NASA Technical Reports Server (NTRS) 19990079790: High-Temperature Slow Crack Growth of Silicon Carbide Determined by Constant-Stress-Rate and Constant-Stress Testing

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Author:NASA Technical Reports Server (NTRS)
Language:English
File size:0.65 MB
Number of page:8
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Similar NASA Technical Reports Server (NTRS) 19990079790: High-Temperature Slow Crack Growth of Silicon Carbide Determined by Constant-Stress-Rate and Constant-Stress Testing

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