Ultramicroscopy 1994: Vol 53 Index

6 Pages·1994·1.5 MB·English

NH.
btarss ultramicroscopy
ELSEVIER Ultramicroscopy 53 (1994) 381-382
Author index to volume 53
Ashenford, D.A., see Hutchison 53 (1994) 91 of an ordered vacancy superlattice with
enhanced contrast 53 (1994) 91
Bangert, H., see Schattschneider 53 (1994) 181 Hytch, M.J. and W.M. Stobbs, The use of
Berger, S.D., see Eaglesham 53 (1994) 319 non-linear characteristics of a lattice
Block, J.H., see Medvedev 53 (1994) 27 fringe image for the characterisation of
Bruley, J., see Miillejans 53 (1994) 351 imaging parameters 53 (1994) 63
Hytch, M.J. and W.M. Stobbs, Quantitative
Casanove, M.-J., see Hutchison 53 (1994) 91
comparison of high resolution TEM im-
Cerva, H., see Thoma 53 (1994) 37
ages with image simulations 53 (1994) 191
Cherns, D., see Hutchison 53 (1994) 91
Cherns, D. and J.P. Morniroli, Analysis of
Ishizuka, K., Resolution improvement by
partial and stair-rod dislocations by large
tilted single-sideband holography: prelim-
angle convergent beam electron diffrac-
inary experiments 53 (1994) 9
tion 53 (1994) 167
Ishizuka, K., Number of sampling points re-
Chou, C.T., see Hutchison 53 (1994) 91
quired for aberration correction using
Cowley, J.M., see Liu 53 (1994) 333
off-axis electron holography 53 (1994) 297
Ishizuka, K., T. Tanji, A.T onomura, T. Ohno
Daykin, A.C., see Xiao 53 (1994) 325
and Y. Murayama, Aberration correction
Doukhan, J.C., see Van Cappellen 53 (1994) 343
using off-axis holography. I. Aberration
Duan, X.F., see Xin 53 (1994) 159
assessment 53 (19943)6 1
Eaglesham, D.J. and §.D. Berger, Energy
Jayaram, G., see Xu 53 (1994) 15
filtering the “thermal diffuse” back-
Jefferson, D.A., see Tang 53 (1994) 137
ground in electron diffraction 53 (1994) 319
Jouffrey, B., see Schattschneider 53 (19941)8 1
Endo, J., see Ru 53 (1994) 1
Engel, A., see Schabert 53 (1994) 147
Karrasch, S., see Schabert 53 (19941)4 7
Ernst, F., see Hofmann 53 (1994) 205
Kirkland, A.I., see Tang 53 (19941)3 7
Frank, J., see Penczek 53 (1994) 251 Knapp, H., see Schabert 53 (19941)4 7
Gajdardziska-Josifovska, M., see McCartney 53 (1994) 283 Lentzen, M., see Thust 53 (19941)0 1
Gajdardziska-Josifovska, M. and M.R. Mc- Lichte, H., see Schweda 53 (1994) 53
Cartney, Elimination of thickness depen- Liu, M. and J.M. Cowley, Structures of car-
dence from medium resolution electron bon nanotubes studied by HRTEM and
holograms 53 (1994) 291 nanodiffraction 53 (1994) 333
Gibson, J.M., see Twesten 53 (1994) 223 Lunn, B., see Hutchison 53 (1994) 91
Grassucci, R.A., see Penczek 53 (1994) 251
Marks, L.D., see Xu 53 (1994) 15
Haring, R., see Schabert 53 (1994) 147 Matteucci, G. and M. Muccini, On electron
Hofmann, D. and F. Ernst, Quantitative holographic mapping of electric and
high-resolution transmission electron mi- magnetic fields: recording and processing
croscopy of the incoherent 33 (211) problems and field information reliability 53 (1994) 19
boundary in Cu 53 (1994) 205 McCartney, M.R. and M. Gajdardziska-
Hutchison, J.L., C.T. Chou, M.-J. Casanove, Josifovska, Absolute measurement of
D. Cherns, J.W. Steeds, D.A. Ashenford normalized thickness, t/A;, from off-axis
and B. Lunn, HREM of Ga,Te,: imaging electron holography 53 (1994) 283
j Elsevier Science B.V.
