Ultramicroscopy 1993 - 1995: Vol 51-60 Index

39 Pages·8.2 MB·English

NH,
are
te
ultramicroscopy
ELSEVIER Ultramicroscopy 60 (1995) 445-464
Author index to volumes 51-—60
Abstreiter, G., sez Kolb 57 (1995) 208 Ataka, T., see Fujihira 57 (1995) 176
Agrait, N., see Vélez 60 (1995) 41 Atici, Y. and D. Cherns, Observation of crystal
Alarco, J.A., E. Olsson, Z.G. Ivanov, P.A. Nils- distortions in SiGe /Si superlattice using a
son, D. Winkler, E.A. Stepantsov and A.Ya. new application of large-angle convergent-
Tzalenchuk, Microstructure of an artificial beam electron diffraction 58 (19954)3 5
grain boundary weak link in an YBa),- Auchterlonie, G.J., see Anstis 52 (1993) 167
Cu,0;_, thin film grown on a (100X110), Awaji, M., see Sukedai 54 (1994) 192
[001 }-tilt Y-ZrO, bicrystal 51 (1993) 239 Ayache, J. and P.H. Albaréde, Application of
Albaréde, P.H., see Ayache 60 (1995) 195 the ionless tripod polisher to the preparation
Allard, L., see Joy 51 (1993) 1 of YBCO superconducting multilayer and
Allard, L., see Zhang 51 (1993) 21 bulk ceramics thin films 60 (1995) 195
Allard, L.F., see Volkl 58 (1995) 97
Allen, C.W., In situ ion- and electron-irradia-
tion effects studies in transmission electron Baba, T., see Horita 58 (1995) 327
microscopes 56 (1994) 200 Baba-Kishi, K.Z., Shadow imaging of surface
Allen, E.V., see Dunn 57 (1995) 113 topography in a conventional scanning elec-
Allen, L.J., T.W. Josefsson and C.J. Rossouw, tron microscope by forward scattered elec-
Interaction delocalization in characteristic trons 54(1994) 1
X-ray emission from light elements 55 (1994) 258 Bachelot, R., see Gleyzes 57 (1995) 318
Allen, L.J., see Spargo 55 (1994) 329 Bacher, A., see Ribenkamm 58 (19953)3 7
Amelinckx, S., O. Milat and G. Van Tendeloo, Bachmann, L., see Ribenkamm 58 (19953)3 7
Selective imaging of sublattices in complex Balasubramaniam, S., see Cloninger 57 (19952)2 3
structures 51 (1993) 90 Bange, K., see Becker 52 (1993) 73
Amelinckx, S., see Van Tendeloo 51 (1993) 168 Bangert, H., see Schattschneider 53 (1994) 181
Amelinckx, S., see Zhang 54 (1994) 237 Banhart, F., Strains in crystals with amorphous
Amelinckx, S., see Zhang 55 (1994) 25 surface films studied by convergent beam
Anderson, G.A., see Dunn 57 (1995) 113 electron diffraction and high-resolution
Anderson, S.C., see Chou 55 (1994) 334 imaging 56 (1994) 233
Anderson, S.L., see Ramachandran 51 (19932)8 2 Barber, D.J., Radiation damage in ion-milled
Andersson, T.G., see Olsson 51 (1993) 215 specimens: characteristics, effects and meth-
Ando, T., Y. Taniguchi, Y. Takai, Y. Kimura, ods of damage limitation 52 (1993) 101
R. Shimizu and T. Ikuta, Development of Barchiesi, D. and D. Van Labeke, A perturba-
real-time defocus-modulation-type active tive diffraction theory of a multilayer sys-
image processing (DMAIP) for spherical- tem: applications to near-field optical mi-
aberration-free TEM observation 54 (1994) 261 croscopy SNOM and STOM 57 (1995) 196
Anstis, G.R., G.J. Auchterlonie and J.C. Barry, Barkshire, I.R., see Kenny 56 (1994) 289
Analysis of power spectra of high resolution Barkshire, I.R., see Prutton 59 (1995) 47
electron micrographs 52 (1993) 167 Barreteau, C. and F. Ducastelle, The orthogo-
Aoyama, K., see Ru 55 (1994) 209 nalized plane-wave method applied to the
Aoyama, K., K. Ogawa, Y. Kimura and Y. calculation of dynamical effects in electron
Fujiyoshi, A method for 2D crystallization diffraction 57 (1995) 11
of soluble proteins at liquid—liquid interface 57 (19953)4 5 Barry, J.C., see Anstis 52 (1993) 167
Ashenford, D.A., see Hutchison 53 (1994) 91 Barry, J.C., A study of nickel sulphide stones in
Ataka, T., see Fujihira 57 (1995) 118 tempered glass 52 (1993) 297
Ataka, T., see Muramatsu 57 (1995) 141 Bartsch, M., see Messerschmidt 56 (1994) 163
Elsevier Science B.V.
446 Author index to volumes 51-60
Batson, P.E., Conduction bandstructure in Bonnet, N., Erratum to **Preliminary investiga-
strained silicon by spatially resolved elec- tion of two methods for the automatic han-
tron energy loss spectroscopy 59 (1995) 63 dling of multivariate maps in microanalysis”’
Bauer, S., A. Rosenauer, P. Link, W. Kuhn, J. [Ultramicroscopy 57 (1995) 17-27] 58 (19954)4 1
Zweck and W. Gebhardt, Misfit dislocations Bonnet, N., M. Herbin and P. Vautrot, Exten-
in epitaxial ZnTe/GaAs (001) studied by sion of the scatterplot approach to multiple
HRTEM 51 (19932)2 1 images 60 (19953)4 9
Baumann, F.H., see Kisielowski 58 (1995) 131 Bonnet, R., see Loubradou 51 (1993) 270
Baumeister, W., see Ribenkamm 58 (1995) 337 Booker, G.R., see Konkol 55 (1994) 183
Bayle, P., T. Deutsch, B. Gilles, F. Langon, A. Booker, G.R., see Konkol 58 (19952)3 3
Marty and J. Thibault, Quantitative analysis Boothroyd, C.B. and C.J. Humphreys, Measur-
of the deformation and chemical profiles of ing the height of steps on MgO cubes using
strained multilayers 56 (1994) 94 Fresnel contrast in a scanning transmission
Becker, O. and K. Bange, Ultramicrotomy: an electron microscope 52 (1993) 318
alternative cross section preparation for oxi- Boothroyd, C.B., see Cullen 56 (1994) 127
dic thin films on glass 52 (1993) 73 Boothroyd, C.B., see Botton 59 (1995) 93
Beeching, M.J. and A.E.C. Spargo, A method Boothroyd, C.B., see Meyer 59 (19952)8 3
for crystal potential retrieval in HRTEM 52 (19932)4 3 Boseck, S., see HOper 60 (1995) 17
Beeching, M.J., see Spargo 55 (1994) 329 Béttcher, B., Electron cryo-microscopy of
Behal, S.K., see Hunt 58 (1995) 55 graphite in amorphous ice 58 (19954)1 7
Belmont, A., see Delaney 56 (1994) 319 Botton, G.A., see Burgess 55 (19942)7 6
Bentley, J., see Wang 51 (1993) 64 Botton, G.A., C.B. Boothroyd and W.M.
