IS 7405-1: printed wiring boards, Part 1: General requirements and methods of test

37 Pages·1994·3.5 MB·English

by  Bureau of Indian Standards

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timely dissemination of this information in an accurate manner to the public.
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“The Right to Information, The Right to Live” “Step Out From the Old to the New”
IS 7405-1 (1994): printed wiring boards, Part 1: General
requirements and methods of test [LITD 5: Semiconductor and
Other Electronic Components and Devices]
“!ान $ एक न’ भारत का +नम-ण”
Satyanarayan Gangaram Pitroda
““IInnvveenntt aa NNeeww IInnddiiaa UUssiinngg KKnnoowwlleeddggee””
“!ान एक ऐसा खजाना > जो कभी च0राया नहB जा सकता हहहहै””ै”
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“Knowledge is such a treasure which cannot be stolen”

IS 7405 -( Part 1) : 1994

Indian Standard
SPECIFICATIONF OR PRINTED
WFRINGBOARDS
PART 1 GENERAL REQUIREMENTS AND METHODS OF TEST
Second Revision )
/
tsriF tnirpeR REBMETPES 1995
UDC 62 l-3-049*75

d BIS 1994
BUREAU OF INDIAN STANDARDS
MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG ,
NEW DELHT 110002
Price Group 11
August 1994
detnirP stiucriC lanoitceS ,eettimmoC DTL 17
FOREWORD
sihT naidnI dradnatS ( traP 1 ) was detpoda yb eht uaeruB fo naidnI- StandaIds, retfa eht tfard dezilanif
yb eht detnirP stiucriC lanoitceS eettimmoC had neeb devorppa yb eht scinortcelE and -inummoceleT
noitac noisiviD tnuoC .li
sihT standard was tsrif dehsilbup ni 1973 and desiver ni 1983. ehT dnoces noisiver is gnieb desiver ot
etadpu ti htiw tsetal stnempoleved ni eht dleif fo erutcafunam and esu fo detnirp .stiucric
elihW gniraperp this tfard naidnI ,dradnatS assistance has neeb devired morf eht gniwollof CEI /buP
:tnemucoD/tnemelppuS/tnemdnemA
dnoceS tnemelppus ot CEI buP 2-623 ( 1976 ) - detnirP sdraob : traP 2 tseT sdohtem
tnemdnemA .oN 2 ( 1988 ) - tnemdnemA .oN 2 ( Jan 1988 ) ot buP 2-623 ( 1976 )
CEI toD 52 ( C. 0. ) 309 - tfarD tnemdnemA ot buP 326 : detnirP sdraob : traP 2 tseT sdohtem :
tseT 15b : noitcesorciM
CEI toD 52 ( C. 0. ) -103 tfarD tnemdnemA ot buP 326 : detnirP sdraob : traP 2 tseT sdohtem :
tseT 4a : trohS stiucric
CEI toD 52 ( ttceS ) 294 - snoitiddA ot buP 2-623 : detnirP sdraob : traP 2 tseT sdohtem : tseT 22
cinoI ecafrus noitanimatnoc tset
issued yb eht lanoitanretnI lacinhcetortcelE .noissimmoC
roF eht esoprup fo gnidiced rehtehw a ralucitrap tnemeriuqer fo this standard is deilpmoc ,htiw eht
lanif ,eulav devresbo ro ,detaluclac gnisserpxe eht tluser fo a ,tset shall eb dednuor ffo ni ecnadrocca
htiw SI 2 : 1960 seluR‘ rof gnidnuor ffo laciremun seulav ( .‘)desiver ehT rebmun fo tnacifingis secalp
. deniater ni eht dednuor ffo eulav dluohs eb eht emas as that fo eht deificeps eulav ni this standard.
SI
7405 ( h-t 1) : 1994
Indian Standard
SPECIHCATIONFORPRINTED
WlRINGBOAR.DS
PART 1 GENERAL REQUIREMENTS AND METHODS OF TEST
(
Second Revision )
1 EPOCS osla 7 rebmun of sdraob etched ot the dradnats nrettap
1.1 sihT dradnats (Part 1) seificeps lareneg -criuqer processed gnola htiw the lamron .noitcudorp
stnem dna sdohtem of test for detnirp gniriw sdraob ehT tests llahs eb deirrac tuo ylbareferp no noitcudorp
evitcepserri of rieht dohtem of ,erutcafunaln uehw yeht sdraob tub fi ,deriuqer test snopuoit etched htiw WOC
are ydaer for gnitnuom of .stnenopmoc etisop test nrettap yun eb ehT etisopinoc test
used.
