Atomic Force Microscopy in Adhesion Studies

714 Pages·2005·41.07 MB·English

by  Drelich

ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES
Edited by
JAROSLAW DRELICH and KASH L. MITTAL
VSP
Leiden Boston
e
2005
0 Copyright 2005 by Koninklijke Brill NV, Leiden, The Netherlands.
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ISBN 90 6764 434 X
Printed in the Netherlands by Ridderprint bv, Ridderkerk
Atomic Force Microscopy in Adhesion Studies, pp. ix-x
Eds J. Drelich and K.L. Mittal, VSP, Leiden-Boston 2005
Preface
In recent years, atomic force microscopy (AFM) has become a technique of choice
for non-destructive solid surface imaging and characterization with an atomic
resolution. It is also the instrument that is commonly used in measurements of
long-range and short-range surface forces for microscopic particles and nano-sized
probes. With the AFM instrument, and other techniques classified under scanning
probe microscopy, we are now capable of exploring the adhesion properties of
materials from microscopic scale down to molecular level, which are required for
developing micro-systems and nano-devices (where gravity does not matter and
behaviour of systems is controlled by interactions between surfaces in contact or
separated by only a few nanometers). The AFM has become established, therefore,
as a problem-solving tool in the development of microsystems and nanotechnology.
It has also become one of the basic analytical tools in applications relevant to
particle-solid and particle-liquid interactions. It can deliver data on colloidal and
molecular forces as well as local properties of materials that stimulate development
of new and improved technologies in selective flotation of minerals, recovery of
polymers from plastic waste, deinking of recycled paper, recovery of oil from
mined oil sands, cleaning electronic materials from nanoparticles, design of new
nanocomposites, fabrication of novel biosensors, and others.
This book provides a comprehensive review of AFM techniques and their appli-
cation in adhesion studies. Over 100 authors have contributed to this book, and
they provide a summary of current research on measurements and interpretation of
particle-solid adhesion, capillary and molecular forces, solid surface imaging and
mapping, and measurements of mechanical properties of materials at nanoscale.
Also in this book, the contact mechanics models applicable to particle-substrate and
particle-particle systems are discussed extensively. The process of compiling the
technical papers presented in this book was inititated by us in the year 2000 during
the preparation of a special issue of the Journal of Adhesion Science and Technology
(JAST) on ‘Application of Scanning Probe Microscopy in Interfacial Phenomena’
(Vol. 14, No. 14). As we recognized that even with the present telecommunications
revolution, it took time and effort to collect the published research articles on adhe-
sion studies with the AFM technique, given their spread among numerous journals
- not always easily accessible to many researchers - so we decided to compile
information on this topic in an easily accessible source and this book is the result.
The availability of focussed scientific information into a few accessible resources
becomes attractive and gratifying to many researchers. The positive response that
X Preface
we received from the readers of the first special issue of JAST motivated us to pre-
pare and edit two other issues of this journal (Vol. 16, No. 7,2 002 and Vol. 19,
No. 3-5, 2005) dedicated to the same topic. We have also noticed an increased sub-
mission of manuscripts on the use of the AFM technique and contact mechanics
studies to JAST in the last five years, and concomitantly, several interesting techni-
cal reports have been published in regular JAST issues.
In this single volume, we offer all the papers that were published in JAST on
AFM and contact mechanics studies during 2000-May 2005. This includes 30
papers published in the three special issues dedicated to ‘Application of Scanning
Probe Microscopy in Interfacial Phenomena’ and 12 published in regular JAST
issues. A few errors that appeared in some of the original papers have been
corrected in this book. All these peer-reviewed papers, written by internationally-
renowned researchers, have been arranged according to the following topics:
Adhesion Force Measurements, Chemical Origins of Adhesion, Roughness Effects
in Adhesion Force Measurements, Capillary Adhesion and Wetting Phenomena,
Measurements of Colloidal Forces, Adhesion Mapping and Surface Imaging, and
Examination of Interphases and Nano-indentation. This book not only highlights
the current progress made in applications of the AFM techniques in adhesion
studies and characterization and mapping of solid surfaces, but also provides useful
guidelines for experimental methodologies used in measurements of adhesion,
molecular, colloidal and capillary forces. Applicability of theoretical models in the
interpretation of recorded forces as well as the controversy surrounding the selection
of models in the analysis of the AFM results are also emphasized in this book.
We hope this book will serve as a reference for both new and current users of the
scanning probe microscopes, particularly those who are engaged in exploring both
fundamental and practical aspects of adhesion phenomena. To our knowledge, this
is the first book exclusively dedicated to this important and burgeoning topic.
This book could not materialize without contributions from the authors of
included papers, time and effort that reviewers dedicated to the manuscripts during
the review process, and help received from the publisher. We thank them all!
