Electronic Devices Conventional Current Version

974 Pages·2012·26.02 MB·English

by  Thomas L. Floyd

E
LECTRONIC
D
EVICES
Conventional Current Version
Ninth Edition
Thomas L. Floyd
Prentice Hall
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Library of Congress Cataloging-in-Publication Data
Floyd, Thomas L.
Electronic devices : conventional current version / Thomas L. Floyd.— 9th ed.
p. cm.
Includes index.
ISBN-13: 978-0-13-254986-8 (alk. paper)
ISBN-10: 0-13-254986-7 (alk. paper)
1. Electronic apparatus and appliances. 2. Solid state electronics. I. Title.
TK7870.F52 2012
621.381—dc22 2010043462
10 9 8 7 6 5 4 3 2 1
ISBN 10: 0-13-254986-7
ISBN 13: 978-0-13-254986-8
P
REFACE
This ninth edition of Electronic Devices reflects changes recommended by users and
reviewers. Applications and troubleshooting coverage have been expanded to include
several new topics related to renewable energy and automated test programming. As in the
previous edition, Chapters 1 through 11 are essentially devoted to discrete devices and
circuits. Chapters 12 through 17 primarily cover linear integrated circuits. A completely
new Chapter 18covers an introduction to programming for device testing. It can be used as
a “floating” chapter and introduced in conjunction with any of the troubleshooting
sections. Chapter 19, which was Chapter 18 in the last edition, is an online chapter that
covers electronic communications. Multisim®files in versions 10 and 11 are now available
at the companion website, www.pearsonhighered.com/electronics.
New in This Edition
Reorganizations of Chapters 1 and 2 These chapters have been significantly re-
worked for a more effective coverage of the introduction to electronics and diodes. New
topics such as the quantum model of the atom have been added.
GreenTech Applications This new feature appears after each of the first six chapters
and introduces the application of electronics to solar energy and wind energy. A significant
effort is being made to create renewable and sustainable energy sources to offset, and
eventually replace, fossil fuels. Today’s electronics technician should have some familiarity
with these relatively new technologies. The coverage in this text provides a starting point
for those who may pursue a career in the renewable energy field.
Basic Programming Concepts for Automated Testing A totally new chapter by Gary
Snyder covers the basics of programming used for the automated testing of electronic
devices. It has become increasingly important for electronic technicians, particularly those
working in certain environments such as production testing, to have a fundamental ground-
ing in automated testing that involves programming. This chapter is intended to be used in
conjunction with the traditional troubleshooting sections and can be introduced or omitted
at the instructor’s discretion.
More Multisim®Circuits Updated to Newest Versions Additional Multisim®circuit
files have been added to this edition. All the files have been updated to versions 10 and 11.
New Format for Section Objectives The section objectives have been rewritten to pro-
vide a better indication of the coverage in each section. The new format better reflects the
topics covered and their hierarchy.
Miscellaneous Improvements An expanded and updated coverage of LEDs includes
high-intensity LEDs, which are becoming widely used in many areas such as residential
lighting, automotive lighting, traffic signals, and informational signs. Also, the topic of
quantum dots is discussed, and more emphasis is given to MOSFETs, particularly in
switching power supplies.
IV ◆ PREFACE
Standard Features
◆ Full-color format.
◆ Chapter openers include a chapter outline, chapter objectives, introduction, key
terms list, Application Activity preview, and website reference.
◆ Introduction and objectives for each section within a chapter.
◆ Large selection of worked-out examples set off in a graphic box. Each example has a
related problem for which the answer can be found at www.pearsonhighered.com/
electronics.
◆ Multisim® circuit files for selected examples, troubleshooting, and selected prob-
lems are on the companion website.
◆ Section checkup questions are at the end of each section within a chapter. Answers
can be found at www.pearsonhighered.com/electronics.
◆ Troubleshooting sections in many chapters.
◆ An Application Activity is at the end of most chapters.
◆ A Programmable Analog Technology feature is at the end of selected chapters.