2 Y;(OLONIMRET nrettap llahs eb deificeps ni the liated .snoitacificeps
2.1 roF the esoprup of siht ,dradnats the moitinifed of 6.2 ecnatpeccA stseT
smret as ucvig ni 1s 1885 ( Part 6 ) : 1978 -hcetortcelE‘ sselnU esiwrehto deificeps the ecnatpecca tests llahs eb
lacin yralubacov : Part 6 detnirP ’stiucric llahs .ylppa deirrac tuo no a detimil rebmun of selpmas detceles ni
3 SLAIRETAM ecnadrocca htiw the gnilpmas erudecorp of SI :37601
1983 gnilpmaS‘ snalp dna serudecorp for noitcepsni yb
3.1 ehT detnirp gniriw sdraob llahs eb derutcafunam
setubirtta for cinortcele ’smeti dna hcihw evah passed
morf elbatius slairetam hcihw llahs mrofnoc ot tnaveler
the enituor tests.
naidnI .sdradnatS
4 YROGETA:< 6.3 Routine Tests
All the detnirp gniriw sdraob llahs eb detcejbus ot
4.1 ehT detnirp guiriw sdraob yam eb desirogetac yb
lareneg .noitanimaxe lanoitiddA tests yam eb agreed
the latuclnuorivnc seitireves that yeht nac .dnatshtiw
nopu yb the resahcrup dna the reilppus dna yam eb
esehT seirogetac llahs xl deificepps ni the liated
deirrac tuo ni the ecneserp of the .resahcrup
.snoitacificeps
7 (:ONDITIONS FOR TESTS
5 ;(NIKCI4,M
7.1 Standard Atmospheric Conditions for Testing
5.1 Each drao)I llahs cb ylbigel dna ylbiledni dekram
sselnU esiwrehto ,deificeps lla 5.lset llahs eb deirrac tuo
htiw the date dna s’rerutcafunam code. ehT gnikraut
rednu dradnats cirehpsomta ,snoitidnoc as deificeps
llahs eb decudorp rehtie yb the emas process desu ni
ni SI 9000 (Part 1) : 1977 cisaB‘ latnemnorivne gnitset
gnicudorp the rotcudnoc nrettap or yb the esu of a
serudecorp for cinortcele dna lacirtcele :smeti Part 1
tnenamrep tneirtun-non kni or tniap evitcudnoc -kram
.’lareneG
sgni llahs eb ton resolc ot the nrettap naht the gnicaps
stnemeriuqer deifickps for .rotcudnoc llA gnikram llahs tneibmaehT erutarepmet dna the evitaler ytidimuh at hcihw
eb elbitapmoc htiw slairetam dna parts, elbigel after lla the stnemerusaem are edam llahs eb stated ni the report.
tests dna llahs ni on case effect draob .ecnannofreif nI case of etupsid neewteb the resahcrup dna the rodnev
51.1 gnikraM guitacidni the urettnp noitangised llahs tuoba test ,stluser the tests llahs eb deirrac tuo at eno
eb as agreed ot neewteb the resahcrup dna the of the ‘referee ’snoitidnoc of SI 9000 (Part 1) : 1977
rerutcafunam or the .reilppus cisaB‘ latnemnorivne gnitset serudecorp for cinortcele
dna lacirtcele :meti tr?P 1 .’lareneG
5.2 SISI noitacdit-&( gnikraM
ehT tcudorp ylilll dekram htiw the dradnatS Mark. 7.2 Test Specimen
~ISCI be
fI elbissop dna sselnu esiwrehto ,deificeps the test llahs
5.2.1 ehT CSU of the dradnatS Mark si denrevog yb the
snoisivorp of uaeruB of naidnI sdradnatS ,tcA 1986 dna eb deirrac tuo no noitcudorp .draob tseT sn?(puoc yam
eb yrassecen or elbarised for uiatrec .stsqt tseT snopuoc
the seluR dna snoitalugeR edam .rednuereht ehT sliated
yam eb dCdulcni uo the lenap htiw the noitcudorp
