Scanning Tunneling Microscopy and Related Methods PDF
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Scanning Tunneling Microscopy and Related Methods NATO AS. Series Advanced Science Institutes Series A Series presenting the results of activities sponsored by the NATO Science Committee, which aims at the dissemination of advanced scientific and technological knowledge, with a view to strengthening links between scientific communities. The Series is published by an international board of publishers in conjunction with the NATO Scientific Affairs Division A Life Sciences Plenum Publishing Corporation B Physics London and New York C Mathematical Kluwer Academic Publishers and Physical Sciences Dordrecht, Boston and London D Behavioural and Social Sciences E Applied Sciences F Computer and Systems Sciences Springer-Verlag G Ecological Sciences Berlin, Heidelberg, New York, London, H Cell Biology Paris and Tokyo Series E: Applied Sciences -Vol. 184 Scanning Tunneling Microscopy and Related Methods edited by R. J. Behm Institut fOr Kristaliographie und Mineralogie, Universitat MOnchen, MOnchen, F.R.G. N. Garcia Department of Physics, Universidad Autonoma de Madrid, Madrid, Spain and H. Rohrer IBM Research Division, Zurich Research Laboratory, Rusch/ikon, Switzer/and Springer-Science+ Business Media, B. V. Proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy Erice, Italy April 17-29, 1989 Library of Congress Cataloging in Publication Data NATO Advanced Study Institute on Basic Concept and Applications of Scanning Tunneling Microscopy (1989 Erice. Italy) Scanning tunneling microscopy and related methods Proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scannlng Tunneling Microscapy. Erice. Italy. April 17-29. 1989 / edited by R.J. Behm. N. Garcia. H. Rohrer. p. em. -- (NATO ASI series. Series E. Applled sciences; no. 184) Includes index. 1. Scanning tunneling microscopy--Ccngresses. 2. Surfaces (Physics)--Congresses. 1. Behm. R. J. II. Garcia. N. (Nicolas) III. Rohrer. Hermann. IV. Series. aC173.4.S94N379 1989 502' .8' 2--dc20 90-40494 ISBN 978-90-481-4075-6 ISBN 978-94-015-7871-4 (eBook) DOI 10.1007/978-94-015-7871-4 Printed on acid-free paper All Rights Reserved © 1990 by Springer Science+Business Media Dordrecht Originally published by Kluwer Academic Publishers in 1990. No part of the material protected by this copyright notice may be reproduced or utilized in any form or by any means, electronic or mechanical, including photo- copying, recording or by any information storage and retrieval system, without written permission from the copyright owner. TABLE OF CONTENTS Preface (H. Rohrer) I. Methods 1) Scanning Tunneling Microscopy - methods and 1 variations (H. Rohrer) II. Theory 2) A brief introduction to tunneling theory 27 (C.R.Leavens and G.C.Aers) 3) Tunneling times for one-dimensional barriers 59 (C.R.Leavens and G.C.Aers) 4) Theory of Scanning Tunneling Microscopy and 77 Spectroscopy (J.Tersoff) 5) Theory of tunneling from transition metal tips 97 (G.Doyen, E.Koetter, J.Barth and D.Drakova) 6) Tip-surface interactions (S.Ciraci) 113 7) On the quantized conductance of small contacts 143 (L.Escapa and N.Garcia) 8) Adiabatic evolution and resonant tunneling 157 through a one-dimensional constriction (E.Tekman and S.Ciraci) 9) What do we mean by 'work function' 163 (R.G.Forbes) III. Applications of STM at Solid State Surfaces 10) Scanning Tunneling Microscopy: Metal surfaces, 173 adsorption and surface reactions (R.J.Behm) 11) Scanning Tunneling Microscopy: Semiconductor 211 surfaces, adsorption and epitaxy (R.M.Feenstra) 12) Spectroscopy using conduction electrons 241 (H. van Kempen) 13) Scanning Tunneling Optical Microscopy (STOM) 269 of silver nanostructures (R.Berndt, A.Baratoff and J.K.Gimzewski) 14) Surface modification with the STM and the AFM 281 (C.F.Quate) IV. Liquid-Solid Interface 15) Scanning Probe Microscopy of liquid-solid 299 interfaces (P.K.Hansma, R.Sonnenfeld, J.Schneir, O.Marti, S.A.C.Gould, C.B.Prater, A.L.Weissenhorn, B.Drake, H.Hansma, G.Slough, W.W.McNairy and R.V.Co1eman) 16) In-situ Scanning Tunneling Microscopy in 315 electrochemistry (H. Siegenthaler and R.Christoph) V. Applications of STH at organic and Biological Materials 17) Imaging and conductivity of biological and 335 organic material (G. Travaglini , M.Amrein, B.Miche1 and H.Gross) 18) Study of the biocompatibility of surgical 349 implant materials at the atomic and molecular level using Scanning Tunneling Microscopy (R.Emch, X.Clivaz, C. Taylor-Denes , P.Vaudaux, D.Lew and P.Descouts) 19) Naked DNA helicity observed by Scanning Tunneling 359 Microscopy (A.Cricenti, S.Selci, A.C.Felici, R.Generosi, E.Gori, W.Djaczenko and G.Chiarotti) 20) Applications of Scanning Tunneling Microscopy 367 to layered materials, organic charge transfer complexes and conductive polymers (S.N.Magonov and H.-J.Cantow) 21) Electron tunneling through a molecule 377 (Ch.Joachim and P.Sautet) 22) Electronic transport in disordered organic 391 chains (R.Garcia and N.Garcia) vii VI. Electron and Ion Point SOurces 23) Electron and ion point sources, properties 399 and applications (H.W.Fink) 24) Field electron emission from atomic-size 409 microtips (J.J.Saenz, N.Garcia, Vu Thien Binh and H.De Raedt) VII. Force Microscopy 25) Force Microscopy 443 (H.Heinzelmann, E.Meyer, H.Rudin and H.J.Glintherodt) 26) Electret-condensor-microphone used as a very 469 sensitive force sensor (E.Schreck, J.Knittel and K.Dransfeld) VIII. Optical and Acoustic Microscopy 27) Resolution and contrast generation in Scanning 475 Near-Field Optical Microscopy (U.C.Fischer) 28) Scanning Tunneling Optical Microscopy 497 (D.Courjon) 29) Scanning Near-Field Acoustic Microscopy 507 (P.Glithner, E.Schreck, K.Dransfeld and U.C.Fischer) Index 515 PREFACE Some eight years ago, in March of 1981, the first successful experiments of