Applied Surface Science 1996: Vol 103 Index

18 Pages·1996·4.5 MB·English

applied
surface science
ELSEVIER Applied Surface Science 103 (1996) 535-539
Author index
Aarik, J., K. Kukli, A. Aidla and L. Pung, Bukharaev, A.A., V.M. Janduganov, E.A.
Mechanisms of suboxide growth and Samarsky and N.V. Berdunov, Atomic
etching in atomic layer deposition of force microscopy of laser induced sub-
tantalum oxide from TaCl; and H,O 103 (1996) 331 micrometer periodic structures on im-
Aidla, A., see Aarik, J. 103 (1996) 331 planted fused silica and silicon 103 (1996) 49
Ajithprasad, K.C., V.P.N. Nampoori and Bullemer, B., see Kulakov, M.A. 103 (1996) 443
C.P.G. Vallabhan, Photoemission opto-
galvanic studies with copper as target Chang, S.-L., see Jenks, C.J. 103 (1996) 485
electrode 103 (1996) 465 Chen, H.Y., see Lin, J. 103 (1996) 307
Allen, W.R., see Park, J.W. 103 (1996) 39 Chen, L., see Lin, J. 103 (1996) 307
Allwood, D.A., LK. Perera, J. Perkins, P.E. Chen, X.G., Y. Yang, Z.G. Lin, W. Chu,
Dyer and G.A. Oldershaw, Preparation Y.X. Shi and B.M. Wei, Investigations
of ‘near’ homogeneous samples for the of the pitting corrosion behavior of pas-
analysis of matrix-assisted laser desorp- sive film on REBAR electrodes contain-
tion /ionisation processes 103 (1996) 231 ing ‘artificial pit’ in simulated cement
Aoyagi, Y., see Lee, J.-S. 103 (1996) 275 solutions 103 (1996) 189
Ashiru, O.A. and J. Shirokoff, Electrodepo- Chen, Y., see Xia, W.S. 103 (1996) 1
sition and characterization of tin—zinc Choi, J.I., see Han, M.S. 103 (1996) 183
alloy coatings 103 (1996) 159 Chu, W., see Chen, X.G. 103 (1996) 189
Atanassova, E. and A. Paskaleva, Influence Collaud Coen, M., G. Dietler, S. Kasas and
of the rapid thermal annealing in vac- P. Groning, AFM measurements of the
uum on the XPS characteristics of thin topography and the roughness of ECR
SiO, 103 (1996) 359 plasma treated polypropylene 103 (1996) 27
Auriel, C., see Martinez, H. 103 (1996) 149 Collaud-Coen, M., see Groning, P. 103 (1996) 79
Cui, Y.D., see Lu, H. 103 (1996) 113
Bao, C.L., see Lu, H. 103 (1996) 113
Barwinski, B. and S. Sendecki, The charge Davydov, A.A., see Pestryakov, A.N. 103 (1996) 479
transfer between metal and an adsorbed De Benyacar, M.A.R., see Pregliasco, R.G. 103 (1996) 261
atom observed by means of a scanning Delaney, D.W., see Jenks, C.J. 103 (1996) 485
field emission microscope (SFEM) 103 (1996) 525 Dieckhoff, S., V. Schlett, W. Possart, O.-D.
Bastl, Z., see Stejskalova, K. 103 (1996) 509 Hennemann, J. Giinster and V. Kempter,
Battistoni, C., E. Bemporad, A. Galdikas, S. Characterization of triazine derivatives
Kaéiulis, G. Mattogno, S. Mickevicius on silicon wafers studied by photo-
and V. Olevano, Interaction of mercury electron spectroscopy (XPS, UPS) and
vapour with thin films of gold 103 (19961)0 7 metastable impact electron spectroscopy
Beak, J.H., see Han, M.S. 103 (19961)8 3 (MIES) 103 (19962)2 1
Bemporad, E., see Battistoni, C. 103 (19961)0 7 Dieckhoff, S., see Giinster, J. 103 (19963)5 1
Berdunov, N.V., see Bukharaev, A.A. 103 (1996) 49 Dietler, G., see Collaud Coen, M. 103 (1996) 27
Betz, G., see Seifert, N. 103 (1996) 63 Dorigoni, C., see Laidani, N. 103 (19963)1 5
Bhattacharya, A.K., see Werrett, C.R. 103 (19964)0 3 Dyachenko, T.A., see Kamuz, A.M. 103 (19961)4 1
Bloomer, T.E., see Jenks, C.J. 103 (19964)8 5 Dyer, P.E., see Allwood, D.A. 103 (19962)3 1
Borchardt, G., see Jedlifski, J. 103 (19962)0 5
Borschak, V.A., see Vassilevski, D.L. 103 (19963)8 3 Eisele, I., see Kulakov, M.A. 103 (1996) 443
Bronfin, M., see Jedlifski, J. 103 (19962)0 5 Elmiger, J.R. and M. Kunst, Investigation
Bruque, J.M., see Gonzalez-Martin, M.L. 103 (19963)9 5 of the silicon-plasma silicon nitride in-
536 Author index
terface with in situ transient photocon- Huck, H., see Pregliasco, R.G. 103 (1996) 261
ductivity measurements 103 (1996) 11 Husinsky, W., see Seifert, N. 103 (1996) 63
Erjavec, B., Activation of the Na,KSb Hiittner, B. and G. Rohr, On the theory of
photocathode with Cs and O, at low- ps and sub-ps laser pulse interaction with
ered temperatures 103 (1996) 343 metals. I. Surface temperature 103 (1996) 269
Fan, Y., see Xia, W.S. 103 (1996) 1 Inoue, H., see Kosaka, T. 103 (1996) 55
Feng, K., see Hu, X. 103 (1996) 101 Inoue, H., see Suzuki, S. 103 (1996) 495
Flipse, C.F.J., see Partridge, A. 103 (1996) 127 Isshiki, H., see Lee, J.-S. 103 (1996) 275
Franco, G., see Takakuwa, C. 103 (1996) 255 Isshiki, M., see Suzuki, S. 103 (1996) 495
Iwai, S., see Lee, J.-S. 103 (1996) 275
Galdikas, A., see Battistoni, C. 103 (1996) 107
Galdikas, A., L. Pranevicius and C. Tem- Jancezuk, B., see Gonzalez-Martin, M.L. 103 (1996) 395
plier, Sputtering induced roughening ef- Janduganov, V.M., see Bukharaev, A.A. 103 (1996) 49
fects on ion beam profiling of multilay- Jedlifski, J., A. Glazkov, M. Konopka, G.
