Table Of Content

1992 Volume 21 XRSPAX 21 (1-6) 1-308 (1992) Cy WI LEY ISSN 0049-8246 Publishers Since 1807 X-Ray Spectrometry (X-ray spectrom. ) AN INTERNATIONAL JOURNAL Official medium of publication of the Microbeam Analysis Society EDITOR-IN-CHIEF ADVISORY BOARD JOHN V. GILFRICH 8710 Lowell Street, Bethesda, Maryland 20817, USA Professor J. D. Brown University of Western Ontario, Canada REGIONAL EDITORS Australia J. F. Croke Philips Electronic Instruments, USA Dr K. NORRISH Professor H. Ebel Technische Universitét Wien, Austria C.S.1.R.O., Divisoif oSonils , Private Bag No. 1, P.O., Glen Osmond, S. Australia 5064 France Professor Y. Gohshi University of Tokyo, Japan Professor M. ROMAND Département de Chimie Appliquée, Génie Chimique (CNRS, URA Professor Guang Yi Tao Shanghai Institute of Ceramics, China 904), Université Claude Bernard, Lyon I, 69622 Villeurbanne Cedex, France P. W. Hurley Endian, Huntingdon, UK India Dr M. PATEL Dr R. Jenkins JCPDS—International Centre for Diffraction Data, Director, Pulp and Paper Research Institute, Jaykaypur-765017, India USA Sweden Dr E. SELIN Gi: Kerrigan Booragoon, Western Australia Dean of Environmental Sciences, Department of Physics, Chalmers University of Technology, 412 96 Géteborg, Sweden Professor D. E. Leyden Philip Morris, USA Western Europe, other than France and Sweden Professor Dr R. Van GRIEKEN Dr P. A. Pella National Institute of Standards and Technology, Departement Scheikunde, Universitaire Instellingen Antwerpen, Uni- Gaithersburg, USA versiteitsplein 1, B-2610, Wilrijk, Belgium United Kingdom J. R. Rhodes Columbia Scientific Industries, Texas, USA Dr D. S. URCH Department of Chemistry, Queen Mary College, Mile End Road, Professor J. A. Riveros Universidad Nacional de Cordoba, London El 4NS, UK. Argentina USSR Dr N. KOMYAK Dr I. Roelandts Universite de Liege, Belgium Leningrad Institute of Precision Mechanics and Optics, 14 Sablinskaya, Leningrad 197101, USSR Dr M. A. Short SRS Technologies, USA Dr S. T6r6k Central Research Institute for Physics, Hungary Copyright © 1992 by John Wiley & Sons Ltd. COPYING OF ARTICLES The code and the copyright notice appearing at the bottom of the first page of an article in this journal indicates the copyright owner's consent that copies of the article may be made for personal or internal use, or for the personal or internal use of specific clients, on the condition that the copier pay for the copying beyond that permitted by Sections 107 or 108 of the U.S. Copyright Law. The per-copy fee for each article appears after the dollar sign, and is to be paid through the Copyright Clearance Center, Inc. This consent does not extend to other kinds of copying, such as copying for general distribution, for advertising or promotional purposes, for creating new collective works, or for resale. Such permission requests, or other inquiries, should be addressed to the publisher. Printed and bound in Great Britain by Page Bros, Norwich X-RAY SPECTROMETRY, VOL. 21, NOS. 1-6 (1992) Contents of Volume 21 NUMBER 1 JANUARY-FEBRUARY 1992 From the Editor Obituary RESEARCH PAPERS X-Ray Fluorescence Determination of Trace Elements in Geological Materials: An Iterative