A Journal of Statistics for the Physical Chemical and Engineering Sciences Technometrics 1999: Vol 41 Index & Table of Contents

7 Pages·1999·2.6 MB·English

TECHNOMETRICS
CONTENTS OF VOLUME 41
Numbers 161-164
Articles 1, 89, 183, 2 Index to Volume 41
Book Reviews Articles, by Author
Correction . ee Books Reviewed, by Author vad
Editorial Collaborators II oncc ca cexdsieeeslosencaue 390
INDEX TO VOLUME 41 (1999)
Articles, by Author
Abraham, B., Chipman, H., and Vijayan, K., “Some Risks Iglewicz, Boris (see Tan, Charles Y.)
in the Construction and Analysis of Supersaturated De- Jin, Jionghua, and Shi, Jianjun, “Feature-Preserving Data
signs,” 135 Compression of Stamping Tonnage Information Using
Albers, Willem, Arts, Gerda R. J., and Kallenberg, Wilbert Wavelets,” 327
C. M., “Test Regions Using Two or More Correlated Johnson, Valen E., Fitzgerald, Mark, and Martz, Harry F.,
Product Characteristics,” 153 Discussion of Pascual, Francis G., and Meeker, William
Annis, Charles, Discussion of Pascual, Francis G., and Q., 294
Meeker, William Q., 290 Jones, Geoffrey, and Rocke, David M., “Bootstrapping in
Arts, Gerda R. J. (see Albers, Willem) Controlled Calibration Experiments,” 224
Bingham, Derek, and Sitter, Randy R., “Minimum- Kallenberg, Wilbert C. M. (see Albers, Willem)
Aberration Two-Level Fractional Factorial Split-Plot De- Kim, Kyungmoo (see Li, Chin-Shang)
signs,” 62 Krishnamoorthy, K., and Mathew, Thomas, “Comparison of
Brinkley, Paul A. (see Li, Chin-Shang) Approximation Methods for Computing Tolerance Fac-
tors for a Multivariate Normal Population,” 234
Capilla, Carmen, Ferrer, Alberto, Romero, Rafael, and
Kvam, Eric P. (see Kvam, Paul H.)
Hualda, Angel, “Integration of Statistical and Engineer-
Kvam, Paul H., and Kvam, Eric P., Discussion of Pascual,
ing Process Control in a Continuous Polymerization Pro-
Francis G., and Meeker, William Q., 292
cess,” 14
Li, Chin-Shang, Lu, Jye-Chyi, Park, Jinho, Kim, Kyung-
Chan, K. P.-S. (see Saltelli, A.)
moo, Brinkley, Paul A., and Peterson, John, P., “Multi-
Chen, Hubert J. (see Chen, Shun- Yi)
variate Zero-Inflated Poisson Models and Their Applica-
Chen, Shun-Yi, and Chen, Hubert J., “A Range Test for the
tions,” 29
Equivalency of Means Under Unequal Variances,” 250
Lu, Jye-Chyi (see Li, Chin-Shang)
Chipman, H. (see Abraham, B.)
Luceno, Alberto, and Gonzalez, Francisco J., “Effects of
Chou, Youn-Min, and Mason, Robert L., Discussion of
Dynamics on the Properties of Feedback Adjustment
Davis, Charles B., and McNichols, Roger J., 102
Schemes With Dead Band,” 142
Davis, Charles B., and McNichols, Roger J., “Simultaneous
Martz, Harry F. (see Johnson, Valen E., Umble, Elisabeth
Nonparametric Prediction Models,” 89; Response, 108
J.)
Eilers, Paul H. C. (see Marx, Brian D.)