ers 103 (1996) 471 Borchardt, E. Tscherkasova, M. Bronfin
Glazkov, A., see Jedlinski, J. 103 (1996) 205 and M. Nocuh, An XPS/SEM/EDX
Goepel, W., see Xu, W.-X. 103 (1996) 279 study of the early oxidation stages of the
Gonzalez-Caballero, F., see Gonzalez- Fe—19Cr—S5AI(+ Y) alumina-forming al-
Martin, M.L. 103 (1996) 395 loys 103 (1996) 205
Gonzalez-Martin, M.L., J.M. Bruque, F. Jenks, C.J., D.W. Delaney, T.E. Bloomer,
Gonzalez-Caballero, R. Perea-Carpio S.-L. Chang, T.A. Lograsso, Z. Shen,
and B. Jahezuk, The mechanism of ad- C.-M. Zhang and P.A. Thiel, Prepara-
sorption of sodium dodecylsulfonate on tion of well-defined samples of AIPdMn
fluorite and its surface free energy 103 (1996) 395 quasicrystals for surface studies 103 (1996) 485
Groning, P., see Collaud Coen, M. 103 (1996) 27 Jiang, Y.S., see Xia, W.S. 103 (1996) |
Groning, P., M. Collaud-Coen, O.M. Kiittel Jones, K.S., see Herner, S.B. 103 (1996) 377
and L. Schlapbach, Influence of gas
pressure on the plasma reaction on KaCiulis, S., see Battistoni, C. 103 (1996) 107
polyethersulphone 103 (1996) 79 Kamuz, .A.M., P.F. Oleksenko, E.Yu.
Giinster, J., see Dieckhoff, S. 103 (19962)2 1 Ovsyannikov, F.F. Sizov and T.A. Dy-
Giinster, J.. D. Ochs, S. Dieckhoff and V. achenko, Low-temperature photo-
Kempter, The analysis of surface-ad- hydro-modification of II-VI and IIl-—V
sorbed organic molecules by alkali-as- semiconductors 103 (1996) 141
sisted MIES combined with UPS(He I) 103 (19963)5 1 Kaneda, Y., see Nakata, S. 103 (1996) 369
Kang, T.W., see Han, M.S. 103 (1996) 183
Halac, E.B., see Pregliasco, R.G. 103 (1996) 261 Kanski, J., see Peto, G. 103 (19964)5 9
Han, M.S., J.H. Beak, Y.T. Oh, T.W. Kang, Kasas, S., see Collaud Coen, M. 103 (1996) 27
T.W. Kim and J.I. Choi, The behavior Kato, Y., see Nakata, S. 103 (1996) 369
of the surface charge density in Kempter, V., see Dieckhoff, S. 103 (1996) 221
Hg ,Cd,_,Te epilayers due to hydro- Kempter, V., see Giinster, J. 103 (1996) 351
genation and annealing 103 (1996) 183 Kim, T.W., see Han, M.S. 103 (1996) 183
Hatanaka, T., see Takakuwa, C. 103 (1996) 255 Konopka, M., see Jedlifski, J. 103 (1996) 205
Hennemann, O.-D., see Dieckhoff, S. 103 (19962)2 1 Kosaka, T., see Suzuki, S. 103 (19964)9 5
Herner, S.B., V. Krishnamoorthy and K.S. Kosaka, T., S. Suzuki, H. Inoue, M. Saito,
Jones, Point defect—dislocation loop be- Y. Waseda and E. Matsubara,
havior in Si with a TiSi, film 103 (1996) 377 XPS /GIXS studies of thin oxide films
Hirokawa, K., see Tsuji, K. 103 (1996) 451 formed on Fe—Cr alloys 103 (1996) 55
Hozumi, A. and O. Takai, Effect of hydrol- Krasser, W., see Petersen, P. 103 (1996) 91
ysis groups in fluoro-alkyl silanes on Krishnamoorthy, V., see Herner, S.B. 103 (1996) 377
water repellency of transparent two-layer Kukli, K., see Aarik, J. 103 (19963)3 1
hard-coatings 103 (19964)3 1 Kulakov, M.A., Z. Zhang, A.V. Zotov, B.
