Table Of Content

olrface and Interface Analysis ECASIK 93 Proceedings of the European Conference on Applications of Surface and Interface Analysis 4-8 October 1993; Centro Congressuale ‘La Perla lonica’, Catania, Italy Volume 22 SIANDQ 22(1-12) 1-632 AY ISSN 0142-2421 Copyright © 1994 by John Wiley & Sons Ltd All Rights reserved. No part of this book may be reproduced by any means, nor transmitted, nor translated into a machine language without the written permission of the publisher. CONTENTS ECASIA 93 Preface Committee Members Opening Speech Plenary Lecture G. MARGARITONDO SECTION 1. DEPTH PROFILING Combined Depth Profile Analysis with SNMS, SIMS and XPS: Preferential Sputtering and Oxygen Transport in Binary Metal Oxide Multilayer Systems TH. ALBERS, M. NEUMANN, D. LIPINSKY, L. WIEDMANN AND A. BENNINGHOVEN Oxidation Study of 3d Transition Metals (Cr, Fe, Co and Ni) and Rare Earth (Tb): Application to Auger Depth Profiling of Magneto-optical Disk Y. ABE, A. KATO AND T. NAKAMURA Auger Electron Spectroscopy Studies of Interdiffusion in Electrodeposited Amorphous Ni-P Alloys A. BUKALUK Crystalline Effects on Depth Resolution in AES Depth Profiling K. KAJIWARA Laser Etching of Silicon: Dopant Desorption, Diffusion and Segregation During Laser Induced Surface Melting A. DESMUR, J.-B. OZENNE, B. BOURGUIGNON, J. BOULMER, J.-P. BUDIN, D. DEBARRE AND A. ALIOUCHOUCHE Small-area XPS Investigation on Ion-induced Chemical Modifications During Depth-profiling of An Al,Ga,_,As/GaAs Structure G. PADELETTI AND G. M. INGO X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy of B-FeSi, Films Grown by Ion Beam Assisted Deposition L. ARMELAO, A. TERRASI, M. BOARO, S. RAVESI AND G. GRANOZZI SECTION 2. DATA INTERPRETATION AND QUANTIFICATION Application of Electron Spectroscopies Aided by the Pattern Recognition Method for Quantitative Analysis of Solid Surfaces A. JABLONSKI, B. LESIAK, L. ZOMMER, A. BILINSKI AND A. JOZWIK Local Electronic Structures in Phosphorus Oxyanions L. KOVER, A. NEMETHY, I. CSERNY, A. NISAWA, Y. ITO AND H. ADACHI Experimental Determination of Attenuation Lengths of Photo- and Augerelectrons in Silicon Dioxide and in Silicon Nitride in the Energy Range 500 eV < E,,, < 3100 eV M. F. EBEL, H. EBEL, A. HOFMANN AND R. SVAGERA Quantitative Depth Profile Analysis by EPMA Combined with Monte-Carlo Simulation N. AMMANN AND P. KARDUCK Chemical Information from Auger Data using Factor Analysis: Some Examples C. CHEMELLI Weight Function for Linear Least Squares Fit of Binary CuNi and PtPd Alloy Auger Spectra W. D. ROOS, G. N. van WYK AND J. du PLESSIS Computer Programs for Surface Analysis by SIMS and SNMS A. G. FITZGERALD, H. L. L. WATTON, B. E. STOREY, J. S. COLLIGON AND H. KHEYRANDISH True Auger Spectral Shapes: A Step to Standard Spectra K. GOTO, N. SAKAKIBARA, Y. TAKEICHI, Y. NUMATA AND Y. SAKAI Influence of the Elastic Scattering Cross-section on Angle-resolved Reflection Electron Energy Loss Spectra of Polycrystalline Al, Ni, Pt and Au W. S. M. WERNER AND M. HAYEK CONTENTS Correction of Drift and Slope Distortions in STM Image and Scanner Calibration V. Y. YUROV AND A. N. KLIMOV SiO, Surface Stoichiometry by XPS: a Comparison of Various Methods