Martz, Harry F., Parker, Robert L., and Rasmuson, Dale
Escobar, Luis A., and Meeker, William Q., “Statistical Pre-
M., “Estimation of Trends in the Scram Rate at Nuclear
diction Based on Censored Life Data,” 113
Power Plants,” 352
Ferrer, Alberto (see Capilla, Carmen)
Marx, Brian D., and Eilers, Paul H. C., “Generalized Linear
Fitzgerald, Mark (see Johnson, Valen E.) Regression on Sampled Signals and Curves: A P-Spline
Gibbons, Robert D., Discussion of Davis, Charles B., and Approach,” |]
MeNichols, Roger j., 104 Mason, Robert L. (see Chou, Youn-Min)
Gilbert, Richard O., Discussion of Davis, Charles B.., and Mathew, Thomas (see Krishnamoorthy, K.)
McNichols, Roger J., 106 McNichols, Roger J. (see Davis, Charles B.)
Gonzalez, Francisco J. (see Luceno, Alberto) Meeker, William Q. (see Escobar, Luis A., Pascual, Francis
Hedayat, A. S., and Stufken, John, “Compound Orthogonal G.)
Arrays,” 57 Pan, Guohua, “The Impact of Unidentified Location Effects
Heuvelink, B. M. (see Pebesma, Edzer J.) on Dispersion-Effects Identification From Unreplicated
Hualda, Angel (see Capilla, Carmen) Factorial Designs,” 313
TECHNOMETRICS
CONTENTS OF VOLUME 41
Numbers 161-164
Articles 1, 89, 183, 2 Index to Volume 41
Book Reviews Articles, by Author
Correction . ee Books Reviewed, by Author vad
Editorial Collaborators II oncc ca cexdsieeeslosencaue 390
INDEX TO VOLUME 41 (1999)
Articles, by Author
Abraham, B., Chipman, H., and Vijayan, K., “Some Risks Iglewicz, Boris (see Tan, Charles Y.)
in the Construction and Analysis of Supersaturated De- Jin, Jionghua, and Shi, Jianjun, “Feature-Preserving Data
signs,” 135 Compression of Stamping Tonnage Information Using
Albers, Willem, Arts, Gerda R. J., and Kallenberg, Wilbert Wavelets,” 327
C. M., “Test Regions Using Two or More Correlated Johnson, Valen E., Fitzgerald, Mark, and Martz, Harry F.,
Product Characteristics,” 153 Discussion of Pascual, Francis G., and Meeker, William
Annis, Charles, Discussion of Pascual, Francis G., and Q., 294
Meeker, William Q., 290 Jones, Geoffrey, and Rocke, David M., “Bootstrapping in
Arts, Gerda R. J. (see Albers, Willem) Controlled Calibration Experiments,” 224
Bingham, Derek, and Sitter, Randy R., “Minimum- Kallenberg, Wilbert C. M. (see Albers, Willem)
Aberration Two-Level Fractional Factorial Split-Plot De- Kim, Kyungmoo (see Li, Chin-Shang)
signs,” 62 Krishnamoorthy, K., and Mathew, Thomas, “Comparison of
Brinkley, Paul A. (see Li, Chin-Shang) Approximation Methods for Computing Tolerance Fac-
tors for a Multivariate Normal Population,” 234
Capilla, Carmen, Ferrer, Alberto, Romero, Rafael, and
Kvam, Eric P. (see Kvam, Paul H.)
Hualda, Angel, “Integration of Statistical and Engineer-
Kvam, Paul H., and Kvam, Eric P., Discussion of Pascual,
ing Process Control in a Continuous Polymerization Pro-
Francis G., and Meeker, William Q., 292
cess,” 14
Li, Chin-Shang, Lu, Jye-Chyi, Park, Jinho, Kim, Kyung-
Chan, K. P.-S. (see Saltelli, A.)
moo, Brinkley, Paul A., and Peterson, John, P., “Multi-
Chen, Hubert J. (see Chen, Shun- Yi)
variate Zero-Inflated Poisson Models and Their Applica-
Chen, Shun-Yi, and Chen, Hubert J., “A Range Test for the
tions,” 29
Equivalency of Means Under Unequal Variances,” 250
Lu, Jye-Chyi (see Li, Chin-Shang)
Chipman, H. (see Abraham, B.)