Berger, A., J. Mayer and H. Kohl, Detection Stobbs, Momentum dependent energy loss
limits in elemental distribution images pro- near edge structures using a CTEM: the
duced by energy filtering TEM: case study reliability of the methods available 59 (1995) 93
of grain boundaries in Si,N, 55 (1994) 101 Boudet, A., see Tournier-Lasserve 58 (1995) 123
Berger, A., see Kohl 59 (1995) 191 Boudreau, B.D., see Cloninger 57 (19952)2 3
Berger, A., see Dinges 60 (1995) 49 Boulin, C., see Haider 54(1994) 41
Berger, S.D., see Eaglesham 53 (1994) 319 Bow, J.S., L.M. Porter, MJ. Kim, R.W. Car-
Bernaerts, D., see Zhang 55 (1994) 25 penter and R.F. Davis, Thin film Ti /6H-SiC
Berriman, J. and N. Unwin, Analysis of tran interfacial reaction: high spatial resolution
sient structures by cryo-microscopy com- electron microscopy study 52 (19932)8 9
bined with rapid mixing of spray droplets 56 (1994) 241 Boyd, J.T., see Choo 57 (19951)2 4
Beveridge, T.J., see Firtel 55 (1994) 113 Bradley, S.A. and W.E. King, Foreword 51 (1993) vii
Bierwolf, R. and M. Hohenstein, Premise-free Brandow, S.L., see Turner 58 (19954)2 5
reconstruction of the exit-surface wave Brandt, J., see Ribenkamm 58 (19953)3 7
function in HRTEM 56 (1994) 32 Braun, H.G., see Burmester 55 (1994) 55
Binks, C.J., see Williamson 57 (1995) 235 Braun, N., see Riibenkamm 58 (19953)3 7
Bird, D.M., see Saunders 60 (1995) 311 Bricogne, C., see Voigt-Martin 56 (19942)7 1
Bithell, E.G., R.C. Doole and M.J. Goringe, On Brink, J., see Leapman 52 (19931)5 7
the extraction of high quality data from Broeckx, J., M. Op de Beeck and D. Van Dyck,
real-time transmission electron microscopy A useful approximation of the exit wave
experiments 56 (1994) 172 function in coherent STEM 60 (1995) 71
Blackford, B., see Firtel 55 (1994) 113 Brohan, P., see Rez 59 (19951)5 9
Blanche, G., see Hug 59 (1995) 121 Brown, L.M.., see Ito 52 (19933)4 7
Bleloch, A.L., see Ito 52 (19933)4 7 Bruley, J., see Millejans 53 (19943)5 1
Bleloch, A.L., see Millejans 52 (1993) 360 Bruley, J., see Brydson 59 (1995) 81
Bleloch, A.L., M.R. Castell, A. Howie and Bruley, J., see Rez 59 (19951)5 9
C.A. Walsh, Atomic and electronic Z-con- Brydson, R., J. Bruley, H. Miillejans, C. Scheu
trast effects in high-resolution imaging 54 (1994) 107 and M. Rihle, Modelling the bonding at
Bleloch, A.L., see Tomita 54 (1994) 125 metal—ceramic interfaces using PEELS in
Block, J.H., see Medvedev 53 (1994) 27 the STEM 59 (1995) 81
Boccara, A.C., see Gleyzes 57 (1995) 318 Buckett, M.I. and K.L. Merkle, Determination
Bohm, G., see Kolb 57 (1995) 208 of grain boundary volume expansion by
Bolger, B., see Moers 57 (19952)9 8 HREM 56 (1994) 71
Bolton, J.P.R. and M. Chen, Electron energy Bunn, R.D., see Joy 51 (1993) 1
loss in multilayered slabs 60 (1995) 247 Burgess, W.G., A.R. Preston, G.A. Botton, N.J.
Bonnet, N., Preliminary investigation of two Zaluzec and C.J. Humphreys, Benefits of
methods for the automatic handling of mul- energy filtering for advanced convergent
tivariate maps in microanalysis 57 (1995) 17 beam electron diffraction patterns 55 (1994) 276
Author index to volumes 51-60 447
Burgess, W.G., see Saunders 60 (19953)1 1 Chen, F.-R., see Chen 51 (19933)1 6
Burmester, C., H.G. Braun and R.R. Schréder, Chen, F.R., S.K. Chiou, L. Chang and C.S.
A new quasi-confocal image plate scanner Hong, High-resolution electron microscopy
with improved spatial resolution and ideal of Cu/MgO and Pd/MgoO interfaces 54 (1994) 179
detection efficiency 55 (1994) 55 Chen, J., see Hirayama 54(1994) 9
Butler, B.D. and J.B. Cohen, What the latest Chen, J., see Ishizuka 60 (1995) 25
diffraction techniques can tell us about an Chen, L.J., J.M. Liang, C.S. Liu, W.Y. Hsieh,
old material: steel 52 (1993) 238 J.H. Lin, T.L. Lee, M.H. Wang and W.J.
Buttle, K., see Penczek 60 (1995) 393 Chen, High-resolution transmission electron
microscopy investigation of interfaces in
metal—silicon systems 54 (1994) 156
Cai, Z.-X., see Zhu 52 (1993) 539 Chen, M., see Bolton 60 (19952)4 7
Campbell, G.H., see King 51 (1993) 128 Chen, W.-J. and F.-R. Chen, HRTEM study of
Campbell, G.H., W.L. Wien, W.E. King, S.M. atomic faceting of asymmetrical twin and
Foiles and M. Rihle, High-resolution elec- asymmetrical hetero-twin boundaries in
tron microscopy investigation of the (710) NiSi, /Si 51 (1993) 316
twin in Nb 51 (1993) 247 Chen, W.J., see Chen 54 (1994) 156
Campbell, G.H., see King 56 (1994) 46 Chen, Y. and R.K. Kupka, Analysis of the near
Cantow, H-J., see Wawkuschewski 58 (1995) 185 field image formation of dielectric gratings 57 (1995) 153
Carazo, J.M., see De la Fraga 60 (1995) 385 Cheng, N., see Kocsis 60 (19952)1 9
Carim, A.H. and T.E. Mitchell, 90° boundaries Cheng, S.C., see Egerton 55 (1994) 43
and associated interfacial and stand-off par- Cheng, S.C., see Wang 59 (1995) 109
tial dislocations in YBa,Cu,O, x 51 (19932)2 8 Cheng, T.Z., see Fu 54 (1994) 229
Carpenter, R.W., see Bow 52 (19932)8 9 Cherns, D., see Hutchison 53 (1994) 91
Carragher, B.O., see Whittaker 58 (19952)4 5 Cherns, D. and J.P. Morniroli, Analysis of par-
Carrascosa, J.L., see Vélez 60 (1995) 41 tial and stair-rod dislocations by large angle
Carter, C.B., see Tietz 60 (19952)4 1 convergent beam electron diffraction 53 (1994) 167
Casanove, M.-J., see Hutchison 53 (1994) 91 Cherns, D., see Atici 58 (1995) 435
Caspar, D., see Ruiz 55 (1994) 383 Chevalier, J.-P. and M.J. Hytch, Simulating the
Castell, M.R., see Bleloch 54 (1994) 107 exit wave function for uniformly disordered
Castell, M.R., see Perovic 58 (19951)0 4 systems 52 (19932)5 3
Castiaux, A., A. Dereux, J.-P. Vigneron, C. Chevalier, J.-P., see Hytch 52 (19934)1 5
Girard and O.J.F. Martin, Electromagnetic Chevalier, J.P., see H¥tch 58 (1995) 114
fields in two-dimensional models of near- Chiang, A., see Sinclair 51 (1993) 41
field optical microscope tips 60(1995) 1 Chiba, N., see Muramatsu 57 (19951)4 1
Cates, C., see Ghaemi 57 (1995) 165 Chiou, S.K., see Chen 54 (19941)7 9
Cavalcoli, D., G. Matteucci and M. Muccini, Chiu, W., see Leapman 52 (19931)5 7
Simulation of electron holographic contour Choo, A.G., M.H. Chudgar, H.E. Jackson, G.N.
