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Dunsmore, J: Handbook of Microwave Component Measurements PDF

821 Pages·2020·44.451 MB·English
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(cid:2) HANDBOOK OF MICROWAVE COMPONENT MEASUREMENTS (cid:2) (cid:2) (cid:2) (cid:2) HANDBOOK OF MICROWAVE COMPONENT MEASUREMENTS WITH ADVANCED VNA TECHNIQUES Second Edition JoelP.Dunsmore PhD.,Sebastopol,CA,USA (cid:2) (cid:2) (cid:2) (cid:2) Thiseditionfirstpublished2020 ©2020JohnWiley&SonsLtd EditionHistory JohnWileyandSons(1e,2012) Allrightsreserved.Nopartofthispublicationmaybereproduced,storedinaretrievalsystem,ortransmitted,in anyformorbyanymeans,electronic,mechanical,photocopying,recordingorotherwise,exceptaspermittedby law.Adviceonhowtoobtainpermissiontoreusematerialfromthistitleisavailableathttp://www.wiley.com/go/ permissions. TherightofJoelP.Dunsmoretobeidentifiedastheauthorofthisworkhasbeenassertedinaccordancewithlaw. RegisteredOffices JohnWiley&Sons,Inc.,111RiverStreet,Hoboken,NJ07030,USA JohnWiley&SonsLtd,TheAtrium,SouthernGate,Chichester,WestSussex,PO198SQ,UK EditorialOffice TheAtrium,SouthernGate,Chichester,WestSussex,PO198SQ,UK Fordetailsofourglobaleditorialoffices,customerservices,andmoreinformationaboutWileyproductsvisitusat www.wiley.com. Wileyalsopublishesitsbooksinavarietyofelectronicformatsandbyprint-on-demand.Somecontentthat appearsinstandardprintversionsofthisbookmaynotbeavailableinotherformats. LimitofLiability/DisclaimerofWarranty MATLAB®isatrademarkofTheMathWorks,Inc.andisusedwithpermission.TheMathWorksdoesnotwarrant theaccuracyofthetextorexercisesinthisbook.Thiswork’suseordiscussionofMATLAB®softwareorrelated productsdoesnotconstituteendorsementorsponsorshipbyTheMathWorksofaparticularpedagogicalapproach orparticularuseoftheMATLAB®software. (cid:2) Whilethepublisherandauthorshaveusedtheirbesteffortsinpreparingthiswork,theymakenorepresentationsor (cid:2) warrantieswithrespecttotheaccuracyorcompletenessofthecontentsofthisworkandspecificallydisclaimall warranties,includingwithoutlimitationanyimpliedwarrantiesofmerchantabilityorfitnessforaparticular purpose.Nowarrantymaybecreatedorextendedbysalesrepresentatives,writtensalesmaterialsorpromotional statementsforthiswork.Thefactthatanorganization,website,orproductisreferredtointhisworkasacitation and/orpotentialsourceoffurtherinformationdoesnotmeanthatthepublisherandauthorsendorsetheinformation orservicestheorganization,website,orproductmayprovideorrecommendationsitmaymake.Thisworkissold withtheunderstandingthatthepublisherisnotengagedinrenderingprofessionalservices.Theadviceand strategiescontainedhereinmaynotbesuitableforyoursituation.Youshouldconsultwithaspecialistwhere appropriate.Further,readersshouldbeawarethatwebsiteslistedinthisworkmayhavechangedordisappeared betweenwhenthisworkwaswrittenandwhenitisread.Neitherthepublishernorauthorsshallbeliableforany lossofprofitoranyothercommercialdamages,includingbutnotlimitedtospecial,incidental,consequential,or otherdamages. LibraryofCongressCataloging-in-PublicationData Names:Dunsmore,JoelP.,author. Title:Handbookofmicrowavecomponentmeasurements:withadvancedVNAtechniques/JoelP.Dunsmore. Description:Secondedition.