IS 13875-2: Digital measuring instruments for measurement, control, Part 2: Terms, tests, data sheet details of instruments for measuring analog quantities PDF
Preview IS 13875-2: Digital measuring instruments for measurement, control, Part 2: Terms, tests, data sheet details of instruments for measuring analog quantities
इंटरनेट मानक Disclosure to Promote the Right To Information Whereas the Parliament of India has set out to provide a practical regime of right to information for citizens to secure access to information under the control of public authorities, in order to promote transparency and accountability in the working of every public authority, and whereas the attached publication of the Bureau of Indian Standards is of particular interest to the public, particularly disadvantaged communities and those engaged in the pursuit of education and knowledge, the attached public safety standard is made available to promote the timely dissemination of this information in an accurate manner to the public. “जान1 का अ+धकार, जी1 का अ+धकार” “प0रा1 को छोड न’ 5 तरफ” Mazdoor Kisan Shakti Sangathan Jawaharlal Nehru “The Right to Information, The Right to Live” “Step Out From the Old to the New” IS 13875-2 (1993): Digital measuring instruments for measurement, control, Part 2: Terms, tests, data sheet details of instruments for measuring analog quantities [LITD 8: Electronic Measuring Instruments, Systems and Accessories] “!ान $ एक न’ भारत का +नम-ण” Satyanarayan Gangaram Pitroda ““IInnvveenntt aa NNeeww IInnddiiaa UUssiinngg KKnnoowwlleeddggee”” “!ान एक ऐसा खजाना > जो कभी च0राया नहB जा सकता हहहहै””ै” Bhartṛhari—Nītiśatakam “Knowledge is such a treasure which cannot be stolen” IS 13875 ( Part 2 ) : 1993 Indian Standard DIGITAL-MIYiiiSUkINGINSTRUMENTSFOR MEASUREMENTANDCONTROL PART 2 TERMS, TEST AND DATA SHEET DETAILS OF -INSTRUMENTS FOR IMEASURING ANALOG QUANTITIES UDC 621*317*7:9 093 7.33: 621.38 0 BIS 1993 BUREAU OF INDIAN STANDARDS MANAK BHAVAN. 9 BAHADUR SHAH ZAFAR MARC NEW DELHI 110002 September 1993 Price Group 3 cinortcelE gnirusaeM tnempiuqE lanoitceS ,eettimmoC DTL 21 FOREWORD sihT naidnI dradnatS was detpoda yb eht uaeruB fo naidnI Standards, retfa eht tfard dezilanif yb eht cinortcelE gnirusaeM tnempiuqE lanoitceS eettimmoC had neeb devorppa yb eht scinortcelE and noitacinummoceleT noisiviD .licnuoC sihT standard is desab tuohtiw yna lacinhcet egnahc no CEI toD 66 ( teS ) 50 tnemerusaeM‘ and ,lortnoc latigid gnirusaem :stnemurtsni traP 2 stnemurtsnI rof gnirusaem golana :seititnauq ,smreT stset and data teehs ’sliated issued yb lanoitanretnI lacinhcetortcelE noissimmoC ( CEI .) nI gnitroper eht stluser fo a tset ro sisylana edam ni ecnadrocca htiw this standard, fi eht lanil ,eulav devresbo ro ,detaluclac is ot eb dednuor ,ffo ti dluohs eb enod ni ecnadrocca htiw SI 2 : 1960 seluR‘ rof gnidnuor ffo laciremun