Journal of Electron Spectroscopy and Related Phenomena 1991: Vol 57 Index

5 Pages·1991·0.72 MB·English

Journal of Electron Spectroscopy and Related Phenomena, 57 (1991) 409
Elsevier Science Publishers B.V., Amsterdam
AUTHOR INDEX
Adnot, A. 47 Leroy,D.B. 103
Aebi, P. 165 Luo, B.P. 285
Atrei,A. 99
Margaritondo,G. 199
Bajuk,L. 317 Marsi, M. 199
Baran, E.J. 189 Mok,C.Y. 213
Bardi, U. 99 Morgner, H. 61
Barry, A.O. 47
Baschenko, O.A. 33,297 Nesmeev,A.E. 33
Beamson,G. 79 Nyulaszi,L. 373
Briggs,D. 79
Brion, C.E. 117 Oakley, R.T. 165
Oberbrodhage, J. 61
Ogenko, V.M. 279
Castellani, N.J. 103
Cauletti,C. Rl
Chasse, Th. 1 Piancastelli, M.N. 199
Chen, X. 331 Puchberger,C. 357
Chin, W.S. 213 Puckrin, E. 207
Clark, D.T. 79
Raiser,D. 91
Cockett, M.C.R. 373
Richter, K. 61
Riedl, B. 47
Deville, J.P. 91
Roth, K. 61
De Simone,M. Rl
Rovida,G. 99
De Witte, R.S. 165
Rozenbaum, V.M. 279
Dyke,J.M. 373
Ruhl, E. 137
Ebel,H . 15, 357
Saldin,D.K. 331
Ebel, M.F. 15, 357
Schmelz,H. 307
Slavin, A.J. 207
Fadley,C.S. 223
Stranges,S. Rl
Fellenberg, R. 1
Streubel, P. 1
Ferrer, E.G. 189
Svagera,R. 15, 357
Foote, M.C. 317
Szargan,R. 1
Franke,R. 1
Sze,K.H. 117
French,C.L. 165
Friedman, D.J. 223
Tonner, B.P. 331
Han, Z.-L. 331 Van Esbroeck, J.M. 165
Harp,G.R. 331 Varga,P. 15
Hitchcock, A.P. 137,165 Vasquez, R.P. 317
Huang,H.H. 213 Veszpremi, T. 373
Hunt,B.D. 317
Wen, A.T. 137
Kaduwela, A.P. 223 Westwood, N.P.C. 165
Kaliaguine, S.C. 47 Winklmayr, E. 15
Kendrick, J. 79 Wright, T.G. 373
Knozinger,H. 307
Zanoni,R. 199
Lange, F. 307 Zeitler,E. 285