vacuum tunneling in an STM configuration were carried out and later topographic images with mono-atomic steps on CalrSn4 were obtained within three months. Four years later, in July of 1985, about fifty STMers, or practically the entire STM community, gathered for the first time at a workshop of the IBM Europe Institute in Oberlech, Austria. The workshop was a cross between a school and a research conference: everybody learned like a student but practically everybody also had an opportunity to lecture. The main interest was focussed on such instrumental questions as vibrations, speed and tip stability, and on surface topographies, some of them with atomic resolution. Within the past four years, the scene has completely changed. At the present NATO Advanced Study Institute fourteen main lecturers taught an audience of about 140 participants of which more than half were graduate students in one of the respective fields. From the variety of topics in this issue it is evident that not only the number of scientists in the field has grown but also their competence as well as the depth and breadth of the field itself. Atomic resolution is obtained routinely in surface science applications, spectroscopy has become indispensable, STMs are operated at cryogenic temperatures and in insulating and electrolytic liquids, and a large family of instruments has been built, and about ten kinds are even commer- cially available. Real space imaging with atomic resolution and in various environments is an attractive microscopy capability, but equally significant is the general acceptance of distance and displacement monitoring and control with subangstrom precision. This cleared the way for a variety of new local probe methods which had not even been thought of in Oberlech or were mentioned if at all as exotic curiosities. Force microscopy has since been invented and has even developed into a field with a wide range of variations. Other techniques such as ballistic electron emission microscopy, thermal profiling, and ion flow microscopy have emerged and show interesting potential. The importance of the single-atom tip as a point source for low-energy electrons and ions goes far beyond its original purpose of a we 11- defined tunneling tip for STM. It again opens a new area of "microscopic" thinking. Finally, the tip as an active tool for surface modifications has begun to receive the attention it deserves. The "Fifth International STM Conference on Scanning Tun- neling Microscopy" in 1990 will also be Nano I, the "First International Conference on Nanometer Science and Technology". Crucial to this exciting progress was the openness which exists in the STM com- munity, as openness is a key for any scientific development. I hope this openness continues. Then, I am sure that four years from now the scene will have pro- gressed as much as it has in the past four-year period. ix x I would like to thank all the lecturers for their conscientious and excellent pre- sentations, the special lecturers for presenting their newest achievements, and the students for their incessant and unwavering attention. On behalf of all participants I express our gratitude to our hosts at the Ettore Majorana Center for their gener- osity, efficient organization and comprehensive assistance and for having accepted such an unusually large number of us in the first place, and also to the NATO Science Committee for financial support. H. Rohrer SCANNING TUNNELING MICROSCOPY - METHODS AND VARIATIONS H. Rohrer IBM Research Division Zurich Research Laboratory CH-8803 ROschlikon Switzerland ABSTRACT. In these two lectures, I give a short introduction to local probe methods, pointing out certain aspects which very often do not receive proper attention, and present some of the interesting methods not represented in the main lectures. The various prob- lems addressed should in no way discourage anybody from solving them, and doing it right. 1. Local Probe Methods There are two major methods to perform experiments on a single microscopically small object or part thereof. In the first method, a lens system connects the micro- scopic object with the world of the macroscopic observer or experimenter. This is the classical microscopy with its variations, such as scanning techniques, where the lateral resolution is limited by the wavelength and/or aberrations of the lens system. For the vertical resolution other criteria apply: in optical techniques, such as contrast microscopy or ellipsometry, angstrom or even subangstrom resolution is attainable, provided homogeneity extends over lateral distances greater than the wavelength. For electron microscopy, depth resolution is usually poorer than the lateral resolution. In the second method, the microscopic part of the object under investigation is addressed by a small probe in close proximity to the object. This is the local probe method, which probes a local property of the object or produces a local, reversible or irreversible modification via some interaction between probe and object. It is a natural and conceptionally the simplest way to perform a local experiment and, together with the scanning capability of the probe, to image a microscopic object. A well-known local probe technique is point contact spectroscopy, but without scan- ning capability [1,2]. Another very old and practical example is the medical doc- tor's stethoscope, which is not really microscopic, but the "experiment" is done on a scale much smaller than the wavelength of the sound emitted by the heart. But it remained for scanning tunneling microscopy to truly pioneer the technique for imaging and making local modifications on a nanometer scale. R. J. Behm et af. (eds.), Scanning Tunneling Microscopy and Related Methods, 1-25. © 1990 Kluwer Academic Publishers.
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