seulav ( revised )‘. . IS 13875 ( Part 2 ) : 1993 Indian Standard DIGITALMEASURTNGINSTRUMENTSFOR MEASUREMENTANDCONTROL PART 2 TERMS, TESTS AND DATA SHEET DETAILS OF INSTRUMENTS FOR MEASURING ANALOG QUANTITIES 1 SCOPE gnirusaem egnar and eht epols fo eht ecnerefer .noitcnuf 1.1 sihT standard ( traP 2 ) seificeps ,snoitinifed stset and data teehs sliated hcihw ,ylppa ni 2.1.3 Digitalization Error ,ralucitrap ot gnirusaem stnemurtsni rof -rusaem ehT sum fo all srorre hcihw era decudorp yb eht gni golana seititnauq hcus as, rof ,elpmaxe ssecorp fo .noitazilatigid ,tnerruc egatlov and .ecnatsiser diaS golana seititnauq yam osla eb denoisacco yb cirtcele-non ,seititnauq rof ,elpmaxe .erutarepmet 3 TESTS 1.2 sihT standard seilppa ylno ni noitcnujnoc 3.1 Test Con&dons htiw SI 13875 ( traP I ) : 1993 fo this .seires 3.1.1 Reference Conditions, Rated Operating 2 DEFINITIONS Conditions and Injhence Effects ecnerefeR snoitidnoc and detar gnitarepo -idnoc 2.0 roF eht esoprup fo this standard, ni noitidda snoit shall eb gnidrocca ot 4.1.1 fo traP 1 fo ot eht gniwollof snoitinifed nevig ni traP 1 fo this .seires nI eht esac gnirusaemfo stnemurtsni this seires shall .ylppa rof gnirusaem golana seititnauq ecnerefer -idnoc snoit as nevig ni elbaT 1 ,era ni ,noitidda 2.1 Terms Relating to the Specification of .elbacilppa rehtruF ecnerefer snoitidnoc nif Measuring Instrument Parameters ecnadrocca htiw s’rerutcafunam data. 2.1.1 Sensitivity 3.1.2 Test Equiprnetl t Errors ehT eulav fo eht tupni ytitnauq deriuqer for noitcudorp fo an tuptuo eulav hcihw gniwo ot tseT tnempiuqe srorre shall eb gnidrocca ot 4.1.2 rehto ,sesuac rof elpmaxe ,esion ,sdeecxe yb a fo traP 1 fo this .seires deificeps ,tnuoma that eulav hcihw is ydaerla elbaliava at eht .tuptuo 3.1.3 Type of Test 2.1.2 Conversion Errol tI shall eb gnidrocca ot 4.1.3 fo traP 1 fo this .seires ehT noitaived fo eht noisrevnoc noitcnuf morf a ecnerefer .noitcnuf 3.2 cisnirtnI rorrE tseT NOTES sihT tset shall eb enod gnidrocca ot 4.2 fo 1 erehW eht ecnerefer noitcnuf si a thgiarts ,enil eht traP 1 fo this .seires noisrevnoc rorre si eht ytiraenil .rorre 3.3 ecneulfnI tceffE tseT 2 ehT noitiived fo eht noisrevnoc evruc morf eht ecnerefer noitcnuf yam eb desserpxe yb eno ro erom sihT tset shall eb enod gnidrocca ot 4.3 fo fo eht seitilibissop denoitnem .woleb ehT noisrevnoc traP 1 fo this .seires noitcnuf llahs ni all ,sesac eb tes at eht noitarbilac tniop ( yllausu eht gnirusaem egnar lanif eulav ) dna at eht rehto ecnerefer tniop ( yllausu eht orez 3.4 ecneulfnI tceffE gnitluseR morf egnahC ni tniop 1. tneibmA erutarepmeT 2.1.2.1 Reference function sihT shall eb enod gnidrocca ot 4.4 fo traP J fo A noitcnuf hcihw runs hguorht eht orez tniop this .seires and eht lautca eulav fo eht noitarbilac .tniop 3.5 Influence Effect Resulting from Changes in 2.1.2.2 Diflerentidl error of the slope