R. ALFONSETTI, G. DE SIMONE, L. LOZZI, M. PASSACANTANDO, P. PICOZZI AND S. SANTUCCI Factor Analysis, a Useful Tool for Solving Analytical Problems in AES and XPS: a Study of the Performances and Limitations of the Indicator Function A. ARRANZ AND C. PALACIO Internal Analyser Inelastic Scattering Effects in XPS Quantitative Analysis C. BATTISTONI, G. MATTOGNO AND G. RIGHINI Simultaneous Appearance of Sharp and Diffuse Spots in LEED: Experiments and Simulation for Si N. SAKAKIBARA, Y. HISADA, T. HATTORI AND K. GOTO Ambient Oxygen Effect in Ga* FIB-SIMS T. SAKAMOTO, B. TOMIYASU, M. OWARI AND Y. NIHEI Charging and Mixing Effects During the XPS Analysis of Mixtures of Oxides A. FERNANDEZ, J. P. ESPINOS, D. LEINEN, A. R. GONZALEZ-ELIPE AND J. M. SANZ Simulation of Insulator Charging by a Narrow Electron Beam E. VICARIO, N. ROSENBERG AND R. RENOUD Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and Al Determined by Elastic Peak Electron Spectroscopy H. BEILSCHMIDT, I. S. TILIUIN AND W. S. M. WERNER Quantitative Analysis of REELS Spectra of ZrO,: Determination of the Dielectric Loss Function and Inelastic Mean Free Paths F. YUBERO, J. M. SANZ, J. F. TRIGO, E. ELIZALDE AND S. TOUGAARD Database of Relativistic Elastic Scattering Cross-sections for Calculations of Photoelectron and Auger Electron Transport A. JABLONSKI AND S. TOUGAARD Quantitative GDOS Analysis of Oxide Films on Steels S. SUZUKI, K. SUZUKI AND K. MIZUNO SECTION 3. THIN FILMS AND COATINGS Preparation and Characterization of Cubic Boron Nitride and Metal Boron Nitride Films W. GISSLER Recent Progress of Thin Film Technology in Automobile Industry Y. TAGA In-depth Homogeneity of Vapour Deposited Multicomponent Thin Films H. A. JEHN, E. HUBER AND S. HOFMANN Ex situ and In situ Characterization of Surfactant Monolayers Adsorbed on Nonmetallic Substrate by Infrared Reflection Spectroscopy J. A. MIELCZARSKI Auger Electron Spectroscopy Studies on TiN, J. HAUPT In situ Quantitative Soft x-ray Spectrometry of Thin Films Synthesized by DC Sputtering P. B. LEGRAND, J. P. DAUCHOT, M. WAUTELET AND M. HECQ Determination of the Depth Resolution of Auger Electron Spectroscopy Depth Profiles of Anodic Barrier Oxide Films on Differently Pretreated Aluminium Substrates J. DE LAET, K. DE BOECK, H. TERRYN AND J. VEREECKEN Pulsed Laser Induced Ablation Applied to Epitaxial Growth of Semiconductor Materials: Selenides and Tellurides Plume Analysis R. TEGHIL, A. GIARDINI GUIDONI, A. MELE, S. PICCIRILLO, M. CORENO, V. MAROTTA AND T. M. DI PALMA CONTENTS Deposition of CeO, on Si(111) Studied by LEED, AES, XPS and RBS C. E. GUILLAUME, M. VERMEERSCH, R. SPORKEN, J. J. VERBIST, S. MATHOT AND G. DEMORTIER Surface Stoichiometry Determination of SiO,N, Thin Films by Means of XPS L. LOZZI, M. PASSACANTANDO, P. PICOZZI, S. SANTUCCI, G. TOMASSI, R. ALFONSETTI AND A. BORGHESI Initial Growth of AIN on Clean and Oxidised Iron Studied by AES and EELS F. MALENGREAU, M. VERMEEERSCH, R. SPORKEN, L. PHILIPPE, B. Y. HAN AND R. CAUDANO Investigation of CdS Passivation Layers on Hg_, C,d,T e S. KACIULIS, G. MATTOGNO, S. VITICOLI, M. E. MARINI, F. CESQUI, S. ALFUSO AND A. MERCURI XPS Study of Amorphous As,S, Films Deposited onto Chromium