of snoitidnoc rednu hcihw the ecnecil for the esu of
sdraob or yam eb decudorp as separate etisopmicc test
dradnatS Mark yam eb detnarg ot srerlhcafuiiani or
mopuoc ni noitcnujnoc htiw the noitcudorp sdraob htiw
srecudorp yam eb deniatbo morf the uaeruB of naidnI
the etuas slairetam dna processes so as ot eb -erper
.sdradnatS
evitatnes of the uoitcudorp .sdraob fI separate -lnoc
6 NOITA:(IFISSALC FO STSET
etisop test mopuac are ,derulcafunam yeht llahs eb
6.1 epyT stseT spaced tuo ylneve ni noitcudorp ni hcus a ytitnauq
ehT crudccorp for epyt lavorppa llahs eb ni -drocca that a good egareva tnemssessa nac eb .edam
ecna htiw SI 10673 : 1983 gnilpmaS‘ snalp dna -ecorp
8 LIST OF TESTS
serud for noitcepslti yb setubirtta for cinortcele .’smeti
sselnU esiwrehto ,deificeps the rerutcafunam llahs 8.1 llA the tests nevig ni siht dradnats are detaremune
ylppus 7 detnirp gniriw of each yrogetac dna ni elbaT 1 htiw esualc .secnerefer
boards
1
:
IS 7405 f Part 1 ) 1994
Table 1 List of Tests
( C/mLse X.1 )
._.
Test IGo. Test Clause No.
C;enerul I<xumination 9
I Vkual examination 1.9
la X3 Magnitication method 9.1.1
Ill XI0 Magnification method 9.1.2
cI X250 Magnitication method 9.1.3
2 Dimensional examination 9.2
2a Optical method 9.2.2
Electrical Tests 10
3 Resistance 10.1
3a Resistance of conductors 10.1.1
31, Resistance of interconnections 10.1.2
3(. <‘Irange in resistance of plated-thrclugh holes, thermal cycling 10.1.3
4 Electrical integrity 10.2
4;1 Gcuit isolation 10.2.1
41, Circuit continuity 10.2.2
5 Current proof 10.3.
sa Current proof, plated through holes 10.3.1
Sb Current proof, conductors 10.3.2
6 Insulation resistance 10.4
ha lnsulation resistance, surface layers 10.4.1
611 Insulation resistance, internal layers 10.4.2
6c lnsulalion resistance, between layers 10.4.3
7 Voltage proof 10.5
la Voltage proof, surface layers 10.5.1
?I, V~~ltagc proof, between layers 10.5.2
s f’rcquency drift 10.6
9 C’irzuit impedance 10.7
Mechanical Tests II
Peel strength I I.1
t’eel strength, standard atmospheric conditions 1t.1.1
Peel strength, elevated temperature 11.1.2

Peel stre ngth, tlexible primed hoard 11.1.3

Pull-oKstreng th 11.2
I’ull-off strength, lands with plain holes 11.2.1
Pull-out strength, landless plated through holes 11.2.2
l:latness II.3
Flexural fatigue (tlcxihle printed IxUKk) 11.4
Miscclluneous Tests 12
Plating finishes 12.1
Adhesion of plating, tape method 12.1.1
Adhesion of plating, burnish method 12.1.2
Porosity, gas exposure 12.1.3
Porosity, electrographic test, gold on copper 12.1.4
Porosity, electrographic test, gold on nickel 12.1.5
‘l‘hickness of plating 12.1.6
SolderalGlity 12.2
I)eli~mini~tion, thermi shock 12.3
Micn~.section 12.4
I~l;llnnl;ll)ility, rigid printed hoards, metal removed 12.5
C;\\,w-virv \e~t, printed (Hlatd> 12.5.2
Necdlc-ll;tmc ~cst, rigid printed hcards 125.3
2
SI 7405 ( t-raP 1) : 1994
elbaT 1( concluded )
Test No. Test Clause No.
