Table Of Contentइंटरनेट मानक
Disclosure to Promote the Right To Information
Whereas the Parliament of India has set out to provide a practical regime of right to
information for citizens to secure access to information under the control of public authorities,
in order to promote transparency and accountability in the working of every public authority,
and whereas the attached publication of the Bureau of Indian Standards is of particular interest
to the public, particularly disadvantaged communities and those engaged in the pursuit of
education and knowledge, the attached public safety standard is made available to promote the
timely dissemination of this information in an accurate manner to the public.
“जान1 का अ+धकार, जी1 का अ+धकार” “प0रा1 को छोड न’ 5 तरफ”
Mazdoor Kisan Shakti Sangathan Jawaharlal Nehru
“The Right to Information, The Right to Live” “Step Out From the Old to the New”
IS 13875-2 (1993): Digital measuring instruments for
measurement, control, Part 2: Terms, tests, data sheet
details of instruments for measuring analog quantities
[LITD 8: Electronic Measuring Instruments, Systems and
Accessories]
“!ान $ एक न’ भारत का +नम-ण”
Satyanarayan Gangaram Pitroda
““IInnvveenntt aa NNeeww IInnddiiaa UUssiinngg KKnnoowwlleeddggee””
“!ान एक ऐसा खजाना > जो कभी च0राया नहB जा सकता हहहहै””ै”
Bhartṛhari—Nītiśatakam
“Knowledge is such a treasure which cannot be stolen”
IS 13875 ( Part 2 ) : 1993
Indian Standard
DIGITAL-MIYiiiSUkINGINSTRUMENTSFOR
MEASUREMENTANDCONTROL
PART 2 TERMS, TEST AND DATA SHEET DETAILS OF -INSTRUMENTS FOR
IMEASURING ANALOG QUANTITIES
UDC 621*317*7:9 093 7.33: 621.38
0 BIS 1993
BUREAU OF INDIAN STANDARDS
MANAK BHAVAN. 9 BAHADUR SHAH ZAFAR MARC
NEW DELHI 110002
September 1993 Price Group 3
cinortcelE gnirusaeM tnempiuqE lanoitceS ,eettimmoC DTL 21
FOREWORD
sihT naidnI dradnatS was detpoda yb eht uaeruB fo naidnI Standards, retfa eht tfard dezilanif yb eht
cinortcelE gnirusaeM tnempiuqE lanoitceS eettimmoC had neeb devorppa yb eht scinortcelE and
noitacinummoceleT noisiviD .licnuoC
sihT standard is desab tuohtiw yna lacinhcet egnahc no CEI toD 66 ( teS ) 50 tnemerusaeM‘ and
,lortnoc latigid gnirusaem :stnemurtsni traP 2 stnemurtsnI rof gnirusaem golana :seititnauq ,smreT stset
and data teehs ’sliated issued yb lanoitanretnI lacinhcetortcelE noissimmoC ( CEI .)
nI gnitroper eht stluser fo a tset ro sisylana edam ni ecnadrocca htiw this standard, fi eht lanil ,eulav
devresbo ro ,detaluclac is ot eb dednuor ,ffo ti dluohs eb enod ni ecnadrocca htiw SI 2 : 1960 seluR‘ rof
gnidnuor ffo laciremun seulav ( revised )‘.
.