◆ A sectionalized chapter summary, key term glossary, and formula list at the end of
each chapter.
◆ True/false quiz, circuit-action quiz, self-test, and categorized problem set with basic
and advanced problems at the end of each chapter.
◆ Appendix with answers to odd-numbered problems, glossary, and index are at the
end of the book.
◆ PowerPoint®slides, developed by Dave Buchla, are available online. These innova-
tive, interactive slides are coordinated with each text chapter and are an excellent
tool to supplement classroom presentations.
Student Resources
Companion Website (www.pearsonhighered.com/floyd) This website offers students
an online study guide that they can check for conceptual understanding of key topics.
Also included on the website are the following: Chapter 19, “Electronic Communications
Systems and Devices,” a table of standard resistor values, derivatives of selected equa-
tions, a discussion of circuit simulation using Multisim and NI ELVIS, and an
examination of National Instruments’ LabVIEWTM. The LabVIEW software is an ex-
ample of a visual programming application and relates to new Chapter 18. Answers to
Section Checkups, Related Problems for Examples, True/False Quizzes, Circuit-
Action Quizzes, and Self-Tests are found on this website.
Multisim® These online files include simulation circuits in Multisim® 10 and 11 for
selected examples, troubleshooting sections, and selected problems in the text. These
circuits were created for use with Multisim®software. Multisim®is widely regarded as
an excellent circuit simulation tool for classroom and laboratory learning. However, no
part of your textbook is dependent upon the Multisim®software or provided files.
Laboratory Exercises for Electronic Devices,Ninth Edition, by Dave Buchla and Steve
Wetterling. ISBN: 0-13-25419-5.
Instructor Resources
To access supplementary materials online, instructors need to request an instructor access code.
Go to www.pearsonhighered.com/irc to register for an instructor access code. Within 48 hours
of registering, you will receive a confirming e-mail including an instructor access code. Once
you have received your code, locate your text in the online catalog and click on the Instructor
Resources button on the left side of the catalog product page. Select a supplement, and a login
PREFACE ◆ V
page will appear. Once you have logged in, you can access instructor material for all Prentice
Hall textbooks. If you have any difficulties accessing the site or downloading a supplement,
please contact Customer Service at http://247.prenhall.com.
Online Instructor’s Resource Manual Includes solutions to chapter problems,
Application Activity results, summary of Multisim® circuit files, and a test item file.
Solutions to the lab manual are also included.
Online Course Support If your program is offering your electronics course in a dis-
tance learning format, please contact your local Pearson sales representative for a list of
product solutions.
Online PowerPoint®Slides This innovative, interactive PowerPoint slide presentation
for each chapter in the book provides an effective supplement to classroom lectures.
Online TestGen This is a test bank of over 800 questions.
Chapter Features
Chapter Opener Each chapter begins with an opening page, as shown in Figure P–1.The
chapter opener includes a chapter introduction, a list of chapter sections, chapter objectives,
key terms, an Application Activity preview, and a website reference for associated study aids.
(cid:2) FIGURE P–1
A typical chapter opener.