maps of linear charged dislocations 57 (1995) 385 De Brabander, M. Kumar and J.T. Boyd,
Cazaux, J., Correlations between ionization ra- Photon scanning tunneling microscopy of
diation damage and charging effects in optical channel waveguides 57 (1995) 124
transmission electron microscopy 60 (19954)1 1 Chou, C.T., see Hutchison 53 (1994) 91
Ceh, M., see Gu 59 (19952)1 5 Chou, C.T., S.C. Anderson, D.J.H. Cockayne,
Cerritelli, M.E., see Kocsis 60 (1995) 219 A.Z. Sikorski and M.R. Vaughan, Surface
Cerva, H., V. Huber, W. Eckers and A. Mitwal- relaxation of strained heterostructures re-
sky, Specific preparation procedures for vealed by Bragg line splitting in LACBED
failure analysis of (sub)micron areas in sili- patterns 55 (1994) 334
con devices 52 (1993) 127 Christensen, D.A., Analysis of near field tip
Cerva, H., see Thoma 53 (1994) 37 patterns including object interaction using
Chang, C., see Turner 58 (1995) 425 finite-difference time-domain calculations 57 (1995) 189
Chang, L., see Chen 54 (1994) 179 Chudgar, M.H., see Choo 57 (1995) 124
Chang, Y.C. and J.M. Howe, In situ HRTEM Clarke, D.R., see De Graef 52 (1993) 179
study of {) precipitate dissolution in an Claverie, A., see Liliental-Weber 52 (1993) 570
Al—Cu—Mg-Ag alloy 51 (1993) 46 Cline, J.A. and M. Isaacson, Comparison of
Chau, K.-L., see Kirkland 57 (19953)5 5 different modes of reflection in near-field
Chen, C.Y. and W.M. Stobbs, The a-fringe optical imaging 57 (1995) 147
contrast of thin twins in relation to the Cloninger, T.L., S. Balasubramaniam, B.D.
anomalous weak-beam contrast of stacking Boudreau, J. Raja and R.J. Hocken, A sim
faults 58 (1995) 289 ple technique for screening near-field probes 57 (1995) 223
448 Author index to volumes 51-60
Cockayne, DJ.H., see Chou 55 (1994) 334 De Graef, M., D.R. Clarke and J.S. Speck, In
Cohen, J.B., see Butler 52 (1993) 238 situ domain multiplication and migration in
Cole, J.S.W., see Perovic 58 (1995) 104 the antiferroelectric ceramic PLSnZT 52 (1993) 179
Colliex, C., see Tencé 58 (1995) 42 De Hollander, R.B.G., N.F. van Hulst and
Colliex, C., see Yuan 59 (1995) 149 R.P.H. Kooyman, Near field plasmon and
Corbett, J.M., see Robertson 58 (1995) 175 force microscopy 57 (1995) 263
Cowley, J.M., see Liu 52 (19933)3 5 De Hosson, J.Th.M., see Verwerft 56 (1994) 135
Cowley, J.M., see Tsai 52 (1993) 400 De la Fraga, L.G., J. Dopazo and J.M. Carazo,
Cowley, J.M., see Liu 53 (19943)3 3 Confidence limits for resolution estimation
Cowley, J.M., see Wang 55 (19942)2 8 in image averaging by random subsampling 60 (19953)8 5
Cowley, J.M., see Hsu 55 (1994) 302 De Meulenaere, P.. D. Van Dyck, G. Van
Cowley, J.M., Chromatic coherence and inelas- Tendeloo and J. Van Landuyt, Dynamical
tic scattering in electron holography 57 (19953)2 7 electron diffraction in substitutionally disor-
Cowley, J.M., see Huang 57 (19953)9 1 dered column structures 60 (19951)7 1
Cowley, J.M., M.S. Hansen and S.-Y. Wang, De Meulenaere, P., G. Van Tendeloo, J. Van
Imaging modes with an annular detector in Landuyt and D. Van Dyck, On the interpre-
STEM 58 (1995) 18 tation of HREM images of partially ordered
Cowley, J.M., see Gajdardziska-Josifovska 58 (1995) 65 alloys 60 (19952)6 5
Cowley, J.M., see Mankos 58 (1995) 87 De Ruijter, W.J., see Smith 52 (19935)9 1
Cramer, K., see Wawkuschewski 58 (19951)8 5 De Ruijter, W.J., R. Sharma, M.R. McCartney
Craven, A.J., see Garvie 54(1994) 83 and DJ. Smith, Measurement of lattice-
Creuzet, F., see Piednoir 57 (19952)8 2 fringe vectors from digital HREM images:
Crone, M., see Prutton 59 (1995) 47 experimental precision 57 (19954)0 9
Crozier, P.A., see Pan 52 (19934)8 7 De Veirman, A.E.M., F.J.G. Hakkens and A.G.