Approach to Compton Scatter Corrections for Matrix Absorption P. K. HARVEY Monte Carlo Simulation of the Matrix and Geometrical Effects in X-Ray Microfluorescence Analysis of Individual Particles M. LANKOSZ Comprehensive Major, Minor and Trace Element Analysis of a Submarine Polymetallic Nodule by Wavelength-Dispersive X-Ray Fluorescence Spectrometry S. CAI, Y. GUO AND J. LI Measurement of Intensities of Some Newly Observed Diagram Lines in the L-Emission Spectra of "La to Eu B. D. SHRIVASTAVA, G. D. GUPTA AND S. K. JOSHI Formulation of a Universal Electron Probe Microanalysis Correction Method V. D. SCOTT AND G. LOVE Measurement of the Spectral Distribution of a Diffraction X-Ray Tube with a Solid-State Detector R. GORGL, P. WOBRAUSCHEK, P. KREGSAMER AND CH. STRELI Matrix Correction in X-Ray Fluorescence Analysis by the Effective Coefficient Method N. BROLL, P. CAUSSIN AND M. PETER NUMBER 2 MARCH-APRIL 1992 From the Editor Obituary: James P Blackledge (1920-1991) P. K. PREDECKI RESEARCH PAPERS Rayleigh and Compton Scattering Contributions to the XRF Intensity J. E. FERNANDEZ X-Ray Fluorescence Analysis of Rocks by the Fundamental Parameter Method V. P. AFONIN, A. L. FINKELSHTEIN, V. J. BORKHODOEV AND T. N. GUNICHEVA Caveat Emptor; Gross Refraction Effects Pose Problems in the Use of Multilayers for Soft X-Ray Spectroscopy S. LUCK, D. §. URCH AND D. H. ZHENG Characterization of Materials by Chemical Shift of X-Ray Absorption Edges M. HUSAIN AND A. NARULA Trihydroxymethylaminomethane High-Efficiency X-Ray Analyser Crystal S. GENBO, L. ZHENGDONG, H. GONGFAN AND P. FENG iV CONTENTS OF VOLUME 21 A New Laboratory XAFS Spectrometer for X-Ray Absorption Spectra of Light Elements S. YAMASHITA, K. TANIGUCHI, S$. NOMOTO, T. YAMAGUCHI AND H. WAKITA lodine Determination in Photographic Fixers by Energy Dispersive X-Ray Fluorescence M. A. MORSE NUMBER 3 MAY-JUNE 1992 Defects in Glasses Examined by Back-scattered Electron Imaging and by X-Ray Wavelength and Energy Dispersive Spectroscopy F. VALDRE Measurement of Relative Intensities of L-Shell X-Rays of Some Heavy Elements using Cd-109 Radioisotope Source J. B. DARKO AND G. K. TETTEH Compton Peak Shift in XRF Study of Graphite K. D. KUNDRA A Model for the Multi-Element Analysis of Prestea Gold ore with Energy-Dispersive X-Ray Fluor- escence (EDXRF) Analysis I. J. K.A BOH, S. A.B AMFORD AND G. K. TETTEH A Compton Peak Method for Incident Angle Determination in XRF with Annular Excitation E. D. GREAVES, L. S. BOHUS, L. MARCO AND M. ALVAREZ The Effect of the Photon Intensity Selected at Various Positions Under the Photopeak on the Mass Attenuation Coefficient of X-Rays B. R. KERUR, S. R. THONTADARYA AND B. HANUMAIAH X-Ray Analysis of Thin Ge,C,O.H Films M. F. EBEL, H. EBEL, M. MANTLER, J. WERNISCH, R. SVAGERA, M. GAZICKI, F. OLCAYTUG, J. SCHALKO, F. KOHL AND A. JACHIMOWICZ Glass Fibre Filter for Analysis of Aerosol Particles using Energy Dispersive X-ray Fluorescence A. SALAZAR Dependence of the Accuracy of the Results of Steel X-Ray Fluorescence Analysis on the Method of Considering the Variation of a Coefficients with Sample Chemical Composition E. 1. MOLCHANOVA, A. N. SMAGUNOVA, T. N. GUNICHEVA AND A. V. SMAGUNOV