17a tnevloS dna xulf ecnatsiser 12.6
22 cinoI ecafrus noitanimatnoc tset 12.7
23 gnissagtuO tset fo detalp hguorht seloh latnemnorivne gninoitidnoc 12.8
18 gninoitidnocerP 13.1
18a ,gninoitidnocerP dradnats cirehpsomta snoitidnoc 13.1.1
bSI ,gninoitidnocerP 12S’C 13.1.1
19 lamrehT shock 13.2
19a lamrehT ,kcohs ,noisremmi lio htab 13.2.1
19b lamrehT ,kcohs ,noisremmi dezidiulf dna htab 13.2.2
19c lamrehT ,kcohs ,gnitaolf redlos htab 13.2.3
19d lamrehT ,kcohs gniredlos-dnah 13.2.4
19e lamrehT ,kcohs gniredlos-pid 13.2.5
f9l lamrehT ,kcohs ,gnitaolf redlos htab 280°C 13.2.6
2Oa detareleccA gniega ‘13.3
9 LARENEG NOITANIMAXE 10.1.1.1 Object
9.1 tseT 1 : Visual Examinatiou oT enimreted the ecnatsiser of .srotcudnoc
ehT lausiv noitanimaxe checks ,noitacifitnedi -pa 10.1.1.2 Specimen
,ecnaraep ,pihsnamkrow ,hsinif ,nrettap etc, of a detnirp ehT tnemerusaem llahs eb deirrac tuo no deificeps
draob tsniaga the tnaveler noitacificeps yb gniweiv .srotcudnoc esehT srotcudnoc llahs eb as gnol dna
htiw or tuohtiw esu of .noitacifingam worran as .elbissop
9.1.1 Test In: X3 Mngnijicntion Method 10.1.1.3 Method
ehT lausiv noitanimaxe llahs eb deirrac gnisu~tuo -itpo The ecnatsiser llahs eb derusaem gnisu a elbatius
lac tnempiuqe htiw yletamixorppa X3 raenil -gam dohtem no two srotcudnoc at two .secalp ehT -rusaem
noitacifin dna where elbissop dettimsnart .thgil gni llahsrorre ton eb greater naht 5 .tnecrep ehT tnerruc
llahs cb kept llams ,hguone ylbareferp 0.1 ,A ot diova
9.1.2 Test lb : XI0 Magnificution Method
gnitaeh the nemiceps .ylbaicerppa nI case of ,etupsid a
nehW ,deificeps the lausiv llahsnoitanimaxe eb deirrac
laninnet-ruof dohtem llahs eb .desu
tuo gnisu lacitpo tnempiuqe htiw yletamixorppa X 210
raenil noitacitingam dna where elbissop dettimsnart 10.1.1.4 Details to be specified :
.thgil a) srotcudnoc ot eb ,derusaem
9.‘1.3 Test Ic : 250 Magnification Method )b eulav of the ,ecnatsiser dna
nehW ,deificeps the lausiv noitanimaxe llahs eb deirrac tuo c) yna noitaived morf the dradnats test .dohtem
gnisu lacitpo tnempiuqe htiw yletamixorppa X 250 raenil 10.1.2 Test 3b : Resjstance of Interconnections
noitacifingam sihT si yllausu deriuqer for .noitcesorcim 10.1.2.1 Object
9.2 Test 2 : Dimensional Examination oT enimreted the ecnatsiser of snoitcennocretni no a
detnirp .draob
ehT lanoisnemid noitanimaxe si the tnemerusaem of
lautca s.noisLte1nid htiw the dia of gnirusaem sloot dna 10.1.2.2 Specimen
ehT tnemerusaem llahs eb deirrac tuo no deificeps parts
gnirusaem tnempiuqe tsniaga the tnaveler .noitaciticeps
of a noitcudorp ,draob of a test ro,nopuoc of a -isopmoc
9.2.1 ehT gnirusaem sloot dna tnempiuqe llahs evah na
te test .nopuoc
ycarucca aud ytilibadaer elbatius rof eht snoisnemid
10.1.2.3 Method
dna ecnarelot ot eb .derusaem
ehT ecnatsiser llahs eb derusaem htiw a lanimret-ruof
9.2.2 Test 1~2 : Optical Method dohtem of tnelaviuqe dohtem neewteb two deificeps
nehW ,deificeps ralucitrap ,stnemerusaem for ,ecnatsni .seloh ehT gnirusaem tnerruc llahs ton exceed 0.1 .A
no snoisnemid of seloh dna edge defects ni ,srotcudnoc ehT latot gnirusaem error llahs eb ssel naht 5 .tnecrep
llahs eb derusaem htiw na lacitpo tnemurtsni gnivah a owT lacipyt noitcennoc sdohtem are uwohs ni .giF 1 dna 2.
gnirusaem elucitcer dna a ytilibadaer of 0.025 .mm
a) Leads are deredlos otni the deificeps selon -ca
9.2.3 nehW ,deificeps ralucitrap ,stnemerusaem for
gnidroc ot .giF 1.