Crozier, P.A., Quantitative elemental mapping Dirks, Cross-sectional transmission electron
of materials by energy-filtered imaging 58 (1995) 157 microscopy studies of metallic multilayers 51 (1993) 306
Csillag, S., see Yuan 59 (1995) 149 Deem, M.W., see Treacy 52 (19935)1 2
Cullen, S.L., C.B. Boothroyd and C.J. Deininger, C., G. Necker and J. Mayer, Deter-
Humphreys, Interpretation of the {100} mination of structure factors, lattice strains
fringes in lattice images from the centre of and accelerating voltage by energy-filtered
carbon nanotubes 56 (1994) 127 cenvergent beam electron diffraction 54(1994) 15
Currie, J.E., see Robertson 58 (1995) 175 Delaney, A.H. and A. Belmont, Restoration of
Cyrklaff, M. and W. Kihlbrandt, High-resolu- high-tilt electron micrographs using a focus
tion electron microscopy of biological spec- series 56 (1994) 319
imens in cubic ice 55 (1994) 141 Den Dekker, A.J., see Van den Bos 60 (1995) 345
Dereux, A., see Castiaux 60(1995) 1
Datye, A., see Volkl 58 (1995) 97 DeRosier, D.J., see Ruiz 55 (1994) 383
Datye, A.K., see Ramachandran 51 (19932)8 2 Deutsch, T., see Bayle 56 (1994) 94
Datye, A.K., see Yao 52 (19932)8 2 D’Hoore, A., see Vinckier 57 (19953)3 7
Davis, R.F., see Bow 52 (19932)8 9 Diaz-Avalos, R., see Ruiz 55 (1994) 383
Daw, M.S., see Mills 56 (1994) 79 Dietzsch, Ch., see Driesel 57 (1995) 45
Dawson, P., K.W. Smith, F. de Fornel and J.-P. Dijken, D.K., see Verwerft 56 (1994) 135
Goudonnet, Imaging of surface plasmon Dinges, C., H. Kohl and H. Rose, High-resolu-
launch and propagation using a photon tion imaging of crystalline objects by hol-
scanning tunneling microscope 57 (19952)8 7 low-cone illumination 55 (1994) 91
Daykin, A.C., see Xiao 53 (1994) 325 Dinges, C., A. Berger and H. Rose, Simulation
Daykin, A.C., A report on speckle and coherent of TEM images considering phonon and
diffraction phenomena in selected-area electronic excitations 60 (1995) 49
transmission electron diffraction patterns 55 (19941)2 1 Dirks, A.G., see De Veirman 51 (1993) 306
Daykin, A.C., Letter to the Editor concerning Disko, M.M., see Hunt 58 (1995) 55
Ultramicroscopy 53 (1994) 325-331 56 (1994) xv Dong, F.X., see Goodman 55 (1994) 314
Daykin, A.C. and A.K. Petford-Long, Quantita- Doole, R.C., see Bithell 56 (1994) 172
tive mapping of the magnetic induction dis- Door, R. and D. Gangler, Multiple least-squares
tribution using Foucault images formed in a fitting for quantitative electron energy-loss
transmission electron microscope 58 (19953)6 5 spectroscopy — an experimental investiga-
De Brabander, G.N., see Choo 57 (1995) 124 tion using standard specimens 58 (1995) 197
De Fornel, F., see Dawson 57 (19952)8 7 Dopazo, J., see De la Fraga 60 (1995) 385
Author index to volumes 51—60 449
Dorset, D.L., S. Kopp, J.R. Fryer and W.F. Ellisman, M.H., see Fan 52 (19934)9 9
Tivol, The Sayre equation in electron crys- Ellisman, M.H., see Fan 55(1994) 7
tallography 57 (1995) 59 Ellisman, M.H., see Fan 55 (19941)5 5
Doukhan, J.C., see Van Cappellen 53 (1994) 343 Endo, J., see Ru 53 (1994) 1
Downing, K.H., see Glaeser 52 (19934)7 8 Endo, J., see Ru 55 (1994) 209
Downing, K.H., see Perkins 60( 19952)8 3 Endoh, H., see Kumao 54 (1994) 201
Downing, K.H., see McEwen 60 (1995) 357 Endoh, H. and H. Hashimoto, Atomic resolu-
Dravid, V.P., see Wang 52 (19935)2 3 tion electron microscope images formed by
Dravid, V.P., see Ravikumar 52 (19935)5 7 Si L ,-ionization electrons 54 (19943)5 1
Dravid, V.P., see Zhang 57 (1995) 103 Endoh, H., H. Hashimoto and Y. Makita, Theo-
Dravid, V.P., see Wang 59 (1995) 109 retical and observed electron microscope
Driesel, W., Low-energy ion optical system images of impurity atoms in thin crystals
with a liquid-metal ion source for imaging formed by L-shell ionization electrons 56 (19941)0 8
and processing solid structures 52 (1993) 65 Engel, A., see Schabert 53 (19941)4 7
Driesel, W., Ch. Dietzsch, H. Niedrig and B. Engelborghs, Y., see Vinckier 57 (19953)3 7
Praprotnik, HV TEM in situ investigations Epstein, A., see Haider 54(1994) 41
of the tip shape of a gallium liquid-metal Ernst, F., see Hofmann 53 (19942)0 5
ion /electron emitter 57 (1995) 45 Ewing, R.C., see Wang 51 (1993) 339
Duan, X.F., see Xin 53 (1994) 159 Exner, A., see Schattschneider 59 (19952)4 1
Ducastelle, F., see Barreteau 57 (1995) 11 Eyring, L., see Kang 52 (19933)7 7
Dudarev, S.L., see Peng 52 (19933)1 2 Eyring, L., see Tong 52 (19933)8 8
Dudarev, S.L., L.-M. Peng and M.J. Whelan,
Distorted wave approach to diffuse scatter-
ing in THEED and RHEED 52 (1993) 393 Fan, G.Y. and M.H. Ellisman, High-sensitivity
Dufner, D.C., HREM observations of the con- lens-coupled slow-scan CCD camera for
version of B-Sn into PtSn, in the Pt—Sn transmission electron microscopy 52 (1993) 21
thin film system 52 (19932)7 6 Fan, G.Y., P.J. Mercurio, S.J. Young and M.H.
Duncan, M.D., see Seaver 57 (1995) 219 Ellisman, Telemicroscopy 52 (1993) 499
Dunin-Borkowski, R.E. and W.M. Stobbs, The Fan, G.Y., D.G. Dunkelberger and M.H. Ellis-
defocus contrast of a @’ precipitate in Al- man, Performance of thin foil scintillating
4wt%Cu: Fresnel fringe analysis applied to screen for transmission electron microscopy 55 (1994) 7
an atomically abrupt interface 52 (19934)0 4 Fan, G.Y. and M.H. Ellisman, Stereoscopy by
Dunkelberger, D.G., see Fan 55(1994) 7 tilted illumination in transmission electron
Dunn, R.C., E.V. Allen, S.A. Joyce, G.A. An- microscopy 55 (1994) 155
derson and X.S. Xie, Near-field fluorescent Fan, H.F., see Fu 54 (1994) 229
imaging of single proteins 57 (1995) 113 Farrow, N.A. and F.P. Ottensmeyer, Automatic
Dunn, R.C. and X.S. Xie, Characterization of 3D alignment of projection images of ran-
the temporal behavior of ultrashort pulses domly oriented objects 52 (1993) 141
emerging from a near-field fiber probe 57 (1995) 169 Farrow, R.F.C., see Zhang 51 (1993) 298
Duscher, G., see Gatts 59 (19952)2 9 Farugi, A.R., see Henderson 60 (1995) 375
Firtel, M., W. Xu, G. Southam, P.J. Mulhern,
Eades, J.A., see Lordi 55 (1994) 284 B. Blackford, M.H. Jericho and TJ. Bev-
Eades, J.A., see Liu 56 (1994) 253 eridge, Tip-induced displacement and imag-
Eades, J.A., see Ma 60 (1995) 137 ing of a multilayered bacterial structure by
Eaglesham, D., see Libera 52 (1993) 564 scanning tunneling microscopy 55 (19941)1 3
Eaglesham, D.J. and S.D. Berger, Energy filter- Flank, A.-M., see Hug 59 (19951)2 1
ing the ‘‘thermal diffuse’’ background in Foiles, S.M., see Campbell 51 (19932)4 7
electron diffraction 53 (1994) 319 Foiles, S.M., see Mills 56 (1994) 79
Eckers, W., see Cerva 52 (1993) 127 Frank, J., see Penczek 53 (19942)5 1
Egerton, R.F. and S.C. Cheng, Characterization Frank, J., see Ramani Lata 58 (19953)8 1
of an analytical electron microscope with a Frank, J., see Liu 58 (19953)9 3
NiO test specimen 55 (1994) 43 Frank, J., see Penczek 60 (19953)9 3
Egerton, R.F. and K. Wong, Some practical Friedman, S.L., see Krivanek 59 (19952)6 7
consequences of the Lorentzian angular dis- Froehlich, F., see Kann 57 (19952)5 1
tribution of inelastic scattering 59 (1995) 169 Frost, A.E., see Seaver 57 (19952)1 9
Ekenstedt, M.J., see Olsson 51 (1993) 215 Frost, B., see Volkl 58 (1995) 97
Elich, K., see Voigt-Martin 57 (1995) 29 Fryer, J.R., see Dorset 57 (1995) 59
Ellisman, M.H., see Fan 52 (1993) 21 Fu, Q., see V6Ikl 55 (1994) 75
450 Author index to volumes 51-60
Fu, Z.Q., D.X. Huang, F.H. Li, J.Q. Li, Z.X. Gilles, B., see Bayle 56 (1994) 94