Hu, X., K. Feng, Z. Lin and Y. Xing, Bullemer and I. Eisele, Structure of the
Hydrogen adsorption induced surface re- B/Si(100) surface at low boron cover-
constructions on Si(113) studied by age studied by scanning tunnelling mi-
LEED 103 (1996) 101 croscopy 103 (1996) 443
Hu, X., E.G. Wang and Y. Xing, A surface Kunst, M., see Elmiger, J.R. 103 (1996) 11
structure model for Si(337) 103 (19962)1 7 Kiittel, O.M., see Groning, P. 103 (1996) 79
Author index 537
Laidani, N., C. Dorigoni and A. Miotello, Nampoori, V.P.N., see Ajithprasad, K.C. 103 (1996) 465
N*-implantation induced enhanced ad- Nishiyama, I. and F. Uesugi, Photon energ
hesion in WC,_ ,/Ti-6Al-4V 103 (19963)1 5 dependence of synchrotron radiation in-
Lascovich, J.C. and A. Santoni, Study of duced growth suppression and initiation
the occupied electronic density of states in Al chemical vapor deposition. II. Sur-
of carbon samples by using second face analysis by Auger electron spec-
derivative carbon KVV Auger spectra 103 (1996) 245 troscopy 103 (1996) 299
Lee, J.-S., S. Iwai, H. Isshiki, T. Meguro, T. Nocun, M., see Jedlifiski, J. 103 (1996) 205
Sugano and Y. Aoyagi, Self limiting
growth on nominally oriented (111)A Ochs, D., see Giinster, J. 103 (19963)5 1
GaAs substrates in atomic layer epitaxy 103 (1996) 275 Oh, Y.T., see Han, M.S. 103 (19961)8 3
Lennard, W.N., see Rodriguez-Fernandez, Oldershaw, G.A., see Allwood, D.A. 103 (19962)3 1
ie 103 (1996) 289 Oleksenko, P.F., see Kamuz, A.M. 103 (19961)4 1
Lewowski, T., H. Otop and P. Wieczorek, Olevano, V., see Battistoni, C. 103 (19961)0 7
Surfactant induced growth of thin gal- Otop, H., see Lewowski, T. 103 (1996) 35
lium films on an insulating (sapphire) Ovsyannikov, E.Yu., see Kamuz, A.M. 103 (19961)4 1
substrate 103 (1996) 35
Li, Y.S., K.C. Wong, P.C. Wong and K.A.R. Park, J.W., A.J. Pedraza and W.R. Allen,
Mitchell, XPS investigations of the reac- The interface between sputter-deposited
tivities of oxidized Zr/Nb_ interfaces gold thin films and ion-bombarded sap-
formed by deposition on a gold sub- phire substrates 103 (1996) 39
strate 103 (19963)8 9 Partridge, A., S.L.G. Toussaint and C.F.J.
Licciardello, A., see Scandurra, A. 103 (1996) 19 Flipse, An AFM investigation of the
Lin, J.. H.Y. Chen, L. Chen, K.L. Tan and deposition of nanometer-sized rhodium
H.C. Zeng, N,O decomposition over and copper clusters by spin coating 103 (1996) 127
ZrO, — an in-situ DRIFT, TPR, TPD Paskaleva, A., see Atanassova, E. 103 (1996) 359
and XPS study 103 (1996) 307 Pedraza, A.J., see Park, J.W. 103 (1996) 39
Lin, Z., see Hu, X. 103 (1996) 101 Pei, Z.-F. and V. Ponec, On the intermedi-
Lin, Z.G., see Chen, X.G. 103 (1996) 189 ates of the acetic acid reactions on ox-
Lippert, E., see Stejskalova, K. 103 (1996) 509 ides: an IR study 103 (1996) 171
Liu Juzheng, see Yuan Chunbo 103 (1996) 531 Perea-Carpio, R., see Gonzalez-Martin,
Lograsso, T.A., see Jenks, C.J. 103 (1996) 485 M.L. 103 (19963)9 5
Loudet, M., see Martinez, H. 103 (1996) 149 Perera, I.K., see Allwood, D.A. 103 (1996) 231
Lu, H., Y.D. Cui, J. Qin, C.L. Bao and D.H. Perkins, J., see Allwood, D.A. 103 (1996) 231
Shen, Auger electron depth profiling of Pestryakov, A.N. and A.A. Davydov, The
the Cr/Al,O, metallization system 103 (1996) 113 influence of modifying additions of La
Lu Zuhong, see Yuan Chunbo 103 (19965)3 1 and Ce oxides on electronic state of
surface atoms and ions of supported
Martinez, H., C. Auriel, M. Loudet and G. copper 103 (1996) 479
Pfister-Guillouzo, Electronic structure Petersen, P. and W. Krasser, Surface en-
(XPS and ab-initio band structure calcu- hanced Raman scattering from a ternary
lation) and scanning probe microscopy catalyst Cu/ZnO /AI,O, under reaction
images of a-tin sulfide 103 (1996) 149 conditions 103 (1996) 91
Massoumi, G.R., see Rodriguez-Fernandez, Peto, G. and J. Kanski, Thermal regrowth of
® 103 (19962)8 9 Si(100) damaged by Ne, Ar, and Xe ion
Matsubara, E., see Kosaka, T. 103 (1996) 55 bombardment 103 (19964)5 9
Mattogno, G., see Battistoni, C. 103 (1996) 107 Pfister-Guillouzo, G., see Martinez, H. 103 (1996) 149
Meguro, T., see Lee, J.-S. 103 (1996) 275 Ponec, V., see Pei, Z.-F. 103 (1996) 171
Mickevicius, S., see Battistoni, C. 103 (1996) 107 Possart, W., see Dieckhoff, S. 103 (19962)2 1
Miotello, A., see Laidani, N. 103 (19963)1 5 Pranevicius, L., see Galdikas, A. 103 (19964)7 1
Mitchell, K.A.R., see Li, Y.S. 103 (1996) 389 Pregliasco, R.G., G. Zampieri, H. Huck,
Mocek, K., see Stejskalova, K. 103 (1996) 509 E.B. Halac, M.A.R. de Benyacar and R.
