Nuclear Instruments & Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms 1994: Vol B89 Table of Contents

5 Pages·1994·0.84 MB·English

Nuclear Instruments and Methods in Physics Research B 89 (1994) ix—xiii
North-Holland
Contents
Editorial
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Section I. Ion accelerators and ion sources
A new design of a compact high current ion accelerator
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A 250 kV high current ion accelerator for applications in nuclear astrophysics
G. Bogaert, R. Meunier, D. Ledu, C. Angulo, W.H. Schulte, P. Aguer, A. Coc, A. Lefebvre, F.
de Oliveira, J.P. Thibaud, T. Paradellis, E. Kossionides, S. Harissopulos and G. Galios
BECRIS — a 5 GHz ECR source for a CN Van de Graaff
P. Arndt, N. Golovanivski, H. Homeyer and M. Martin
Beam profile and emittance measurements for ion implantation
M. Sarstedt, R. Thomae, H. Klein, A. Maaser, J. Miiller, B. Seiler and M. Weber
TIARA electrostatic accelerators for multiple ion beam application
Y. Saitoh, S. Tajima, 1. Takada, K. Mizuhashi, $. Uno, K. Ohkoshi, Y. Ishii, T. Kamiya, K.
Yotumoto, R. Tanaka and E. Iwamoto
CANDELA photo-injector high-power tests
C. Travier, M. Bernard, P. Dufresne, G. Michaud, M. Omeich, M. Roch and J. Rodier
Conceptual design of a compact photon source in the 1-100 keV range
M. Silari and M. Milazzo
Design and construction of heavy ion RFQ linac with effective acceleration structure
M. Okamura, Y. Oguri, K. Sasa, T. Ito, M. Okada, T. Hattori, O. Takeda, K. Satoh, T. Miura,
Y. Tanabe and N. Tokuda
Effects of 3D image charge force on the motion of off-centered beams in an RFQ
Y. Oguri, G. Wu and T. Hattori
ILU-type electron accelerators for industrial technologies
V.L. Auslender
Design study of an energy-variable RF-accelerator for ion implantation
J. Dehen, H. Deitinghoff, H. Klein, M. Sarstedt, A. Schempp and R. Thomae
Section II. Electron accelerators
CLIO, an infrared free electron laser facility
R. Prazeres, J.M. Berset, R. Chaput, F. Glotin, D.A. Jaroszynski and J.M. Ortega
The Rhodotron, a new high-energy, high-power, CW electron accelerator
Y. Jongen, M. Abs, J.M. Capdevila, D. Defrise, F. Genin and A. Nguyen
Improvement of electron beam shape control in radiation processing
A. Strasser, R. Fang and F. Kuntz
Section III. Synchrotron radiation
Synchrotron radiation stimulated gas desorption from metals
0168-5/984 3/$X07_.0 0 © 1994 - Elsevier Science B.V. All rights reserved
Contents
The synchrotron light source ROSY
D. Einfeld, H. Biittig, S. Dienel, W. Glaser, Th. Goetz, H. Guratzsch, B. Hartmann, D.
Janssen, H. Krug, J. Linnemann, W. Matz, J.B. Murphy, W. Neumann, W. Oehme, M. Picard,
M. Plesko, D. Préhl, R. Schlenk, D. Tomassini and H. Tyrroff
Section [V. Nuclear reaction analysis and charged particle activation analysis
Channeling charged particle activation analysis of light impurities at trace levels in GaAs
Th. Schenkel, H. Hebert, J.D. Meyer, R.W. Michelmann and K. Bethge
Thin layer activation techniques at the U-120 cyclotron of Bucharest
B. Constantinescu, E.A. Ivanov, G. Pascovici, L. Popa-Simil and P.M. Racolta
Remeasurement and compilation of excitation function of proton induced reactions on iron for
activation techniques
S. Takacs, L. Vasvary and F. Tarkanyi
Localization and mobility of oxygen in monocrystalline GaAs by channeling-NRA
H. Hebert, Th. Schenkel, J.D. Meyer, R.W. Michelmann and K. Bethge
Characterization of boron nitride thin films using (a, p) nuclear reactions
G. Giorginis, P. Misaelides and M. Conti
Stoichiometry of NiO,H , films determined by ion-beam analysis
W. Wagner, F. Rauch and K. Bange
Non-destructive analysis of archaeological bronzes by nuclear techniques
M.A. Respaldiza, B.M. Gémez-Tubio, A. Sanchez del Junco, F. Barranco and C. Saiz-Jiménez.
