NASA Technical Reports Server (NTRS) 20120008333: Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs

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Author:NASA Technical Reports Server (NTRS)
Language:English
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Similar NASA Technical Reports Server (NTRS) 20120008333: Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs

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