Morris, S.J., see Rose, K.C. 103 (1996) 71 Righini, Characterization of hard amor-
phous carbon films deposited with
Nakata, S.. Y. Kato, Y. Kaneda and K. high-energy ion beams 103 (19962)6 1
Yoshikawa, Rhythmic chemical reaction Puglisi, O., see Scandurra, A. 103 (1996) 19
of CO on the surface of a SnO, gas Pung, L., see Aarik, J. 103 (19963)3 1
103 (1996) 369 Pyke, D.R., see Werrett, C.R. 103 (19964)0 3
sensor
538 Author index
Qin, J., see Lu, H. 103 (1996) 113 segregation of chromium on oxidation
of high-purity Fe—Cr alloys at room
Richter, W., see Rose, K.C. 103 (1996) 71 temperature 103 (1996) 495
Righini, R., see Pregliasco, R.G. 103 (1996) 261
Rodriguez-Fernandez, L., W.N. Lennard, H. Takai, O., see Hozumi, A. 103 (19964)3 1
Xia and G.R. Massoumi, SPIX: a new Takakuwa, C., M. Tomita, T. Hatanaka, I.
technique for quantitative surface spec- Suzuki, G. Franco and H. Yamaguchi,
troscopy applied to S /InP(001) 103 (1996) 289 Improvement of Cs-induced surface
Rohr, G., see Hiittner, B. 103 (1996) 269 roughness for high depth resolution pro-
Rose, K.C., D.A. Woolf, S.J. Morris, D.I. filing of CdZnSe /ZnSe multilayer films 103 (19962)5 5
Westwood, R.H. Williams and W. Tan, K.L., see Lin, J. 103 (19963)0 7
Richter, Sub-monolayer coverages of Be Templier, C., see Galdikas, A. 103 (19964)7 1
grown on GaAs(001)-c(4 x 4) and (2 x Thiel, P.A., see Jenks, C.J. 103 (19964)8 5
4)-B by molecular beam epitaxy studied Tomita, M., see Takakuwa, C. 103 (19962)5 5
by reflectance anisotropy spectroscopy Torrisi, A., see Scandurra, A. 103 (1996) 19
and reflection high-energy electron Toussaint, S.L.G., see Partridge, A. 103 (19961)2 7
diffraction 103 (1996) 71 Troyon, M. and L. Wang, Influence of sac-
Ruckh, M., see Schmid, D. 103 (19964)0 9 charin on the structure and corrosion
resistance of electrodeposited Cu/Ni
Saito, M., see Kosaka, T. 103 (1996) 55 multilayers 103 (19965)1 7
Samarsky, E.A., see Bukharaev, A.A. 103 (1996) 49 Tscherkasova, E., see Jedlifiski, J. 103 (1996) 205
Santoni, A., see Lascovich, J.C. 103 (1996) 245 Tsuji, K. and K. Hirokawa, Nondestructive
Scandurra, A., A. Licciardello, A. Torrisi, depth profiling of oxidized Fe—Cr alloy
R. Weigert and O. Puglisi, SNMS char- by the glancing-incidence and -takeoff
acterization of ion irradiated GaAs sur- X-ray fluorescence method 103 (19964)5 1
faces 103 (1996) 19
Schierbaum, K.D., see Xu, W.-X. 103 (1996) 279 Uesugi, F., see Nishiyama, I. 103 (1996) 299
Schlapbach, L., see Gréning, P. 103 (1996) 79
Schlett, V., see Dieckhoff, S. 103 (1996) 221 Vallabhan, C.P.G., see Ajithprasad, K.C. 103 (1996) 465
Schmid, D., M. Ruckh and H.W. Schock, Vassilevski, D.L., M.S. Vinogradov and
Photoemission studies on Cu(In, Ga)Se, V.A. Borschak, Photon induced modula-
thin films and related binary selenides 103 (1996) 409 tion of surface barrier: investigation and
Schock, H.W., see Schmid, D. 103 (1996) 409 application for a new image sensor 103 (1996) 383
Seifert, N., G. Betz and W. Husinsky, Vinogradov, M.S., see Vassilevski, D.L. 103 (1996) 383
Droplet formation on metallic surfaces
during low-fluence laser irradiation 103 (1996) 63 Wang, E.G., see Hu, X. 103 (19962)1 7
Sendecki, S., see Barwinski, B. 103 (19965)2 5 Wang, L., see Troyon, M. 103 (19965)1 7
Shen, D.H., see Lu, H. 103 (19961)1 3 Waseda, Y., see Kosaka, T. 103 (1996) 55
Shen, Z., see Jenks, C.J. 103 (19964)8 5 Waseda, Y., see Suzuki, S. 103 (19964)9 5
Shi, Y.X., see Chen, X.G. 103 (19961)8 9 Wei, B.M., see Chen, X.G. 103 (19961)8 9
Shirokoff, J., see Ashiru, O.A. 103 (19961)5 9 Weigert, R., see Scandurra, A. 103 (1996) 19
Shuff, P.J., see Smith, G.C. 103 (19961)9 9 Werrett, C.R., A.K. Bhattacharya and D.R.
