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Springer Series in Materials Science 318 Alain Diebold Tino Hofmann Optical and Electrical Properties of Nanoscale Materials Springer Series in Materials Science Volume 318 SeriesEditors RobertHull,CenterforMaterials,Devices,andIntegratedSystems,Rensselaer PolytechnicInstitute,Troy,NY,USA ChennupatiJagadish,ResearchSchoolofPhysicsandEngineering,Australian NationalUniversity,Canberra,ACT,Australia YoshiyukiKawazoe,CenterforComputationalMaterials,TohokuUniversity, Sendai,Japan JamieKruzic,SchoolofMechanical&ManufacturingEngineering, UNSWSydney,Sydney,NSW,Australia RichardM.Osgood,DepartmentofElectricalEngineering,ColumbiaUniversity, NewYork,USA JürgenParisi,UniversitätOldenburg,Oldenburg,Germany UdoW.Pohl,InstituteofSolidStatePhysics,TechnicalUniversityofBerlin, Berlin,Germany Tae-YeonSeong,DepartmentofMaterialsScience&Engineering, KoreaUniversity,Seoul,Korea(Republicof) Shin-ichiUchida,ElectronicsandManufacturing,NationalInstituteofAdvanced IndustrialScienceandTechnology,Tsukuba,Ibaraki,Japan ZhimingM.Wang,InstituteofFundamentalandFrontierSciences-Electronic, UniversityofElectronicScienceandTechnologyofChina,Chengdu,China TheSpringerSeriesinMaterialsSciencecoversthecompletespectrumofmaterials research and technology, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of allimportantclassesofmaterials. Moreinformationaboutthisseriesathttps://link.springer.com/bookseries/856 · Alain Diebold Tino Hofmann Optical and Electrical Properties of Nanoscale Materials AlainDiebold TinoHofmann SUNYPolytechnicInstitute DepartmentofPhysicsandOpticalScience Albany,NY,USA UniversityofNorthCarolinaatCharlotte Charlotte,NC,USA ISSN0933-033X ISSN2196-2812 (electronic) SpringerSeriesinMaterialsScience ISBN978-3-030-80322-3 ISBN978-3-030-80323-0 (eBook) https://doi.org/10.1007/978-3-030-80323-0 ©SpringerNatureSwitzerlandAG2021 Thisworkissubjecttocopyright.AllrightsarereservedbythePublisher,whetherthewholeorpartof thematerialisconcerned,specificallytherightsoftranslation,reprinting,reuseofillustrations,recitation, broadcasting,reproductiononmicrofilmsorinanyotherphysicalway,andtransmissionorinformation storageandretrieval,electronicadaptation,computersoftware,orbysimilarordissimilarmethodology nowknownorhereafterdeveloped. Theuseofgeneraldescriptivenames,registerednames,trademarks,servicemarks,etc.inthispublication doesnotimply,evenintheabsenceofaspecificstatement,thatsuchnamesareexemptfromtherelevant protectivelawsandregulationsandthereforefreeforgeneraluse. Thepublisher,theauthorsandtheeditorsaresafetoassumethattheadviceandinformationinthisbook arebelievedtobetrueandaccurateatthedateofpublication.Neitherthepublishernortheauthorsor theeditorsgiveawarranty,expressedorimplied,withrespecttothematerialcontainedhereinorforany errorsoromissionsthatmayhavebeenmade.Thepublisherremainsneutralwithregardtojurisdictional claimsinpublishedmapsandinstitutionalaffiliations. ThisSpringerimprintispublishedbytheregisteredcompanySpringerNatureSwitzerlandAG Theregisteredcompanyaddressis:Gewerbestrasse11,6330Cham,Switzerland TomylovingwifeAnnalisa,andour wonderfulandinquisitivechildrenLauraand GregoryandsoninlawAustin. AlainDiebold TomyparentsRosietaandEberhardandmy wonderfulwifeJulianeandour curiouschildrenAnnelieseandOswin. TinoHofmann Preface Thewritingofthisbookisanendeavourofloveforthesubject.Oneofthegoalsof thisbookistoprovidetheellipsometryandopticalphysicscommunityanoverviewof 2Dmaterialsphysics.Onemightsaythatthephysicscommunityworkontopological materials speaks a different language from the materials science community. This bookprovides anintroductiontoboththephysics of2Dmaterialsandtopological physicsaimedatthematerialssciencecommunitywhoseresearchisintheareaof opticalcharacterizationofmaterials. Itisclearfromteachingopticalphysicsatthegraduatelevelthatthereisaneed forprovidingadvancedundergraduateandintroductorygraduatestudentswithatext on optical physics. It is also clear that many students can be described as “math allergic”.Inordertoaddressthatneed,thisbookprovidesadditionaldetailsabout derivations. ACD and TH both gratefully acknowledge the expert and professional artwork of Yangzi Isabel Tian. Isabel endured roughly two years of weekly reviews of the figuresandchapters.Herworkbringsthetexttolife.Manyofthefigureshavebeen adaptedforuseinthisbook. Aswithmostbooks,anumberofpeopleprovidedcriticalassistancethatmadethis bookpossible.WethankZachEvensonwhoisoureditoratSpringer.Hehaspatiently workedthroughthecountlessissuesassociatedwiththeauthorshipandpublication. WealsothankRobertHullofRPIwhoverykindlyputusincontactwithZachmaking the book possible. ACD very gratefully acknowledges many discussions with Ed Seebauer whose guidance greatly influenced not only the text but the philosophy behind it. We note that Paul van der Heide and Brennan Peterson provided many usefulcommentsformostofthechaptersofthebook. We note the following read specific chapters and provided detailed review and