Zhao, T.Z. Cheng and H.F. Fan, Incommen- Gilmore, C.J., see Voigt-Martin 56 (1994) 271
surate modulation in minute crystals re- Girard, C., see Castiaux 60 (1995) 1
vealed by combining high-resolution elec- Gjonnes, J. and J. Tafto, Bloch wave symmetry
tron microscopy and electron diffraction 54 (1994) 229 in electron diffraction 52 (1993) 445
Fujihira, M., H.M onobe, H. Muramatsu and T. Gladfelter, W.L., see Haugstad 54 (1994) 31
Ataka, Measurements of lateral distribution Glaeser, R.M. and K.H. Downing, High-resolu-
of fluorescence intensities and fluorescence tion electron crystallography of protein
spectra of microareas by a combined SNOM molecules 52 (1993) 478
and AFM 57 (1995) 1i8 Glaeser, R.M., see Han 55 (1994) 1
Fujihira, M., see Muramatsu 57 (1995) 141 Glaeser, R.M., see Perkins 60 (1995) 283
Fujihira, M., H. Monobe, H. Muramatsu and T. Glaeser, R.M., see McEwen 60 (1995) 357
Ataka, Near-field optical microscopic Glas, F., The consequences of the atomic size
recording on Langmuir—Blodgett (LB) films effect in quantitative high resolution elec-
and chemically modified surfaces 57 (1995S) 176 tron microscopy 60 (1995) 91
Fujimoto, F., A. Mazel and J. Sévely, Image Gleyzes, P., A.C. Boccara and R. Bachelot,
formation by inelastically scattered elec Near field optical microscopy using a metal-
trons in TEM and STEM 55 (1994) 253 lic vibrating tip 57 (1995) 318
Fujita, H., see Mori 51 (1993) 31 Goldberg, B.B., see Ghaemi 57 (1995) 165
Fujita, Y., see Kumao 54 (1994) 201 Gong, H., Theory and computation for imaging
Fujiyoshi, Y., see Aoyama 57 (1995) 345 in scanning transmission microscopy con-
Fung, K.K., see Wang 60 (19954)2 7 sidering partial coherence in illuraination 55 (1994) 373
Furuya, K., see Ishikawa 56 (19942)1 1 Goodman, P. and P. Miller, Reassessment of
the symmetry of the 221 PbBiSrCaCuO
Gaber, B.P., see Turner 58 (1995) 425 structure using LACBED and high-resolu-
Gajdardziska-Josifovska, M., see McCartney 53 (1994) 283 tion SAD: the relevance of Cowley’s theory
Gajdardziska-Josifovska, M. and M.R. McCart- of disorder scattering to a real-space struc-
ney, Elimination of thickness dependence tural analysis 52 (1993) 549
from medium resolution electron holograms 53 (1994) 291 Goodman, P., Foreword to Festschrift for Gunter
Gajdardziska-Josifovska, M., see Huang 57 (1995) 391 Lehmpfuhl 55 (1994) vii
Gajdardziska-Josifovska, M., J.K. Weiss and Goodman, P., S. Matheson and F.X. Dong,
J.M. Cowley, Studies of Mo/Si multilayers Bloch-wave analysis of periodic surface
with coherent electron beams 58 (1995) 65 contrast in zone-axis images 55 (1994) 314
Gangler, D., see Door 58 (1995) 197 Goringe, M.J., see Bithell 56 (1994) 172
Garcia, N., see Vu Thien Binh 58 (1995) 307 Goudonnet, J.-P., see Dawson 57 (1995) 287
Garvie, L.AJ. and A.J. Craven, Electron- Govoni, D., see Merli 60 (1995) 229
beam-induced reduction of Mn** in man- Grassucci, R.A., see Penczek 53 (1994) 251
ganese oxides as revealed by parallel EELS 54(1994) 83 Greffet, J.-J., see Sentenac 57 (1995) 246
Garvie, L.A.J., see Rez 59 (1995) 159 Grigorieff, N. and R. Henderson, Diffuse scat-
Gatts, C., G. Duscher, H. Miillejans and M. tering in electron diffraction data from pro-
Rihle, Analyzing line scan EELS data with tein crystals 60 (1995) 295
neural pattern recognition 59 (1995) 229 Grogger, W., see Hofer 59 (1995) 15
Gebhardt, W., see Bauer 51 (1993) 221 Gross, L.J., see Lewis 56 (1994) 303
Gemperle, A. and J. Gemperlova, Practical ac- Gu, H., M. Ceh, S. Stemmer, H. Milllejans and
curacy of grain misorientation measure- M. Rihle, A quantitative approach for spa-
ments by Kikuchi line technique 60 (19952)0 7 tially-resolved electron energy-loss spec-
Gemperlova, J., see Gemperle 60 (19952)0 7 troscopy of grain boundaries and planar de-
Gesang, T., see Héper 60 (1995) 17 fects on a subnanometer scale 59 (19952)1 5
Ghaemi, H., C. Cates and B.B. Goldberg, Low Gubbens, A.J. and O.L. Krivanek, Applications
temperature near field spectroscopy and mi- of a post-column imaging filter in biology
croscopy 57 (19951)6 5 and materials science 51 (1993) 146
Gibson, J.M., see Treacy 52 (1993) 31 Gubbens, A.J., B. Kraus, O.L. Krivanek and
Gibson, J.M., see Twesten 53 (1994) 223 P.E. Mooney, An imaging filter for high
Gibson, J.M., see Treacy 54(1994) 93 voltage electron microscopy 59 (1995) 255
Gibson, J.M., Breakdown of the weak-phase Gubbens, A.J., see Krivanek 59 (1995) 267
object approximation in amorphous objects Gubbens, A.J., see Meyer 59 (1995) 283
and measurement of high-resolution elec- Gurevich, V.S. and M.N. Libenson, Surface
tron optical parameters 56 (1994) 26 polaritons propagation along micropipettes 57 (1995) 277
Author index to volumes 51—60
Hackney, S.A., T.M. Lillo, R.S. Kedia, Q.C. Herring, R.A., G. Pozzi, T. Tanji and A. Tono-
Horn and M.R. Plichta, Edge instabilities in mura, Interferometry using convergent elec-
thin plates studied by in situ transmission tron diffracted beams plus an electron
electron microscopy 51 (1993) 81 biprism (CBED + EBI) 60 (1995) 153
Haider, M., A. Epstein, P. Jarron and C. Boulin, Hertz, H.M., L. Malmgqvist, L. Rosengren and
A versatile, software configurable multi- K. Ljungberg, Optically trapped non-linear
channel STEM detector for angle-resolved particles as probes for scanning near-field
imaging 54(1994) 41 optical microscopy 57 (1995) 309
Hakkens, F.J.G., see De Veirman 51 (1993) 306 Heydenreich, J., see Riihle 56 (1994) ix
Hallen, H.D., see LaRosa 57 (19953)0 3 Heyvaert, I., see Vinckier 57 (19953)3 7
Hammel, M. and H. Rose, Optimum rotation- Higgs, A.A., see Mankos 58 (1995) 87
ally symmetric detector configurations for Hillyard, S. and J. Silcox, Thickness effects in
phase-contrast imaging in scanning trans- ADF STEM zone axis images 52 (1993) 325
mission electron microscopy 58 (1995) 403 Hillyard, S. and J. Silcox, Detector geometry,
Han, B.-G., S.G. Wolf, J. Vonck and R.M. thermal diffuse scattering and strain effects
Glaeser, Specimen flatness of glucose-em- in ADF STEM imaging 58 (1995) 6
bedded biological materials for electron Hirayama, T., J. Chen, T. Tanji and A. Tono-
crystallography is affected significantly by mura, Dynamic observation of magnetic do-
the choice of carbon evaporation stock 55(1994) 1 mains by on-line real-time electron hologra-
Han, P., see Zhang 57 (1995) 103 phy 54(1994) 9
Hansen, M.S., see Cowley 58 (1995) 18 Hocken, R.J., see Cloninger 57 (1995) 223
Harada, J., Effects of crysial surface roughness Hofer, F., P. Warbichler and W. Grogger, Imag-
on X-ray CTR scattering 52 (1993) 233 ing of nanometer-sized precipitates in solids
Haring, R., see Schabert 53 (1994) 147 by electron spectroscopic imaging 59 (1995) 15
Harscher, A., G. Lang and H. Lichte, Inter- Hoffmann, H., see Schuhrke 58 (1995) 319
pretable resolution of 0.2 nm at 100 kV Hofmann, D. and F. Emst, Quantitative high-
using electron holography 58 (1995) 79 resolution transmission electron microscopy
Hashimoto, H., see Yokota 54 (1994) 207 of the incoherent 23 (211) boundary in Cu 53 (1994) 205
Hashimoto , a, see Endoh 54 (19943)5 1 Hohenstein, M., see Bierwolf 56 (1994) 32
Hashimoto. » .. see Endoh 56 (1994) 108 Hgier, R., see Holmestad 52 (1993) 454
Hashimoto, N., see Takahashi 56 (1994) 193 Hgier, R., see Marthinsen 55 (1994) 268
Hashimoto >} see Joy 51(1993) 1 Holmestad, R., O.L. Krivanek, R. Hoier, K.