Layers K. PETKOV, V. KRASTEV AND TS. MARINOVA XPS Analysis of Lithium Intercalation in Thin Films of Molybdenum Oxysulphides L. BENOIST, D. GONBEAU, G. PFISTER-GUILLOUZO, E. SCHMIDT, G. MEUNIER AND A. LEVASSEUR The Growth Mode of Copper and Iron for the Cu/Fe and Fe/Cu Interfaces G. POLZONETTI, V. DI CASTRO AND C. FURLANI Growth of Cobalt Overlayers onto Si(100) G. BENITEZ, J. L. CARELLI, J. M. HERAS AND L. VISCIDO An XPS Study of Diamond Films Grown on Differently Pretreated Silicon Substrates F. AREZZO, E. SEVERINI AND N. ZACCHETTI SECTION 4. ADHESION Surface Modification of PET Films with RF Plasma and Adhesion of in situ Evaporated Al on PET Q. T. LE, J. J. PIREAUX AND J. J. VERBIST The Chemical Environment of Nitrogen in the Surface of Carbon Fibres M. R. ALEXANDER AND F. R. JONES XPS and AES Study of Al,O,;/Ti6AI4V Interface: Influence of Oxidation and Nitruration of the Metal Surface P. DELOGU, T. DIKONIMOS-MAKRIS, R. GIORGI, J. LASCOVICH, L. CANEVE AND S. SCAGLIONE An XPS and SEMS Study of Silica Sol-gel/Metal Substrate Interaction A. STOCH, J. STOCH AND A. RAKOWSKA SECTION 5. CERAMICS AND GLASSES Characterization of Nanophase Powders Prepared by Laser Synthesis R. GIORGI, S. MARTELLI, S. TURTU, G. ZAPPA, E. BORSELLA AND S. BOTTI Insulator Surface Analysis C. LE GRESSUS AND G. BLAISE Interface Analysis of Ceramic Matrix Composites by XPS, AES, SEM and XRD S. CONTARINI, G. GIUNTA, S. LORETI, N. NISTICO, E. LAMBERS AND P. H. HOLLOWAY The Microchemistry of Interfaces in Fibre-reinforced Ceramics and Glasses R. SCHNEIDER AND J. WOLTERSDORF Surface versus Bulk Composition of a Phosphate Glass W. MEISEL, D. SPRENGER AND P. GUTLICH Electron Spectroscopy of Porous Silicon Layers. Indirect Detection of Hydrogen by Elastic Peak Electron Spectroscopy G. GERGELY, B. GRUZZA, L. BIDEUX, P. BONDOT, C. JARDIN AND E. VAZSONYI XPS and SEM Studies of Ca- and Ni-substituted LaCrO, after Quenching from Reducing and Oxidizing Atmospheres at 800°C R. GLENNE, J. A. HORST, S. JORGENSEN, T. NORBY AND M. SEIERSTEN High-Resolution Electron-Energy-Loss Spectroscopy of Hydroxyl Groups at the Surface of Bulk Insulating Oxides V. COUSTET AND J. JUPILLE CONTENTS Investigation of the Thermal Degradation of Polyacrylonitrile on Various Glasses B. A. KELLER, CH. LOWE AND R. HANY SECTION 6. IMAGING Surface Structure of the PAN-based Carbon Fibres Studied by the Scanning Probe Microscopy (SPM) P. A. ZHDAN, D. GREY AND J. E. CASTLE STM Characterization of InP Gratings for DFB Laser Fabrication G. MENEGHINI, G. B. PICOTTO, M. GENTILI AND L. GRELLA The Investigation of Instrumental and Sample Parameters as Potential Sources for Affecting the Reproducibility of Isotopic Ratio Measurements in Secondary Ion Mass Spectrometry A. ADRIAENS AND F. ADAMS Automatic Matching of Dissimilar SAM-Images S. D. BOHMIG, B. M. REICHL, M. M. EISL AND H. STORI SECTION 7. METALLURGY An Interfacial Study of a Sigma Fibre/Ti-6Al-4V Composite Using Scanning Auger /EDX Microscopy M. A. BAKER AND D. UPADHYAYA Surface Structure of Al-Sn Layered Systems Codeposited in the Presence of Oxygen L. KOVER, A. NEMETHY, P. B. BARNA AND M. ADAMIK Impurity Segregation in an Fe-3.5at.