Journal of Electron Spectroscopy and Related Phenomena, 57 (1991) 411-412
Elsevier Science Publishers B.V., Amsterdam
SUBJECT INDEX
Arsenic oxides chemithermomechanical pulp grafted with
An X-ray photoelectron spectroscopy polyacrylonitrile 47
study of oxides of arsenic supported on Concentration profiles
TiO, 307 A comparison of two XPS methods for
Attenuation lengths quantification of concentration
On the energy dependence of attenuation profiles 15
lengths in hydrocarbon contam- Photoelectron mean free path chemical
inations 357 composition dependence and elastic scat-
tering and analyzer acceptance angle fi-
n°-C;H;Co(CO). niteness effects in restoring concentration
Inner-shell excitation of y°-C;H;Co(CO)? profiles from angular resolved X-ray
and related compounds studied by gas photoelectron spectroscopy data 297
Core hole screening
phase electron energy loss
Core hole screening in oxides and screen-
spectroscopy 137
CeH,S.N> ing variations due to oxidation of
elements 103
A valence- and inner-shell electronic and
Cyclopropane
photoelectron spectroscopic study of the
Inner-shell and valence-shell electronic
frontier orbitals of 2,1,3-benzothiadiazole,
excitation of cyclopropane and ethylene
C,H,SNo, 1,3,2,4-benzodithiadiazine,
oxide by high resolution electron energy
C,H,S.N., and 1,3,5,2,4-benzotrithiadi-
loss spectroscopy 117
azepine, C,H,S,N. 165
CeH,S,N>
A valence- and inner-shell electronic and Depth-profiling
photoelectron spectroscopic study of the The effect of elastic photoelectron scatter-
frontier orbitals of 2,1,3-benzothiadiazole, ing on depth-profiling by angular resolved
C,H,SNo, 1,3,2,4-benzodithiadiazine, X-ray photoelectron spectroscopy 33
C,H,S.N., and 1,3,5,2,4-benzotrithiadi- Dipole glass
azepine,C,H,S,N. 165 Vibrational spectra of surface hydroxyl
C,H,SN> groups in various phases including dipole
A valence- and inner-shell electronic and glass 279
photoelectron spectroscopic study of the
fronier orbitals of 2,1,3-benzothiadiazole,
Escape probability
C,H,SNo, 1,3,2,4-benzodithiadiazine,
The geometric factor in the angle-inte-
C.H,S.No, and 1,3,5,2,4-benzotrithiadi-
grated escape probability in electron
azepine, Cg,H,S,N. 165
spectroscopy 207
Chemical state information
Ethylene oxide
Chemical state information from photo-
Inner-shell and valence-shell electronic
electron and Auger electron lines—inves-
excitation of cyclopropane and ethylene
tigation of potential and relaxation effects
oxide by high resolution electron energy
of solid silicon and _ phosphorus
loss spectroscopy 117
compounds 1
Chemiionization reactions
A study of some gas-phase lanthanide plus Ferrocene
oxidant chemiionization reactions with Organometallic adsorption on semicon-
chemielectron spectroscopy 373 ductors: a synchrotron radiation pho-
Chemithermomechanical pulp toemission study of ferrocene and nicke-
X-ray photoelectron spectroscopy of loceneo n Si (111)2x1 199
412
Gadolinium compounds tigation of potential and relaxation effects
Study of XPS photoemission of some gad- of solid silicon and _ phosphorus
olinium compounds 91 compounds 1
Gas-liquid phase transition shift Photoemission holography
The gas-liquid phase transition shift at The effects of various experimental pa-
surfaces: experimental method and rameters on the accuracy of photoemis-
interpretation 61 sion holography 331
Polyacrylonitrile
Hydrocarbon contaminations X-ray photoelectron spectroscopy of
On the energy dependence of attenuation chemithermomechanical pulp grafted with
lengths in hydrocarbon — contam- polyacrylonitrile 47
inations 357
Hydrocarbon polymers Semiconductors
Observation of vibrational asymmetry in Organometallic adsorption on semiconduc-
the high resolution monochromatized XPS tors: a synchrotron radiation photoemis-
of hydrocarbon polymers 79 sion study of ferrocene and nickelocene on
Si (111) 2x1 199
M-shell cross-sections
M-shell cross-sections for fast electron Silicon
inelastic collisions based on photoabsorp- Chemical state information from photo-
tiondata 285 electron and Auger electron lines—inves-
Multiple scattering approach tigation of potential and relaxation effects
Application of a novel multiple scattering of solid silicon and _ phosphorus
approach to photoelectron diffraction and compounds 1
Auger electron diffraction 223 SnCl,
Electronic structure of SnCl, by Hel and
Ni,Al alloy Hell gas-phase photoelectron spectros-
Low pressure oxidation of the Ni,Al alloy:
copy and_ pseudo-potential calcu-
a structural study by surface extended en-
lations Rl
ergy loss fine structure 99
Surface hydroxyl groups
Nickelocene
Vibrational spectra of surface hydroxyl
Organometallic adsorption on semicon-
groups in various phases including dipole
ductors: a synchrotron radiation pho-
glass 279
toemission study of ferrocene and nicke-
locene on Si (111) 2x1 199
TiO,
Nitroalkanes
An X-ray photoelectron spectroscopy
He(I) and He(II) photoelectron spectra
study of oxides of arsenic supported on
of simple nitroalkanes 213
TiO, 307
Oxides
Core hole screening in oxides and screen- Vanadyl (IV ) tetraphenylporphyrin
ing variations due to oxidation of Electronic and photoelectron spectra of
elements 103 vanadyl(IV) tetraphenylporphyrin 189
Phosphorus
YBa,.Cu,0;_;
Chemical state information from photo- Valence bond and Ba core level study of
electron and Auger electron lines—inves- chemically-etched YBa,Cu,0,.; 317