Ultramicroscopy 1992: Vol 42-44 Index

33 Pages·1992·7.4 MB·English

Ultramicroscopy 42-44 (1992) 1685-1701
North-Holland
Author index to volumes 42-44
Achten, F., see Van Hulst 42-44 (1992) 416 Anguiano, E., see Aguilar 42-44 (1992) 1329
Adam, P., see De Fornel 42-44 (1992) 422 Antognazza, L., see Maggio-Aprile 42-44 (1992) 728
Adamchuk, V.K., A.V. Ermakov and S.I. Aono, M., see Watanabe 42-44 (1992) 105
Fedoseenko, Scanning tunneling mi- Apell, H.-J., see Linder 42-44 (1992) 329
croscope with large scan range 42-44 (1992) 1602 Apell, H.-J., J. Colchero, A. Linder, O.
Adrian, M., see Zenhausern 42-44 (1992) 1168 Marti and J. Mlynek, Na,K-ATPase
Agrait, N., J.G. Rodrigo and S. Vieira, in crystalline form investigated by
On the transition from tunneling scanning force microscopy 42-44 (1992) 1133
regime to point-contact: graphite 42-44 (1992) 177 Aronsson, B.-O., see Olin 42-44 (1992) 567
Aguilar, M., M. Pancorbo, F. Vazquez, F. Ascoli, C., see Allegrini 42-44 (1992) 371
Gémez, E. Anguiano, J.M. Gonzales, Asenjo, A., J.M. Gémez-Rodriguez and
M. Vazquez and F. Cebollada, Study A.M. Baré, Current imaging tunnel-
of the surface roughness of Co-based ing spectroscopy of metallic deposits
amorphous alloys by STM 42-44 (1992) 1329 on silicon 42-44 (1992) 933
Aguilar, M., see Diaspro 42-44 (1992) 1668 Asenjo, A., see Gémez-Rodriguez 42-44 (1992) 1321
Ajustron, F., see Coratger 42-44 (1992) 653 Atamny, F., R. Schlégl, W.J. Wirth and J.
Akamine, S., see Yamada 42-44 (1992) 1044 Stephan, Topochemistry of graphite
Albrecht, T.R., P. Griitter, D. Rugar and oxidation 42-44 (1992) 660
D.P.E. Smith, Low-temperature force Atkins, E.D.T., see Lee 42-44 (1992) 1107
microscope with all-fiber interferome- Atlan, D., G. Gardet, Vu Thien Binh, N.
ter 42-44 (1992) 1638 Garcia and J.J. Saenz, 3D calcula-
Alduino, A., see Keller 42-44 (1992) 1481 tions at atomic scale of the electro-
Allegrini, M., C. Ascoli, P. Baschieri, F. static potential and field created by a
Dinelli, C. Frediani, A. Lio and T. teton tip 42-44 (1992) 154
Mariani, Laser thermal effects on Avouris, Ph. and D. Cahill, STM studies
atomic force microscope cantilevers 42-44 (1992) 371 of Si(100)-2 x 1 oxidation: defect
Allen, M.J., M. Balooch, S. Subbiah, R.J. chemistry and Si ejection 42-44 (1992) 838
Tench, R. Balhorn and W.J. Siekhaus,
Analysis of adenine and thymine ad- Badt, D., see Kliese 42-44 (1992) 824
sorbed on graphite by scanning tun- Bai, C., C. Zhu, G. Huang, J. Yang, M.