IS 13875 ( Part 2 ) : 1993
Indian Standard
DIGITALMEASURTNGINSTRUMENTSFOR
MEASUREMENTANDCONTROL
PART 2 TERMS, TESTS AND DATA SHEET DETAILS OF INSTRUMENTS FOR
MEASURING ANALOG QUANTITIES
1 SCOPE gnirusaem egnar and eht epols fo eht ecnerefer
.noitcnuf
1.1 sihT standard ( traP 2 ) seificeps ,snoitinifed
stset and data teehs sliated hcihw ,ylppa ni 2.1.3 Digitalization Error
,ralucitrap ot gnirusaem stnemurtsni rof -rusaem
ehT sum fo all srorre hcihw era decudorp yb eht
gni golana seititnauq hcus as, rof ,elpmaxe
ssecorp fo .noitazilatigid
,tnerruc egatlov and .ecnatsiser diaS golana
seititnauq yam osla eb denoisacco yb cirtcele-non
,seititnauq rof ,elpmaxe .erutarepmet 3 TESTS
1.2 sihT standard seilppa ylno ni noitcnujnoc 3.1 Test Con&dons
htiw SI 13875 ( traP I ) : 1993 fo this .seires
3.1.1 Reference Conditions, Rated Operating
2 DEFINITIONS Conditions and Injhence Effects
ecnerefeR snoitidnoc and detar gnitarepo -idnoc
2.0 roF eht esoprup fo this standard, ni noitidda snoit shall eb gnidrocca ot 4.1.1 fo traP 1 fo
ot eht gniwollof snoitinifed nevig ni traP 1 fo
this .seires nI eht esac gnirusaemfo stnemurtsni
this seires shall .ylppa
rof gnirusaem golana seititnauq ecnerefer -idnoc
snoit as nevig ni elbaT 1 ,era ni ,noitidda
2.1 Terms Relating to the Specification of .elbacilppa rehtruF ecnerefer snoitidnoc nif
Measuring Instrument Parameters ecnadrocca htiw s’rerutcafunam data.
2.1.1 Sensitivity
3.1.2 Test Equiprnetl t Errors
ehT eulav fo eht tupni ytitnauq deriuqer for
noitcudorp fo an tuptuo eulav hcihw gniwo ot tseT tnempiuqe srorre shall eb gnidrocca ot 4.1.2
rehto ,sesuac rof elpmaxe ,esion ,sdeecxe yb a fo traP 1 fo this .seires
deificeps ,tnuoma that eulav hcihw is ydaerla
elbaliava at eht .tuptuo 3.1.3 Type of Test
2.1.2 Conversion Errol tI shall eb gnidrocca ot 4.1.3 fo traP 1 fo this
.seires
ehT noitaived fo eht noisrevnoc noitcnuf morf a
ecnerefer .noitcnuf 3.2 cisnirtnI rorrE tseT
NOTES
sihT tset shall eb enod gnidrocca ot 4.2 fo
1 erehW eht ecnerefer noitcnuf si a thgiarts ,enil eht traP 1 fo this .seires
noisrevnoc rorre si eht ytiraenil .rorre
3.3 ecneulfnI tceffE tseT
2 ehT noitiived fo eht noisrevnoc evruc morf eht
ecnerefer noitcnuf yam eb desserpxe yb eno ro erom sihT tset shall eb enod gnidrocca ot 4.3 fo
fo eht seitilibissop denoitnem .woleb ehT noisrevnoc
traP 1 fo this .seires
noitcnuf llahs ni all ,sesac eb tes at eht noitarbilac
tniop ( yllausu eht gnirusaem egnar lanif eulav ) dna
at eht rehto ecnerefer tniop ( yllausu eht orez 3.4 ecneulfnI tceffE gnitluseR morf egnahC ni
tniop 1. tneibmA erutarepmeT
2.1.2.1 Reference function
sihT shall eb enod gnidrocca ot 4.4 fo traP J fo
A noitcnuf hcihw runs hguorht eht orez tniop this .seires
and eht lautca eulav fo eht noitarbilac .tniop
3.5 Influence Effect Resulting from Changes in
2.1.2.2 Diflerentidl error of the slope Relative Air Humidity
The ecnereffid neewteb eht tsrif evitavired fo eht sihT shall eb enod gnidrocca ot 4.5 fo traP I .fo
lautca evruc at a deificeps tniop nihtiw eht this .seires
1
IS 13875 ( Part 2 ) : 1993
Table 1 Influence Quantity Reference Conditions 3.11 lntlucnce Effect Resulting from Interference
and Tolerances for Test Purposes Relating to Test
Measuring Instrument for Measuring
3.21.1 Series Mode Interference Voltage Rejection
Analog Quantities
Test ( ShIR, Normnl or Series Mode Rejection )
( CIazrse 3.1.1 )
3.11.1.1 Witltin the (l.c. voltflge range
ehT mumixam elbissimrep .c.a egatlov fo 50 ro
Influence Quantities Reference Tolerances
Conditions, for Test 60 zH ro 400 zH ( nehw deificeps ni eht data
Unless P;WW% teehs ,) hcihw seod ton possess yna .c.d egatlov
Otherwise ,tnenopmoc shall eb deilppa ni eht tsewol .c.d
Specified Otherwise
egatlov egnar and eht yalpsid eulav denimreted
Specified
- ( A, .) ehT r.m.s. eulav fo eht .c.a egatlov shall
elppiR tnetnoc fo a .c.d 0 0’1 tnecrep eb derusaem ( ehT seires edom ecnerefretni
B, ).
