department, Elsevier Science Ltd.. The Boulevard, Langford fax: (+ 1) 212-633-3680; e-mail: [email protected] Lane, Kidlington, Oxford OXS IGB, UK: phone: (+44) (1865) 843565; fax: (+44) (1865) 843976; e-mail: r.leveson- gower(@ elsevier.co.uk US Mailing notice — Surface Science (ISSN 0039-6028) is published three times per month by Elsevier Science B.V., Molenwerf 1, P.O. Box 211, 1000 AE Amsterdam, The Netherlands, Annual subscription price in the USA is USS 9234 (valid in North, Central and South America only), including air speed delivery. Periodicals postage paid at Jamaica, NY 11431. USA Postmasters: Send changes to Surface Science, Publications Expediting, Inc., 200 Meacham Avenue, Elmont, NY 11003 Airfreight and mailing in the USA by Publications Expediting. ~ The paper used in this publication meets the requirements of ANSI NISO Z39.48-1992 ( Permanence of Paper) Printed in The Netherlands North-Holland, an imprint of Elsevier Science SURFACE SCIENCE ADVISORY EDITORIAL BOARD E. Bauer, Clausthal—Zellerfeld G. Benedek, Milan E.A. Carter, Los Angeles, CA P.J. Feibelman, Albuquerque, NM W. Goodman, College Station, TX B. Gumhalter, Zagreb T. Gustafsson, Piscataway, NJ, B. Kasemo, Goteborg A. Kleyn, Amsterdam D.M. Kolb, Ulm H.J. Kreuzer, Halifax J. Krim, Raleigh, NC M.G. Lagally, Madison, WI K. Mitchell, Vancouver A.G. Naumovets, Kiev J.K. Norskov, Lyngby A. Okiji, Osaka J. Pollmann, Miinster K.D. Rendulic, Graz C.A. Sébenne, Paris J. Tully, New Haven, CT Xun Wang, Shanghai E.D. Williams, College Park, MD D.P. Woodruff, Coventry K. Yagi, Tokyo J.T. Yates, Jr., Pittsburgh, PA A. Yoshimori, Okayama V.P. Zhdanov, Novosibirsk Surface science including surface science letters A JOURNAL DEVOTED TO THE PHYSICS AND CHEMISTRY OF INTERFACES Editor: Charles B. Duke, Webster, NY Associate Editors: Joel Kubby, Webster, NY Joe Mort, Webster, NY Regional Editors: Richard M. Lambert, Yoshitada Murata, Klaus Wandelt Master Index to Volumes 411—440 ELSEVIER Amsterdam — Lausanne — New York — Oxford — Shannon — Tokyo © 1999 Elsevier Science B.V. All rights reserved This journal and the individual contributions contained in it are protected under copyright by Elsevier Science B.V_., and the following terms and conditions apply to their use Photocopying Single photocopies of single articles may be made for personal use as allowed by national copyright laws Permission of the Publisher and payment of a fee is required for all other photocopying, including multiple or systematic copying, copying for advertising or promotional purposes, resale, and all forms of document delivery. Special rates are available for educational institutions that wish to make photocopies for non-profit educational classroom use Permissions may be sought directly from Elsevier Science Rights & Permissions Department, PO Box 800, Oxford OXS IDX, UK; phone (+44) 1865 843830, fax: (+44) 1865 853333, e-mail: permissions(@elsevier.co.uk. You may also contact Rights & Permissions directly through Elsevier's home page (http: www.elsevier.nl ), selecting first ‘Customer support’, then “General Information’, then ‘Permissions Query Form’ In the USA, users may clear permissions and make payments through the Copyright Clearing Centre, Inc., 222 Rosewood Drive, Danvers, MA 01923, USA; phone (+ 1) 978 7508400, fax: (+ 1) 978 7504744, and in the UK through the Copyright Licensing Agency Rapid Clearance Service (CLARCS ), 90 Tottenham Court Road, London W1P OLP, UK; phone: (+44) 171 631 5555, fax: (+44) 171 631 5500. Other countries may have a local reprographic rights