Sizov, F.F., see Kamuz, A.M. 103 (19961)4 1 Pyke, The validity of Cls charge refer-
Smith, G.C. and P.J. Shuff, Electron spec- encing in the XPS of oxidised Al—Si
troscopy of carbonaceous materials 103 (1996) 199 alloys 103 (19964)0 3
Spirovova, I., see Stejskalova, K. 103 (1996) 509 Westwood, D.I., see Rose, K.C. 103 (1996) 71
Stejskalova, K., I. Spirovova, E. Lippert, K. Wieczorek, P., see Lewowski, T. 103 (1996) 35
Mocek and Z. Bastl, A study of SO, Williams, R.H., see Rose, K.C. 103 (1996) 71
interaction with sodium carbonates by Wong, K.C., see Li, Y.S. 103 (19963)8 9
X-ray photoelectron spectroscopy 103 (1996) 509 Wong, P.C., see Li, Y.S. 103 (19963)8 9
Stobifski, L., Molecular and atomic deu- Woolf, D.A., see Rose, K.C. 103 (1996) 71
terium chemisorption on thin gold films Wu Ying, see Yuan Chunbo 103 (19965)3 1
at 78 K: an isotope effect 103 (1996) 503
Sugano, T., see Lee, J.-S. 103 (1996) 275 Xia, H., see Rodriguez-Fernandez, L. 103 (1996) 289
Suzuki, I., see Takakuwa, C. 103 (1996) 255 Xia, W.S., Y. Fan, Y.S. Jiang and Y. Chen,
Suzuki, S., see Kosaka, T. 103 (1996) 55 Local surface state of amorphous NiP
Suzuki, S., T. Kosaka, H. Inoue, M. Isshiki and NiB alloy catalysts 103 (1996) 1
and Y. Waseda, Effect of the surface Xing, Y., see Hu, X. 103 (1996) 101
Author index
Xing, Y., see Hu, X. 103 (19962)1 7 structure observed on the phospholipid
Xu, W.-X., K.D. Schierbaum and W. Goe- Langmuir—Blodgett bilayer by atomic
pel, Ab initio study of interaction be- force microscopy 103 (1996) 531
tween the OH hydroxyl and Pt,, (nm = 1-
10) clusters 103 (1996) 279
Yamaguchi, H., see Takakuwa, C. 103 (1996) 255
Yang, Y., see Chen, X.G. 103 (1996) 189 Zampieri, G., see Pregliasco, R.G. 103 (1996) 261
Yang Xiaomin, see Yuan Chunbo 103 (1996) 531 Zeng, H.C., see Lin, J. 103 (1996) 307
Yoshikawa, K., see Nakata, S. 103 (1996) 369 Zhang, C.-M., see Jenks, C.J. 103 (1996) 485
Yuan Chunbo, Wu Ying, Yang Xiaomin, Zhang, Z., see Kulakov, M.A. 103 (1996) 443
Lu Zuhong and Liu Juzheng, A novel Zotov, A.V., see Kulakov, M.A. 103 (1996) 443

applied
surface science
ELSEVIER Applied Surface Science 103 (1996) 541-552
Subject index
Alkali metals Bloomer, S.-L. Chang, T.A. Lograsso,
Z. Shen, C.-M. Zhang and P.A. Thiel 103 (1996) 485
Effect of the surface segregation of
Improvement of Cs-induced surface rough-
chromium on oxidation of high-purity
ness for high depth resolution profiling
Fe—Cr alloys at room temperature, S.
of CdZnSe/ZnSe multilayer films, C.
Suzuki, T. Kosaka, H. Inoue, M. Isshiki
Takakuwa, M. Tomita, T. Hatanaka, I.
and Y. Waseda 103 (1996) 495
Suzuki, G. Franco and H. Yamaguchi 103 (1996) 255
Activation of the Na,KSb_ photocathode
Aluminium
with Cs and O, at lowered tempera-
tures, B. Erjavec 103 (1996) 343
The analysis of surface-adsorbed organic An XPS/SEM/EDX study of the early
molecules by alkali-assisted MIES com- oxidation stages of the Fe-—19Cr-
bined with UPS(Hel), J. Giinster, D. S5AK+Y) alumina-forming alloys, J.
Ochs, S. Dieckhoff and V. Kempter 103 (19963)5 1 Jedlifski, A. Glazkov, M. Konopka, G.
A study of SO, interaction with sodium Borchardt, E. Tscherkasova, M. Bronfin
carbonates by X-ray photoelectron spec- and M. Nocun 103 (1996) 205
troscopy, K. Stejskalova, I. Spirovova, Photon energy dependence of synchrotron
E. Lippert, K. Mocek and Z. Bastl 103 (1996) 509 radiation induced growth suppression
and initiation in Al chemical vapor de-
position. II. Surface analysis by Auger
Alloys
electron spectroscopy, I. Nishiyama and
F. Uesugi 103 (1996) 299
XPS/GIXS studies of thin oxide films N*-implantation induced enhanced adhe-
formed on Fe—Cr alloys, T. Kosaka, S. sion in WC,_,/Ti-6AI-4V, N.
