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Optics for Materials Scientists PDF

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OPTICS FOR MATERIALS SCIENTISTS OPTICS FOR MATERIALS SCIENTISTS Myeongkyu Lee, PhD Apple Academic Press Inc. Apple Academic Press Inc. 3333 Mistwell Crescent 1265 Goldenrod Circle NE Oakville, ON L6L 0A2 Palm Bay, Florida 32905 Canada USA © 2020 by Apple Academic Press, Inc. Exclusive worldwide distribution by CRC Press, a member of Taylor & Francis Group No claim to original U.S. Government works International Standard Book Number-13: 978-1-77188-757-1 (Hardcover) International Standard Book Number-13: 978-0-42942-535-6 (eBook) All rights reserved. No part of this work may be reprinted or reproduced or utilized in any form or by any electric, mechanical or other means, now known or hereafter invented, including photocopying and record- ing, or in any information storage or retrieval system, without permission in writing from the publisher or its distributor, except in the case of brief excerpts or quotations for use in reviews or critical articles. This book contains information obtained from authentic and highly regarded sources. Reprinted material is quoted with permission and sources are indicated. Copyright for individual articles remains with the authors as indicated. A wide variety of references are listed. Reasonable efforts have been made to publish reliable data and information, but the authors, editors, and the publisher cannot assume responsibility for the validity of all materials or the consequences of their use. The authors, editors, and the publisher have attempted to trace the copyright holders of all material reproduced in this publication and apologize to copyright holders if permission to publish in this form has not been obtained. If any copyright material has not been acknowl- edged, please write and let us know so we may rectify in any future reprint. Trademark Notice: Registered trademark of products or corporate names are used only for explanation and identification without intent to infringe. Library and Archives Canada Cataloguing in Publication Title: Optics for materials scientists / Myeongkyu Lee, PhD. Names: Lee, Myeongkyu, author. Description: Includes bibliographical references and index. Identifiers: Canadiana (print) 20190088117 | Canadiana (ebook) 20190088125 | ISBN 9781771887571 (hardcover) | ISBN 9780429425356 (ebook) Subjects: LCSH: Optics. | LCSH: Materials science. Classification: LCC QC355.3 .L44 2019 | DDC 535.02/462011—dc23 Library of Congress Cataloging-in-Publication Data Names: Lee, Myeongkyu, author. Title: Optics for materials scientists / Myeongkyu Lee, PhD. Description: Toronto ; New Jersey : Apple Academic Press, 2020. | Includes bibliographical references and index. Identifiers: LCCN 2019014399 (print) | LCCN 2019017540 (ebook) | ISBN 9780429425356 (ebook) | ISBN 9781771887571 (hardcover : alk. paper) Subjects: LCSH: Optics. | Optical materials. Classification: LCC QC355.3 (ebook) | LCC QC355.3 .L44 2020 (print) | DDC 535--dc23 LC record available at https://lccn.loc.gov/2019014399 Apple Academic Press also publishes its books in a variety of electronic formats. Some content that appears in print may not be available in electronic format. For information about Apple Academic Press products, visit our website at www.appleacademicpress.com and the CRC Press website at www.crcpress.com About the Author Myeongkyu Lee, PhD Myeongkyu Lee, PhD, is currently a professor in the Department of Materials Science and Engineering at Yonsei University in Seoul, Korea. Formerly, he was a researcher at the National Institute for Materials Science, Japan, and a Postdoctoral Fellow in the Department of Electrical Engineering, Stanford University, California, where he received his PhD. Dr. Lee’s research inter- ests include dye-sensitized solar cell, non-lithographic thin-film patterning for electronics, transparent electrode, diffractive optics and holography, and laser materials processing. He is a member of several academic societies, including the Materials Research Society (MRS), the European Materials Research Society (E-MRS), and the Optical Society of America (OSA), and he is the former editor of Electronic Materials Letters (2013–2014). Contents About the Author ...............................................................................................v Abbreviations ...................................................................................................ix Preface .............................................................................................................xi 1. Electromagnetic Waves ...................................................................................1 2. Reflection and Refraction .............................................................................45 3. Superposition of Waves ................................................................................83 4. Interference..................................................................................................109 5. Diffraction ....................................................................................................141 6. Light Propagation in Anisotropic Media ..................................................187 7. Polarization ..................................................................................................209 8. Thin-Film Optics and Reflectance Control ...............................................239 9. Interference Lithography ...........................................................................273 10. Metal Plasmonics ........................................................................................307 Index .....................................................................................................................363 Abbreviations 1D one-dimensional AR antireflection BCC body-centered cubic DDA discrete dipole approximation DPI dots per inch EMF electromotive force EMT effective medium theory FCC face-centered cubic FDTD finite-difference time‐domain FEM finite element method FOM figure of merit FTIR frustrated total internal reflection IR infrared ITO indium tin oxide LSPRs localized surface plasmon resonances LSPs localized surface plasmons OPL optical path length PMMA polymethylmethacrylate PS polystyrene PVA polyvinyl alcohol RCWA rigorous coupled-wave analysis SERS surface-enhanced Raman spectroscopy s-Si single-crystalline Si SPP surface plasmon polariton SPR surface plasmon resonance SPs surface plasmons TA transmission axis TE transverse electric TEM transmission electron microscope TIR total internal reflection TM transverse magnetic UV ultraviolet

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