NUMBER 4 JULY-AUGUST 1992 From the Editor Obituary: Dr William Parrish (1914-1991) T. C. HUANG X-ray Fluorescence Intensity of an Element in Multicomponent Ores and the Use of Compton Radiation for Matrix Effect Correction N. DOMI Physical Parameters for L X-ray Production Cross-Sections S. PURI, B. CHAND, M. L. GARG, N. SINGH, J. H. HUBBELL AND P. N. TREHAN CONTENTS OF VOLUME 21 Background Determination in Wavelength Dispersive Electron Microprobe Analysis: Some Difficulties and Presentation of a New Analyatical Model M. FIALIN A Peak-to-Background Method for Electron-Probe X-Ray Microanalysis Applied to Individual Small Particles J. L. LABAR AND S. TOROK Carbon Ka@ Peak Shift Study Using Electron Probe Microanalyzer with a Vanadium-Carbon Mul- tilayer Pseudo-Crystal L. C. LIANG X-Ray K-Absorption Edge Studies in a-GayySe7) and a-GaySe7_ ,In, M. M. MALIK, A. N. NIGAM AND M. HUSAIN Molybdenum Concentration Profiles in Aluminium Cylinders by Means of Electron-Probe Micro- analysis P. G. VAZQUEZ AND J. A. RIVEROS Identification of the Lines in the L-Emission Spectrum of Cerium and Samarium B. D. SHRIVASTAVA, D. SINGH AND B. D. SHRIVASTAVA Book Review: Determination of the Precious Metals: Selected Instrumental Methods by J C VANLOON and R R Bareroor J. GILFRICH Meeting Report H. D. HITCHCOCK NUMBER 5 SEPTEMBER-OCTOBER 1992 From the Editor Obituary: Henry Chessin R. JENKINS Determination of Impurities in Nuclear-Grade Uranium Compounds by X-Ray Fluorescence Spec- trometry A. S. AL-AMMAR AND F. H. ALI The Absorption Correction in Electron Probe Microanalysis M. GABER Lorenztian Contributions to X-Ray Lineshapes in Si(Li) Spectroscopy J. L.C AMPBELL AND J.-X. WANG Accurate Description of Surface Ionization in Electron Probe Microanalysis: An Improved For- mulation C. MERLET K£/Ka Ratios and Chemical Effects in Partially Filled 3d-Shell Elements C. V. RAGHAVAIAH,N. V. RAO, G. S. KRISHNA MURTY, M. S. CHANDRASEKHAR RAO, S. B. REDDY AND D. L. SASTRY On the Validity of a Simple Approximation for Enhancement Calculations V. ROSSIGER vi CONTENTS OF VOLUME 21 Characterization of an X-Ray Source for the Fundamental Parameter Method I. POZSGAI Background Correction Procedure for Multi-channel X-Ray Fluorescent Spectrometers T. N. GUNICHEVA, V. P. AFONIN AND A. L. FINKELSHTEIN NUMBER 6 NOVEMBER-DECEMBER 1992 From the Editor REVIEW ARTICLE Figures-of-merit, their Philosophy, Design and Use R. JENKINS AND J. V. GILFRICH RESEARCH PAPERS Accuracy of Calibration Procedure for Energy Dispersive X-Ray Fluorescence Spectrometry A. MARKOWICZ, N. HASELBERGER AND P. MULENGA Ka X-ray Emission Induced by 1-100 MeV Protons S. BASSI, G. GLANFORMA AND M. SILARI Calculation of X-ray Fluorescence and Scattered Primary Radiation Intensities in X-Ray Fluorescence Analysis of Powder Slurry-Like Materials A. L. FINKELSHTEIN, T. N. GUNICHEVA, A. G. KALUGHIN AND V. P. AFONIN Chemical Analysis of Ream Defect in Float Glass D. R. LIU, J. S. PARK, R. E. BENOIT AND F. D. JACKSON High-Order Multiple Scattering Contributions in X-Ray Spectrometry R. SARTORI AND J. E. FERNANDEZ Meeting Report: 4ist Annual Denver Conference on Applications of X-ray Analysis J. V. GILFRICH Author Index