,eeuat..tri ssscntalt detnirpto ,sdraob llahs cb deirrac tuo
gnisu seguag as deificeps rednu the test dohtem ro/dna )b ehT snoitcennoc are edam guisu two sriap of
the liated .troitacificcps tcatnoc snip gnidrocca ot .giF 2.
10 S’I’S’IT,IA:(UI’1‘:(E.IE ETON - owT fo eht tset seborp sa debircsed ni Tc?t 5a
era elbatiW ees( .giF 4).
10.1 tseT 3 : Resistance
10.1.1 Test _%I : Resistcrrrce of Conductors 10.1.2.4 Details to be specified :
a) seloH dna snoitcetmocretni ot cb .derusaem
3
IS 7405( :)ltraP 1994
_ h) n oitcennoC ,dohtem - 3 lm diea.ciroboroulf 40 tnecrep ytisned( 1.32 ”mc/g at
;)C°02 dna
c) mumixaM eulav of ,ecnatsiser~eht dna
- 670 lm dezinoied .retaw
d) ynA noitaived morf the dradnats test .dohtem
nehW gnisu ,srevomer the yrassecen snoituacerp llahs
eb nekat ot diova yna yrujni ot .htlaeh
EGATLOV 10.1.3.3 dohteM
SPILC
ehT ecnatsiser (or the gnidnopserroc egatlov drop) of
the seloh detcennoc ni seires shaH eb derusaem at a
tnatsnoc gnirusaem tnerruc of 100 + 5 Am gnisu the
lanimret-ruof .dohtem ehT ecnatsiser llahs eb
derotinom ylsuounitnoc gnirud the test. ehT nemiceps
llahs eb detcennoc ot the gnidrocer ,yb’ecived fctr
,elpmaxe a elbatius draob-egde .rotcennoc
ehT lamreht gnilcyc llahs eb deirrac tuo yb gnisu -lof
gniwol two separate diulf shtab :yletanretla
CURRENl
a) nA tneihma erutarepmet ,htab as deificeps ni
SPILC
13.2.1 tseT 19a, tub kept at the erutarepmet of 25
5 ;C’2 ti si laitnesse for tneiciffe gnilooc that the
htab at 25’C dluohs niatnoc a wol ytisocsiv .diulf
)b A hot htab as deificeps ni 13.2.1, tseT 19a kept
CONlACl SNIP FOR
1 TNEMERUSAEM at the erutarepmet of 260 ‘2 ‘C.
ehT nemiceps llahs eb desremmi ni the diulf yllacitrev
ot a depth hcihw sevael the area of ,noitcennoc for
SNIP FOR ,elpmaxe the edge draob ,rotcennoc yletamixorppa 30
TNEMERUSAEM nun evoba the ecafrus of the .diulf oT evorpmi the heat
refsnart gnirud the noisrenuni ni the hot ,diulf the
nemiceps dluohs eb ylthgils devom ni{ a latnoziroh
.i<lF 2 IWM.W:ISA.~IM ;10 RFSIWAN~~EWITCMO NTACT SNIP
noitcerid lellarap ot sti .)ecafrus retfA noisremmi dna
10.1.3 Test .?c : Chnge in Resistance of Plnted -- lawardhtiw morf the C°52 ,htab the diulf gniniamer op the
Thvrcgh Holes, Thermc~l Cycling test lenap llahs eb devomer erofeb the txen .noisremmi
10.1.3.1 Object ehT llahsnemicrps eb desremmi yletanretla ni the C°52
oT enimreted the esaercni ni ecnatsiser of detalp sdnednasnigebgnilcycehT.htabC”O62ehtnidnahtab
hguorht seloh that yam rucco nehw the seloh era -bus htiw ua noisremmi the C°52 .htab ehT nemiceps tsum
in
detcej ot lantreht ,gnilcyc yb gnirotinom the ecnatsiser eb derrefsnart morf the C°062 htab otni the C°52 htab
ylsuounitnoc gnirud the test. tuohtiw emii .yaled
ehT sevigesaercni na .gnitalpehtfoytilauqehtfonoitacidni ehT lalot rebmun of snoisremmi llahs eb as .deificeps
10.1.3.2 Specimen ehT nemiceps llahs niamer ni the C°52 htab litnu a
c!bats gnidaer of the ecnatsiser si .deniatbo ehT
The llahstset eb deirrac anotuo elbatius detnirp draob gnivah ncmicePc llahs niamer ni the 26O*C for a doirep of
a rebmun of hguorht-detalp seloh detcennoc