derusaem ytitnauq ( citisarap egatlov ) noitcejer shall eb denimreted
noitrotsiD fo na .c.a 0 nI eht esac fo as :swollof
rotcaf derusaem gnirusaem -sni
ytitnauq stnemurt hcihw s = 20. gol $- Bd
do ton zIcj;rp
m.r s. X
dna gnirusaem 3.11.1.2 Wit/tin the n.c. voltage range
stnemurtsni htiw
ehT emas tset, dohtem as nevig rednu 3.11.1.1
esahp gnicalpsid
:skrowten flah shall eb ,deilppa tpecxe that tnemerusaem sekitt
eht tnuoma fo ecalp htiw .c.d egatlov nihtiw eht tsewol .c.a
eht cisnirtni egatlov .egnar
rorre stimil or
1 ,tnecrep -hcihw
NOTES
reve si rellams
1 nI eht esac fo srotareneg dna gnirusaem -urtsni
tserC rotcaf 414;Ai;7Q nI the case . fo stnem wol ecnadepmi slanimret ot htrae llahs eh
gnirusaem -sm detcennoc htiw hcae .rehto
evaw 1 stnemurt hcihw
do ton tcudorp 2 ehT gnirusaem tnemurtsni llahs ton eb decalp no a
.s.m.r seulav : evitcudnoc troppus as esiwrehto gnixim htiw nommoc
f 50’0 edom noitcejer yam .rucco
3.11.2
ycneuqerF fo eht .c.a 45 ot 6.5 zH Common Mode Rejection ( CMR )
derusaem ytitnauq
3.11.2.1 Circuit
ehT test rof gnikcehc nommoc edom noitcejer
3.6 Inlluence Effect Resulting from a Change in
shall eb deirrac ,tuo htiw eno fo eht eerht
Position
stiucric as nwohs ni .giF 1 nihtiw hcae -rusaem
This llahs eb enolc gnidrocca ot 4.6 fo traP 1 fo gni ,egnar sselnu esiwrehto .deificeps
thus .seires
ehT tsom elbaruovafnu eulav gnitluser morf
tnemerltsaem dna the dohtem fo tnemerusaem
3.7 Influence Effect Resulting from External desu shall eb .nevig
Electromagnetic Fields
dluohS eht gnirusaem tnemurtsni possess an
rednU .noitaraperp detalusni erusolcne neht ti shall eb ,decalp rof
tset ,sesoprup no a latem ,etalp as ecnerefer
3,s Influence Effect Resulting from the Supply ,laitnetop said etalp gnidurtorp yb at tsael
Voltage 150 mm revo eht segde fo eit gnirusaem
.tnemurtsni
sihT llahs eb enod gnidrocca ot 4.8 fo traP 1 fo
this .seires
3.11.2.2
Test witlzin (l.c. voltage rarlge witk dc.