Luceno, Alberto, and Gonzalez, Francisco J., “Effects of
Chou, Youn-Min, and Mason, Robert L., Discussion of
Dynamics on the Properties of Feedback Adjustment
Davis, Charles B., and McNichols, Roger J., 102
Schemes With Dead Band,” 142
Davis, Charles B., and McNichols, Roger J., “Simultaneous
Martz, Harry F. (see Johnson, Valen E., Umble, Elisabeth
Nonparametric Prediction Models,” 89; Response, 108
J.)
Eilers, Paul H. C. (see Marx, Brian D.)
Martz, Harry F., Parker, Robert L., and Rasmuson, Dale
Escobar, Luis A., and Meeker, William Q., “Statistical Pre-
M., “Estimation of Trends in the Scram Rate at Nuclear
diction Based on Censored Life Data,” 113
Power Plants,” 352
Ferrer, Alberto (see Capilla, Carmen)
Marx, Brian D., and Eilers, Paul H. C., “Generalized Linear
Fitzgerald, Mark (see Johnson, Valen E.) Regression on Sampled Signals and Curves: A P-Spline
Gibbons, Robert D., Discussion of Davis, Charles B., and Approach,” |]
MeNichols, Roger j., 104 Mason, Robert L. (see Chou, Youn-Min)
Gilbert, Richard O., Discussion of Davis, Charles B.., and Mathew, Thomas (see Krishnamoorthy, K.)
McNichols, Roger J., 106 McNichols, Roger J. (see Davis, Charles B.)
Gonzalez, Francisco J. (see Luceno, Alberto) Meeker, William Q. (see Escobar, Luis A., Pascual, Francis
Hedayat, A. S., and Stufken, John, “Compound Orthogonal G.)
Arrays,” 57 Pan, Guohua, “The Impact of Unidentified Location Effects
Heuvelink, B. M. (see Pebesma, Edzer J.) on Dispersion-Effects Identification From Unreplicated
Hualda, Angel (see Capilla, Carmen) Factorial Designs,” 313
INDEX TO VOLUME 41 389
Park, Jinho (see Li, Chin-Shang) Seaver, Bill, Triantis, Konstantinos, and Reeves, Chip, “The
Parker, Robert L. (see Martz, Harry F.) Identification of Influential Subsets in Regression Using
Pascual, Francis G., and Meeker, William Q., “Estimating a Fuzzy Clustering Strategy,” 340
Fatigue Curves With the Random Fatigue-Limit Model,” Shi, Jianjun (see Jin, Jionghua)
Sitter, Randy R. (see Bingham, Derek)
277; Response, 277
Stufken, John (see Hedayat, A. S.)
Pebesma, Edzer J., and Heuvelink, B. M., “Latin Hypercube
Tan, Charles Y., and Iglewicz, Boris, “Measurement-
Sampling of Gaussian Random Fields,” 303
Methods Comparisons and Linear Statistical Relation-
Peterson, John P. (see Li, Chin-Shang)
ship,” 192
Rasmuson, Dale M. (see Martz, Harry F.) Tarantola, S. (see Saltelli, A.)
Reeves, Chip (see Seaver, Bill) Triantis, Konstantinos (see Seaver, Bill)
Rocke, David M. (see Jones, Geoffrey) Umble, Elisabeth J., Seaman, John W., Jr., and Martz, Harry
Romero, Rafael (see Capilla, Carmen) F., “A Distribution-Free Bayesian Approach for Deter-
Rosenbaum, Paul R., “Blocking in Compound Dispersion mining the Joint Probability Failure of Materials Subject
to Multiple Proof Loads,” 183
Experiments,” 125
Van Driessen, Katrien (see Rousseeuw, Peter J.)
Rousseeuw, Peter J., and Van Driessen, Katrien, “A Fast Al-
Vangel, Mark G., Discussion of Davis, Charles B., and Mc-
gorithm for the Minimum Covariance Determinant Esti-
Nichols, Roger J., 108
mator,” 212
Van Valkenburg, Enid S. (see Vardeman, Stephen B.)
