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Influence of Temperature on Microelectronics and System Reliability-A Physics of Failure Approach PDF

327 Pages·1997·101.946 MB·\327
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Author:Pradeep Lall (Author); Michael G. Pecht (Author); Edward B. Hakim (Author)
Publication Year:1997
ISBN:9780367400972
Pages:327
Language:\327
File Size:101.946
Format:PDF
Price:FREE
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Most books are stored in the elastic cloud where traffic is expensive. For this reason, we have a limit on daily download.