Chapter outline
2
DIODES AND APPLICATIONS
Website
CHAPTER OUTLINE VISIT THE COMPANION WEBSITE
22––12 DVoioltdaeg eO-Cpuerrraetniotn (V-I) Characteristics of a Diode Shttutpd:y// awidwsw a.pneda Mrsounlthisiigmhefrileeds. cfoorm t/heilse ccthraopntiecrs are available at reference
2–3 Diode Models
2–4 Half-Wave Rectifiers INTRODUCTION
2–5 Full-Wave Rectifiers In Chapter 1, you learned that many semiconductor devices
2–6 Power Supply Filters and Regulators are based on the pnjunction. In this chapter, the operation
List of 2222––––78910 DVTTrhoiooeltu daDbegli eeoL sidMmheou iDtolettairipstnal gaisenhrdse eCtlampers adpdabniirooeidlddsi etceeynh im tatneoro dae dc claoeetnecnlstrdd rir soutetnecipctsir cstcei nuocsiegrfr rn cteihutsni iendtt sgidi s ncitcoa huodnrsneensee eoa ddtlre .eib vrT eeceho closetv iv eooiemrfnre ea pdwmpo. hprAptirhllaosenaxo bsci,mi elzto heaocdrtfkei .iot enIhntges are Introduction
performance- AGprepelincTaeticohn A Apcptliivciatytion 2: Solar Power cmuarnreyn tty ipne tsh oef octihrceuri tdsi.r eOcntieo nci rics ueists ienn ptiaarl ttiocu tlhaer iosp tehrea taicon of
rectifier, which is covered in this chapter. Other important
based chapter CHAPTER OBJECTIVES aclpapmlipcaetriso, nasn adr de icoidrceu vitosl tsaugceh m asu ldtiipodliee rlsi.m Ai tderast,a dshioedeet is
(cid:2)Use a diode in common applications discussed for specific diodes.
objectives (cid:2)Analyze the voltage-current (V-I) characteristic of a diode
(cid:2)Explain how the three diode models differ APPLICATION ACTIVITY PREVIEW
(cid:2)Explain and analyze the operation of half-wave rectifiers You have the responsibility for the final design and testing
(cid:2)Explain and analyze the operation of full-wave rectifiers of a power supply circuit that your company plans to use in
(cid:2)(cid:2)EEclxxappmllaapiiennr saanndd aannaallyyzzee tphoew oepr esruaptipolny foiflt derios daen dli mreigteurlsa taonrds sdcehiovaedpretae lcr i.orfc uitists p troo dthuec tAs.p Ypoliuca wtiiolln a Apcptliyv iytoy uart kthneo wenledd ogef tohfe AApctpivliictaytion
(cid:2)Explain and analyze the operation of diode voltage
(cid:2)mInuteltripprleiet rasnd use diode datasheets preview
(cid:2)Troubleshoot diodes and power supply circuits
KEY TERMS
(cid:2)Diode (cid:2)Half-wave rectifier
(cid:2)Bias (cid:2)Peak inverse voltage (PIV)
(cid:2)Forward bias (cid:2)Full-wave rectifier
(cid:2)Reverse bias (cid:2)Ripple voltage
(cid:2)V-Icharacteristic (cid:2)Line regulation
(cid:2)DC power supply (cid:2)Load regulation
Key terms (cid:2)Rectifier (cid:2)Limiter
(cid:2)Filter (cid:2)Clamper
(cid:2)Regulator (cid:2)Troubleshooting
Section Opener Each section in a chapter begins with a brief introduction and section
objectives. An example is shown in Figure P–2.
Section Checkup Each section in a chapter ends with a list of questions that focus on the
main concepts presented in the section. This feature is also illustrated in Figure P–2. The
answers to the Section Checkups can be found at www.pearsonhighered.com/electronics.
Troubleshooting Sections Many chapters include a troubleshooting section that relates
to the topics covered in the chapter and that illustrates troubleshooting procedures and
techniques. The Troubleshooting section also provides Multisim® Troubleshooting exer-
cises. A reference to the optional Chapter 18 (Basic Programming Concepts for
Automated Testing) is included in each Troubleshooting section.
VI ◆ PREFACE
(cid:3) FIGURE P–2 Section checkup
A typical section opener and section ends each 482 (cid:2) FET AMPLIFIERSANDSWITCHINGCIRCUITS
review. section. results in conduction power losses lower than with BJTs. Power MOSFETs are used for
motor control, dc-to-ac conversion, dc-to-dc conversion, load switching, and other applica-
tions that require high current and precise digital control.
SECTION 9–6 1.Describe a basic CMOS inverter.
CHECKUP 2.What type of 2-input digital CMOS circuit has a low output only when both inputs are
high?