Suzuki, H. Inoue, M. Saito, Y. Waseda Laidani, C. Dorigoni and A. Miotello 103 (19963)1 5
and E. Matsubara 103 (1996) 55 The validity of Cls charge referencing in
Electrodeposition and characterization of the XPS of oxidised Al—Si alloys, C.R.
tin—zine alloy coatings, O.A. Ashiru and Werrett, A.K. Bhattacharya and D.R.
J. Shirokoff 103 (1996) 159 Pyke 103 (1996) 403
An XPS/SEM/EDX study of the early Preparation of well-defined samples of
oxidation stages of the Fe—19Cr- AIPdMn quasicrystals for surface stud-
ies, C.J. Jenks, D.W. Delaney, T-.E.
SAK+Y) alumina-forming alloys, J.
Jedlinski, A. Glazkov, M. Konopka, G. Bloomer, S.-L. Chang, T.A. Lograsso,
Borchardt, E. Tscherkasova, M. Bronfin Z. Shen, C.-M. Zhang and P.A. Thiel 103 (1996) 485
and M. Nocun 103 (1996) 205
N*-implantation induced enhanced adhe- Aluminium oxide
sion in WC,_,/Ti-6Al-4V, N.
Laidani, C. Dorigoni and A. Miotello 103 (1996) 315 Surfactant induced growth of thin gallium
The validity of Cls charge referencing in films on an insulating (sapphire) sub-
the XPS of oxidised Al—Si alloys, C.R. strate, T. Lewowski, H. Otop and P.
Werrett, A.K. Bhattacharya and D.R. Wieczorek 103 (1996) 35
Pyke 103 (1996) 403 The interface between sputter-deposited gold
Preparation of well-defined samples of thin films and ion-bombarded sapphire
AIPdMn quasicrystals for surface stud- substrates, J.W. Park, A.J. Pedraza and
ies, C.J. Jenks, D.W. Delaney, T.E. W.R. Allen 103 (1996) 39
542 Subject index
Surface enhanced Raman scattering from a Interaction of mercury vapour with thin
ternary catalyst Cu/ZnO /AI,O, under films of gold, C. Battistoni, E. Bempo-
reaction conditions, P. Petersen and W. rad, A. Galdikas, S. Kaciulis, G. Mat-
Krasser 103 (1996) 91 togno, S. Mickevicius and V. Olevano 103 (1996) 107
Auger electron depth profiling of the Auger electron depth profiling of the
Cr/Al,O, metallization system, H. Lu, Cr/Al,O, metallization system, H. Lu,
Y.D. Cui, J. Qin, C.L. Bao and D.H. Y.D. Cui, J. Qin, C.L. Bao and D.H.
Shen 103 (1996) 113 Shen 103 (1996) 113
Electron spectroscopy of carbonaceous ma-
Annealing terials, G.C. Smith and P.J. Shuff 103 (1996) 199
Study of the occupied electronic density of
The behavior of the surface charge density states of carbon samples by using sec-
in Hg ,Cd,_ ,Te epilayers due to hydro- ond derivative carbon KVV Auger spec-
genation and annealing, M.S. Han, J.H. tra, J.C. Lascovich and A. Santoni 103 (1996) 245
Beak, Y.T. Oh, T.W. Kang, T.W. Kim Characterization of hard amorphous carbon
and J.I. Choi 103 (1996) 183 films deposited with high-energy ion
Influence of the rapid thermal annealing in beams, R.G. Pregliasco, G. Zampieri, H.
vacuum on the XPS characteristics of Huck, E.B. Halac, M.A.R. de Benyacar
thin SiO,, E. Atanassova and A. and R. Righini 103 (1996) 261
Paskaleva 103 (1996) 359 Photon energy dependence of synchrotron
radiation induced growth suppression
Argon and initiation in Al chemical vapor de-
position. II. Surface analysis by Auger
Thermal regrowth of Si(100) damaged by electron spectroscopy, I. Nishiyama and
Ne, Ar, and Xe ion bombardment, G. F. Uesugi 103 (1996) 299
Peto and J. Kanski 103 (1996) 459 N*-implantation induced enhanced adhe-
sion in WC,_,/Ti-6AI-4V, N.
Atomic force microscopy Laidani, C. Dorigoni and A. Miotello 103 (19963)1 5
Preparation of well-defined samples of
AFM measurements of the topography and AIPdMn quasicrystals for surface stud-
the roughness of ECR plasma treated ies, C.J. Jenks, D.W. Delaney, T-E.
polypropylene, M. Collaud Coen, G. Di- Bloomer, S.-L. Chang, T.A. Lograsso,
etler, S. Kasas and P. Gréning 103 (1996) 27 Z. Shen, C.-M. Zhang and P.A. Thiel 103 (1996) 485
An AFM investigation of the deposition of
nanometer-sized rhodium and copper Beryllium
clusters by spin coating, A. Partridge,
S.L.G. Toussaint and C.F.J. Flipse 103 (1996) 127
Sub-monolayer coverages of Be grown on
Improvement of Cs-induced surface rough-
GaAs(001)-c(4 x 4) and (2 xX 4)-B by
ness for high depth resolution profiling
molecular beam epitaxy studied by re-
of CdZnSe/ZnSe multilayer films, C.
flectance anisotropy spectroscopy and
Takakuwa, M. Tomita, T. Hatanaka, I.
reflection high-energy electron diffrac-
Suzuki, G. Franco and H. Yamaguchi 103 (1996) 255
tion, K.C. Rose, D.A. Woolf, S.J. Mor-
Influence of saccharin on the structure and
ris, D.I. Westwood, R.H. Williams and
corrosion resistance of electrodeposited
W. Richter 103 (1996) 71
Cu/Ni multilayers, M. Troyon and L.
