multispectral image processing and pattern recognition techniques for quality inspection of apple

132 Pages·2006·14.57 MB·English

MULTISPECTRAL IMAGE PROCESSING AND PATTERN
RECOGNITION TECHNIQUES FOR QUALITY INSPECTION OF
APPLE FRUITS
Devrim Unay
Members of the jury:
Prof. M. REMY (FPMs), President Prof. J. TRECAT (FPMs)
Prof. M.-F. DESTAIN (FUSAGx) Prof. J. HANCQ (FPMs), Co-supervisor
Dr. O. DEBEIR (ULB) Prof. B. GOSSELIN (FPMs), Supervisor
Dr. C. LEGER (Polytech’Orl´eans) Prof. P. LYBAERT (FPMs), Doyen
Dissertation submitted to the Facult´e Polytechnique de Mons
for the degree of Doctor of Philosophy in applied sciences

(cid:176)c Presses universitaires de Louvain, 2006
Registration of copyright: D/2006/9964/31
ISBN-10: 2-87463-041-1
ISBN-13: 978-2-87463-041-1
Printed in Belgium
All rights reserved. No part of this publication may be reproduced,
adapted or translated, in any form or by any means, in any country,
without the prior permission of Presses universitaires de Louvain.
Distribution: wwww.i6doc.com, online university publishers
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