Introductory 3.What type of 2-input digital CMOS circuit has a high output only when both inputs
are low?
paragraph begins
each section. 9–7 TROUBLESHOOTING
A technician who understands the basics of circuit operation and who can, if necessary,
perform basic analysis on a given circuit is much more valuable than one who is limited
Performance-based tboo acradrr tyhiantg h oaust o rnoluyt ian es ctheestm partoicc ewdiutrhe sn.o I nsp tehcisif iseedc ttieosnt ,p yroouc ewduilrle s eoer vhoolwta tgoe tleesvte al sc. iIrncuit
this case, basic knowledge of how the circuit operates and the ability to do a quick
section objectives circuit analysis are useful.
After completing this section, you should be able to
(cid:3)Troubleshoot FET amplifiers
(cid:3)Troubleshoot a two-stage common-source amplifier
Reference to Chapter (cid:2)(cid:2)ERxeplaltaei nth eea cchir csuteitp biona trhde ttor othueb lsecshheomotaintigc procedure (cid:2)Use a datasheet
18, “Basic Chapter 18: Basic Programming Concepts for Automated Testing
Selected sections from Chapter 18may be introduced as part of this troubleshooting
Programming coverage or, optionally, the entire Chapter 18may be covered later or not at all.
Concepts for
Automated Testing” A Two-Stage Common-Source Amplifier
Assume that you are given a circuit board containing an audio amplifier and told simply
that it is not working properly. The circuit is a two-stage CS JFET amplifier, as shown in
Figure 9–46.
(cid:2)FIGURE 9–46 +12 V
A two-stage CS JFET amplifier circuit. R1.25 k(cid:2) C3 R1.55 k(cid:2) C5
Vin C1 Q1 0.1 μF Q2 10 μFVout
0.1 μF
R101 M(cid:2) R2430 (cid:2) C1020 μF R104 M(cid:2) R2460 (cid:2) 1C040 μF
Worked Examples, Related Problems, and Multisim®Exercises Numerous worked-
out examples throughout each chapter illustrate and clarify basic concepts or specific procedures.
Each example ends with a Related Problem that reinforces or expands on the example by
requiring the student to work through a problem similar to the example. Selected examples
feature a Multisim® exercise keyed to a file on the companion website that contains the
circuit illustrated in the example. A typical example with a Related Problem and a
Multisim®exercise are shown in Figure P–3. Answers to Related Problems can be found at
www.pearsonhighered.com/electronics.
(cid:3) FIGURE P–3
A typical example with a related THECOMMON-SOURCEAMPLIFIER (cid:2) 463
problem and Multisim®exercise. TheT hgee nceirraclu ditc i na nFailgyusrise p9r–o1c4eeudsse sa sv ofoltlalogwe-sd uivsiidnegr tbhiea sE t-oM aOcShiFeEveT ac hVaGrSacatberoivstei ct herqeushatoilodn.
(Equation 8–4) to solve for ID.
VGS=aR1R+2R2bVDD
ID=K(VGS-VGS(th))2
VDS=VDD-IDRD
Examples are set off from The voltage gain expression is the same as for the JFET and D-MOSFET circuits. The ac
input resistance is
text. Rin(cid:2)R1||R2||RIN(gate) Equation 9–5
where RIN(gate)=VGS>IGSS.