Wang 103 (19965)1 7
Boron
A novel structure observed on the phospho-
lipid Langmuir—Blodgett bilayer by
Structure of the B/Si(100) surface at low
atomic force microscopy, Yuan Chunbo,
boron coverage studied by scanning tun-
Wu Ying, Yang Xiaomin, Lu Zuhong
nelling microscopy, M.A. Kulakov, Z.
and Liu Juzheng 103 (1996) 531
Zhang, A.V. Zotov, B. Bullemer and I.
Eisele 103 (1996) 443
Auger electron spectroscopy
The interface between sputter-deposited gold Cadmium
thin films and ion-bombarded sapphire
substrates, J.W. Park, A.J. Pedraza and The behavior of the surface charge density
W.R. Allen 103 (1996) 39 in Hg ,Cd,_ ,Te epilayers due to hydro-
Subject index
genation and annealing, M.S. Han, J.H. Suzuki, H. Inoue, M. Saito, Y. Waseda
Beak, Y.T. Oh, T.W. Kang, T.W. Kim and E. Matsubara 103 (1996) 55
and J.1. Choi 103 (1996) 183 Auger electron depth profiling of the
Improvement of Cs-induced surface rough- Cr/Al,O, metallization system, H. Lu,
ness for high depth resolution profiling Y.D. Cui, J. Qin, C.L. Bao and D.H.
of CdZnSe/ZnSe multilayer films, C. Shen 103 (1996) 113
Takakuwa, M. Tomita, T. Hatanaka, I. An XPS/SEM/EDX study of the early
Suzuki, G. Franco and H. Yamaguchi 103 (1996) 255 oxidation stages of the Fe-—19Cr-
SAK+Y) alumina-forming alloys, J.
Carbides Jedlifski, A. Glazkov, M. Konopka, G.
Borchardt, E. Tscherkasova, M. Bronfin
and M. Nocun 103 (1996) 205
N*-implantation induced enhanced adhe-
Nondestructive depth profiling of oxidized
sion in WC,_,/Ti-6Al-4V, N.
Fe—Cr alloy by the glancing-incidence
Laidani, C. Dorigoni and A. Miotello 103 (19963)1 5
and -takeoff X-ray fluorescence method,
K. Tsuji and K. Hirokawa 103 (19964)5 1
Carbon
Effect of the surface segregation of
chromium on oxidation of high-purity
Electron spectroscopy of carbonaceous ma- Fe—Cr alloys at room temperature, S.
terials, G.C. Smith and P.J. Shuff 103 (1996) 199 Suzuki, T. Kosaka, H. Inoue, M. Isshiki
Study of the occupied electronic density of and Y. Waseda 103 (1996) 495
states of carbon samples by using sec-
ond derivative carbon KVV Auger spec-
Clusters
tra, J.C. Lascovich and A. Santoni 103 (1996) 245
Characterization of hard amorphous carbon Ab initio study of interaction between the
films deposited with high-energy ion OH hydroxyl and Pt,, (2 = 1-10) clus-
beams, R.G. Pregliasco, G. Zampieri, H. ters, W.-X. Xu, K.D. Schierbaum and
Huck, E.B. Halac, M.A.R. de Benyacar W. Goepel 103 (1996) 279
and R. Righini 103 (1996) 261
Computer simulations
Carbon monoxide
Ab initio study of interaction between the
OH hydroxyl and Pt,, (7 = 1-10) clus-
Rhythmic chemical reaction of CO on the
surface of a SnO, gas sensor, S. Nakata, ters, W.-X. Xu, K.D. Schierbaum and
Y. Kato, Y. Kaneda and K. Yoshikawa 103 (1996) 369 W. Goepel 103 (1996) 279
Copper
Chemical vapour deposition
Surface enhanced Raman scattering from a
Investigation of the silicon-plasma silicon
ternary catalyst Cu/ZnO/AI,O, under
nitride interface with in situ transient
reaction conditions, P. Petersen and W.
photoconductivity measurements, J.R.
Krasser 103 (1996) 91
Elmiger and M. Kunst 103 (1996) 11
An AFM investigation of the deposition of
Photon energy dependence of synchrotron
nanometer-sized rhodium and copper
radiation induced growth suppression
clusters by spin coating, A. Partridge,
and initiation in Al chemical vapor de-
S.L.G. Toussaint and C.F.J. Flipse 103 (1996) 127
position. II]. Surface analysis by Auger
Photoemission studies on Cu(In, Ga)Se, thin
electron spectroscopy, I. Nishiyama and
films and related binary selenides, D.
F. Uesugi 103 (1996) 299
Schmid, M. Ruckh and H.W. Schock 103 (1996) 409
Mechanisms of suboxide growth and etch-
Photoemission optogalvanic studies with
ing in atomic layer deposition of tanta-
copper as target electrode, K.C. Ayjith-
lum oxide from TaCl; and H,O, J.
prasad, V.P.N. Nampoori and C.P.G.