Section V. Backscattering, channeling and recoil analysis
Applications of cyclotron based ion scattering
L.J. van IJzendoorn, J.W. Niemantsverdriet, R.J. Severens, P.W.L. van Dijk and M.J.A.
de Voigt
Computer simulation of ion beam methods in analysis of thin films
G. Vizkelethy
Elastic recoil detection analysis with heavy ions
W. Assmann, H. Huber, Ch. Steinhausen, M. Dobler, H. Gliickler and A. Weidinger
Analysis and characterization of a new magneto-optic display material
Th. Kessler, H. Baumann, J. Reinmann, K. Friedrich, R. Omet and K. Bethge
Nuclear microbeam analysis of wear particles in tissue surrounding failed hip joint implants
G.W. Grime, J.T. Triffitt, M.C. Williamson and N.A. Athanasou
Analysis of boron-doped amorphous silicon by means of a heavy-ion time-of-flight ERD spectrom-
eter
E. Arai, A. Zounek, N. Sekino and K. Saito
The role of stress in deuterium ingress into thin foils of Zr and Zr—2.5wt%Nb
J.S. Forster, R.L. Tapping, T. Laursen and J.R. Leslie
High resolution techniques using scanning proton microprobe (SPM)
M. Cholewa, A. Saint, S. Prawer, J.S. Laird, G.J.F. Legge, R.A. Bardos, G.F. Moorhead, G.N.
Taylor, S.-A. Stuart and J. Howard
Investigation of silicon width (p, p’) resonance scattering in (110) channeling direction
F. Ditréi, J.D. Meyer, R. Michelmann, D. Kislat and K. Bethge
Comparison of MeV-implanted GaAs and InP
T. Bachmann, S. Schippel, E. Wendler, W. Wesch, U. Richter and W. Witthuhn
Thin layer analysis with heavy ion RBS
M. Dobeli, A. Lombao, D. Vetterli and M. Suter
Channeling and TEM investigation of nanosized thallium inclusions in aluminium
A. Johansen, E. Johnson, H.H. Andersen, L. Sarholt-Kristensen and M. Olsen
Diffusion parameters at the Pt—Co interface
D. Raiser, I. Rossini and J.C. Sens
Investigation of the electronic energy loss of light ions for materials analysis
J.D. Meyer, R.W. Michelmann, F. Ditréi and K. Bethge
High depth resolution ERDA of H and D by means of an electrostatic spectrometer
O. Kruse and H.D. Carstanjen
Section VI. Particle induced X-ray emission
PIXE study of the kinetics of biomaterials ossification
G. Weber, G. Robaye, F. Braye, H. Oudadesse and J.L. Irigaray
RBS-PIXE analysis on ym scale on thin film high-T, superconductors
J.A. van Kan, J.H. Rector, B. Dam and R.D. Vis
Proton microprobe and X-ray fluorescence investigations of nickel distribution in serpentine flora
from South Africa
J. Mesjasz-Przybylowicz, K. Balkwill, W.J. Przybytowicz and H.J. Annegarn
Trace elements in platinum group minerals studied using nuclear microscopy
H. Tamana, A. Criddle, G. Grime, D. Vaughan and J. Spratt
Data acquisition and scan control system for nuclear microprobe and other multiparameter
experiments
M. Bogovac, I. Bogdanovi¢, S. Fazini¢é, M. JakSi¢é, L. Kukec and W. Wilhelm
A PC-based data acquisition package for nuclear microbeam systems
G.W. Grime and M. Dawson
PIXE microprobe for geoscience applications
J. Meijer, A. Stephan, J. Adamczewski, H.H. Bukow, C. Rolfs, T. Pickart, F. Bruhn and J.
Reference materials for PIXE analysis of aerosols
O. Valkovié, D. Ceccato, G. Moschini, $. Galassini and E. Menapace
A high resolution crystal diffraction spectrometer for X-ray analysis
U. Lehnert, K. Merla and G. Zschornack
Section VII. Accelmeasrs aspetctroomretr y
Impurity determination in electronic materials by accelerator mass spectrometry
F.D. McDaniel, J.M. Anthony, J.F. Kirchhoff, D.K. Marble, Y.D. Kim, S.N. Renfrow, E.C.