%Si Bicrystal B. M. REICHL, M. M. EISL, S. D. BOHMIG AND H. STORI Surface Composition of Machined Leaded Brass J. X. WU, M. R. JI, M. GALEOTTI, A. M. GIUSTI AND G. ROVIDA Evaluation of Temperature-dependent Surface Chemistry in Zr,Fe and ZrVFe via X-ray Photo- emission Spectroscopy J. KOVAC, O. SAKHO, P. MANINI AND M. SANCROTTI SECTION 8. MICROELECTRONICS Advances in Auger Microanalysis for Semiconductor Technology W. PAMLER Low Energy Field Emission Auger Electron Spectroscopy N. M. FORSYTH AND S. BEAN Secondary Ion Mass Spectrometry of Si/Ge Structures Grown by Surfactant-mediated Epitaxy and by Low Pressure Chemical Vapour Deposition J. HERION, H. SIEKMANN, B. VOIGTLANDER AND L. VESCAN Ellipsometric Investigation of Single Crystalline Cz-Si Subjected to Hydrostatic Pressure A. M. KAMINSKA, A. MISIUK AND J. WOLF Silicon-Insulator Interface Probing by Reflected Optical Second Harmonic Generation I. V. KRAVETSKY, L. L. KULYUK AND A. V. MICU Characterization and Reliability of Ti/Ni/Au, Ti/Ni/Ag and Ti/Ni Back-Side Metallizations in the Die-bonding of Power Electronic Devices A. SCANDURRA, A. PORTO, L. MAMELI, O. VISCUSO, V. DEL BO AND S. PIGNATARO SECTION 9. OPTOELECTRONICS In-depth Inhomogeneous Photoluminescent Properties of Porous Silicon Layers V. P. PARKHUTIK, J. M. MARTINEZ-DUART, D. MORENO, J. M. ALBELLA, J. GONZALEZ-VELASCO AND M. L. MARCOS XPS Investigations of Electrochemically Modified Porous Silicon Layers M. JESKE, K. G. JUNG, J. W. SCHULTZE, M. THONISSEN AND H. MUNDER SIMS and X-ray Diffraction Characterization of Carbon-Doped GaAs, Al,Ga,_,As Films Grown by MBE C. GERARDI, C. GIANNINI, L. TAPFER, A. FISCHER AND K. H. PLOOG CONTENTS SECTION 10. SENSORS ESCA Investigation of SnO, Films Used as Gas Sensors R. SANJINES, D. ROSENFELD, F. GOZZO, PH.ALMERAS, L. PEREZ, F. LEVY, G. MARGARITONDO AND W. H. SCHREINER XPS Analysis of Sol-gel Processed Doped and Undoped TiO, Films for Sensors R. ZANONI, G. RIGHINI, A. MONTENERO, G. GNAPPI, G. MONTESPERELLI, E. TRAVERSA AND G. GUSMANO SECTION 11. SUPERCONDUCTORS Interfacial Depth Profiling of Superconducting High-7, Mono- and Multilayer Structures by Auger Electron Spectroscopy E. W. SEIBT, A. ZALAR AND P. PANJAN Interfacial Phenomena in PbBiSrCaCuO/Ag and Ag-In: Wettability, AES and XPS Studies M. POLAK, J. BARAM AND N. FROUMIN SECTION 12. TRIBOLOGY AND WEAR Tribological Behaviour of Heat-Treated Thin Films of Electropolymerized Polyacrylonitrile S. NOEL, P. NEWTON, C. BODIN, F. HOUSE, L. BOYER, P. VIEL, P. VALIN AND G. LECAYON SECTION 13. CATALYSIS Characterisation of MoO,/ZrO, System by XPS and IR Spectroscopies D. GAZZOLI, F. PRINETTO, M. C. CAMPA, A. CIMINO, G. GHIOTTI, V. INDOVINA AND M. VALIGI XPS-investigation of Titanium Modified MFI-type Zeolites I. GROHMANN, W. PILZ, G. WALTHER, H. KOSSLICK AND V. A. TUAN Study of the Bulk and Surface Acidity of Protonated Y Zeolites by TPD and XPS C. GUIMON, A. BOREAVE AND G. PFISTER-GUILLOUZO Surface Reactions at the Controlled Structure of SrTiO; (001) M. KUDO, T. HIKITA, T. HANADA, R. SEKINE AND M. KAWAI Identification of the Fixed Nitrogen Containing Species During the Photo-oxidative Fixation of Molecular Nitrogen on UV-illuminated TiO, Surfaces J. A. NAVIO, C. REAL AND R. I. BICKLEY SECTION 