neling and atomic force microscopy 42-44 (1992) 1049 Wan and R.-S. Chen, Scanning tun-
Allen, M.J., N.V. Hud, M. Balooch, R.J. neling microscopic imaging of doped
Tench, W.J. Siekhaus and R. Bal- polyaniline 42-44 (1992) 1079
horn, Tip-radius-induced artifacts in Bai, C.L., see Tian 42-44 (1992) 460
AFM images of protamine-complexed Balhorn, R., see Allen 42-44 (1992) 1049
DNA fibers 42-44 (1992) 1095 Balhorn, R., see Allen 42-44 (1992) 1095
Allen, R.E., see Huang 42-44 (1992) 97 Balooch, M., see Tench 42-44 (1992) 668
Allen, R.E., see Gryko 42-44 (1992) 793 Balooch, M., see Allen 42-44 (1992) 1049
Allison, D.P., see Thundat 42-44 (1992) 1083 Balooch, M., see Allen 42-44 (1992) 1095
Allison, D.P., R.J. Warmack, L.A. Bot- Baltruschat, H., see Vogel 42-44 (1992) 562
tomley, T. Thundat, G.M. Brown, Bando, H., H. Tokumoto, A. Zettl and K.
R.P. Woychik, J.J. Schrick, K.B. Ja- Kajimura, Construction of a low-tem-
cobson and T.L. Ferrell, Scanning perature STM with in situ sample
tunneling microscopy of DNA: a novel cleavage 42-44 (1992) 1627
technique using radiolabeled DNA to Bar, G., S.N. Magonov, H.-J. Cantow, J.
evaluate chemically mediated attach- Gmeiner and M. Schwoerer, Atomic-
ment of DNA to surfaces 42-44 (1992) 1088 scale imaging of anisotropic organic
Allison, D.P., see Thundat 42-44 (1992) 1101 conductors by scanning probe tech-
Angert, N., see Kemmer 42-44 (1992) 1345 niques (STM/AFM) 42-44 (1992) 644
Elsevier Science Publishers B.V.
1686 Author index
Bar, G., see Magonov 42-44 (1992) 1009 Binnig, G., see Ohnesorge 42-44 (1992) 1236
Baratoff, A., see Ciraci 42-44 (1992) 163 Birringer, R., see Wang 42-44 (1992) 594
Baré, A.M., see Asenjo 42-44 (1992) 933 Biscarini, F., see Kenkre 42-44 (1992) 122
Baré, A.M., see Gémez-Rodriguez 42-44 (1992) 1321 Blackford, B.L., see Mulhern 42-44 (1992) 1214
Barrett, R.C. and C.F. Quate, Large-scale Bocquet, M.-L., see Dunphy 42-44 (1992) 490
charge storage by scanning capaci- Bélger, B., see Van Hulst 42-44 (1992) 416
tance microscopy 42-44 (1992) 262 Bonnell, D.A. and I. Solomon, Measure-
Barth, J.V., see Schuster 42-44 (1992) 533 ment of space charge adjacent to ox-
Baschieri, P., see Allegrini 42-44 (1992) 371 ide grain boundaries by tunneling
Bashkin, M.O., V.A. Bespalov, A.V. spectroscopy 42-44 (1992) 788
Emelyanov, V.N. Inkin, S.M. Portnov, Borbonus, M., see Haase 42-44 (1992) 541
A.V. Zimin, $.1. Kharkevich and O.D. Borisov, A.Y., see Golubok 42-44 (1992) 1228
Menshikov, Surface modification of Bosbach, D. and W. Rammensee, Sur-
organic films deposited on graphite face manipulation on layered organic
by the scanning tunneling microscope 42-44 (1992) 977 crystals by scanning force microscopy 42-44 (1992) 973
Batra, L.P., see Ciraci 42-44 (1992) 163 Bosch, J.-G., see Kent 42-44 (1992) 1632
Batra, I.P. and S. Ciraci, Adsorption site Bottomley, L.A., see Allison 42-44 (1992) 1088
