JIS Z 4334: Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

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Author:Japan Standards Association (JSA)
Language:Japanese
Release year:2005
File size:2.2 MB
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Similar JIS Z 4334: Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

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