Standard Reference Materials : Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

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Author:Vezzetti, Carol F., Varner, Ruth N., Potzick, James E.
Language:English
File size:3.1 MB
Number of page:56
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Similar Standard Reference Materials : Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

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