EXAMPLE 9–8 AVatD cVSo,G maSnmd=o tnh4-e sV oa,uc Vr ocGeuS ta(ptmhu)tp =vliofil2et arV gu,e sa.i nnAgds asgnum mE=e-M t2hO3atS mfFoSEr. T tVh iiissn sp=haorwt2i5cnu milnaV rF .digeuvriec e9,– I1D7(o. nF)in=d 2V0G0S ,m IDA,
(cid:2)FIGURE 9–17 +V1D5D V
Each example contains a 4R.17 M(cid:2) R3.D3 k(cid:2) C2Vout
related problem relevant Vin C1 10 μF
to the example. 0.01 μF 8R220 k(cid:2) R33L k(cid:2)
Solution VGS=aR1R+2R2bVDD=a58.5220MkÆÆb15V=2.23V
For VGS(cid:2) 4 V,
K=(VGSI-D(VonG)S(th))2=(4V200-m2AV)2=50mA>V2
Selected examples include a Therefore,
Multisim®exercise coordinated VRDIDSd===RVKDD(VD7GR-SL-I=DRV3DG.3S(=tkhÆ)1)257=V33(-5k0Æ(m2.=6A5>3VmkA2Æ))((23.2.33kVÆ)-=2V6.)226=V2.65mA
with the Multisim circuit files The ac output voltage is
on the companion website. Related Problem aFnodr tghme E=-M10OV moSuFStE.= FTi AninvdV FViniGgSu=,r eIgD 9m, –RV1dD7VS,i ,nI aD=n(odn( )t2h3=e ma2cS5 o) m(u3tApk uÆatt ) vV(o2Gl5tSamg=eV. 5)V Vi=n, =V1.G72S35(tV hm)V=.1.5 V,
Open the Multisim file E09-08 in the Examples folder on the companion website.
cDaeltceurlmatiende vIaDl,u VesD.S, and Voutusing the specified value of Vin. Compare with the
PREFACE ◆ VII
Application Activity This feature follows the last section in most chapters and is identi-
fied by a special graphic design. A practical application of devices or circuits covered in
the chapter is presented. The student learns how the specific device or circuit is used and is
taken through the steps of design specification, simulation, prototyping, circuit board
implementation, and testing. A typical Application Activity is shown in Figure P–4.
Application Activities are optional. Results are provided in the Online Instructor’s
Resource Manual.
Multisim®
368 (cid:2) POWERAMPLIFIERS 372 (cid:2) POWERAMPLIFIERS
Activity
Application Activity:The Complete PA System
Simulate the audio amplifier using your Multisim software. Observe the operation
with the virtual oscilloscope.
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TEox ebruciilsde sa nfodr tEeslet cat rsoimniicl aDr ecviriccuesit,b gyo D taov Eidx pBeurcimhlean at n7d i nS tyeovuenr lWabe tmtearnliunagl) .(Laboratory in lab
Microphone DC power supply Circuit Board manual
The power amplifier is implemented on a printed circuit board as shown in Figure 7–39.
Speaker Heat sinks are used to provide additional heat dissipation from the power transistors.
9.Check the printed circuit board and verify that it agrees with the schematic in
Figure 7–35. The volume control potentiometer is mounted off the PC board for
Audio preamp Power amplifier 10.eLaasbye al cecaecshs .input and output pin according to function. Locate the single back-
side trace.
(a) PA system block diagram (b) Physical configuration Printed
(cid:3)FIGURE 7–34
The Power Amplifier Circuit Heat sink circuit
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bias. Both a traditional Darlington pair and a complementary Darlington (Sziklai) pair are
used to provide sufficient current to an 8Æspeaker load. The signal from the preamp is
(cid:2)ClaFsIsG AUBR pEo w7e–r3 p5ush-pull amplifier. +15 V
R1 2k(cid:2) Q2N13904
D1 QBD2135
R1510 k(cid:2) DD23Q2N33906 Output (cid:2)PowFIeGr UamRpEl i7fi–e3r 9circuit board. Sarime purlaotviiodnesd
Input Q2N53904 QBD4135 TAFir gpouourwbe le7ers– ah4mo0op.tliinfige rt hcier cPuoitw beora Ardm hpalsi ffiaeirle Bd otahred production test. Test results are shown in for most
R2230 (cid:2) Put1t1in.gB tahsee dS yosnt etmhe Tscoogpeeth deirsplays, list possible faults for the circuit board. Application
The preamp circuit board and the power amplifier circuit board are interconnected and
–15 V tthioem dect epro awree ra sttuapcphleyd (, baast tsehroyw pna cikn) F, migiucrreo 7p–h4o1n.e, speaker, and volume control poten- Activity
12.Verify that the system interconnections are correct.
circuits.
(cid:4) FIGURE P–4
Portion of a typical Application Activity section.