Saltelli, A., Tarantola, S., and Chan, K. P.-S., “A Quanti- Vardeman, Stephen B., and VanValkenburg, Enid S., “Two-
tative Model-Independent Method for Global Sensitivity Way Random-Effects Analyses and Gauge R&R Studies,”
Analysis of Model Output,” 39 202
Seaman, John W., Jr. (see Umble, Elisabeth J.) Vijayan, K. (see Abraham, B.)
BOOKS REVIEWED, BY AUTHOR
Aft, Lawrence S., Fundamentals of Industrial Quality Con- Blank, Ronald, The SPC Troubleshooting Guide, 266
trol, 178 Booth-Kewley, Stephanie (see Edwards, Jack E.)
Al-Sultan, K., and Rahim, M. A. (editors), Optimization in Bowman, Adrian W., and Azzalini, Adelchi, Applied
Quality Control, 178 Smoothing Techniques for Data Analysis, 263
Albright, S. Christian (see Winston, Wayne L.) Box, George, and Luceno, Alberto, Statistical Control by
Alreck, Pamela L., and Settle, Robert B., The Survey Re- Monitoring and Feedback Adjustment, 167
search Handbook, 83 Brillinger, David R. (see Gregoire, Timothy G.)
American Society for Quality, Quality Assurance for the Cameron, A. Colin, and Trivedi, Pravin K., Regression
Chemical and Process Industries, 380 Analysis of Count Data, 369
Canty, Morton John (see Avenhaus, Rudolf)
Andersen, Bjorn, Business Process Improvement Toolbox,
Carey, Patrick (see Berk, Kenneth N.)
372
Casella, George (see Lehmann, E. L.)
Avenhaus, Rudolf, and Canty, Morton John, Compliance
Chambers, John M., Programming With Data, 266
Quantified: An Introduction to Data Verification, 174
Chien, W.-T. (see Kuo, W.)
Ayyub, Bilal M., and McCuen, Richard H., Probability,
Chow, Siu, Statistical Significance, 181
Statistics, and Reliabilitfyo r Engineers, 172
Clark, Timothy J., Success Through Quality, 373
Azzalini, Adelchi, Statistical Inference Based on the Likeli-
Cobb, George W., /ntroduction to Design and Analysis of
hood, 176 (see also Bowman, Adrian W.)
Experiments, 170
Barlow, Richard E., Engineering Reliability, 75
Cook, R. Dennis, Regression Graphics: Ideas for Studying
Barnett, V., and Turkman, K. Feridun (editors), Statistics
Regressions Through Graphics, 366
for the Environment 3, 273
Corbett, Patrick W. M. (see Jensen, Jerry L.)
Barnett, Vic, and Turkman, K. Feridun (editors), Statistics
Couper, Mick P. (see Groves, Robert M.)
for the Environment 2, 179 Cox, Lawrence H. (see Nychka, Douglas)
Beebe, Kenneth R., Pell, Randy J., and Seasholtz, Mary del Vecchio, R. J., Understanding Design of Experiments:
Beth, Chemometrics: A Practical Guide, 373 A Primer for Technologists, 265
Bemowski, Karen, and Stratton, Brad (editors), /0/ Good Denker, Manfred, and Woyczynski, Wojbor A., /ntroduc-
Ideas—How to Improve Just About Any Process, 85 tory Statistics and Random Phenomena, 270
Berestizhevsky, Samuel (see Kolosova, Tanya) Dey, D. D., and Muller, P. (editors), Practical Nonparamet-
Berk, Kenneth N., and Carey, Patrick, Data Analysis With ric and Semiparametric Bayesian Statistics, 81
Microsoft Excel, 378 Dickey, David A. (see Rawlings, John O.)
Birolini, Alessandro, Quality and Reliability of Technical Diggle, Peter J. (see Gregoire, Timothy G.)