JAROSLAW DRELICH and KASH L. MITTAL
June 2005
Contents
Preface
J. Drelich and K. L. Mittal ix
Adhesion Force Measurements
Application of atomic force spectroscopy (AFS) to studies of adhesion
phenomena: a review
E L. Leite and l? S. l? Herrmann 3
Interaction force measurements using atomic force microscopy
for characterization and control of adhesion, dispersion and lubrication
in particulate systems
M. S. Esayanul; S. B. Yeruva, I: I. Rabinovich and B. M. Moudgil 45
Comparison of various adhesion contact theories and the influence
of dimensionless load parameter
X.S hi and K-l? Zhao 61
Accounting for the JKR-DMT transition in adhesion and friction measurements
with atomic force microscopy
D. S. Grierson, E. E. Flater and R. W Carpick 75
Frictio!i, adhesion, and deformation: dynamic measurements with the atomic
force microscope
P. Attard 97
Direct adhesion measurements of pharmaceutical particles to gelatin capsule
surfaces
I: H.I brahim, T R. Burk, E M. Etzler and R. D. Neuman 137
Analysis of atomic force microscopy data for deformable materials
M. W Rutland, J. W G. Tyrrell and P. Attard 155
Dynamic adhesion of grafted polymer surfaces as studied by surface force
measurements
M. A. Plunkett and M. W Rutland 173
Chemical Origins of Adhesion
Chemical force microscopy: probing chemical origin of interfacial forces
and adhesion
D. K Vezenov, A. Noy and l? Ashby 189
Pull-off forces measured between hexadecanethiol self-assembled monolayers
in air using an atomic force microscope: analysis of surface free energy
E. R. Beach, G. W Tormoen and J. Drelich 24 1
vi Contents
Adhesion forces between functionalized probes and hydrophilic silica surfaces
D. Christendat, l? Abraham, Z. Xu and J. Masliyah 265
Analysis of atomic force microscope pull-off forces for gold surfaces portraying
nanoscale roughness and specific chemical functionality
G. W Tormoen, J. Drelich and E. R. Beach, III 28 1
A study of adhesion forces by atomic force microscopy
C. Jacquot and J. Takadoum 299
Roughness Effects in Adhesion Force Measurements
Microparticle adhesion studies by atomic force microscopy
L. H. G. J. Segeren, B. Siebum, F: G. Karssenberg, J. W A. van den Berg
and G. J. Vancso 309
A distribution of AFM pull-off forces for glass microspheres on a symmetrically
structured rough surface
G. W Tormoen, J. Drelich and J. Nalaskowski 345
Experimental analysis of the influence of surface topography on the adhesion
force as measured by an AFM
A. Mkndez-Vilas, M. L. Gonza'lez-Martfn, L. Labajos-Broncano and M. J. Nuevo 365
Adhesion forces between individual gold and polystyrene particles
L. 0. Heim, S. Ecke, M. Preuss and H.-J. Butt 377
Adhesion of carbonyl iron powder particles studied by atomic force microscopy
L. Heim, M. Farshchi, M. Morgeneyel; J. Schwedes, H.-J. Butt and M. Kappl 393
Adhesion of rough surfaces with plastic deformation
L. Zhang and Z-P Zhao 409
Deformation of soft colloidal probes during AFM pull-off force measurements:
elimination of nano-roughness effects
G. W Tormoen and J. Drelich 425
Capillary Adhesion and Wetting Phenomena
Role of surface roughness in capillary adhesion
A. Ata, E I. Rabinovich and R. K. Singh 445
Direct measurements of the adhesion between a glass particle and a glass
surface in a humid atmosphere
S. Biggs, R. G. Cain, R. R. Dagastine and N. W Page 455
Measurement of oil-mediated particle adhesion to a silica substrate by atomic
force microscopy
Z I. Rabinovich, M. S. Esayanul; K. D. Johanson, J. J. Adler and B. M. Moudgil 473
Effect of relative humidity on adhesion and frictional properties of micro- and
nano-scopic contacts
A. A. Feilel; f? Jenkins and M. W Rutland 49 1
Contents vii
Scanning force microscopy investigation of liquid structures and its application
to fundamental wetting research
S. Herminghaus, 7: Pompe and A. Fey 507
Contact angles on hydrophobic microparticles at water-air
and water-hexadecane interfaces
G. E. Yakubov, 0. I. Vinogradova and H.-J. Butt 523
Capillarity at the nanoscale: an AFM view
E Mugele, i? Beckel; R. Nikopoulos, M. Kohonen and S. Herminghaus 54 1
Measurements of Colloidal Forces
Surface forces between sphalerite and silica particles in aqueous solutions
Z. Xu, R. Chi, 7: Difeo and J. A. Finch 557
Long-range attractive forces and energy barriers in de-inking flotation: AFM
studies of interactions between polyethylene and toner
J. Drelich, J. Nalaskowski, A. Gosiewska, E. Beach and J. D. Miller 573