GreenTech Application Inserts These inserts are placed after each of the first six chap-
ters to introduce renewable energy concepts and the application of electronic devices to
solar and wind technologies. Figure P–5illustrates typical GreenTech Application pages.
Chapter End Matter The following pedagogical features are found at the end of most
chapters:
◆ Summary
◆ Key Term Glossary
◆ Key Formulas
◆ True/False Quiz
◆ Circuit-Action Quiz
◆ Self-Test
◆ Basic Problems
◆ Advanced Problems
◆ Datasheet Problems (selected chapters)
◆ Application Activity Problems (many chapters)
◆ Multisim®Troubleshooting Problems (most chapters)
VIII ◆ PREFACE
224 (cid:2) BIPOLARJUNCTIONTRANSISTORS GREENTECHAPPLICATION4 (cid:2) 225
GreenTech Application 4: Solar Power daily east-to-west movement. This is particularly important with concentrating collectors
that need to be oriented correctly to focus the sun on the active region.
Figure GA4–2is an example showing the improvement in energy collection of a typical
In this GreenTech Application, solar tracking is examined. Solar tracking is the process of tracking panel versus a nontracking panel for a flat solar collector. As you can see, track-
moving the solar panel to track the daily movement of the sun and the seasonal changes ing extends the time that a given output can be maintained.
in elevation of the sun in the southern sky. The purpose of a solar tracker is to increase the
ainmcroeuanste o off s 3o0la%r eton e5r0g%y t hina tc coallne cbtee dc oelnleecrgteyd c bayn tbhee rseyasltiezmed. wFoitrh f lsautn-p tarnacekl icnogl lceoctmorpsa,r aend (cid:2)GraFpIhGsU oRf Evo GltAag4e–s2 in tracking and Relative output voltage
to fixed solar panels. nontracking (fixed) solar panels. Tracking
Before looking at methods for tracking, let’s review how the sun moves across the sky. Panel’s rated current
Tpohien tdeadi lnyo mrtoht nioena ro tfh teh elo scuanti ofonl loofw ths et hNe oarrtch oSft aar .c Aircsl eth fer osmea seoansst tcoh wanegset tfhroatm h athse i tws ianxtiesr Nontracking
solstice to the summer solstice, the sun rises a little further to the north each day. Between
tahme osuunmt mofe trh seo nlsotircthe- asnodut thh em wotiinotne rd seoplesntidcse ,o tnh ey osuunr lmocoavteiosn f.urther south each day. The 67891011121234567 Time of day
Single-Axis Solar Tracking
For flat-panel solar collectors, the most economical and generally most practical solution There are several methods of implementing solar tracking. Two main ones are sensor con-
to tracking is to follow the daily east-west motion, and not the annual north-south motion. trolled and timer controlled.
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solar panel and frequently multiple panels. The panels can be oriented horizontally but Figure GA4–3shows the basic idea of a sensor-controlled tracker. Two photodiodes with
still track the east-to-west motion of the sun. Although this does not intercept as much of a light-blocking partition between them are mounted on the same plane as the solar panel.
the sunlight during the seasons, it has less wind loading and is more feasible for long
rows of solar panels. Figure GA4–1(b) shows a solar array that is oriented horizontally
with the axis pointing to true north and uses azimuth tracking (east to west). As you can
see, sunlight will strike the polar-aligned panel more directly during the seasonal movement
of the sun than it will with the horizontal orientation of the azimuth tracker. SUN SUN
Polar North
(North Star) Electric
motor
tpuarnnesl sthe True North Photodiodes Solar panel
West East Lower output Higher output
West
East Posictiiorcnu ciotsntrol
(a) A single-axis polar-aligned tracker (b) Single-axis azimuth tracker
(cid:2)FIGURE GA4–1 Output rotates motor
Types of single-axis solar tracking. ( a ) dOiruetcptulyts foafc itnhge tphheo stoudni.odes are unequal if solar panel is not ( b ) Opauntpelu tosr ioefn tthatei opnh oisto odpitoidmeusm ar.e equal when solar
Siso kmneo wsonl aars t rdaucakli-nagx issy tsrtaecmkisn cgo. mIdbeianlely b, oththe tshoel aarz ipmanuethl sahnodu tlhde a elwleavyatsi ofanc ter adcikreincgtl,y which (cid:3)FIGURE GA4–3
toward the sun so that the sun light rays are perpendicular to the panel. With dual-axis Simplified illustration of a light-sensing control for a solar-tracking system. Relative sizes are exagger-
tracking, the annual north-south motion of the sun can be followed in addition to the ated to demonstrate the concept.