agency for payments Derivative Works Subscribers may reproduce tables of contents or prepare lists of articles including abstracts for internal circulation within their institutions Permission of the Publisher is required for resale or distribution outside the institution Permission of the Publisher is required for all other derivative works, including compilations and translations Electronic Storage or Usage Permission of the Publisher is required to store or use electronically any material contained in this journal, including any article or part of an article Except as outlined above, no part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any means, electronic, mechanical, photocopying, recording or otherwise, without prior written permission of the Publisher Address permissions requests to: Elsevier Science Rights & Permissions Department, at the mail, fax and e-mail addresses noted above Notice No responsibility ts assumed by the Publisher for any injury and or damage to persons or property as a matter of products liability, negligence or otherwise, or from any use or operation of any methods, products, instructions or ideas contained in the material herein. Because of rapid advances in the medical sciences, in particular, independent verification of diagnoses and drug dosages should be made Although all advertising material is expected to conform to ethical (medical) standards, inclusion in this publication does not constitute a guarantee or endorsement of the quality of such product or of the claims made of it by its manufacturer ~The paper used in this publication meets the requirements of ANSI NISO Z39.48-1992 (Permanence of Paper) Printed in The Netherlands MASTER INDEX Volumes 411—440 Author index Subject index Materials index surface science ELSEVIER Surface Science 411-440 (1 999) 1-69 www .elsevier.nl/locate/susc Author index to Volumes 41 1—440 Abdelrehim, I.M., see Madey 438 (1999) 191 Aguilar, M., A.I. Oliva and E. Anguiano, The importance of Abee, M.W., see York 437 (1999) 386 imaging conditions in scanning tunneling microscopy for the Abellan, J., R. Chicon and A. Arenas, Properties of nanowires in determination of surface texture and roughness air. Controlled values of conductance 418 (1998) 493 420 (1999) 275 Abrams, N.E., see Jones 414 (1998) 396 Ahlswede, B. and K. Jug, MSINDO study of the adsorption of Abrikosov, 1.A., see Pourovskii 439 (1999) 111 water molecules at defective NaCl( 100) surfaces Abriou, D. and J. Jupille, Self-inhibition of water dissociation on 439 (1999) 86 magnesium oxide surfaces 430 (1999) L527 Ahn, J., see Asari 426 (1999) 269 Abukawa, T., see Kosugi 412-413 (1998) 125 Ahn, J.. H. Kawanowa and R. Souda, STM study of oxygen- Abukawa, T., see Shimomura 412-413 (1998) 625 adsorbed TiC( 111) surface 429 (1999) 338 Abukawa, T., see Kono 420 (1999) 200 Ahn, J.R., see Kim 430 (1999) LS15 Abukawa, T., see Kono 438 (1999) 83 Ahner, J., see Mocuta 436 (1999) 72 Ackermann, R. and K. Knorr, X-ray diffraction study of C,F,Cl Aid, K.. Y. Garreau, M. Sauvage-Simkin and R. Pinchaux, physisorbed on graphite 424 (1999) 290 Atomic structures of the (2 x 4) Ing <,;Gap ,-As/InP(001) Adam, E., see Vilfan 440 (1999) 279 reconstructed surface. A study of average strain and growth temperature effects on the indium segregation Adamchuk, V.K., see Shikin 424 (1999) 155 425 (1999) 165 Adamchuk, V.K., see Shikin 429 (1999) 287 Ainsworth, M.K.. V. Fiorin, M.RS. McCoustra and Adamek, J., see Krajnikov 417 (1998) 337 M.A. Chesters, NO scattering from well-ordered adlayers Adams, D.L., see