of alkali metal overlayers on Si(001)- Bouju, X., C. Girard and B. Labani,
2x1 42-44 (1992) 889 Self-consistent study of the electro-
Bauer, P., see Burger 42-44 (1992) 721 magnetic coupling between a thin
Bear, D., see Keller 42-44 (1992) 1173 probe tip and a surface: implication
Beauvillain, J., see Coratger 42-44 (1992) 653 for atomic-force and near-field mi-
Becker, C., see Gottschalk 42-44 (1992) 1376 croscopy 42-44 (1992) 430
Behm, R.J., see Schréder 42-44 (1992) 475 Bourhettar, A., see Troyon 42-44 (1992) 1564
Behm, R.J., see Schuster 42-44 (1992) 533 Bourillot, E., see De Fornel 42-44 (1992) 422
Belin, M., see Rousset 42-44 (1992) 515 Bozzolo, G. and J. Ferrante, Theoretical
Bennett, J., see Dagata 42-44 (1992) 1288 modelling of AFM for bimetallic
Bergasa, F. and J.J. Saenz, Is it possible tip-substrate interactions 42-44 (1992) 55
to observe biological macromolecules Bridges, G.E. and D.J. Thomson, High-
by electrostatic force microscopy? 42-44 (1992) 1189 frequency circuit characterization us-
Berndt, R., J.K. Gimzewski and R.R. ing the AFM as a reactive near-field
Schlittler, Enhanced photon emission probe 42-44 (1992) 321
from the STM: a general property of Brodbeck, D., see Meyer 42-44 (1992) 274
metal surfaces 42-44 (1992) 355 Brodbeck, D., see Lang 42-44 (1992) 715
Berndt, R., see Gimzewski 42-44 (1992) 366 Brodbeck, D., see Overney 42-44 (1992) 983
Berndt, R., J.K. Gimzewski and R.R. Brodbeck, D., see Jung 42-44 (1992) 1446
Schlittler, Tunneling characteristics at Brodbeck, D., L. Howald, R. Lithi, E.
atomic resolution on close-packed Meyer and R.M. Overney, Scan con-
metal surfaces 42-44 (1992) 528 trol and data acquisition for bidirec-
Berthe, R., U. Hartmann and C. Heiden, tional force microscopy 42-44 (1992) 1580
Influence of a transport current on Brodde, A. and H. Neddermeyer, Nucle-
the Abrikosov flux lattice observed ation and growth of Fe on Cu(111) in
with a low-temperature scanning tun- the monolayer range 42-44 (1992) 556
neling microscope 42-44 (1992) 696 Brorsson, G., see Olin 42-44 (1992) 734
Bertolini, J.C., see Porte 42-44 (1992) 1355 Brown, G.M., see Allison 42-44 (1992) 1088
Besenbacher, F., see Ruan 42-44 (1992) 498 Brugger, J., see Buser 42-44 (1992) 1476
Besenbacher, F., see Eierdal 42-44 (1992) 505 Brunner, O., see Maggio-Aprile 42-44 (1992) 728
Bespalov, V.A., see Bashkin 42-44 (1992) 977 Bruynseraede, Y., see Stockman 42-44 (1992) 1317
Beveridge, T.J., see Mulhern 42-44 (1992) 1214 Bucher, E., see Fuchs 42-44 (1992) 1295
Bickmann, B., see Stocker 42-44 (1992) 1141 Buchholz, S., see Eng 42-44 (1992) 1059
Bielefeldt, H., see Marti 42-44 (1992) 345 Bumgarner, S. and P.E. Russell, Sample
Bielefeldt, H., see Hipp 42-44 (1992) 1498 preparation for STM imaging of sili-
Binnig, G., Force microscopy 42-44(1992) 7 con at atmospheric pressure 42-44 (1992) 1433
Binnig, G., see Giessibl 42-44 (1992) 281 Burger, J., P. Bauer, M. Veith and G.