Hashimoto > * see Zhang 51 (1993) 21 Marthinsen and J.C.H. Spence, Commercial
Haskel, D., M. Sarikaya, M. Qian and E.A. spectrometer modifications for energy filter-
Stern, EXELFS as a tool for quantifying ing of electron diffraction patterns and im-
phase distributions in materials 58 (1995) 353 ages 52 (19934)5 4
Haugstad, G. and W.L. Gladfelter, Force—dis- Holmestad, R., see Marthinsen 55 (1994) 268
placement measurements in a beam-reflec- Holton, M., see Valaskovic 57 (19952)1 2
tion scanning force microscope: calibration Homma, Y., M. Tomita and T. Hayashi, Atomic
issues 54(1994) 31 step imaging on silicon surfaces by scan-
Hawkes, P.W., Tables, handbooks, proceedings ning electron microscopy 52 (1993) 187
and a life 52 (1993) 205 Honda, T., T. Tomita, T. Kaneyama and Y.
Hawkes, P.W., Reading matter 56 (1994) 337 Ishida, Field emission ultrahigh-resolution
Hawkes, P.W., Volumes and issues 60 (1995) 325 analytical electron microscope 54 (1994) 132
Hayashi, T., see Homma 52 (1993) 187 Honda, T., see Terauchi 54 (1994) 268
Hecht, B., H. Heinzelmann and D.W. Pohl, Hong, C.S., see Chen 54 (1994) 179
Combined aperture SNOM/PSTM: best of Hoper, R., T. Gesang, W. Possart, O.-D. Hen-
both worlds? 57 (1995) 228 nemann and S. Boseck, Imaging elastic
Heinzelmann, H., see Hecht 57 (1995) 228 sample properties with an atomic force mi-
Hellemans, L., see Vinckier 57 (1995) 337 croscope operating in the tapping mode 60 (1995) 17
Hembree, G.G., see Liu 52 (1993) 369 Horio, Y. and A. Ichimiya, Origin of phase
Henderson, R., see Grigorieff 60 (1995) 295 shift phenomena in RHEED intensity oscil-
Henderson, R. and A.R. Farugi, Analysis of lation curves 55 (1994) 321
sensitivity of cold stages on Philips CM12 Horita, Z., S. Matsumura and T. Baba, General
to sources of vibration 60 (1995) 375 formulation for ALCHEMI 58 (1995) 327
Hennemann, O.-D., see Héper 60 (1995) 17 Horiuchi, S., see Takeda 56 (1994) 144
Herbin, M., see Bonnet 60 (19953)4 9 Horiuchi, T., see Sukedai 54 (1994) 192
Hermann, C., see Safarov 57 (1995) 270 Horn, Q.C., see Hackney 51 (1993) 81
452 Author index to volumes 51-60
Héschen, R., see Phillipp 56 (1994) 1 Ikuta, T., see Takai 54 (19942)5 0
Hovmiller, S., see Zou 52 (19934)3 6 Ikuta, T., see Ando 54 (19942)6 1
Howe, J.M., see Chang 51 (1993) 46 Inouye, Y., see Kawata 57 (1995) 313
Howie, A., see Perovic 52 (1993) 353 Isaacson, M., Foreword to Near Field Optics 57 (1995) vii
Howie, A., see Millejans 52 (19933)6 0 Isaacson, M., see Cline 57 (19951)4 7
Howie, A., see Bleloch 54 (1994) 107 Isaacson, M., see Klotzkin 58 (1995) 261
Howie, A., see Perovic 58 (1995) 104 Ishida, Y., see Honda 54 (1994) 132
Hsieh, W.Y., see Chen 54 (1994) 156 Ishikawa, N. and K. Furuya, Dual ion beam
Hsu, T. and J.M. Cowley, Study of twinning irradiation system interfaced with a trans-
with reflection electron microscopy (REM) 55 (1994) 302 mission electron microscope and the obser-
Huang, D.X., see Fu 54 (1994) 229 vation of defect evolution in Ni during irra-
Huang, Y., M. Gajdardziska-Josifovska and diation 56 (1994) 211
J.M. Cowley, REM in a UHV TEM for the Ishikawa, T. and T. Wakabayashi, Proposal of
observation of dynamic phase transforma- alignment-independent classification of
tion processes on the Cu, Au(111) surface 57 (19953)9 1 electron microscopic images with helical
Huber, V., see Cerva 52 (1993) 127 symmetry and its application to reconsti-
Hug, G., G. Blanche, M. Jaouen, A.-M. Flank tuted thin filaments of skeletal muscle 57 (1995) 91
and J.J. Rehr, Simulation of the extended Ishizuka, K., Optimized sampling schemes for
fine structure of K-shell edges in intermetal- off-axis holography 52 (1993)
lic ordered alloys 59 (1995) 121 Ishizuka, K., Analysis of electron image detec-
Humphreys, C.J., see Boothroyd 52 (1993) 318 tion efficiency of slow-scan CCD cameras 52 (1993)
Humphreys, C.J., see Burgess 55 (1994) 276 Ishizuka, K., Resolution improvement by tilted
Humphreys, C.J., see Cullen 56 (1994) 127 single-sideband holography: preliminary ex-
Humphreys, C.J., see Saunders 60 (19953)1 1 periments 53 (1994)
Hunt, J.A., M.M. Disko, S.K. Behal and R.D. Ishizuka, K., Number of sampling points re-
Leapman, Electron energy-loss chemical quired for aberration correction using off-
imaging of polymer phases 58 (1995) 55 axis electron holography 53 (1994) 297
Hutchison, J.L., C.T. Chou, M.-J. Casanove, D. Ishizuka, K., T. Tanji, A. Tonomura, T. Ohno
Cherns, J.W. Steeds, D.A. Ashenford and and Y. Murayama, Aberration correction
B. Lunn, HREM of Ga,Te,: imaging of an using off-axis holography. I. Aberration as-
ordered vacancy superlattice with enhanced sessment 53 (1994) 361
contrast 53 (1994) 91 Ishizuka, K., T. Tanji, A. Tonomura, T. Ohno
Hiitten, A. and G. Thomas, Investigation of and Y. Murayama, Aberration correction
heterogeneous Cu,_ .Co, alloys with giant using off-axis holography. II. Beyond the
magnetoresistance 52 (19935)8 1 Scherzer limit 55 (1994) 197
Hytch, M.J., see Chevalier 52 (1993) 253 Ishizuka, K., Coma-free alignment of a high-
Hytch, M.J. and J.-P. Chevalier, Quantitative resolution electron microscope with three-
method of assessing the nature of local or- fold astigmatism 55 (1994) 407
der from HREM images for SRO on crys- Ishizuka, K. and J. Chen, HREM alignment
talline sublattices 52 (1993) 415 aided by a real-time diffractometer using a
Hytch, MJ. and W.M. Stobbs, The use of liquid-crystal panel 60 (1995) 25
non-linear characteristics of a lattice fringe Isshiki, T., see Nishio 54 (19943)0 1
image for the characterisation of imaging Ito, Y., A.L. Bleloch, J.H. Paterson and L.M.