14. CORROSION High Temperature Corrosion Characterisation by the Combined Use of Surface Microsurgery and Surface Analysis M. J. BENNETT Surface Analytical Investigations of Al and (Ti, Al) Nitrides Formed by Ion Implantation and their Corrosion Properties S. SIMSON, N. HEIDE AND J. W. SCHULTZE Use of Ion Implantation to Study the Corrosion of an Austenitic Steel in an Oxidizing/Sulphidizing Atmosphere M. F. STROOSNIJDER AND J. F. NORTON AES and SAM Studies of Oxide Formation on Inconel 600 at High Temperatures N. C. ALSTRUP, N. LANGVAD AND I. CHORKENDORFF Non-destructive Characterization of Chromium Phosphate Coated Aluminium with SE and FTIRS Correlated to Surface Analytical Analysis by AES and TEM G. GOEMINNE, J. DE LAET, H. TERRYN AND J. VEREECKEN Application of Reflectance Spectrophotometry to the Study of Copper (I) Oxides (Cu,0 and Cu,0,) on Metallic Substrate B. LEFEZ, K. KARTOUNI, M. LENGLET, D. RONNOW AND C. G. RIBBING Theoretical and Experimental Study of the Infrared Reflectance of Multilayer Oxide Films on Metals B. LEFEZ AND M. LENGLET CONTENTS Analytical and Electrochemical Study of Passive Films Formed on Nickel-Chromium Alloys: Influence of the Chromium Bulk Concentration S. BOUDIN, J.-L. VIGNES, G. LORANG, M. DA CUNHA BELO, G. BLONDIAUX, S. M. MIKHAILOV, J. P. JACOBS AND H. H. BRONGERSMA AES Investigations of Local Inhomogeneities in Aluminium Oxide Films on Fe-based Alloys S. OSWALD, A. JOHN AND W. J. QUADAKKERS SECTION 15. ENVIRONMENTAL STUDIES Ion Beam Analyses of Ceramics and Glasses in Nuclear Energy HJ. MATZKE SECTION 16. POLYMERS A Spectroscopic Analysis of Plasma Polymers Prepared from a Series of Vinyl Sulphones A. J. WARD AND R. D. SHORT The Formation of the Copper /Polyphenylquinoxaline Interface: An HREELS Study C. GREGOIRE, J. J. PIREAUX, A. CROS AND R. CAUDANO The Use of XPS Valence Band Spectra in the Study of Plasma-deposited Films of Tetramethyldisiloxane or Hydroxyethylmethacrylate F. GARBASSI, M. MORRA, E. OCCHIELLO AND L. POZZI Interfacial Effects of a Multifunctional Additive on Carbon Black Filled Rubber E. SHENG, R. H. BRADLEY, I. SUTHERLAND, P. K. FREAKLEY AND H. ISMAIL XPS of Oxidised Wool Fibre Surfaces R. H. BRADLEY, I. L. CLACKSON AND D. E. SYKES XPS Analysis of Polypropylene Grafted with Acrylic Monomers P. J. DE LANGE, B. GEBBEN AND P. J. ELFRINK An XPS Valence Band Study of Alkane Chains Secondary Structure J. RIGA, J. DELHALLE, M. DELEUZE, J. J. PPREAUX AND J. J. VERBIST Optical and Electronic Properties of Ag- and Cu-TCNQ in Polymeric Matrix A. ARENA, G. DI MARCO, R. GIORGI, A. M. MEZZASALMA, S. PATANE AND G. SAITTA SECTION 17. RADIATION EFFECT ARXPS and LEISS Characterizations for Chemically Etched and Ion-bombarded GaAs(100) Surfaces J. L. SULLIVAN, W. YU AND S. O. SAIED Comparison Between Pulsed Laser and Ion Irradiation of Hydrogenated Amorphous Carbon Films G. COMPAGNINI AND R. REITANO Irradiation Effects Induced by Reactive and Non-reactive Low Energy Ion Irradiation of Graphite: an Electron Spectroscopy Study I. GOUZMAN, R. BRENER, C. CYTERMANN AND A. HOFFMAN Radiation Effects in Static SIMS of Polymers A. LICCIARDELLO, B. WENCLAWIAK, C. BOES AND A. BENNINGHOVEN Degradation of Polymers by