|Hoboken,NJ:JohnWiley&Sons,Inc., [2020]|Includesbibliographicalreferencesandindex. Identifiers:LCCN2020003649(print)|LCCN2020003650(ebook)|ISBN 9781119477136(hardback)|ISBN9781119477112(adobepdf)|ISBN9781119477129(epub) Subjects:LCSH:Microwavedevices–Testing. Classification:LCCTK7876.D842020(print)|LCCTK7876(ebook)|DDC621.381/330287–dc23 LCrecordavailableathttps://lccn.loc.gov/2020003649 LCebookrecordavailableathttps://lccn.loc.gov/2020003650 Coverdesign:Wiley Coverimage:CreatedbyJoelDunsmore,©TuomasLehtinen/GettyImages Setin10/12ptTimesLTStdbySPiGlobal,Chennai,India PrintedandboundbyCPIGroup(UK)Ltd,Croydon,CR04YY 10 9 8 7 6 5 4 3 2 1 (cid:2) (cid:2) TomydearwifeDana (cid:2) (cid:2) (cid:2) (cid:2) Contents ForewordtotheSecondEdition xvii ForewordtotheFirstEdition xix PrefacetotheSecondEdition xxi PrefacetotheFirstEdition xxiii AcknowledgmentsfortheSecondEdition xxv AcknowledgmentsfromtheFirstEdition xxvii 1 IntroductiontoMicrowaveMeasurements 1 1.1 ModernMeasurementProcess 2 (cid:2) (cid:2) 1.2 APracticalMeasurementFocus 3 1.3 DefinitionofMicrowaveParameters 3 1.3.1 S-ParameterPrimer 4 1.3.2 PhaseResponseofNetworks 11 1.4 PowerParameters 13 1.4.1 IncidentandReflectedPower 13 1.4.2 AvailablePower 13 1.4.3 DeliveredPower 14 1.4.4 PowerAvailablefromaNetwork 14 1.4.5 AvailableGain 15 1.5 NoiseFigureandNoiseParameters 15 1.5.1 NoiseTemperature 16 1.5.2 EffectiveorExcessInputNoiseTemperature 17 1.5.3 ExcessNoisePowerandOperatingTemperature 17 1.5.4 NoisePowerDensity 17 1.5.5 NoiseParameters 18 1.6 DistortionParameters 19 1.6.1 Harmonics 19 1.6.2 Second-OrderIntercept 19 1.6.3 Two-ToneIntermodulationDistortion 20 1.6.4 AdjacentChannelPowerandAdjacentChannelLevelRatio 23 1.6.5 NoisePowerRatio(NPR) 24 1.6.6 ErrorVectorMagnitude(EVM) 25 (cid:2) (cid:2) viii Contents 1.7 CharacteristicsofMicrowaveComponents 26 1.8 PassiveMicrowaveComponents 27 1.8.1 Cables,Connectors,andTransmissionLines 27 1.8.2 Connectors 31 1.8.3 Non-coaxialTransmissionLines 44 1.9 Filters 47 1.10 DirectionalCouplers 49 1.11 CirculatorsandIsolators 51 1.12 Antennas 52 1.13 PCBoardComponents 53 1.13.1 SMTResistors 53 1.13.2 SMTCapacitors 56 1.13.3 SMTInductors 57 1.13.4 PCBoardVias 57 1.14 ActiveMicrowaveComponents 58 1.14.1 LinearandNon-linear 58 1.14.2 Amplifiers:System,Low-Noise,HighPower 58 1.14.3 MixersandFrequencyConverters 59 1.14.4 FrequencyMultiplierandLimitersandDividers 61 1.14.5 Oscillators 62 1.15 MeasurementInstrumentation 63 1.15.1 PowerMeters 63 1.15.2 SignalSources 64 (cid:2) (cid:2) 1.15.3 SpectrumAnalyzers 65 1.15.4 VectorSignalAnalyzers 66 1.15.5 NoiseFigureAnalyzers 67 1.15.6 NetworkAnalyzers 67 References 70 2 VNAMeasurementSystems 