Systems: Theory, Practice, Management, 171 Doty, Leonard A., SPC for Short Run Manufacturing, 169
TECHNOMETRICS, NOVEMBER 1999, VOL. 41, NO. 4
390 INDEX TO VOLUME 41
Draper, Norman R., and Smith, Harry, Applied Regression Hart, Jeffrey D., Nonparametric Smoothing and Lack-of-Fit
Analysis, 265 Tests, 175
Haugh, Larry D. (see Peck, Roxy)
Eddy, W. (see Mockus, J.)
Edwards, Jack E., Thomas, Marie D., Rosenfeld, Paul, and Hettmansperger, T. P. and McKean, J. W., Robust Nonpara-
Booth-Kewley, Stephanie, How to Conduct Organiza- metric Statistical Methods, 74
tional Surveys, 83 Hildebrand, David, and Ott, Lyman, Statistical Thinking for
Ellis, Richard, Communication for Engineers, 180 Managers, 181
Hollander, Myles, and Wolfe, Douglas, A.., Nonparametric
Everitt, B. S., and Rabe-Hesketh, S., The Analysis of Prox-
Statistical Methods, 378
imity Data, 73
Hubele, Norma F. (see Montgomery, Douglas C.)
Fedorov, Valerii V., and Hackl, Peter, Model-Oriented De-
Jaccard, James, /nteraction Effects in Factorial Analysis of
sign of Experiments, 77
Variance, 80
Fink, Arlene, and Kosecoff, Jacqueline, How to Conduct
Jacoby, William G., Statistical Graphics for Visualizing
Surveys—A Step-by-Step Guide, 83
Multivariate Data, 262, 367
Flury, Bernard, A First Course in Multivariate Statistics,
Jensen, Jerry L., Lake, Larry W., Corbett, Patrick W. M.,
262
and Goggin, David J., Statistics for Petroleum Engineers
Franz, Jurgen (see Kahle, Waltraud)
and Geoscientists, 377
French, S., and Smith, J. Q. (editors), The Practice of Jensen, Uwe (see Kahle, Waltraud)
Bayesian Analysis, 73 Jobe, J. Marcus (see Vardeman, Stephen B.)
Freund, Rudolph J., and Wilson, William J., Regression John, Peter, Statistical Design and Analysis of Experiments,
Analysis: Statistical Modeling of a Response Variable, 79
/
366 Johnson, Richard A., and Wichern, Dean W., Applied Mul-
Frigon, Normand L., and Mathews, David, Practical Guide tivariate Statistical Analysis, 81
to Experimental Design, 170 Johnson, Richard A., and Tsui, Kam-Wah, Statistical Rea-
Fuchs, Camil, and Kenett, Ron S., Multivariate Quality soning and Methods, 269
Control: Theory and Applications, 168 Jorgenson, Bent, The Theory of Dispersion Models, 177
Garcia-Diaz, Alberto, and Phillips, Don T., Principles of Kahle, Waltraud, von Colloni, Elart, Franz, Jurgen, and
Experimental Design and Analysis, 77 Jensen, Uwe, Advances in Stochastic Models for Relia-
Gentle, James E., Numerical Linear Algebra for Applica- bility, Quality and Safety, 268
tions in Statistics, 272 Kaye, D. (see Zeisel, H.)
Gibbons, Jean Dickinson, Nonparametric Methods for Kenett, Ron S., and Zacks, Shelemyahu, Modern Industrial
Quantitative Analysis, 75 Statistics: Design and Control of Quality and Reliability,
Goggin, David J. (see Jensen, Jerry L.) 263
Goodman, Arnold (see Peck, Roxy) Kenett, Ron S. (see Fuch, Camil)
Gourieroux, Christian, ARCH Models and Financial Appli- Kharin, Yurij, Robustness in Statistical Pattern Recognition,
368
cations, 380
Gravely, Archer, Survey Research Using the SAS System, Kim, T. (see Kuo, W.)