3.9 Mechanical Load voltage
ehT mumixam elbissimrep d.c. egatlov ( B, j
sihT tset shall eb enod gnidrocca ot 4.9 traPfo 1 shall eb deilppa neewteb eht slanimret and eht
fo this .seires ecnerefer tniop ni ecnadrocca htiw eht eerht
stiucric as nevig evoba and nihtiw hcae -rusaem
3.10 Influence Effect Resulting from Other Pbysi- gni .egnar yalpsiD eulav A, shall eb .denimreted
,cal Quantities ( for Example Air Pressure, nommoC edom noltcejer is denimreted morf eht
Radiation, etc ) gniwollof :noitauqe
sihT shall eb enod gnidrocca ot 4.10 fo traP 1 fo
g = 20 gol +- )Bd(
this .seires X
2
SI 57831 ( Part 2 ) : 1993
P HGIH MI
1kJ-l
LOW
-w-a --e SCREEN
MI I GNIRUSAEM NI EHT ESAC OF
TNEMURTSNI 0ETALUSNI SERUSOLCNE
NOITCENNOC OT LATEM
.ETALP
GIF 1 CIRCUITS-FOR TSET FOR GNIKCHHC COM~ION M~DH NOITCEJER
3.11.2.3 fo gnirusaem stnemurtsni
Test withil? the d.c. voltage range with a.c. with r.m.s. value
.noitamrof
voltuge
ehT emas tset dohtem as nevig ni 2.2.11.3 shall 3.12.1 Test of InjGersce Error Resulting fromC rest
eb desu ,ereh tpecxe that an .c.a egatlov fo 50,
Factor
60 ro 400 zH is deilppa daetsni fo .c.d .egatlov
3.12.1.1 Test signal
3.11.2.4 tseT
within the a.c. voltage range with dx.
ehT tset fo eht ecneulfni tceffe gnitluser morf
voltage
tserc rotcaf S is deirrac tuo htiw a tset signal
ehT emas tset dohtem as nevig is 3.11.2.2 shall hcihw has eht epahs fo a erauqs-enis eslup
eb desu ,ereh tpecxe that eht tset shall eb tuohtiw .c.d tnenopmoc ( .giF 2 .) ehT said tset
deirrac tuo nihtiw eht tsewol .c.a egatlov .egnar shall eb deirrac tuo ni htob noitcerid fc
.ytiralop
3.11.2.5
Test within the a.c. voltage range with a.c.
voltage )1( ytuD rotcaf zn = $-
ehT emas tset dohtem as nevig ni 3.11.2.2 shall
eb ,desu titb .c.a egatlov shall eb .deilppa
NOTE - erehW ,yrassecen nommoc edom egatlov (2) tserC rotcaf S = 3, 2 II--m- - lr1
llahs eb .decuder
ffC /2 3
21.3 ecneulfnI tceffe gnitluser morf noitrotsid fo ’”7 - ?IPi
a ladiosunis .c.a derusaem ytitnauq ni eht esac
3
IS 13875 ( Part 2 ) : 1993
3.12.1.3 Test method
)a hctiwS no evaw-enis rotareneg enisG yb
gninrut hctiws ot noitisop A, eht -enis
mrofevaw gnieb ni ecnadrocca htiw -efer
ecner noitidnoc and ycneuqerf as deificeps
yb eht .rerutcafunam teS eht eulav fo eht
derusaem ytitnauq os that lamreht -revnoc
rot gnirusaem stnemurtsni etacidni 90
tnecrep fo eht lluf elacs eulav fo eht
gnirusaem .tnemurtsni
ehT yalpsid eulav no eht gnirusaem -urtsni
FIG. 2 TEST SIGNAL tnem shall neht eb daer tuo ( B ni digits .)
b) hctiwS no noitcnuf rotareneg lloitcnufG yb
roF tset sesoprup eht mumixam elbissimrep tserc gninrut hctiws ot noitisop eht tset
B,
rotcaf s,,, shall eb nekat as a basis rof elacs-lluf signal ( tserc rotcaf as deificeps yb eht
.eulav rerutcafunam ) gnieb at eht emas
ycneuqerf lf = tas rednu ,)a( and tes eht
eulav fo eht derusaem ytitnauq os that
3.12.1.2 Test circuit (for example, for voltage ) eht lamreht rotrevnoc gnirusaem -urtsni
tnem syalpsid eht emas eulav as rednu .)a(
tseT tiucric shall eb gnidrocca ot .giF 3. ehT ehT yalpsid eulav no eht glirusaem
ycneuqerf egnar fo eht lamreht rotrevnoc tnemurtsni shall eb daer tuo ( ,B m
gnirusaem tnemurtsni shall eb at tsael digits .)