(cid:4) FIGURE P–5
Portion of a typical GreenTech Application.
Suggestions for Using This Textbook
As mentioned, this book covers discrete devices and circuits in Chapters 1through 11 and
linear integrated circuits in Chapters 12 through 17. Chapter 18 introduces programming
concepts for device testing and is linked to Troubleshooting sections.
Option 1 (two terms) Chapters 1 through 11 can be covered in the first term.
Depending on individual preferences and program emphasis, selective coverage may be
necessary.Chapters 12through 17 can be covered in the second term. Again, selective cov-
erage may be necessary.
Option 2 (one term) By omitting certain topics and by maintaining a rigorous schedule,
this book can be used in one-term courses. For example, a course covering only discrete
devices and circuits would use Chapters 1through 11 with, perhaps, some selectivity.
Similarly, a course requiring only linear integrated circuit coverage would use Chapters
12through 17. Another approach is a very selective coverage of discrete devices and circuits
topics followed by a limited coverage of integrated circuits (only op-amps, for example).
Also, elements such as the Multisim exercises, Application Activities, and GreenTech
Applications can be omitted or selectively used.
To the Student
When studying a particular chapter, study one section until you understand it and only then
move on to the next one. Read each section and study the related illustrations carefully; think
about the material; work through each example step-by-step, work its Related Problem and
check the answer; then answer each question in the Section Checkup, and check your
answers. Don’t expect each concept to be completely clear after a single reading; you may
have to read the material two or even three times. Once you think that you understand the ma-
terial, review the chapter summary, key formula list, and key term definitions at the end of the
PREFACE ◆ IX
chapter. Take the true/false quiz, the circuit-action quiz, and the self-test. Finally, work the as-
signed problems at the end of the chapter. Working through these problems is perhaps the
most important way to check and reinforce your comprehension of the chapter. By working
problems, you acquire an additional level of insight and understanding, and develop logical
thinking that reading or classroom lectures alone do not provide.
Generally, you cannot fully understand a concept or procedure by simply watching or
listening to someone else. Only hard work and critical thinking will produce the results
you expect and deserve.
Acknowledgments
Many capable people have contributed to the ninth edition of Electronic Devices. It has
been thoroughly reviewed and checked for both content and accuracy. Those at Prentice
Hall who have contributed greatly to this project throughout the many phases of develop-
ment and production include Rex Davidson, Yvette Schlarman, and Wyatt Morris. Lois
Porter has once more done an outstanding job editing the manuscript. Thanks to Sudip
Sinha at Aptara for his management of the art and text programs. Dave Buchla contributed
extensively to the content of the book, helping to make this edition the best one yet. Gary
Snyder created the circuit files for the Multisim®features in this edition. Gary also wrote
Chapter 18, Basic Programming Concepts for Automated Testing. I wish to express my
appreciation to those already mentioned as well as the reviewers who provided many valu-
able suggestions and constructive criticism that greatly influenced this edition. These
reviewers are William Dolan, Kennebec Valley Community College; John Duncan, Kent
State University; Art Eggers, Community College of Southern Nevada; Paul Garrett, ITT
Technical Institute; Mark Hughes, Cleveland Community College; Lisa Jones, Southwest
Tennessee Community College; Max Rabiee, University of Cincinnati; and Jim Rhodes,
Blue Ridge Community College.
Tom Floyd
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