|
i]
382 Author index / Ultramicroscopy 53 (1994) 381-382
McCartney, M.R., see Gajdardziska-Josi- Stobbs, W.M., see Hytch 53 (1994) 191
fovska 53 (1994) 291 Strahle, J., see Schweda 53 (1994) 53
Medvedev, V.K., Yu. Suchorski and J.H. Su, D.S., M. Swoboda and E. Zeitler,
Block, Lithium field desorption micro- Single-electron excitation of amorphous
scope: a new tool for surface investiga- carbon observed with energy filter 53 (1994) 97
tions 53 (1994) 27 Suchorski, Yu., see Medvedev 53 (1994) 27
Midgley, P.A., see Vincent 53 (1994) 271 Swoboda, M., see Su 53 (1994) 97
Moller, M., see Sheiko 53 (19943)7 1
Morniroli, J.P., see Cherns 53 (1994) 167 Tang, D., A.I. Kirkland and D.A. Jefferson,
Morniroli, J.P., see Redjaimia 53 (19943)0 5 Optimisation of high-resolution image
Muccini, M., see Matteucci 53 (1994) 19 simulations. II. Image selection in recip-
Millejans, H. and J. Bruley, Improvements rocal space 53 (1994) 137
in detection sensitivity by spatial differ- Tanji, T., see Ishizuka 53 (1994) 361
ence electron energy-loss spectroscopy at Thoma, S. and H. Cerva, Comparison of the
interfaces in ceramics 53 (1994) 351 information content in (110)- and
Murayama, Y., see Ishizuka 53 (1994) 361 {100)-projected high-resolution transmis-
sion electron microscope images for the
Ohno, T., see Ishizuka 53 (1994) 361
quantitative analysis of AlAs/GaAs in-
Osakabe, N., see Ru 53 (1994) 1 terfaces 53 (1994) 37
Thust, A., M. Lentzen and K. Urban, Non-
Penczek, P.A., R.A. Grassucci and J. Frank,
linear reconstruction of the exit plane
The ribosome at improved resolution:
wave function from periodic high-resolu-
new techniques for merging and orienta-
tion electron microscopy images 53 (1994) 101
tion refinement in 3D cryo-electron mi-
Tischler, Ch., see Schattschneider 53 (1994) 181
croscopy of biological particles 53 (1994) 251
Tonomura, A., see Ru 53 (1994) 1
Tonomura, A., see Ishizuka 53 (1994) 361
Radermacher, M., Three-dimensional recon-
struction from random projections: orien- Twesten, R.D. and J.M. Gibson, Kinematic
tational alignment via Radon transforms 53 (1994) 121 analysis of transmission electron diffrac-
tion data from Si(111)-7 x 7 53 (1994) 223
Redjaimia, A. and J.P. Morniroli, Applica-
tion of microdiffraction to crystal struc-
ture identification 53 (1994) 305 Urban, K., see Thust 53 (1994) 101
Reuvekamp, E.M.C.M., see Sheiko 53 (1994) 371
Richter, K., High-density morphologies of Van Cappellen, E. and J.C. Doukhan, Quan-
ice in high-pressure frozen biological titative transmission X-ray microanalysis
specimens 53 (1994) 237 of ionic compounds 53 (1994) 343
Ru, Q., N. Osakabe, J. Endo and A. Tono- Vincent, R. and P.A. Midgley, Double coni-
cal beam-rocking system for measure-
mura, Electron holography available in a
ment of integrated electron diffraction
non-biprism transmission electron micro-
scope 53 (1994) 1 intensities 53 (1994) 271
Volkl, E., see Schweda 53 (1994) 53
Schabert, F., H. Knapp, S. Karrasch, R.
Haring and A. Engel, Confocal scanning Wang, Z.L., Dislocation contrast in high-an-
laser — scanning probe hybrid microscope gle hollow-cone dark-field TEM 53 (1994) 73
for biological applications 53 (1994) 147
Schattschneider, P., B. Jouffrey, Ch. Tischler Xiao, H.Z. and A.C. Daykin, Extra diffrac-
and H. Bangert, The chromatic image tions caused by stacking faults in cubic
shift in spatially resolved EELS 53 (1994) 181 crystals 53 (1994) 325
Schweda, E., J. Strahle, H. Lichte and E. Xin, Y. and X.F. Duan, Reasonably good
Volkl, Combination of high-resolution images of dislocations in LACBED pat-
electron imaging and holography in the terns and effects of dislocation strain
investigation of the modulated structure fields on the Bragg lines 53 (1994) 159
of Zr,ON,F; 53 (1994) 53 Xu, P., G. Jayaram and L.D. Marks, Cross-
Sheiko, S.S., M. M6ller, E.M.C.M. correlation method for intensity mea-
Reuvekamp and H.W. Zandbergen, Eval- surement of transmission electron
uation of the probing profile of scanning diffraction patterns 53 (1994) 15
force microscopy tips 53 (1994) 371
Steeds, J.W., see Hutchison 53 (1994) 91 Zandbergen, H.W., see Sheiko 53 (1994) 371
Stobbs, W.M., see Hytch 53 (1994) 63 Zeitler, E., see Su 53 (1994) 97
Subject guide to volume 53
General methods in microscopy
High resolution transmission electron microscopy (HRTEM)