c>
taepeR eht tset gnidrocca ot )b! htiw a
$-06ro$-2
desrever ytiralop tset signal.
d) ehT ecneulfni rorre gnitluser morf eht tserc
nihti\\ eht deilppa gnirusaem ,egnar revehcihw
rotcaf is neht eht retaerg ecnereffid
eulav is eht .rehgih
( & - B, ni digits .)
ehT noituloser fo eht ecnerefer tnemurtsni as )e nI eht esac fo rellams derusaem seulav a
against eht elacs-lluf eulav gnittes shall eb at rehgih tserc rotcaf is .elbjssimrepyilamron
tsael that eht yalpsid no eht gnirusaem ehT tset shall neht eb deirrac tuo at
such
tnemurtsni sreffid yb less than eno htnet fo eht 10 tnecrep fo eht elacs-lluf eulav ni -rocca
ecneulfni rorre ni eht esac fo detaeper sgnittes ecnad htiw eht evoba denoitnem ,tset tub
rednu eht emas .snoitidnoc taking tnaveler s’rerutcafunam data otni
.tnuocca
NOTE - nI eht esac fo gnirusaem tnemurtsni
htiw citamotua egnar lortnoc eht tset llahs cb
deirrac tuo ylsuogolana at eht reppu dna revuol
revohctiws tniop ( ees s’rerutcafunam data )
nihtiw eht ecnerefer .egnar
2.2-1.3 Test of Frequency InJuence Effect at the
Test Signal According to 3.12.1.1
sG 3.12.2.1 Test signal according to 3.12.1.1
3.12.2.2 Test circuit according, for example,
to 3.12.1.2 but without Gsine and change ove1*
switch
ehT tset shall eb deirrac tuo as :swollof
3.12.2.3
C = roticapaC rof gnikcolb .c.d egatlov tnenopmcc )a tseT signal gnidrocca ot 3.12.1.1.
elpmas
TI, = lamrehT rotrevnoc gnirusaem tnemurtsni tseT signal noititeper-eslup ycneuqerf :
( ccnarefer gnirusaem tnemurtsni 1 ecnerefer .ycneuqerf ehT eulav fo eht
,FG = evaw-eniS rotareneg derusaem ytitnauq shall eb os tes lluf that
eht lamreht rotrevnoc gnirusaem -urtsni
fG = noitcnuF rotareneg
tnem setacidni 90 tnecrep fo eht elacs
eulav fo eht gnirusaem .tnemurtsni [ ehT
FIG. 3 TEST CIRCUIT
4
IS 13875 ( Part 2 ) : 1993
yalpsid ewlav fo eht gnirusaem tnemurtsni )a tnenamreP :daolrevo nI all segnar htiw at
shall eb daer tuo ( ,B ) 1. tsael a lanif eulav fo + 20 tnecrep rof a
muminim fo 2 ,sruoh unless esiwrehto
)b ehT tset signal noititeper-eslup ycneuqerf ;deificeps and
-shall eb tes at eht mumixam ycneuqerf
detacidni rof this .esoprup b) emit-trohS :daolrevo ecnO ni all segnar
htiw eht nevig daolrevo fo 0.5 ,sdnoces
nI this esac stnemeriuqer gnitaler 10 -reht unless esiwrehto .deificeps A ,esuf fi ,yna
mal rotrevnoc gnirusaem stnemurtsni as yam .etarepo
nevig ni 3.12.1.2 shall eunitnoc ot eb .tem
ehT eulav fo eht derusaem ytitnauq shall 3.15.1 Test
eb os tes that eht lamreht rotrevnoc -aem
suring tnemurtsni again setacidni 90 ehT cisnirtni rorre shall eb denimreted at
a>
tnecrep fo eht elacs-lluf eulav fo eht eht elacs-lluf eulav ( B, ni digits ;)
gnirusaem .tnemurtsni ehT yalpsid eulav
fo eht gnirusaem tnemurtsni shall eb daer daolrevO shall eb deilppa rof eht deificeps
b)
tuo ( B, >. doirep ot eht gmrusaem ;tnemurtsni
)c ehT ecneulfni tceffe gnitluser morf eht gnirusaeM tnemurtsni shall eb tpek ni a
c>
ycneuqerf fo eht tset signal is neht B,,-B, no-dehctiws noitidnoc rof at tsael owt
ni digits. sruoh at ecnerefer ;erutarepmet and
3.13 Frequency Influence Error in the Case ‘of d) ehT cisnirtni rorre shall eb denimreted at
ax. Voltage Measurement eht elacs-lluf eulav ( B, in digits .)
