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Download High resolution X-ray diffractometry and topography by D.K. Bowen, Brian K. Tanner in PDF format completely FREE. No registration required, no payment needed. Get instant access to this valuable resource on PDFdrive.to!
About High resolution X-ray diffractometry and topography
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.
Detailed Information
| Author: | D.K. Bowen, Brian K. Tanner |
|---|---|
| Publication Year: | 1998 |
| ISBN: | 9780850667585 |
| Pages: | 278 |
| Language: | English |
| File Size: | 11.457 |
| Format: | |
| Price: | FREE |
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