parameters 53 (1994) 63 Brown, Electron diffraction from gratings
Hytch, MJ. and W.M. Stobbs, Quantitative fabricated by electron beam nanolithogra-
comparison of high resolution TEM images phy 52 (19933)4 7
with image simulations 53 (19941)9 1 Itoh, H., see Ichinokawa 54 (1994) 116
Hytch, M.J. and J.P. Chevalier, On the break- Ivanov, Z.G., see Alarco 51 (1993) 239
down of Friedel’s Law for coherent micro-
diffraction from amorphous materials 58 (1995) 114
Jackson, H.E., see Choo 57 (1995) 124
Ichimiya, A., see Horio 55 (1994) 321 Jager, W. and J. Mayer, Energy-filtered trans-
Ichinokawa, T., H. Itoh, A. Schmid, D. Winau mission electron microscopy of Si,,Ge, su-
and J. Kirschner, Scanning tunneling micro- perlattices and Si—Ge heterostructures. I.
scopic studies of surface reconstructed Experimental results 59 (1995) 33
structures for metal /Si(100) systems 54 (1994) 116 Jahncke, C.L., see LaRosa 57 (19953)0 3
Ikuhara, Y. and P. Pirouz, A high-resolution Jaouen, M., see Hug 59 (19951)2 1
electron microscopy study of vanadium de- Jarron, P., see Haider 54(1994) 41
posited on the basal plane of sapphire 52 (19934)2 1 Jayaram, G., see Xu 53 (1994) 15
Author index to volumes 51-60
Jefferson, D.A., see Tang 53 (1994) 137 Kim, H.S. and S.S. Sheinin, On effects of exit
Jericho, M.H., see Firtel 55 (1994) 113 and entrance surface inclination on structure
Jiang, J.C. and K.H. Kuo, Quantitative evalua- images 51 (1993) 109
tion of phasons in octogonal quasicrystals Kim, M.J., see Bow 52 (19932)8 9
by high-resolution electron microscopy 54 (19942)1 5 Kim, Y., see Kisielowski 58 (1995) 131
Johnson, A.W.S. and A.R. Preston, Some notes Kimoto, T., see Watanabe 52 (19934)6 5
on the selection of structural chirality by Kimura, Y., see Ando 54 (1994) 261
CBED 55 (1994) 348 Kimura, Y., see Ogai 54 (1994) 345
Josefsson, T.W., see Smith 55 (1994) 247 Kimura, Y., see Aoyama 57 (1995) 345
Josefsson, T.W., see Allen 55 (1994) 258 King, W.E., see Bradley 51 (1993) vii
Josephs, R., see Lewis 56 (1994) 303 King, W.E. and G.H. Campbell, Determination
Jouffrey, B., see Schattschneider 53 (1994) 181 of thickness and defocus by quantitative
Joy, D.C., Y.-S. Zhang, X. Zhang, T. comparison of experimental and simulated
Hashimoto, R.D. Bunn, L. Allard and T.A. high-resolution images 51 (1993) 128
Nolan, Practical aspects of electron hologra- King, W.E., see Campbell 51 (1993) 247
phy 51 (1993) 1 King, W.E. and G.H. Campbell, Quantitative
Joy, D.C., see Zhang 51 (1993) 21 HREM using non-linear least-squares meth-
Joyce, S.A., see Dunn 57 (1995) 113 ods 56 (1994) 46
Judkins, J., see Kann 57 (19952)5 1 Kinoshita, C., Y. Tomokiyo and K. Nakai, In-
situ observations of irradiation-induced
Kachi, T., see Tanaka 52 (1993) 533 phase transformations 56 (19942)1 6
Kambe, K. and C. Stampfl, Non-local pseu- Kipp, S., R. Lacmann and M.A. Schneeweiss,
dopotentials in the multi-slice method of Problems in temperature control performing
calculating electron wavefunctions in crys- in situ investigations with the scanning force
tals 55 (1994) 221 microscope 57 (1995) 333
Kamimura, O., see Terauchi 54 (1994) 268 Kirkland, A.I., see Tang 53 (1994) 137
Kamiya, Y., K. Michishita and C. Tanaka, In- Kirkland, A.I., W.O. Saxton, K.-L. Chau, K.