Hyperthermal Atomic Oxygen R. VERED, S. MATLIS, G. NAHOR, G. D. LEMPERT, E. GROSSMAN, G. MAROM AND Y. LIFSHITZ Argon Bombardment-induced Topography Development on InP J. B. MALHERBE AND N. G. van der BERG Surface Compositional Changes of InP due to Krypton Ion Bombardment J. B. MALHERBE AND N. G. van der BERG Mossbauer and Auger Spectroscopic Investigations of Fe-Si Alloys Produced by Ion Implantation H. REUTHER Ion Bombardment Induced Modification of Polyvinyltrimethylsilane Studied by XPS A. TOTH, I. BERTOTI AND V. S. KHOTIMSKY Surface Concentration Modification of PtPd Alloys by Noble Gas Ion Sputtering J. DU PLESSIS AND E. TAGLAUER CONTENTS SECTION 18. TECHNIQUE DEVELOPMENTS Recent Aspects of Surface Infrared Spectroscopy P. DUMAS Hydrogen Content of C,. Fullerenes, Measured by Elastic Recoil Detection A. BRANDSTOTTER, O. BENKA, L. PALMETSHOFER, E. STEINBAUER AND J. KASTNER Glancing Incidence X-ray Analysis: Forgotten or to be Discovered? W. W. v.d. HOOGENHOF AND D. K. G. de BOER The Design and Development of a Time of Flight Fast Atom/Ion Scattering Spectrometer R. GILES, J. L. SULLIVAN AND C. G. PEARCE Auger Imaging from Rough, Chemically Inhomogeneous, Materials M. CRONE, I. R. BARKSHIRE, M. PRUTTON AND P. G. KENNY Surface Acoustic Wave Resonance Spectroscopy (SAWRS) as A Novel Technique to Study Surface Phenomena A. I. BORONIN, R. I. KVON, I. P. PROSVIRIN, V. N. BREZHNEV, V. P. OSTANIN, I. E. SERIKBAEV, V. S. TUPIKOV AND A. N. BELYAEV Extended Fine Structure in the Secondary Electron Emission Spectra of Graphite and Glassy Carbon A. HOFFMAN, R. BRENER AND C. CYTERMANN The Influence of Al Oxidation on the Cu/AIL,O, Interface Formation: an XPS Study S. CIAMPI AND V. DI CASTRO Bulk-to-Surface Diffusion Measurements in a (111)Cu(0.lat.%)Sn Single Crystal Using a Linear Programmed Heating Method E. C. VILJOEN AND J. DU PLESSIS Investigation of Thin Films by Soft X-ray Fluorescence and by Total Electron Yield Measurements H. EBEL, M. MANTLER, R. SVAGERA AND R. KAITNA Optical Second Harmonic Generation as a Crystalline Surface Symmetry Probe for III-V Semi- conductors I. V. KRAVETSKY AND L. L. KULYUK The Use of the Anaerobic Transfer Electrochemical Cell in the XPS Investigation of Polyaniline G. MOREA, J. C. VICKERMAN AND J. WALTON SECTION 19. WORK OF ART Small-area XPS and XAES Study of the Iron Ore Smelting Process 614 G. M. INGO, S. MAZZONI, G. BULTRINI, S. FONTANA, G. PADELETTI, G. CHIOZZINI AND L. SCOPPIO Author Index 621 List of Presentations 625 PAPERS PRESENTED AT ECASIA 93 PUBLISHED IN SURFACE AND INTERFACE ANALYSIS, VOLUME 21, ISSUE 6/7 Development and Practical Application of a Transmission X-ray Photoelectron Spectrometer S. N. JENKINS AND J. E. CASTLE Simple Method of Depth Profiling (Stratifying) Contamination Layers, Illustrated by Studies on Stainless Steel M. P. SEAH, J. H. QIU, P. J. CUMPSON AND J. E. CASTLE ToF SIMS Study of the Desorption of Emulsifiers from Polystyrene Latexes L. T. WENG, P. BERTRAND, J. H. STONE-MASUI AND W. E. E. STONE Sputter-induced Effects on Quantitative GD-OES Depth Profiles From Hot-dip Zinc-coated Steel J. KARLSSON, S. E. HORNSTROM, H. KLANG AND J-O. NILSSON '8Q Tracer Study of the Oxidation of Zircaloy-4 in Steam Y. MATSUDA, H. ANADA AND H. E. BISHOP Segregation Aspects at the Fracture Surfaces of 8 wt.