3.13.1 ehT yalpsid eulav ( rB ni digits ) shall ehT daolrevo ecneulfni rorre is detaluclac
eb denimreted at eht ecnerefer ycneuqerf as morf B, - B,.
deificeps yb eht rerutcafunam rednu ecnerefer *
snoitidnoc and ni all segnar fo tnemerusaem 3.16 Self-Heating Due to the Measured Quantity
( evitceffe segnar .)
Test
3.33.2 ehT ycneuqerf shill neht eb deirav nihtiw
gnirusaeM ,stnemurtsni gnidulcni -secca
detar.eht egnar fo esu at tnatsnoc egatldv ro/dna a)
,seiros shall eb tpek ni a no-dehctiws
tnerruc and eht yalpsid eulav htiw eht tsetaerg
noitidnoc rof at tsael owt sruoh at -efer
noitaived ( B, ) shali eb .denimreted
ecner ,erutarepmet tub tuohtiw a derusaem
ytitnauq ;deilppa
ehT ecneulfni rorre is neht B, - B, ni digits.
gnirusaeM stnemurtsni shall eb ,degrahc
,noitaluclaC ni digits, and gnidrocca ot 4.2.2 fo ‘4
rof 30 ,setunim htiw yletamixorppa
traP 1 fo this ,seires fo eht mumixam elbissimrep
90 tnecrep fo eht elacs-lluf ;eulav
ycneuqerf ecneulfni tceffe as deificeps yb eht
.rerutcafunam
yalpsiD seulav shall eb tuo-daer retfa eht
c)
espale fo eno etunim ( Br ni digits ;) and
3.114 Step Response Time
yalpsiD seulav shall eb tuo-daer retfa eht
A denifed ytitnauq ta’fo tsael 80 tnecrep fo eht 4 espale fo 30 setunim ( ,B ni digits .)
elacs-lluf eulav shall eb deilppa ot eht gnirusaem
tnemurtsni rof eht noitarud fo eht pets esnopser
ehT gnitaeh-fles ecneulfni rorre is detaluclac
emit as deificeps yb eht .rerutcafunam At eht
morf B, - Br.
dne fo this doirep eht eulav detacidni shall ton .
etaived morf eht eulav ni eht etats-ydaets -idnoc
noit ( > 10 semit pets esnopser emit ) yb erom 4 DATA SHEET INFORMATION FOR
than eht mumixam elbissimrep cisnirtni .rorre DIGITAL MEASURING INSTRUMENTS
3.15 daolrevO 4.1 Data teehs shall eb gnidrgcca ot 5 fo traP 1
fo this .seires nI ,noitidda eht data nevig ni eht
sihT tset shall esuac on egamad ot eht gnirusaem gniwollof elbaT 2 shall eb dedivorp ni eht esac
tnemurtsni and eht cisnirtni rorre shall niamer fo gnirusaem stnemurtsni rof gnirusaem golana
eht .emas .seititnauq