tensity distribution of scintillation produced Tsuno and M. Kawasaki, Super-resolution
by high-energy electrons 54 (1994) 286 by aperture synthesis: tilt series reconstruc-
Kamiya, Y., see Kotera 54 (1994) 293 tion in CTEM 57 (19953)5 5
Kaneyama, T., see Honda 54 (1994) 132 Kirschner, J., see Ichinokawa 54 (1994) 116
Kaneyama, T., see Terauchi 54 (1994) 268 Kirtikar, A.S., see Sinclair 51 (1993) 41
Kang, Z.C. and L. Eyring, Analysis of time-re- Kisielowski, C., P. Schwander, F.H. Baumann,
solved, in-situ change in high-resolution M. Seibt, Y. Kim and A. Ourmazd, An
electron microscopy 52 (1993) 377 approach to quantitative high-resolution
Kann, J.L., T.D. Milster, F. Froehlich, R.W. transmission electron microscopy of crys-
Ziolkowski and J. Judkins, Numerical anal- talline materials 58 (1995) 131
ysis of a two-dimensional near-field probe 57 (1995) 251 Kitagawa, T., see Tanaka 52 (19935)3 3
Karrai, K., see Kolb 57 (1995) 208 Kizuka, T., see Tanaka 52 (19935)3 3
Karrasch, S., see Schabert 53 (1994) 147 Klotzkin, D. and M. Isaacson, Determination of
Kato, K., see Khurshudov 60 (1995) 11 Cr particle sizes in thin dilute Cr-in-Cu
Kawasaki, M., see Kirkland 57 (1995) 355 films from measurement statistics 58 (19952)6 1
Kawasaki, T. and J.M. Rodenburg, Deconvolv- Knapp, H., see Schabert 53 (1994) 147
ing lens transfer functions in electron holo- Ko, D.H. and R. Sinclair, In-situ dynamic
grams 52 (19932)4 8 high-resolution transmission electron micro-
Kawata, S. and Y. Inouye, Scanning probe copy: application to Pt/GaAs interfacial re-
optical microscopy using a metallic probe actions 54 (1994) 166
tip 57 (19953)1 3 Kocsis, E., M.E. Cerritelli, B.L. Trus, N. Cheng
Kedia, R.S., see Hackney 51 (1993) 81 and A.C. Steven, Improved methods for
Kenny, P.G., LR. Barkshire and M. Prutton, determination of rotational symmetries in
Three-dimensional scatter diagrams: appli- macromolecules 60 (1995) 219
cation to surface analytical microscopy 56 (1994) 289 Kohl, H., see Dinges 55 (1994) 91
Kessler, P., see Lichte 52 (1993) 575 Kohl, H., see Berger 55 (1994) 101
Khurshudov, A. and K. Kato, Wear of the Kohl, H. and A. Berger, The resolution limit for
atomic force microscope tip under light load, elemental mapping in energy-filtering trans-
studied by atomic force microscopy 60 (1995) 11 mission electron microscopy 59 (1995) 191
454 Author index to volumes 51-60
Kolb, G., C. Obermiiller, K. Karrai, G. Abstre- Lacmann, R., see Kipp 57 (19953)3 3
iter, G. Béhm, G. Trankle and G. Weimann, Lai, G., see Ru 55 (1994) 209
Photodetector with subwavelength spatial Lakis, R.E., see Lyman 58 (1995) 25
resolution 57 (19952)0 8 Lampel, G., see Safarov 57 (1995) 270
Komatsu, M., see Mori 51 (1993) 31 Lancon, F., see Bayle 56 (1994) 94
Konkol, A., P.R. Wilshaw and G.R. Booker, Lang, G., see Harscher 58 (1995) 79
Deconvolution method to obtain composi- Langmore, J.P., see Monson 57 (19952)5 7
tion profiles from SEM backscattered elec- LaRosa, A., C.L. Jahncke and H.D. Hallen,
tron signal profiles for bulk specimens 55 (1994) 183 Time as a contrast mechanism in near-field
Konkol, A., G.R. Booker and P.R. Wilshaw, imaging 57 (1995) 303
Backscattered electron contrast on cross Lavoie, C., see Perovic 58 (1995) 104
sections of interfaces and multilayers in the Leapman, R.D., J. Brink and W. Chiu, Low-
scanning electron microscope 58 (19952)3 3 dose thickness measurement of glucose-em-
Konno, T.J., see Sinclair 56 (19942)2 5 bedded protein crystals by electron energy
Kooyman, R.P.H., see De Hollander 57 (19952)6 3 loss spectroscopy and STEM dark-field
Kopelman, R., see Smith 57 (19951)7 3 imaging 52 (1993) 157
Kopelman, R., see Monson 57 (19952)5 7 Leapman, R.D., see Hunt 58 (1995) 55
Kopp, S., see Dorset 57 (1995) 59 Leapman, R.D. and S. Sun, Cryo-electron en-
Kosobukin, V.A., see Safarov 57 (19952)7 0 ergy loss spectroscopy: observations on vit-
Kotera, M. and Y. Kamiya, Computer simula- rified hydrated specimens and radiation
tion of light emission by high-energy elec- damage 59 (1995) 71
trons in YAG single crystals 54 (19942)9 3 Lee, T.L., see Chen 54 (1994) 156
Kovacs, J., see Tsai 57 (19951)3 0 Lehmann, M., E. Volkl and F. Lenz, Recon-
Kraus, B., see Gubbens 59 (19952)5 5 struction of electron off-axis holograms: a
Kraus, B., see Krivanek 59 (19952)6 7 new and fast alternative method 54 (19943)3 5
Krishnan, K.M., see Zhang 51 (19932)9 8 Leifer, K., see Stadelmann 58 (1995) 35
Krivanek, O.L., see Gubbens 51 (19931)4 6 Lentzen, M., see Thust 53 (1994) 101
Krivanek, O.L., see Holmestad 52 (1993) 454 Lenz, F., see Lichte 52 (19935)7 5
Krivanek, O.L., Three-fold astigmatism in Lenz, F., see Lehmann 54 (19943)3 5
high-resolution transmission electron mi- Lenz, F., see V6Ikl 55 (1994) 75
croscopy 55 (1994) 419 Lewis, M.R., LJ. Gross and R. Josephs, Vari-
Krivanek, O.L. and P. Stadelmann, Foreword to able pitch in frozen-hydrated sickle
EELSI 94 59 (1995) ix hemoglobin fibers: an image analysis model
Krivanek, O.L., see Gubbens 59 (19952)5 5 study 56 (1994) 303
Krivanek, O.L., S.L. Friedman, A.J. Gubbens Li, F.H., see Fu 54 (1994) 229
and B. Kraus, An imaging filter for biologi- Li, J.Q., see Fu 54 (1994) 229
cal applications 59 (19952)6 7 Liang, J.M., see Chen 54 (1994) 156
Krivanek, O.L., see Meyer 59 (19952)8 3 Libenson, M.N., see Gurevich 57 (1995) 277
Krivanek, O.L. and P.A. Stadelmann, Effect of Libera, M., D.A. Smith, L. Tsung and D. Ea-
three-fold astigmatism on high resolution glesham, High-spatial-resolution analysis of
electron micrographs 60 (1995) 103 Ge layers in Si 52 (1993) 564
Kruit, P., Editor’s statement about co-author- Lichte, H., Parameters for high-resolution elec-
ship 56 (1994) xvi tron holography 51 (1993) 15
Kruit, P., Editorial 60 (1995) v Lichte, H., P. Kessler, F. Lenz and W.D. Rau,
Kruit, P., Hawkes and Kasper, Volume 3 60 (19953)4 3 0.1 nm _ information limit with the
Krumbigel, M.A., see Totzeck 57 (1995) 160 CM30FEG-Special Tiibingen 52 (1993) 575
Kudoh, J., see Shindo 54 (19942)2 1 Lichte, H., see Schweda 53 (1994) 53
Kihibrandt, W., see Cyrklaff 55 (1994) 141 Lichte, H., see Schweda 54(1994) 94
Kuhn, W., see Bauer 51 (1993) 221 Lichte, H. and W.D. Rau, High-resolution elec-
Kumao, A., Y. Fujita and H. Endoh, Growth of tron holography with the CM30FEG-Spe-
dendritic and needle tungsten oxide crystals cial Tubingen 54 (1994) 310
studied by high-resolution electron mi- Lichte, H., see Volkl 55 (1994) 75
croscopy 54 (19942)0 1 Lichte, H., see Harscher 58 (1995) 79
Kumar, M., see Choo 57 (19951)2 4 Licoppe, C., see Piednoir 57 (19952)8 2
Kuo, K.H., see Jiang 54 (19942)1 5 Liliental-Weber, Z., F. Namavar and A.
Kupka, R.K., see Chen 57 (19951)5 3 Claverie, Arsenic implantation into GaAs: a
Kurnikov, I., see Nevernov 58 (1995) 269 SOI technology for compound semiconduc-
Kuwano, N., see Tomokiyo 54 (1994) 276 tors? 52 (1993) 570