High voltage electron microscopy (HVEM)
Holography
Exit wave reconstruction
Three-dimensional reconstruction and stereo microscopy
Electron diffraction
Electron energy loss spectroscopy (EELS)
X-ray microanalysis
Miscellaneous methods
Specimen-related methods
Microscopic methods, specifically for catalysts and small particles
Microscopic methods, specifically for solid interfaces and multilayers
Microscopic methods, specifically for surfaces
Cryomicroscopic methods
Tools
Electron microscope design and characterization
Tip scanning instrument design and characterization
Instrument control and alignment
Miscellaneous instruments
Theories
Electron diffraction and elastic scattering theory, image simulation
Inelastic electron scattering theory
ultramicroscopy
ELSEVIER Ultramicroscopy 53 (1994) 384-386
Subject index to volume 53
Quantitative comparison of high resolution
Cryomicroscopic methods
TEM images with image simulations,
High-density morphologies of ice in high-
Hytch and Stobbs 53 (1994) 191
pressure frozen biological specimens,
Richter 53 (1994) 237
Electron energy loss spectroscopy (EELS)
The ribosome at improved resolution: new
Single-electron excitation of amorphous car-
techniques for merging and orientation
bon observed with energy filter, Su, Swo-
refinement in 3D cryo-electron mi-
boda and Zeitler 53 (1994) 97
croscopy of biological particles, Penczek,
The chromatic image shift in spatially re-
Grassucci and Frank 53 (1994) 251
solved EELS, Schattschneider, Jouffrey,
Electron diffraction Tischler and Bangert 53 (1994) 181
Cross-correlation method for intensity mea- Energy filtering the “thermal diffuse” back-
surement of transmission electron ground in electron diffraction, Eagle-
diffraction patterns, Xu, Jayaram and sham and Berger 53 (1994) 319
Marks 53 (1994) 15 Improvements in detection sensitivity by spa-
Reasonably good images of dislocations in tial difference electron energy-loss spec-
LACBED patterns and effects of disloca- troscopy at interfaces in ceramics,
tion strain fields on the Bragg lines, Xin Miillejans and Bruley 53 (1994) 351
and Duan 53 (1994) 159
Analysis of partial and stair-rod dislocations Electron microscope design and characterization
by large angle convergent beam electron Double conical beam-rocking system for
diffraction, Cherns and Morniroli 53 (1994) 167 measurement of integrated electron
Kinematic analysis of transmission electron diffraction intensities, Vincent and Midg-
diffraction data from Si(111)-7 x 7, ley 53 (1994) 271
Twesten and Gibson 53 (1994) 223 Aberration correction using off-axis hologra-
Double conical beam-rocking system for phy. I. Aberration assessment, /shizuka,
measurement of integrated electron Tanji, Tonomura, Ohno and Murayama 53 (1994) 361
diffraction intensities, Vincent and Midg-
Exit wave reconstruction
ley 53 (1994) 271
Resolution improvement by tilted single-
Application of microdiffraction to crystal
sideband holography: preliminary experi-
structure identification, Redjaimia and
ments, Ishizuka 53 (1994) 9
Morniroli 53 (1994) 305
Non-linear reconstruction of the exit plane
Energy filtering the “thermal diffuse” back-
wave function from periodic high-resolu-
ground in electron diffraction, Eagle-
sham and Berger 53 (1994) 319 tion electron microscopy images, Thust,
Lentzen and Urban 53 (1994) 101
Extra diffractions caused by stacking faults
Number of sampling points required for
in cubic crystals, Xiao and Daykin 53 (1994) 325
aberration correction using off-axis elec-
Structures of carbon nanotubes studied by
tron holography, /shizuka 53 (1994) 297
HRTEM and nanodiffraction, Liu and
Aberration correction using off-axis hologra-
Cowley 53 (1994) 333
phy. I. Aberration assessment, /shizuka,
Electron diffraction and elastic scattering theory, Tanji, Tonomura, Ohno and Murayama 53 (1994) 361
image simulation
Optimisation of high-resolution image simu- High resolution transmission electron microscopy (HRTEM)
lations. II. Image selection in reciprocal Comparison of the information content in
space, Tang, Kirkland and Jefferson 53 (1994) 137 (110>- and (100)-projected high-resolu-
Elsevier Science B.V. |
|
Subject index / Ultramicroscopy 53 (1994) 384-386 385
tion transmission electron microscope Inelastic electron scattering theory
images for the quantitative analysis of Single-electron excitation of amorphous car-