Grannan, E.R. Reznik, G. Vizkelethy and S. Matteson
Hydride ambiguities in the accelerator mass spectrometry (AMS) of heavy elements
M.A. Garwan, M.-J. Nadeau, X.-L. Zhao and A.E. Litherland
Accelerator mass spectrometry analysis of aroma compound absorption in plastic packaging
materials
K. Stenstrém, B. Erlandsson, R. Hellborg, A. Wiebert, G. Skog and T. Nielsen
The charge state distributions of carbon beams measured at the Lund Pelletron accelerator
A. Wiebert, B. Erlandsson, R. Hellborg, K. Stenstrém and G. Skog
Isobar separation with gas ionization counters in accelerator mass spectrometry
U. Zoppi, M. Suter and H.-A. Synal
Isobar discrimination in accelerator mass spectrometry by detecting characteristic projectile
X-ra
MIM. Wagner, H.-A. Synal and M. Suter
Section VIII. lon beam modification
Ion implanted waveguide lasers in insulators
Contents
Ion beam mixing in metal /metal and nitride / metal layers — new perspectives
K.-P. Lieb, W. Bolse and M. Uhrmacher
High-energy ion implantation for electrical isolation of microelectronic devices
M.C. Ridgway, S.L. Ellingboe, R.G. Elliman and J.S. Williams
Ion beam techniques in microelectronics
B.J. Sealy and P.L.F. Hemment
Tailored defects in HTSC — What can we learn from swift heavy ion irradiation?
M. Kraus, G. Kreiselmeyer, J. Daniel, M. Leghissa, G. Saemann-Ischenko, B. Holzapfel, P.
Kummeth, R. Scholz and L. Ya. Vinnikov
MeV ion processing applications for industry
Computer simulation of ion-beam assisted film growth
W. Moller
Spike effects in the ion mixing of metallic marker system
F. Shi, W. Bolse and K.P. Lieb
Experimental study and modeling of structure formation in buried layers at ion beam synthesis
S. Reiss, R. Weber, K.-H. Heinig and W. Skorupa
Adaptation of the 70 kV INP ion implanter to the IBAD technique
B. Rajchel, M. Drwiega, E. Lipifiska and M. Wierba
'HCSN, ay)!?2C nuclear resonance broadening measurements of hydrogen incorporation during
plasma etching of GaAs and Ga, In,,_,,As quantum wells
L. Persson, H.J. Whitlow, J. Keinonen, P. Torri, 1. Maximov, L. Samuelsson, J. Knox and K.G.
Malmavist
Electrical effects of residual defects in Si after high energy implantation of Ge* ions and
annealing
R. Kégler, J. von Borany, D. Panknin and W. Skorupa
A heavy ion implanting facility at the Chiang Mai University
D. Suwannakachorn, D. Boonyawan, J.P. Green, S$. Aumkaew, C. Thongleurm, P. Vichaisiri-
mongkol and T. Vilaithong
A new approach to ion beam modification of powders
H.R. Miiller, W. Ensinger, G. Frech and G.K. Wolf
Investigations of ultrathin silicon nitride layers produced by low-energy ion implantation and
EB-RTA
A. Markwitz, H. Baumann, W. Grill, A. Knop, E.F. Krimmel and K. Bethge
Effect of noble gas ions on the synthesis of c-BN by ion beam assisted deposition
D. Bouchier, G. Sené, M.A. Djouadi and P. Miller
Waveguiding structures in polymers by ion implantation
S. Brunner, D.M. Riick, W.F.X. Frank, F. Linke, A. Schésser and U. Behringer
Gettering of hydrogen in titanium caused by nitrogen implantation
K. Neu, H. Baumann, N. Angert, D. Riick and K. Bethge
lon-beam induced modifications of Sb-Al bilayers
F. Shi, W. Bolse, K.P. Lieb and J.-P. Wilbrandt
Section IX. Miscellaneous techniques
Accelerator based techniques for contraband detection
G. Vourvopoulos
Low temperature bolometer detectors in ion beam analysis
A. Broniatowski
Contents
Neutron focusing using capillary optics
H. Chen, D.F.R. Mildner, R.G. Downing, R.E. Benenson, Q.F. Xiao and V.A. Sharov
Application of accelerator in research of condensed lasants for nuclear pumped lasers
E.A. Seregina, P.P. D’yachenko and V.V. Kalinin
Transition radiation very soft X-ray source
K. Umiastowski and A. Nguyen
A superconducting solenoid as probe forming lens for microprobe applications
A. Stephan, J. Meijer, M. Héfert, H.H. Bukow and C. Rolfs
Secondary electron emission factors from metals bombarded with highly-charged, laser-produced
tantalum ions
Y. Amdidouche, M. Bourgeois, J.L. Collier and T.R. Sherwood
Stationary DIANE Equipment Description and performance of the thermal neutron source
S. Cluzeau and P. Le Tourneur
DIANE stationary neutron radiography system image quality and industrial applications
S. Cluzeau, J. Huet and P. Le Tourneur
Model of the contamination effect in ion-induced electron emission
A.M. Arrale, Z.Y. Zhao, J.F. Kirchhoff, D.K. Marble, D.L. Weathers, F.D. McDaniel and S.
Matteson
Conference Summary
Applied research and technology with accelerators - State of the art, 1993
J.L. Debrun, K. Bethge and J.L. Duggan
Author index