commentaryasfollows: Chapter 1. Gerald Jellison very kindly provided detailed edits and suggestions. TonyHeinzfordiscussionsaboutcharacterizingnanoscalethickfilms. Chapter3.StefanSchöcheforhelpwiththeopticalpathofellipsometers. Chapters 4 and 5. Edmund Seebauer very kindly provided detailed edits and suggestions. vii viii Preface Chapter 6. Ji Ung Lee for several critically important comments including the needforthetheorybehindtheintegerquantumHalleffectfora2Delectrongas toexplainthe1partin109uncertainty. Chapter9.Shun-QingShenfordiscussionsaboutThoules,Kohmoto,Nightingale, anddenNijsquantization;ShiyuanLiufordiscussionsaboutZrTe ;AnaAkrap 5 for discussions about ZrTe and Cd As ; and Ken Burch for comments on the 5 2 3 opticalcharacterizationoftetradymites,especiallyBi Se . 2 3 AppendixC.EmilioCobaneraformanydiscussionsabouttopologicalclassifica- tionandthetopologicalperiodictableandEyalCornfeldforguidanceoninter- pretingthetopologicalclassificationandtopologicalperiodictablethatincludes spatialsymmetry. Others have knowingly or unknowingly provided inspiration that also deserves recognition.Overthepastseveraldecades,theellipsometrycommunityhasheldone ofthemostenjoyableandscientificallyusefulconferences:theInternationalConfer- enceonSpectroscopicEllipsometry(ICSE).DiscussionsatICSE8aboutnanoscale materialsprovidedconsiderableinspiration.ICSE8washeldinBarcelonain2019 andwaschairedbyM.IsabelAlonso.OriolArteagaandMiquelGarrigawerethe otherkeyorganizers.ShiyuanLiu’sinvitedtalkanddiscussionsclearlypointedout thechallengesassociatedwithdeterminingtheopticalpropertiesofanisotropictopo- logical materials such as zirconium pentatelluride. ACD acknowledges the great fortuneofbeinginvitedtopresentatICSE5inStockholm,Sweden.Thistripprovided anintroductiontotheellipsometrycommunity.Atthattime,DaveAspnesandJay Jellisonwerekindenoughtodiscussthetopicsthatbecameinspiration.Bothofthem aresoenthusiasticthatonecannothelpbutfollowtheirlead.Iwillneverforgetthe time Dave derived a useful electromagnetic expression at an AVS meeting on the backofanapkinforACD.WealsoacknowledgecountlessdiscussionswithStefan Zollner. The generous guidance of John Woollam and his company are specially mentioned as both inspiration and assistance. James Hilfiker, Tom Tiwald, Gerry Cooney,BlaineJohsandHarlandTompkinshavebeensogenerouswiththeirtime overthepastcountlessyears.WealsoacknowledgethoseatWoollamwhohelpkeep the equipment operational including Mark Brayton. The many scientists at NIST includingDaveSeilerneedspecialacknowledgement. ACD acknowledges the students also provided insight into the challenges of teaching optical physics through their questions and comments. Vimal Kamineni, ManasaMedikonda,RajaMuthinti,FlorenceNelson,LayWaiKong,DhairyaDixit, SamO’Mullane,AveryGreenandMadhulikaKordealltooktheopticalphysicsclass thatevolvedintothistext.VimalKaminenidesignedandbuiltaphotoluminescence system. The experience of mentoring undergraduate student Colin Wadsworth in ellipsometryandscatterometryhasbeenveryuseful.GertLeusink’sgroupatTEL TechnologyCenterAmericadeservesspecialacknowledgementforfundingresearch that included optical characterization of high k dielectrical films such as hafnium zirconiumoxides.HisgroupincludingSteveConsiglio,DinaTriyoso,KandaTapily andRobClarkprovidedthestudentswithmaterialsthatareessentialtothesemicon- ductorindustry.WealsoacknowledgeTomAdamsandAlexReznicekwhoprovided Preface ix nanoscalefilmsofSi1−xGex alloysforopticalcharacterization.Thegrouppostdocs especiallyEricBerchandSonalDeyalsoprovidedthesestudentspracticalexamples oftheapplicationofellipsometryandcriticalmentoring. Theauthorsalsohopethatthebookwillbeusefultothematerialssciencecommu- nitythatusesellipsometry,photoluminescenceandRamanspectroscopy.Thebook is intended to address the need for increased communication between the users of thesemethods,thecommunityofpractitionersandthephysicscommunity. Theauthorsalsorecognizethatmanytopicscannotbecoveredinthisintroductory text especially the mathematical foundations of topological physics. These topics mightbeausefuladditiontoasecondeditionofthisbook. Niskayuna,NY,USA AlainDiebold Charlotte,NC,USA TinoHofmann Acknowledgements YangziIsabelTianforalltheartworkincludingtheadaptationofpublishedfigures. ZachEvensonforeditingandguidingusthroughthepublicationprocess. RobertHullforconnectingustoSpringer. General comments on the book—Paul van der Heide and Brennan Peterson.ReviewofthePreface—HowardHuff. Chapter1.GeraldJellison. Chapters4and5.EdmundSeebauer. Chapter6.JiUngLeeforseveralcriticallyimportantcommentsincludingtheneed forthetheorybehindtheIQHEfora2DEGtoexplainthe1partin109uncertainty. Shun-QingShenfordiscussionsaboutTKNNquantization. Chapter9.AnaAkrap(ZrTe andCd As ),EmilioCobanera(topologicalclas- 5 2 3 sificationandperiodictable),EyalCornfeld(topologicalclassificationandperiodic table),KenBurch(tetradymites). Niskayuna,NY,USA AlainDiebold Charlotte,NC,USA TinoHofmann xi

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