Relative Air Humidity The ecnereffid neewteb eht tsrif evitavired fo eht sihT shall eb enod gnidrocca ot 4.5 fo traP I .fo lautca evruc at a deificeps tniop nihtiw eht this .seires 1 IS 13875 ( Part 2 ) : 1993 Table 1 Influence Quantity Reference Conditions 3.11 lntlucnce Effect Resulting from Interference and Tolerances for Test Purposes Relating to Test Measuring Instrument for Measuring 3.21.1 Series Mode Interference Voltage Rejection Analog Quantities Test ( ShIR, Normnl or Series Mode Rejection ) ( CIazrse 3.1.1 ) 3.11.1.1 Witltin the (l.c. voltflge range ehT mumixam elbissimrep .c.a egatlov fo 50 ro Influence Quantities Reference Tolerances Conditions, for Test 60 zH ro 400 zH ( nehw deificeps ni eht data Unless P;WW% teehs ,) hcihw seod ton possess yna .c.d egatlov Otherwise ,tnenopmoc shall eb deilppa ni eht tsewol .c.d Specified Otherwise egatlov egnar and eht yalpsid eulav denimreted Specified - ( A, .) ehT r.m.s. eulav fo eht .c.a egatlov shall elppiR tnetnoc fo a .c.d 0 0’1 tnecrep eb derusaem ( ehT seires edom ecnerefretni B, ). derusaem ytitnauq ( citisarap egatlov ) noitcejer shall eb denimreted noitrotsiD fo na .c.a 0 nI eht esac fo as :swollof rotcaf derusaem gnirusaem -sni ytitnauq stnemurt hcihw s = 20. gol $- Bd do ton zIcj;rp m.r s. X dna gnirusaem 3.11.1.2 Wit/tin the n.c. voltage range stnemurtsni htiw ehT emas tset, dohtem as nevig rednu 3.11.1.1 esahp gnicalpsid :skrowten flah shall eb ,deilppa tpecxe that tnemerusaem sekitt eht tnuoma fo ecalp htiw .c.d egatlov nihtiw eht tsewol .c.a eht cisnirtni egatlov .egnar rorre stimil or 1 ,tnecrep -hcihw NOTES reve si rellams 1 nI eht esac fo srotareneg dna gnirusaem -urtsni tserC rotcaf 414;Ai;7Q nI the case . fo stnem wol ecnadepmi slanimret ot htrae llahs eh gnirusaem -sm detcennoc htiw hcae .rehto evaw 1 stnemurt hcihw do ton tcudorp 2 ehT gnirusaem tnemurtsni llahs ton eb decalp no a .s.m.r seulav : evitcudnoc troppus as esiwrehto gnixim htiw nommoc f 50’0 edom noitcejer yam .rucco 3.11.2 ycneuqerF fo eht .c.a 45 ot 6.5 zH Common Mode Rejection ( CMR ) derusaem ytitnauq 3.11.2.1 Circuit ehT test rof gnikcehc nommoc edom noitcejer 3.6 Inlluence Effect Resulting from a Change in shall eb deirrac ,tuo htiw eno fo eht eerht Position stiucric as nwohs ni .giF 1 nihtiw hcae -rusaem This llahs eb enolc gnidrocca ot 4.6 fo traP 1 fo gni ,egnar sselnu esiwrehto .deificeps thus .seires ehT tsom elbaruovafnu eulav gnitluser morf tnemerltsaem dna the dohtem fo tnemerusaem 3.7 Influence Effect Resulting from External desu shall eb .nevig Electromagnetic Fields dluohS eht gnirusaem tnemurtsni possess an rednU .noitaraperp detalusni erusolcne neht ti shall eb ,decalp rof tset ,sesoprup no a latem ,etalp as ecnerefer 3,s Influence Effect Resulting from the Supply ,laitnetop said etalp gnidurtorp yb at tsael Voltage 150 mm revo eht segde fo eit gnirusaem .tnemurtsni sihT llahs eb enod gnidrocca ot 4.8 fo traP 1 fo this .seires 3.11.2.2 Test witlzin (l.c. voltage rarlge witk dc. 3.9 Mechanical Load voltage ehT mumixam elbissimrep d.c. egatlov ( B, j sihT tset shall eb enod gnidrocca ot 4.9 traPfo 1 shall eb deilppa neewteb eht slanimret and eht fo this .seires ecnerefer tniop ni ecnadrocca htiw eht eerht stiucric as nevig evoba and nihtiw hcae -rusaem 3.10 Influence Effect Resulting from Other Pbysi- gni .egnar yalpsiD eulav A, shall eb .denimreted ,cal Quantities ( for Example Air Pressure, nommoC edom noltcejer is denimreted morf eht Radiation, etc ) gniwollof :noitauqe sihT shall eb enod gnidrocca ot 4.10 fo traP 1 fo g = 20 gol +- )Bd( this .seires X 2 SI 57831 ( Part 2 ) : 1993 P HGIH MI 1kJ-l LOW -w-a --e SCREEN MI I GNIRUSAEM NI EHT ESAC OF TNEMURTSNI 0ETALUSNI SERUSOLCNE NOITCENNOC OT LATEM .ETALP GIF 1 CIRCUITS-FOR TSET FOR GNIKCHHC COM~ION M~DH NOITCEJER 3.11.2.3 fo gnirusaem stnemurtsni Test withil? the d.c. voltage range with a.c. with r.m.s. value .noitamrof voltuge ehT emas tset dohtem as nevig ni 2.2.11.3 shall 3.12.1 Test of InjGersce Error Resulting fromC rest eb desu ,ereh tpecxe that an .c.a egatlov fo 50, Factor 60 ro 400 zH is deilppa daetsni fo .c.d .egatlov 3.12.1.1 Test signal 3.11.2.4 tseT within the a.c. voltage range with dx. ehT tset fo eht ecneulfni tceffe gnitluser morf voltage tserc rotcaf S is deirrac tuo htiw a tset signal ehT emas tset dohtem as nevig is 3.11.2.2 shall hcihw has eht epahs fo a erauqs-enis eslup eb desu ,ereh tpecxe that eht tset shall eb tuohtiw .c.d tnenopmoc ( .giF 2 .) ehT said tset deirrac tuo nihtiw eht tsewol .c.a egatlov .egnar shall eb deirrac tuo ni htob noitcerid fc .ytiralop 3.11.2.5 Test within the a.c. voltage range with a.c. voltage )1( ytuD rotcaf zn = $- ehT emas tset dohtem as nevig ni 3.11.2.2 shall eb ,desu titb .c.a egatlov shall eb .deilppa NOTE - erehW ,yrassecen nommoc edom egatlov (2) tserC rotcaf S = 3, 2 II--m- - lr1 llahs eb .decuder ffC /2 3 21.3 ecneulfnI tceffe gnitluser morf noitrotsid fo ’”7 - ?IPi a ladiosunis .c.a derusaem ytitnauq ni eht esac 3 IS 13875 ( Part 2 ) : 1993 3.12.1.3 Test method )a hctiwS no evaw-enis rotareneg enisG yb gninrut hctiws ot noitisop A, eht -enis mrofevaw gnieb ni ecnadrocca htiw -efer ecner noitidnoc and ycneuqerf as deificeps yb eht .rerutcafunam teS eht eulav fo eht derusaem ytitnauq os that lamreht -revnoc rot gnirusaem stnemurtsni etacidni 90 tnecrep fo eht lluf elacs eulav fo eht gnirusaem .tnemurtsni ehT yalpsid eulav no eht gnirusaem -urtsni FIG. 2 TEST SIGNAL tnem shall neht eb daer tuo ( B ni digits .) b) hctiwS no noitcnuf rotareneg lloitcnufG yb roF tset sesoprup eht mumixam elbissimrep tserc gninrut hctiws ot noitisop eht tset B, rotcaf s,,, shall eb nekat as a basis rof elacs-lluf signal ( tserc rotcaf as deificeps yb eht .eulav rerutcafunam ) gnieb at eht emas ycneuqerf lf = tas rednu ,)a( and tes eht eulav fo eht derusaem ytitnauq os that 3.12.1.2 Test circuit (for example, for voltage ) eht lamreht rotrevnoc gnirusaem -urtsni tnem syalpsid eht emas eulav as rednu .)a( tseT tiucric shall eb gnidrocca ot .giF 3. ehT ehT yalpsid eulav no eht glirusaem ycneuqerf egnar fo eht lamreht rotrevnoc tnemurtsni shall eb daer tuo ( ,B m gnirusaem tnemurtsni shall eb at tsael digits .) c> taepeR eht tset gnidrocca ot )b! htiw a $-06ro$-2 desrever ytiralop tset signal. d) ehT ecneulfni rorre gnitluser morf eht tserc nihti\\ eht deilppa gnirusaem ,egnar revehcihw rotcaf is neht eht retaerg ecnereffid eulav is eht .rehgih ( & - B, ni digits .) ehT noituloser fo eht ecnerefer tnemurtsni as )e nI eht esac fo rellams derusaem seulav a against eht elacs-lluf eulav gnittes shall eb at rehgih tserc rotcaf is .elbjssimrepyilamron tsael that eht yalpsid no eht gnirusaem ehT tset shall neht eb deirrac tuo at such tnemurtsni sreffid yb less than eno htnet fo eht 10 tnecrep fo eht elacs-lluf eulav ni -rocca ecneulfni rorre ni eht esac fo detaeper sgnittes ecnad htiw eht evoba denoitnem ,tset tub rednu eht emas .snoitidnoc taking tnaveler s’rerutcafunam data otni .tnuocca NOTE - nI eht esac fo gnirusaem tnemurtsni htiw citamotua egnar lortnoc eht tset llahs cb deirrac tuo ylsuogolana at eht reppu dna revuol revohctiws tniop ( ees s’rerutcafunam data ) nihtiw eht ecnerefer .egnar 2.2-1.3 Test of Frequency InJuence Effect at the Test Signal According to 3.12.1.1 sG 3.12.2.1 Test signal according to 3.12.1.1 3.12.2.2 Test circuit according, for example, to 3.12.1.2 but without Gsine and change ove1* switch ehT tset shall eb deirrac tuo as :swollof 3.12.2.3 C = roticapaC rof gnikcolb .c.d egatlov tnenopmcc )a tseT signal gnidrocca ot 3.12.1.1. elpmas TI, = lamrehT rotrevnoc gnirusaem tnemurtsni tseT signal noititeper-eslup ycneuqerf : ( ccnarefer gnirusaem tnemurtsni 1 ecnerefer .ycneuqerf ehT eulav fo eht ,FG = evaw-eniS rotareneg derusaem ytitnauq shall eb os tes lluf that eht lamreht rotrevnoc gnirusaem -urtsni fG = noitcnuF rotareneg tnem setacidni 90 tnecrep fo eht elacs eulav fo eht gnirusaem .tnemurtsni [ ehT FIG. 3 TEST CIRCUIT 4 IS 13875 ( Part 2 ) : 1993 yalpsid ewlav fo eht gnirusaem tnemurtsni )a tnenamreP :daolrevo nI all segnar htiw at shall eb daer tuo ( ,B ) 1. tsael a lanif eulav fo + 20 tnecrep rof a muminim fo 2 ,sruoh unless esiwrehto )b ehT tset signal noititeper-eslup ycneuqerf ;deificeps and -shall eb tes at eht mumixam ycneuqerf detacidni rof this .esoprup b) emit-trohS :daolrevo ecnO ni all segnar htiw eht nevig daolrevo fo 0.5 ,sdnoces nI this esac stnemeriuqer gnitaler 10 -reht unless esiwrehto .deificeps A ,esuf fi ,yna mal rotrevnoc gnirusaem stnemurtsni as yam .etarepo nevig ni 3.12.1.2 shall eunitnoc ot eb .tem ehT eulav fo eht derusaem ytitnauq