Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling

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Author:Souvik Mahapatra (eds.)
Language:English
Release year:2016
File size:20.69 MB
Number of page:281

Similar Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling

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