AlAs /GaAs interfaces, Thoma and Cerva 53 (1994) 37 bon observed with energy filter, Su, Swo-
Combination of high-resolution electron boda and Zeitler 53 (1994) 97
imaging and holography in the investiga- Energy filtering the “thermal diffuse” back-
tion of the modulated structure of ground in electron diffraction, Eagle-
Zr,ON,F;, Schweda, Strahle, Lichte and sham and Berger 53 (1994) 319
Volkl 53 (1994) 53
The use of non-linear characteristics of a Instrument control and alignment
lattice fringe image for the characterisa- The use of non-linear characteristics of a
tion of imaging parameters, Hytch and lattice fringe image for the characterisa-
Stobbs 53 (1994) 63 tion of imaging parameters, Hytch and
HREM of Ga,Te,: imaging of an ordered Stobbs 53 (1994) 63
vacancy superlattice with enhanced con- The chromatic image shift in spatially re-
trast, Hutchison, Chou, Casanove, Cherns, solved EELS, Schattschneider, Jouffrey,
Steeds, Ashenford and Lunn 53 (1994) 91 Tischler and Bangert 53 (1994) 181
Quantitative comparison of high resolution
TEM images with image simulations, Microscopic methods, specifically for catalysts
Hytch and Stobbs 53 (1994) 191 and small particles
Quantitative high-resolution transmission Structures of carbon nanotubes studied by
electron microscopy of the incoherent 33 HRTEM and nanodiffraction, Liu and
(211) boundary in Cu, Hofmann and Ernst 53 (1994) 205 Cowley 53 (1994) 333
Microscopic methods, specifically for solid interfaces
High voltage electron microscopy (HVEM)
and multilayers
Quantitative high-resolution transmission
Comparison of the information content in
electron microscopy of the incoherent 33
{110)- and <100)-projected high-resolu-
(211) boundary in Cu, Hofmann and Ernst 53 (1994) 205
tion transmission electron microscope
images for the quantitative analysis of
Holography AlAs /GaAs interfaces, Thoma and Cerva 53 (1994) 37
Electron holography available in a non-bi-
prism transmission electron microscope, Microscopic methods, specifically for surfaces
Ru, Osakabe, Endo and Tonomura 53 (1994) 1 Kinematic analysis of transmission electron
Resolution improvement by tilted single- diffraction data from Si(111)-7 x 7,
sideband holography: preliminary experi- Twesten and Gibson 53 (1994) 223
ments, Ishizuka 53 (1994) 9
On electron holographic mapping of electric Miscellaneous instruments
and magnetic fields: recording and pro- Lithium field desorption microscope: a new
cessing problems and field information tool for surface investigations, Medvedev,
reliability, Matteucci and Muccini 53 (1994) 19 Suchorski and Block 53 (1994) 27
Combination of high-resolution electron
imaging and holography in the investiga- Miscellaneous methods
tion of the modulated structure of Dislocation contrast in high-angle hollow-
Zr,ON;3F;, Schweda, Strahle, Lichte and cone dark-field TEM, Wang 53 (1994) 73
Volkl 53 (1994) 53
Absolute measurement of normalized thick- Tip scanning instrument design and characterization
ness, ¢/A;, from off-axis electron holog- Confocal scanning laser — scanning probe
raphy, McCartney and Gajdardziska- hybrid microscope for biological applica-
Josifouska 53 (1994) 283 tions, Schabert, Knapp, Karrasch, Haring
Elimination of thickness dependence from and Engel 53 (1994) 147
medium resolution electron holograms, Evaluation of the probing profile of scanning
Gajdardziska-Josifouska and McCartney 53 (1994) 291 force microscopy tips, Sheiko, Moller,
Number of sampling points required for Reuvekamp and Zandbergen 53 (1994) 371
aberration correction using off-axis elec-
tron holography, /shizuka 53 (1994) 297 Three-dimensional reconstruction and stereo microscopy
Aberration correction using off-axis hologra- Three-dimensional reconstruction from ran-
phy. I. Aberration assessment, /shizuka, dom projections: orientational alignment
Tanji, Tonomura, Ohno and Murayama 53 (1994) 361 via Radon transforms, Radermacher 53 (1994) 121
386 Subject index / Ultramicroscopy 53 (1994) 384-386
The ribosome at improved resolution: new X-ray microanalysis
techniques for merging and orientation Quantitative transmission X-ray microanaly-
refinement in 3D cryo-electron mi- sis of ionic compounds, Van Cappellen
croscopy of biological particles, Penczek, and Doukhan 53 (1994) 343
Grassucci and Frank 53 (1994) 251