Kitagawa, Genshiro (see Parzen, Emanuel)
180
Kolosova, Tanya, and Berestizhevsky, Samuel, Program-
Gregoire, Timothy G., Brillinger, David R., Diggle, Pe-
ming Techniques for Object-Based Statistical Analysis
ter J., Russek-Cohen, Estelle, Warren, William G., and
With SAS Software, 272
Wolfinger, Russell D. (editors), Modelling Longitudinal
Kosecoff, Jacqueline (see Fink, Arlene)
and Spatially Correlated Data, 82
Kovalenko, Igor N., Kuznetsoy, Nickolaj Yu., and Pegg,
Grey, Stephen, Practical Risk Assessment for Project Man-
Philip A., Mathematical Theory of Reliability of Time De-
agement, 378 pendent Systems With Practical Applications, 269
Gross, D., and Harris, C. M., Fundamentals of Queueing
Kramer, Richard, Chemometric Techniques for Quantitative
Theory, 76 Analysis, 173
Groves, Robert M., and Couper, Mick P., Nonresponse in
Kuo, W., Chien, W.-T., and Kim, T., Reliability, Yield and
Household Interview Surveys, 379
Stress Burn-in, 369
Gruber, Marvin H. J., Improving Efficiency by Shrinkage,
Kuznetsoy, Nickolaj Yu. (see Kovalenko, Igor N.)
176
Lake, Larry W. (see Jensen, Jerry L.)
Hackl, Peter (see Fedorov, Valerii V.)
Lapin, Lawrence L., Modern Engineering Statistics, 371)
Haimes, Yacov Y., Risk Modeling, Assessment, and Man- Le, Chap T., Applied Survival Analysis, 267
agement, 374 Lehman, Ann (see Sall, John)
Hald, Anders, A History of Mathematical Statistics From Lehmann, E. L., and Casella, George, Theory of Point Esti-
1750 to 1930, 85 mation, 274
Hand, David J., Construction and Assessment of Classifica- Lenz, H. J., and Wilrich, P. T. (editors), Frontiers in Statis-
tion Rules, 267 tical Quality Control 5, 179
Harris, C. M. (see Gross, D.) Letkowski, Jersy J. (see Pelosi, Marilyn)
TECHNOMETRICS, NOVEMBER 1999, VOL. 41, NO. 4
INDEX TO VOLUME 41
Lind, Douglas A. (see Mason, Robert D.) Ross, Joel E. (see Swift, Jill A.)
Littell, Ramon C. (see Schlotzhauer, Sandra D.) Royall, Richard, Statistical Evidence: A Likelihood Paradigm,
Luceno, Alberto (see Box, George) 80
Marchal, William G. (see Mason, Robert D.) Rudas, T., Odds Ratios in the Analysis of Contingency Ta-
Mason, Robert D., Lind, Douglas A., and Marchal, William bles, 181
G., Statistics: An Introduction, 27\ Runger, George C. (see Montgomery, Douglas C.)
Mathews, David (see Frigon, Normand L.) Russek-Cohen, Estelle (see Gregoire, Timothy G.)
McCuen, Richard H. (see Ayyub, Bilal M.) Sall, John, and Lehman, Ann, JMP Start Statistics, 84
McKean, J. W. (see Hettmansperger, T. P.) Sandifer, Theresa M. (see Pelosi, Marilyn)
Mieczkowski, Tammy A. (see Timm, Neil H.) Schlotzhauer, Sandra D., and Littell, Ramon C., SAS System
Millard, Steven P., Environmental Stats for S-Plus, 179 for Elementary Statistical Analysis, 84
Mockus, A. (see Mockus, J.) Searle, S. R., Linear Models, 381
Mockus, J., Eddy, W., Mockus, A., Mockus, L., and Seasholtz, Mary Beth (see Beebe, Kenneth R.)