Petersen 437 (1999) 317 Adams, J.B., see Liao 415 (1998) 11 adsorbed on Pt(111): translational energy and rotational state distributions 433-435 (1999) 790 Adzié, R.R., see Wang 412-413 (1998)37 4 Ainsworth, M.K. M.R.S. McCoustra, M.A. Chesters, Aebi, P., see Diederich 417 (1998) 41 N. Sheppard and C. De La Cruz, An infrared study of ethene Aebi, P., see Diederich 418 (1998) 219 and CO coadsorption on Pt[{111] and a Pt/SiO, catalyst: Aebi, P., see Diederich 424 (1999) L314 ambiguities in the interpretation of difference spectra Aebi, P., see Hayoz 433-435 (1999) 104 437 (1999) 9 Aebi, P., see Naumovic 433-435 (1999) 302 Aisaka, T., see Ishii 438 (1999) 31 Agaki, K. and M. Tsukada, Theoretical study of the hydrogen Aisaka, T., see Seino 438 (1999) 43 relay dissociation of water molecules on Si(001) surfaces Aizawa, H., M. Tsukada, N. Sato and S. Hasegawa, Asymmetric 438 (1999)9 structure of the Si( 111)-V3 x V3-Ag surface Ageev, V.N. and S.Y. Davydov, lonization of hyperthermal 429 (1999) L509 beams on solid surfaces 425 (1999) 152 Aizawa, H., S. Tsuneyuki and T. Ogitsu, Population analysis Agrawal, B.K., S. Agrawal and R. Srivastava, First-principles study of etching processes at Si(001) surfaces with adsorbed calculation of valence band offset and the interface states in halogens and hydrogens 438 (1999) 18 GaAs/GaN(001) superlattice 424 (1999) 232 Aizawa, T., see Hayami 415 (1998) 433 Agrawal, B.K., S. Agrawal and R. Srivastava, Effect of atomic Aizawa, T., see Souda 416 (1998) 320 relaxation on the valence band offset and the interface states Aizawa, T., see Asari 426 (1999) 269 in ZnS/ZnSe( 110) superlattices 431 (1999) 84 Aizawa, T., see Asari 432 (1999) 171 Agrawal, S., see Agrawal 424 (1999) 232 Ajito, K. and M. Morita, Imaging and spectroscopic analysis of Agrawal, S., see Agrawal 431 (1999) 84 single microdroplets containing p-cresol using the near- Agren, H., see Evans 436 (1999) L691 infrared laser tweezers/Raman microprobe system Aguilar, M., see Oliva 417 (1998) L1139 427-428 (1999) 141 Author index to Volumes 411-440 Ajustron, F., see Pechou 418 (1998) 1 Andersen, J.N., see Sandell 415(19984)1 1 Akazawa, H., Formation and decomposition of a Si hydride Andersen, J.N., see Wiklund 418 (19982)1 0 layer during vacuum ultraviolet-excited Si homoepitaxy Andersen, J.N., see Beutler 418 (19984)5 7 from disilane 427-428 (1999) 214 Andersen, J.N., see Jaworowski 431 (1999)3 3 Akerlund, C., 1. Zoric and B. Kasemo, Displacement of O, from Anderson, C.A., see Walker 412-413 (1998)40 5 Pt(111) by incident CO: dynamics an kinetics Anderson, G.W., see Ma 420 (1999) 134 418 (1998) 543 Andersson, S., see Jonasson 411 (1998) L872 Akimoto, K., see Emoto 438 (1999) 107 Ando, T., see Takami 440 (1999) 103 Akita, M., N. Osaka, S. Hiramoto and K. Itoh, Infrared reflec- Andrés, J., see Calatayud 430 (1999) 213 tion absorption spectroscopic study on the adsorption struc- Andryushechkin, BV. K.N. Eltsov, V.M. Sheviyuga, tures of ethylene on Ag( 110) and atomic oxygen pre-covered C. Tarducci, B. Cortigiani, U. Bardi and A. Atrei, Epitaxial Ag( 110) surfaces 427-428 (1999) 374 growth of AgCl layers on the Ag( 100) surface Akita, M., see Osaka 427-428 (1999) 381 421 (1999)2 7 AkitTa.,, s ee Lee 412-413 (1998)2 4 Andryushechkin, B.V.. K.N. Elstov, V.M. Shevlyuga and Akiyama, R., T. Matsumoto and T. Kawai, Dipole-controlled V.Yu. Yurov, Direct STM observation of surface modifica- manipulation of DNA base molecules 418 (1998) L73 tion and growth of AgCl on Ag(111) upon chlorination at Al-Shamery, K., see Wilde 427-428 (1999) 27 room