in series. C°01 2 1 .s fI the scitsiretcarahc of the esab lairetam
ehT tset draob llahs ylbareferp ton eb dael-nit .d.eta1p fI desu eriuqer ,ti ylthgils tnereffid noisremmi semit yam
ti ,si the gnitalp llahs eb yllacimehc devomer roirp ot cb deificeps ni the tnaveler noitacificeps or agreed nopu
guitsct tub erac llahs eb nekat ot diova yna latnemirted neewteb the resahcrup dna the .rodnev
tceffe ot eht .reppoc
ehT ecnatsiser eulav (or the gnidnopserroc egatlov drop)
NOTE - elbatiusA revomer stsisnoc fo : ’si dettolp no a emit elacs tmiaga the rebmun of -remmi
- 330 lm cirtin dica 60 pcrc’cnf (density 1.36 ’,”c/g at .snois &T margaid ,gnitluser fr elpmaxe morf a chart
;J-Yo2 :,~~~rrcordcr, ahas na aspect ralimis ot that nwohs .giF 3.
II in
2;I:M MERSION
$ 1 LAITINI ECNATSISER I-_-
_L____-
REBMUN FO SNOISREMMI EMIT
.GIF 3 :~;(WWC NI ~~(w,TswR -IO ~~;(l!o~tT-u:n~.lP SL.loH~ :XID IX ..AMKJIIIT GNIXWC
SI 7405 ( Par-t 1) : 1994
10.1.3.4 Details to lx, .+ec~$kd : kciuqA noitaulave trobsrof stiucric yam eb edam gnisu
nemicepS ot eb ;detset a elpmis ,rotacidni hcus as na rotacidni pmal or -rusaem
gni tnemurtsni or yb na lacirtcele tiucric gnimrofsnart
rebmuN of 26O’C ;snoisremmi
the tnerruc otni a langis hcihw yam eb detaulave yb na
mulnixgM elbissimrep esaercni ni tnecrep of
citamotua test .tnempiuqe
ecnatsiser neewteb the tsrif dna the tsal 25’C
roF detacitsihpos noitaulave of short ,stiucric the
;noisremmi
tnerruc llahs eb derotinom ahcusni noihsaf as ot elbane
mumixaM eibissinnep esaercnj ni tnecrep of
the eulav cimhofo ecnatsiser gnitsixe etarapesneewteb
ecnatsiser neewteb the tsrif dna the tsal 26O’C
evitcudnoc snrettap ot eb elbanimreted nihtiw a -saem
;noisremmi tnemeru ytniatrecnu ton gnideecxe 100% at the -inim
lnumixaM elbissilmep esaercni ni tnecrep of mum eulav of ecnatsiser nevig~ as the gnitiinil
ecnatsiser gnirud yna eno C°062 ;noisremmi dna tnemeriuqer for tiucric .noitalosi
ynA noitaived morf the dradnats test .dohtem erehT llahs eb on short stiuc’iic neewteb deificeps
.stniop nehW evaluating cificeps ,stnemeriuqer tiucric
10.2 tseT 4 : Electricai integrity noitalosi si demeed ot eb deniatniam nehw the eulav
ytirgetni.la~irtreJE llahs eb dehsilbatse yb two (2) test of ecnatsiser detneserper yb yna tnerruc gniwolf
serudecorp - tseT :a4 tiucriC noitalosi dna LseT :b4 neewteb separate srotcudnoc rednu test si relaerg naht
tiucriC .ytiunitnoc esehT tests yam eb denibmoc ni 1 ,mhogeln or as esiwrehto deificeps ni the s’remotsuc
order ot eb act, dehsilpln eno after the other on the emas liated .noitacificeps
.ne~niceps 10.2.1.4 Details to De speccified :
ehT uoltacllppa of a non~noc eulav of tnerruc as a a) tseT ,egatlov
gnitimil noitidnoc (that ,si as enil-redrob neewteb -ric )b lnuminiM elbawolla ecnatsiser fi other naht
tiuc noitalosi snoitidnoc dna tiucric ytiunitnoc -idnoc
1 ,mhogem
)snoit as llew as the esu of citamotua test tnempiuqe
c) Part(s) of evitcudnoc nrettap ot eb tested,
yalu etatilicaf the .noitanibmoc
d) elbawollA mumixaln ,tnerruc dna
esehT SISCI arc’ ton dednetni ot etutitsbus for lausiv
noitcepsui lScT( e) ynA noitaived morf the dradnats test .dohtem
li\).