shall 3.15.1 Test eb os tes that eht lamreht rotrevnoc -aem suring tnemurtsni again setacidni 90 ehT cisnirtni rorre shall eb denimreted at a> tnecrep fo eht elacs-lluf eulav fo eht eht elacs-lluf eulav ( B, ni digits ;) gnirusaem .tnemurtsni ehT yalpsid eulav fo eht gnirusaem tnemurtsni shall eb daer daolrevO shall eb deilppa rof eht deificeps b) tuo ( B, >. doirep ot eht gmrusaem ;tnemurtsni )c ehT ecneulfni tceffe gnitluser morf eht gnirusaeM tnemurtsni shall eb tpek ni a c> ycneuqerf fo eht tset signal is neht B,,-B, no-dehctiws noitidnoc rof at tsael owt ni digits. sruoh at ecnerefer ;erutarepmet and 3.13 Frequency Influence Error in the Case ‘of d) ehT cisnirtni rorre shall eb denimreted at ax. Voltage Measurement eht elacs-lluf eulav ( B, in digits .) 3.13.1 ehT yalpsid eulav ( rB ni digits ) shall ehT daolrevo ecneulfni rorre is detaluclac eb denimreted at eht ecnerefer ycneuqerf as morf B, - B,. deificeps yb eht rerutcafunam rednu ecnerefer * snoitidnoc and ni all segnar fo tnemerusaem 3.16 Self-Heating Due to the Measured Quantity ( evitceffe segnar .) Test 3.33.2 ehT ycneuqerf shill neht eb deirav nihtiw gnirusaeM ,stnemurtsni gnidulcni -secca detar.eht egnar fo esu at tnatsnoc egatldv ro/dna a) ,seiros shall eb tpek ni a no-dehctiws tnerruc and eht yalpsid eulav htiw eht tsetaerg noitidnoc rof at tsael owt sruoh at -efer noitaived ( B, ) shali eb .denimreted ecner ,erutarepmet tub tuohtiw a derusaem ytitnauq ;deilppa ehT ecneulfni rorre is neht B, - B, ni digits. gnirusaeM stnemurtsni shall eb ,degrahc ,noitaluclaC ni digits, and gnidrocca ot 4.2.2 fo ‘4 rof 30 ,setunim htiw yletamixorppa traP 1 fo this ,seires fo eht mumixam elbissimrep 90 tnecrep fo eht elacs-lluf ;eulav ycneuqerf ecneulfni tceffe as deificeps yb eht .rerutcafunam yalpsiD seulav shall eb tuo-daer retfa eht c) espale fo eno etunim ( Br ni digits ;) and 3.114 Step Response Time yalpsiD seulav shall eb tuo-daer retfa eht A denifed ytitnauq ta’fo tsael 80 tnecrep fo eht 4 espale fo 30 setunim ( ,B ni digits .) elacs-lluf eulav shall eb deilppa ot eht gnirusaem tnemurtsni rof eht noitarud fo eht pets esnopser ehT gnitaeh-fles ecneulfni rorre is detaluclac emit as deificeps yb eht .rerutcafunam At eht morf B, - Br. dne fo this doirep eht eulav detacidni shall ton . etaived morf eht eulav ni eht etats-ydaets -idnoc noit ( > 10 semit pets esnopser emit ) yb erom 4 DATA SHEET INFORMATION FOR than eht mumixam elbissimrep cisnirtni .rorre DIGITAL MEASURING INSTRUMENTS 3.15 daolrevO 4.1 Data teehs shall eb gnidrgcca ot 5 fo traP 1 fo this .seires nI ,noitidda eht data nevig ni eht sihT tset shall esuac on egamad ot eht gnirusaem gniwollof elbaT 2 shall eb dedivorp ni eht esac tnemurtsni and eht cisnirtni rorre shall niamer fo gnirusaem stnemurtsni rof gnirusaem golana eht .emas .seititnauq
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