VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
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Author:Brajesh Kumar Kaushik,Sudeb Dasgupta,Virendra Singh (eds.)
Language:English
Release year:2017
File size:96.461 MB
Number of page:820
Language:English
Release year:2017
File size:96.461 MB
Number of page:820
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Most books are stored in the elastic cloud where traffic is expensive. For this reason, we have a limit on daily download.