% Yttria—Zirconia Thermal Barrier Coatings G. M. INGO AND G. PADELETTI An in situ XPS Study of the Formation of Nickel-polyethylene and Nickel-polypropylene Interfaces P. MARCUS, A. MEYER AND C. HINNEN CONTENTS XPS Study of Passive Films Formed on an Iron—Aluminium Intermetallic Compound in Acid Solution S. FRANGINI, R. GIORGI, J. LASCOVICH AND A. MIGNONE Factor Analysis as a Tool to Deconvoluate Auger Spectra of Tungsten Nitrides and Carbides F. RENIERS, A. HUBIN, H. TERRYN AND J. VEREECKEN Surface Chemical Changes in PVD TiN Layers Induced by Ion Bombardment I. BERTOTI, M. MOHAI, J. L. SULLIVAN AND S. O. SAIED Experimental Influences on the Results of Concentration Depth Profiling by ARXPS H. EBEL, M. F. EBEL, H. FISCHER, B. SCHOBMANN AND R. SVAGERA Thermodynamic Effects on Ion-beam Mixing in SiC-Metal Systems N. LAIDANI, L. CALLIARI, R. KELLY AND A. MIOTELLO Application of Factor Analysis to the Auger Electron Spectroscopy Study of YBa,Cu,O,_, Super- conductors N. ROOSE, M. YE, J. VEREECKEN AND E. W. SEIBT E-Beam SNMS: a Complementary Surface Analysis Technique A. R. BAYLY, J. WOLSTENHOLME AND C. R. PETTS Use of Parallel Imaging XPS to Perform Rapid Analysis of Polymer Surfaces with Spatial Resolution <Spym N. M. FORSYTH AND P. COXON Surface Analysis of Patterned and Selectively Metallized Silicon Surface with Imaging and Static SIMS H. van der WEL, E. van der SLUIS-van der VOORT AND N. P. WILLARD Deposition of Cationic Yttrium on Heterogeneous Surfaces S. J. DAVIS, J. F. WATTS AND L. B. HAZELL Observation of the Action of Penicillin on Bacillus subtilis using the Atomic Force Microscope: Technique for the Preparation of Bacteria S. KASAS, B. FELLAY AND R. CARGNELLO Scanning Force Imaging of Organic Multimolecular Films O. CAVALLERI, D. RICCI AND R. ROLANDI Interaction of Oxygen with ZrN at Room Temperature: an XPS Study P. PRIETO, L. GALAN AND J. M. SANZ Electrochemical, Ellipsometrical and Surface Analytical Investigations of Passive Layers on Binary Fe/Al Alloys D. SCHAEPERS, H-H. STREHBLOW, U. KUNZELMANN AND Y. SCHWARZ Application of Tougaard Background Subtraction to XPS Spectra of Passivated Fe-17 Cr B. S. NORGREN, M. A. J. SOMERS AND J. H. W. de WIT Comparative in situ ToF-SIMS/XPS Study of Polystyrene Modified by Argon, Oxygen, and Nitrogen Plasmas F. M. PETRAT, D. WOLANY, B. C. SCHWEDE, L. WIEDMANN AND A. BENNINGHOVEN XPS/AFM Study of Thermally Evaporated Aluminium/Polycarbonate Interface C. MASSARO, Q. T. LE AND J. J. PPREAUX Use of XAS and Chemical Probe to Study the Structural Damage Induced in Oxide Ceramics by Bombardment with Low-energy Ions A. CABALLERO, D. LEINEN, J. P. ESPINOS, A. FERNANDEZ AND A. R. GONZALEZ-ELIPE Preparation and Characterization of Organic Superlattice Thin Films Grown on Hydrogenated Silicon Single-crystal Substrates A. ISHITANI AND T. NONAKA Study of Passive Film Formation on Cu-Ni 70/30 Alloy in Sea Water at High Temperature A. M. BECCARIA, Y. Z. WANG AND G. POGGI Towards the Ultimate Limits of Depth Resolution in Sputter Profiling: Beam-induced Chemical Changes and the Importance of Sample Quality K. WITTMAACK