10.2. I Tkt h : Circrrit Isoltrtion 10.2.2 Test 4h : Circuit Continuity
10.2.1.1 rccjOO 10.2.2.1 tcejbO
oT yfirev the ecnesba of evitcudnoc noitcennoc -eb oT yfirev the tnemhsilbatse of lacirtcele ytiunitnoc
ncewt deificeps itap of a evitcudnoc nrettap of a detnirp hguorht the deificeps detcennoc stniop of a evitcudnoc
draob that were dednetni ot eb ,detcennocnu ecnadroccani nrettap of a detnirp draob ni ecnadrocca htiw the
htiw the tnaveler noitacificeps (that ,si artwork, remotsuc tnaveler noitacificeps (that ,si artwork, remotsuc -er
,.tnemeriuqer retupmoc dedia data, etc). ,5tnemeriuq retupmoc dedia data, etc).
10.2.1.2 Specimen 10.2.2.2 Specimen
ehT test llahs eb deirrac tuo no deificeps snoitrop of ehT test llahs eb deirrac tuo no deificeps snoitrop of

evitcudnoc snrettap no or ngwteb yna sreyal of the evitcudnoc snrettap no or neewteb yna sreyal of
noitcudorp .sdraob the noitcudorp ,draob
10.2.1.3 Meflrod 10.2.2.3 Method
ehT deificeps stniop of each yletarapes elbissecca -ric The deificeps stniop of the evitcudnoc snrettap llahs
eb detcennoc ot the test tiucric yb yna elbatius
tiuc fo eht evitcudnoc nrettap llahs eb detcennoc ot eht
ISC~ ecruos yb elbatius ,snaem for ,elpmaxe yb test ,snaem for ,elpmaxe yb test seborp gnitcatnoc the
seborp gnitcatnoc the deificeps srotcudnoc or .sdnal deificeps srotcudnoc or .sdnal erehW ,etairporppa -lum
ehT gniniamer ,stiucric ton rednu test, yam eb -noc elpit stnenegnarra of test seborp yam eb .desu erehW
detcen together, detcennoc as spuorg ni ,nrut or tested a detnirp draob sniatnoc edge draob ,stcatnoc yant~yeht
each ni sti .nrut osla eb desu together htiw a elbatius edge socket
.rotcennoc
erehW ,etairporppa elpitluin stnemegnarra of test
seborp yam cb desu (that ,si deb of ,slian + C/ nrettap A deificeps ac or dc egatlov llahs eG deilppa ot each
,eborp etc), where detnirp hoard sniatnoc edge draob yletarapes detcennoc evitcudnoc path ni ,nrut across
yeht yaln :I osla eb desu together htiw yna yllanretxe elbissecca tiucric noitcennoc tniop (for
elbatiursontarts, edge socket .rotcennoc a ,elpmaxe ,dnal edge rotcennoc )tcatnoc dna -laitneuqes
yl ot each other lanretxe gnitcennoc tniop ot hcihw ri
deificepsA or dc lsel egatlov llahs eb deilppa OI parts
;IC si denetni ot eb .detcennoc
of the evitcudnoc nrettap rednu test, so that a tnerruc lliw
woU fi a short tiucric si .tneserp ehT ecruos of the test kciuqA noitaulave for tiucric ytiunitnoc yam eb edam
egatlov llahs eb detaicossa htiw the snaem for monitoring gnisu a clpnhs ,rotacidni hcus as na rotacidni pmal or
dereviled tnerruc dna gnitimil the tnerruc ot a eulav ot eb gnirusaem tnemurtsni or yb na lacirtcele tiucric -snart
nihtiw the tnerruc gniyrrac yticapac of the tiucric rednu gnimrof I eh tnerruc otni a langis hcihw yam eb
test ni order ot diova .gnitaeh-revo detaulave yb na citamotua test .tnemifiuqe
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