Reklaitis, G., Bayesian Heuristic Approach to Discrete Senn, Stephen, Statistical Issues in Drug Development,
and Global Optimization, 376 381
Mockus, L. (see Mockus, J.) Settle, Robert B. (see Alreck, Pamela L.)
Molchanov, Stanislav A., and Woyczynski, Wojbor A., Smith, Harry (see Draper, Norman R.)
Stochastic Models in Geosystems, 274 Smith, J. Q. (see French, S.)
Molenberghs, Geert (see Verbeke, Geert) Smith, Peter J., Into Statistics: A Guide to Understand-
Montgomery, Douglas C., Runger, George C., and Hubele, ing Statistical Concepts in Engineering and the Sciences,
37]
Norma F., Engineering Statistics, 271
Som, R. K., Practical Sampling Techniques, 175
Muller, P. (see Dey, D. D.)
Stratton, Brad (see Bemowski, Karen)
Myers, Raymond H. (see Walpole, Ronald E.)
Suhir, Ephraim, Applied Probabilitfyo r Engineers and Sci-
Myers, Sharon L. (see Walpole, Ronald E.)
entists, 76
Nychka, Douglas, Piegorsch, Walter W., and Cox, Lawrence
Swift, Jill A., Ross, Joel E., and Omachonu, Vincent K.,
H., Case Studies in Environmental Statistics, 273
Principles of Total Quality, 379
Omachonu, Vincent K. (see Swift, Jill A.)
Tanabe, Kunio (see Parzen, Emanuel)
Ott, Lyman (see Hildebrand, David)
Thomas, Marie D. (see Edwards, Jack E.)
Pantula, Sastry G. (see Rawlings, John O.)
Timm, Neil H., and Mieczkowski, Tammy A., Univariate
Parzen, Emanuel, Tanabe, Kunio, and Kitagawa, Genshiro
and Multivariate General Linear Models, 82
(editors), Selected Papers of Hirotugu Akaike, 381
Trivedi, Pravin K. (see Cameron, A. Colin)
Peck, Roxy, Haugh, Larry D., and Goodman, Arnold, Sta-
Tsui, Kam-Wah (see Johnson, Richard A.)
tistical Case Studies, 380
Turkman, K. Feridun (see Barnett, V., Barnett, Vic)
Pegg, Philip A. (see Kovalenko, Igor N.)
Vapnik, Vladimir N., Statistical Learning Theory, 375
Pell, Randy J. (see Beebe, Kenneth R.)
Vardeman, Stephen B., and Jobe, J. Marcus, Statistical
Pelosi, Marilyn, Sandifer, Theresa M., and Letkowski, Jersy
Quality Assurance Methods for Engineers, 370
J., Doing Statistics With Excel 97, 271
Velu, Raja P. (see Reinsel, Gregory C.)
Phillips, Don T. (see Garcia-Diaz, Alberto)
Verbeke, Geert, and Molenberghs, Geert (editors), Linear
Piegorsch, Walter W. (see Nychka, Douglas)
Mixed Models in Practice: A SAS-Oriented Approach,
Poling, Sheila R. (see Wheeler, Donald J.) 79
PQ Systems, Inc., Total Quality Tools, 84 Vining, G. Geoffrey, Statistical Methods for Engineers,
Quesenberry, Charles P., SPC Methods for Quality Improve- 264
ment, 167 von Colloni, Elart (see Kahle, Waltraud)
Rabe-Hesketh, S. (see Everitt, B. S.) Vose, David, Quantitative Risk Analysis, 379
Rahim, M. A. (see Al-Sultan, K.) Wadsworth, Harrison M. (editor), Handbook of Statistical
Rao, C. R., Statistics and Truth, 72 Methods for Engineers and Scientists, 83
Rawlings, John O., Pantula, Sastry G., and Dickey, David Walker, Glenn A., Common Statistical Methods for Clinical
A., Applied Regression Analysis—A Research Tool, 82 Research With SAS Examples, 179
Reinsel, Gregory C., and Velu, Raja P., Multivariate Walpole, Ronald E., Myers, Raymond H., and Myers,
Reduced-Rank Regression, 367 Sharon L., Probability and Statistics for Engineers and
Reklaitis, G. (see Mockus, J.) Scientists, 180
Rhyder, Robert F., Manufacturing Process Design and Op- Warren, William G. (see Gregoire, Timothy G.)