71 2.1 Introduction 71 2.2 VNABlockDiagrams 72 2.2.1 VNASource 73 2.2.2 UnderstandingSource-Match 76 2.2.3 VNATestSet 82 2.2.4 DirectionalDevices 85 2.2.5 VNAReceivers 91 2.2.6 IFandDataProcessing 95 2.2.7 MultiportVNAs 97 2.2.8 High-PowerTestSystems 104 2.2.9 VNAwithmm-WaveExtenders 105 2.3 VNAMeasurementofLinearMicrowaveParameters 107 2.3.1 MeasurementLimitationsoftheVNA 107 2.3.2 LimitationsDuetoExternalComponents 111 2.4 MeasurementsDerivedfromS-Parameters 112 2.4.1 TheSmithChart 112 2.4.2 TransformingS-ParameterstoOtherImpedances 117 (cid:2) (cid:2) Contents ix 2.4.3 ConcatenatingCircuitsandT-Parameters 118 2.5 ModelingCircuitsUsingYandZConversion 120 2.5.1 ReflectionConversion 120 2.5.2 TransmissionConversion 120 2.6 OtherLinearParameters 121 2.6.1 Z-Parameters,orOpen-CircuitImpedanceParameters 122 2.6.2 Y-Parameters,orShort-CircuitAdmittanceParameters 123 2.6.3 ABCDParameters 124 2.6.4 H-ParametersorHybridParameters 125 2.6.5 ComplexConversionsandNon-equalReferenceImpedances 126 References 126 3 CalibrationandVectorErrorCorrection 127 3.1 Introduction 127 3.1.1 ErrorCorrectionandLinearMeasurementMethodsforS-Parameters 128 3.1.2 PowerMeasurementswithaVNA 131 3.2 BasicErrorCorrectionforS-Parameters:Cal-Application 134 3.2.1 12-TermErrorModel 134 3.2.2 1-PortErrorModel 136 3.2.3 8-TermErrorModel 136 3.3 DeterminingErrorTerms:Cal-Acquisitionfor12-TermModels 139 3.3.1 1-PortErrorTerms 139 3.3.2 1-PortStandards 141 (cid:2) (cid:2) 3.3.3 2-PortErrorTerms 148 3.3.4 12-Termto11-TermErrorModel 153 3.4 DeterminingErrorTerms:Cal-Acquisitionfor8-TermModels 153 3.4.1 TRLStandardsandRawMeasurements 153 3.4.2 SpecialCasesforTRLCalibration 157 3.4.3 UnknownThruorSOLR(ReciprocalThruCalibration) 158 3.4.4 ApplicationsofUnknownThruCalibrations 159 3.4.5 QSOLTCalibration 161 3.4.6 ElectronicCalibration(ECal™)orAutomaticCalibration 162 3.5 WaveguideCalibrations 166 3.6 CalibrationforSourcePower 167 3.6.1 CalibratingSourcePowerforSourceFrequency Response 168 3.6.2 CalibrationforPowerSensorMismatch 169 3.6.3 CalibrationforSourcePowerLinearity 171 3.7 CalibrationforReceiverPower 173 3.7.1 SomeHistoricalPerspective 173 3.7.2 ModernReceiverPowerCalibration 173 3.7.3 ResponseCorrectionfortheTransmissionTestReceiver 178 3.7.4 PowerWavesvs.ActualWaves 181 3.8 CalibratingMultipleChannelsSimultaneously:CalAll 182 3.9 MultiportCalibrationStrategies 186 3.9.1 N×2-PortCalibrations:SwitchingTestSets 186 3.9.2 N-portCalibration:TrueMultiport 188 (cid:2) (cid:2) x Contents 3.10 AutomaticIn-SituCalibrations:CalPod 191 3.10.1 CalPodInitializationandRecorrection 192 3.10.2 CalPod-as-Ecal 194 3.11 DevolvedCalibrations 194 3.11.1 ResponseCalibrations 195 3.11.2 EnhancedResponseCalibration 196 3.12 DeterminingResidualErrors 199 3.12.1 ReflectionErrors 199 3.12.2 UsingAirlinestoDetermineResidualErrors 199 3.13 ComputingMeasurementUncertainties 210 3.13.1 UncertaintyinReflectionMeasurements 210 