Surface forces and characterization of glass surfaces bearing grafted polymers:
solvent dependence
M. A. Plunkett, S. Rodnel; L. Bergstrom and M. II? Rutland 589
Adhesion Mapping and Surface Imaging
Design of a digitally controlled adhesion imaging mode using a scanning force
microscope
Z Zhang, A. Pungol; G. Jogikalmath and V Hlady 609
Mapping of adhesion forces on soil minerals in air and water by atomic force
spectroscopy (AFS)
I;: L. Leite, A. Rid, JI: and I? S. R Herrmann 625
The investigation of sized cellulose surfaces with scanning probe microscopy
techniques
L. E. Dickson and J. C. Berg 64 1
Atomic force microscopy, X-ray diffraction, X-ray photoelectron spectroscopy
and thermal studies of the new melamine fiber
R. S. Rajeev, S. K. De, A. K. Bhowmick, B. Gong and S. Bandyopadhyay 657
Morphology and elasticity of waterborne acrylic pressure-sensitive adhesives
investigated with atomic force microscopy
J. Malldgol, 0. Dupont and J. L. Keddie 679
Relating material surface heterogeneity to protein adsorption: the effect
of annealing of micro-contact-printed OTS patterns
G. Hodgkinson and V Hlady 697
...
Vlll Contents
Examination of Interphases and Nano-Indentation
Determining the interphase thickness and properties in polymer matrix
composites using phase imaging atomic force microscopy and nanoindentation
7: D. Downing, R. Kumal; W M. Cross, L. Kjerengtroen and J. J. Kellar 721
Use of an atomic force microscope to measure surface deformations
in polymeric systems
M. C. Roggemann and J. G. Williams 733
Studies of the interphase in epoxy -aluminum joints using nano-indentation
and atomic force microscopy
F: Li, J. G. Williams, B. S. Altan, I. Miskioglu and R. L. Whipple 749
Interphase variation in silane-treated glass-fiber-reinforced epoxy composites
C. Griswold, W M. Cross, L. Kjerengtroen and J. J. Kellar 765
Characterization of the interphase in epoxy/aluminum bonds using atomic force
microscopy and a nano-indenter
J. G. Williams, F: Li and I. Miskioglu 777
Stiffness and adhesion characterization of nanolithographed poly(methy1
methacrylate) by means of force-displacement curves
B. Cappella, H. Sturm and E. Schulz 799
Adhesion Force Measurements
Atomic Force Microscopy in Adhesion Studies, pp. 3-43
Eds J. Drelich and K.L. Mittal, VSP, Leiden-Boston 2005
Application of atomic force spectroscopy (AFS) to studies
of adhesion phenomena: a review
E L. LEITE 1.2 and P. S. P. HERRMANN ',*
Embrapa Agricultural Instrumentation, Rua XV de Novembro 1452, CEP 13560-970, Sdo Carlos,
Sdo Paulo, Brazil
Institute of Physics of Sdo Carlos, University of Sdo Paul0 (USP), CEP 13560-970, Sdo Carlos,
Sdo Paulo, Brazil
Abstract-This review article describes the fundamental principles of atomic force spectroscopy
(AFS) and how this technique became a useful tool to investigate adhesion forces. AFS is a technique
derived from atomic force microscopy (AFM) and can determine, at every location of the sample
surface, the dependence of the interaction on the probe-sample distance. AFS provides valuable
information, at the nano-scale, such as, for example: (i) how the magnitude of the adhesion force
depends on long- and short-range interactions and (ii) the tip-sample contact area. An overview
about the theory and experiments with local force spectroscopy, force imaging spectroscopy, chemical
force microscopy and colloidal probe technique is presented. The many applications of the AFS
technique for probing surface interactions open up new possibilities to evaluate adhesion, an important
characteristic of materials.
Keywords: Atomic force spectroscopy; adhesion phenomena; surface properties; atomic force
microscopy; interfacial phenomena.
1. INTRODUCTION
In 1980-1981 Binnig and co-workers at the IBM Zurich Research Laboratory
developed a new type of microscope which they called the scanning tunneling
microscope (STM) [l],b eing the first one in the scanning probe microscopy (SPM)
family, that allowed visualization of surfaces on an atomic scale. Although the STM
technique is limited to electrically conducting samples, it led to the development of
numerous devices that utilize a range of physico-chemical interactions between a
tip and sample surface. Equally important, this family of techniques includes one
*To whom correspondence should be addressed. Tel.: [phone]. Fax: [phone].
E-mail: [email protected]