timization, 78 Welbrock, Peter R., Strategic Data Warehousing Principles
Robert, Christian P. (editor), Discretization and MCMC Using SAS Software, 272
Convergence Assessment, 381 Welsh, A. H., Aspects of Statistical Inference, 270
Rosenfeld, Paul (see Edwards, Jack E.) Wheeler, Donald J., and Poling, Sheila R., Building Contin-
Rosenkrantz, Walter A., Introduction to Probability and ual Improvement, 169
Statistics for Scientists and Engineers, 371 Wichern, Dean W. (see Johnson, Richard A.)
TECHNOMETRICS, NOVEMBER 1999, VOL. 41, NO. 4
392 INDEX TO VOLUME 41
Wilrich, P. T. (see Lenz, H. J.) Wolfinger, Russell D. (see Gregoire, Timothy G.)
Wilson, William J. (see Freund, Rudolph J.) Woyczynski, Wojbor A. (see Denker, Manfred, Molchanov,
Winston, Wayne L., and Albright, S. Christian, Practical Stanislav A.)
Management Science, 274 Zacks, Shelemyahu (see Kenett, Ron S.)
Wolfe, Douglas A. (see Hollander, Myles) Zeisel, H., and Kaye, D., Prove It With Figures, 181
BOOK REVIEWERS
Ajmani, Vivek B., 371 Goldberg, Judith D., 267 O’ Donnell, Robert, 78
Alexander, William, 175 Griffith, William S., 269 Peterson, John J., 369
Altland, Henry W., 366 Groggel, David J., 75 Pfahler, Lori B., 262
Basu, Asit P., 270 Gunst, Richard F., 265 Ramirez, José G., 265
Bates, Douglas M., 266 Heckler, Charles E., 367 Rigdon, Steven E., 77
Bayne, Charles K., 173 Hembree, Barry, 266 Samaniego, Francisco J.,
Belunis, Nancy, 169 Jobe, J. Marcus, 77 73, 369
Booth, David E., 368 LaLonde, Steven M., 262 Sandry, Thomas D., 170
Bryson, Maurice, 172 Lee, Kwan, 73 Sen, Ananda, 177
Crosby, Teri A., 371 Leigh, Stefan, 176 Spagon, Patrick D., 370
Davis, Charles B., 174 Lin, Yachen, 270 Stephenson, Hal W., and
Del Castillo, Enrique, 167 Liu, Shin Ta, 374 Gibbons, Ned M., 372
De Veaux, Richard D., 263 Lordo, Robert A., 269 Stewart, Paul, 79
Doganaksoy, Necip, 17! Lynch, Richard O., 170 Syski, R., 76
Easterling, Robert G., 72 Maryak, John, 376 Taam, Winson, 371
Emptage, Michael R., 80 Mason, Robert L., 168 Thode, Henry C., Jr., 76
Faltin, Frederick W., 167 McCool, John I., 75 Timm, Neil H., 367
Famoye, Felix, 176 Mi, Jie, 74 Tobias, Randall D., 373
Freitas, Stephen A., 263 Miller, Melinda A., 264 Tortorella, Michael, 268
Gibbons, Ned M. (see Moore, Roger H., 366 Wade, Mark R., 267
Stephenson, Hal W.) Morgan, Walter T., 169 Wu, Yuhai, 375
Glosup, Jeffrey, 80 Morganstein, David R., 175 Ziegel, Eric R., 81, 178,
Neubauer, Dean V., 373 271, 377
TECHNOMETRICS, NOVEMBER 1999, VOL. 41, NO. 4
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Py