temperature 431 (1999) 96 Ala-Nissila, T., see Salmi 425 (1999) 31 Andryushechkin, B.V., K.N. Eltsov and V.M. Sheviyuga, Atomic Alatalo, M., see Salmi 425 (1999) 31 structure of silver chloride formed on Ag( 111) surface upon Albini, L., see Gubbiotti 433-435 (1999) 680 low temperature chlorination 433-435 (1999) 109 Albini, L., see Gubbiotti 433-435 (1999) 685 Angot, T., see Louis 422 (1999) 65 Albrecht, M., J.K ohler, K. Friemelt and E. Bucher, Growth and Angot, T. and P. Louis, Metal-semiconductor transition structure of Cr on Ru(0001)-(2 x 2) and Cr/Ru multilayers observed by HREELS on the surface of Si, .Ge,/Si(001) 415 (1998) 170 grown by CTL-CVD at 620 K 427-428 (1999) 224 Aldao, C.M., see Williams 412-413 (1998) 174 Anguiano, E., see Oliva 417 (1998) L1139 Aldao, C.M., see Williams 425 (1999) L387 Anguiano, E., see Aguilar 420 (1999) 275 Aldaz, A., see Orts 416 (1998) 371 Anton, J., see Zamini 417 (1998) 372 Aldaz, A., see Herrero 440( 19992)5 9 Aoki, K., see Ohwaki 433-435 (1999) 496 Aldea, A., see Velasco 412-413 (1998) 397 Aono, M., see Thirstrup 411 (1998) 203 Alexander, A., see Fishtik 430 (1999) 1 Aono, M., see Wu 415( 1998) L1032 Alfé, D., S. de Gironcoli and S. Baroni, The reconstruction of Aono, M., see Shklyaev 423 (1999) 61 nickel and rhodium (001) surfaces upon carbon, nitrogen or Apai, G., see Kesmodel 429 (1999) L475 oxygen adsorptions 437 (1999) 18 Apra, E., see Bredov 418 (1998) 150 Alfredsson, M., see Hermansson 411 (1998) 23 Arai, H., see Ishii 438 (1999)3 1 Ali, T.. A.V. Walker, B. Klétzer and D.A. King, A molecular Arai, S., see Komori 438 (1999) 123 beam study of the H,-induced lifting of the Ir{100}-+1 x 5) Arciprete, F., see Fanfoni 419 (1998) 24 reconstruction 414 (1998) 304 Arenas, A., see Abellan 418 (1998) 493 Alieva, E.V., see Mattei 427-428 (1999) 235 Arenhold, K.. S. Surnev, P. Coenen, H.P. Bonzel and Allison, W., see Dastoor 433-435 (1999) 99 P. Wynblatt, Scanning tunneling microscopy of equilibrium Allison, W., see Luo 433-435 (1999) 590 crystal shape of Pb particles: test of universality Aloni, S., see Gorelik 432 (1999) 265 417 (1998) L1160 Alonso, C., see Gutiérrez 430 (1999) 206 Arenhold, K., S. Surnev, H.P. Bonzel and P. Wynblatt, Step Altman, E.1., see Nakakura 416 (1998) 488 energetics of Pb( 111) vicinal surfaces from facet shape Altman, E.1., see Nakakura 424 (1999) 244 424 (1999) 271 Altshuler, E.S., D.L. Mills and R.B. Gerber, Solid and liquid-like Arigane, T., K. Yoshida, T. Wadayama and A. Hatta, In situ FT- phases of chemisorbed hydrogen monolayers on bec metal IR and photoluminescence study of porous silicon during surfaces: structure, dynamics and order—disorder transition exposure to F,, H,O, and D,O 427-428 (1999) 304 414(1998) 1 Arnistov, V.Yu., L. Douillard and P. Soukiassian, High temper- Alvarez, J.. Y. Calvayrac, J.L. Joulaud and MJ. Capitan, ature dismantling of Si atomic lines on B-SiC( 100) Characterization of the five-fold plane surface of an 440 (1999) L825 Also.4Pd., 4Mng , quasi-crystal by means of surface X-ray Armstrong, N.R., see Schlaf 420 (1999) L122 diffraction 423 (1999) L251 Armstrong, N.R., see Schmitz-Hibsch 437 (1999) 163 Amemiya, K., see Fujita 423 (1999) 160 Armstrong, R.A., see Hird 420 (1999) L131 Ammer, Ch., see Meinel 420 (1999) 213 Armstrong, R.A., see Hird 431 (1999) LS70 Ammer, Ch., see Beckmann 432 (1999) L589 Arnaud d’Avitaya, F., see Miller 417 (1998) 107 An, T., see Yoshimura 433-435 (1999) 470 Arnold, M., see Fritsch 427-428 (1999) 58 Andersen, J.N., see Beutler 411(1998) 111 Arnolds, H., see Ebinger 412-413 (1998)58 6