High resolution X-ray diffractometry and topography PDF
278 Pages·1998·11.457 MB·English
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Description:
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.
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Most books are stored in the elastic cloud where traffic is expensive. For this reason, we have a limit on daily download.