Aarik, K. Kukli, A. Aidla and L. Pung 103 (1996) 331
Vallabhan 103 (1996) 465
The influence of modifying additions of La
Chromium and Ce oxides on electronic state of
surface atoms and ions of supported
XPS/GIXS studies of thin oxide films copper, A.N. Pestryakov and A.A.
formed on Fe—Cr alloys, T. Kosaka, S. Davydov 103 (1996) 479
544 Subject index
Influence of saccharin on the structure and Electron diffraction
corrosion resistance of electrodeposited
Cu/Ni multilayers, M. Troyon and L. Sub-monolayer coverages of Be grown on
Wang 103 (19965)1 7 GaAs(001)-c(4 X 4) and (2 x 4)-B by
molecular beam epitaxy studied by re-
Corrosion flectance anisotropy spectroscopy and
reflection high-energy electron diffrac-
Electrodeposition and characterization of tion, K.C. Rose, D.A. Woolf, S.J. Mor-
tin—zinc alloy coatings, O.A. Ashiru and ris, D.I. Westwood, R.H. Williams and
J. Shirokoff 103 (1996) 159 W. Richter 103 (1996) 71
Investigations of the pitting corrosion be- Point defect—dislocation loop behavior in Si
havior of passive film on REBAR elec- with a TiSi, film, S.B. Herner, V. Kr-
trodes containing ‘artificial pit’ in simu- ishnamoorthy and K.S. Jones 103 (1996) 377
lated cement solutions, X.G. Chen, Y.
Electron energy loss spectroscopy
Yang, Z.G. Lin, W. Chu, Y.X. Shi and
B.M. Wei 103 (1996) 189
Characterization of hard amorphous carbon
Influence of saccharin on the structure and
films deposited with high-energy ion
corrosion resistance of electrodeposited
beams, R.G. Pregliasco, G. Zampieri, H.
Cu/Ni multilayers, M. Troyon and L.
Huck, E.B. Halac, M.A.R. de Benyacar
Wang 103 (19965)1 7
and R. Righini 103 (19962)6 1
Depth profiling Electron microscopy
SNMS characterization of ion irradiated Interaction of mercury vapour with thin
GaAs surfaces, A. Scandurra, A. Liccia- films of gold, C. Battistoni, E. Bempo-
rdello, A. Torrisi, R. Weigert and O. rad, A. Galdikas, S. Kaciulis, G. Mat-
Puglisi 103 (1996) 19 togno, S. Mickevicius and V. Olevano 103 (1996) 107
XPS/GIXS studies of thin oxide films An XPS/SEM/EDX study of the early
formed on Fe—Cr alloys, T. Kosaka, S. oxidation stages of the Fe-—19Cr-
Suzuki, H. Inoue, M. Saito, Y. Waseda 5AI(+Y) alumina-forming alloys, J.
and E. Matsubara 103 (1996) 55 Jedlifski, A. Glazkov, M. Konopka, G.
Auger electron depth profiling of the Borchardt, E. Tscherkasova, M. Bronfin
Cr/Al,O, metallization system, H. Lu, and M. Nocun 103 (1996) 205
Y.D. Cui, J. Qin, C.L. Bao and D.H. Preparation of ‘near’ homogeneous samples
Shen 103 (1996) 113 for the analysis of matrix-assisted laser
N*-implantation induced enhanced adhe- desorption /ionisation processes, D.A.
sion in WC,_,/Ti-6Al-4V, N. Allwood, I.K. Perera, J. Perkins, P.E.
Laidani, C. Dorigoni and A. Miotello 103 (19963)1 5 Dyer and G.A. Oldershaw 103 (19962)3 1
Nondestructive depth profiling of oxidized Improvement of Cs-induced surface rough-
Fe—Cr alloy by the glancing-incidence ness for high depth resolution profiling
and -takeoff X-ray fluorescence method, of CdZnSe/ZnSe multilayer films, C.
K. Tsuji and K. Hirokawa 103 (19964)5 1 Takakuwa, M. Tomita, T. Hatanaka, I.
Sputtering induced roughening effects on Suzuki, G. Franco and H. Yamaguchi 103 (1996) 255
ion beam profiling of multilayers, A. N*-implantation induced enhanced adhe-
Galdikas, L. Pranevicius and C. Tem- sion in WC,_,/Ti-6AI-4V, N.
plier 103 (19964)7 1 Laidani, C. Dorigoni and A. Miotello 103 (19963)1 5
Point defect—dislocation loop behavior in Si
Deuterium with a TiSi, film, S.B. Herner, V. Kr-
ishnamoorthy and K.S. Jones 103 (1996) 377
Molecular and atomic deuterium chemisorp- The influence of modifying additions of La
tion on thin gold films at 78 K: an and Ce oxides on electronic state of
isotope effect, L. Stobifski 103 (1996) 503 surface atoms and ions of supported
copper, A.N. Pestryakov and A.A.
Electrical properties Davydov 103 (1996) 479
Influence of saccharin on the structure and
Rhythmic chemical reaction of CO on the corrosion resistance of electrodeposited
surface of a SnO, gas sensor, S. Nakata, Cu/Ni multilayers, M. Troyon and L.
Y. Kato, Y. Kaneda and K. Yoshikawa 103 (1996) 369 Wang 103 (19965)1 7