3.13.2 UncertaintyinSourcePower 211 3.13.3 UncertaintyinMeasuringPower(ReceiverUncertainty) 212 3.14 S21orTransmissionUncertainty 212 3.14.1 GeneralUncertaintyEquationforS21 214 3.14.2 DynamicUncertaintyComputation 215 3.15 ErrorsinPhase 218 3.16 PracticalCalibrationLimitations 219 3.16.1 CableFlexure 220 3.16.2 ChangingPowerafterCalibration 221 3.16.3 CompensatingforChangesinStepAttenuators 223 3.16.4 ConnectorRepeatability 225 (cid:2) 3.16.5 NoiseEffects 226 (cid:2) 3.16.6 Drift:Short-TermandLong-Term 227 3.16.7 InterpolationofErrorTerms 229 3.16.8 CalibrationQuality:Electronicvs.MechanicalKits 231 Reference 232 4 Time-DomainTransforms 235 4.1 Introduction 235 4.2 TheFourierTransform 236 4.2.1 TheContinuousFourierTransform 236 4.2.2 EvenandOddFunctionsandtheFourierTransform 236 4.2.3 Modulation(Shift)Theorem 237 4.3 TheDiscreteFourierTransform 238 4.3.1 FastFourierTransform(FFT)andInverseFastFourierTransform (IFFT) 238 4.3.2 DiscreteFourierTransforms 240 4.4 FourierTransform(Analytic)vs.VNATimeDomainTransform 240 4.4.1 DefiningtheFourierTransform 241 4.4.2 EffectsofDiscreteSampling 242 4.4.3 EffectsofTruncatedFrequency 244 4.4.4 WindowingtoReduceEffectsofTruncation 246 4.4.5 ScalingandRenormalization 248 (cid:2) (cid:2) Contents xi 4.5 Low-PassTransforms 248 4.5.1 Low-PassImpulseMode 248 4.5.2 DCExtrapolation 249 4.5.3 Low-PassStepMode 249 4.5.4 Band-PassMode 251 4.6 Time-DomainGating 252 4.6.1 GatingLossandRenormalization 253 4.7 ExamplesofTime-DomainTransformsofVariousNetworks 256 4.7.1 Time-DomainResponseofChangesinLineImpedance 256 4.7.2 Time-DomainResponseofDiscreteDiscontinuities 257 4.7.3 Time-DomainResponsesofVariousCircuits 257 4.8 TheEffectsofMaskingandGatingonMeasurementAccuracy 259 4.8.1 CompensationforChangesinLineImpedance 259 4.8.2 CompensationforDiscreteDiscontinuities 260 4.8.3 Time-DomainGating 260 4.8.4 EstimatinganUncertaintyDuetoMasking 265 4.9 Time-DomainTransmissionUsingVNA 265 4.10 Conclusions 269 References 269 5 MeasuringLinearPassiveDevices 271 5.1 TransmissionLines,Cables,andConnectors 271 5.1.1 CalibrationforLowLossDeviceswithConnectors 271 (cid:2) (cid:2) 5.1.2 MeasuringElectricallyLongDevices 273 5.1.3 AttenuationMeasurements 278 5.1.4 ReturnLossMeasurements 295 5.1.5 CableLengthandDelay 305 5.2 FiltersandFilterMeasurements 306 5.2.1 FilterClassesandDifficulties 306 5.2.2 DuplexerandDiplexers 307 5.2.3 MeasuringTunableHigh-PerformanceFilters 308 5.2.4 MeasuringTransmissionResponse 310 5.2.5 HighSpeedvs.DynamicRange 315 5.2.6 ExtremelyHighDynamicRangeMeasurements 317 5.2.7 CalibrationConsiderations 326 5.3 MultiportDevices 327 5.3.1 DifferentialCablesandLines 328 5.3.2 Couplers 328 5.3.3 Hybrids,Splitters,andDividers 331 5.3.4 CirculatorsandIsolators 334 5.4 Resonators 336 5.4.1 ResonatorResponsesonaSmithChart 336 5.5 AntennaMeasurements 338 5.6 Conclusions 340 References 341 (cid:2)

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