Binnig, G., see Heckl 42-44 (1992) 1073 Saemann-Ischenko, Scanning tunnel-
Binnig, G., see Haberle 42-44 (1992) 1161 ing microscopy of surface properties
Author index
of epitaxial YBa,Cu,0,_, and Cohen, S.R., An evaluation of the use of
Bi,Sr,Ca,Cu,O,, high-7, thin films the atomic force microscope for stud-
prepared by different methods 42-44 (1992) ies in nanomechanics 42-44 (1992) 66
Biirgler, D. and G. Tarrach, Model calcu- Colchero, J., see Linder 42-44 (1992) 329
lation for spin-polarized tunneling 42-44 (1992) Colchero, J., see Marti 42-44 (1992) 345
Biirgler, D., see Wiesendanger 42-44 (1992) Colchero, J., see Apell 42-44 (1992) 1133
Burrell, P.M., see Zajac 42-44 (1992) Colchero, J., see Hipp 42-44 (1992) 1498
Buser, R.A., J. Brugger and N.F. de Comin, F., see Vazquez 42-44 (1992) 616
Rooij, Micromachined silicon can- Coratger, R., A. Chahboun, V. Sivel, F.
tilevers and tips for bidirectional force Ajustron and J. Beauvillain, Scanning
microscopy 42-44 (1992) 1476 tunneling microscopy of the damage
Busmann, H.-G., see Zimmermann- induced by ion bombardment on a
Edling 42-44 (1992) 1366 graphite surface 42-44 (1992) 653
Bustamante, C., see Kenkre 42-44 (1992) 122 Cousty, J., see Thibaudau 42-44 (1992) 511
Bustamante, C., see Keller 42-44 (1992) 1173 Cox, G., Ph. Ebert, U. Poppe, M. Simon
Bustamante, C., see Vesenka 42-44 (1992) 1243 and K. Urban, Dislocation reaction
Bustamante, C., see Garcia 42-44 (1992) 1250 on p-doped GaAs (011) observed by
scanning tunnelling microscopy 42-44 (1992) 776
Cox, G., see Ebert 42-44 (1992) 871
Cahill, D., see Avouris 42-44 (1992) 838
Cake, K., see Dahn 42-44 (1992) 1222
Campbell, P.A., see Hagan 42-44 (1992) 587 Dagata, J.A., W. Tseng, J. Bennett, J.
Cantow, H.-J., see Bar 42-44 (1992) 644 Schneir and H.H. Harary, Imaging of
Cantow, H.-J., see Magonov 42-44 (1992) 1009 passivated III-V semiconductor sur-
Cantow, H.-J., see Stocker 42-44 (1992) 1141 faces by a scanning tunneling micro-
Carr, R. and R.E. Thomson, Device for scope operating in air 42-44 (1992) 1288
high resolution positioning 42-44 (1992) 1606 Dahn, D.C., K. Cake and L.R. Hale,
Casero, R., P.A. Serena and N. Garcia, Scanning tunneling microscopy of un-
Large enhancement of transmission broken chloroplasts 42-44 (1992) 1222
probability in non-equilibrium time Dai, C.D., see Tian 42-44 (1992) 460
evolution quantum mechanics 42-44 (1992) 134 Davidsson, P., see Olin 42-44 (1992) 734
Castell, M.R., M.G. Walls and A. Howie, Davidsson, P., H. Olin, M. Persson and
Imaging of low-load indentations into S. Pehrson, Design and operation of a
Si and GaAs by scanning tunneling low-temperature scanning tunneling
microscopy 42-44 (1992) 1490 microscope suitable for operation be-
Cebollada, F., see Aguilar 42-44 (1992) 1329 low 1K 42-44 (1992) 1470
Chahboun, A., see Coratger 42-44 (1992) 653 Davydov, D.N., A.O. Golubok and S.A.
Chang, A., see Rong 42-44 (1992) 333 Rykov, Local tunneling spectroscopy
Chen, C.-H. and A.A. Gewirth, AFM of n-PbTe surface 42-44 (1992) 878
study of the structure of underpoten- Day, S., see Sautiére 42-44 (1992) 1054
tially deposited Ag and Hg on Au(111) 42-44 (1992) 437 De Cheveigné, S., see Rousset 42-44 (1992) 515
Chen, C.J., In-situ characterization of tip De Fornel, F., L. Salomon, P. Adam, E.
electronic structure in scanning tun- Bourillot, J.P. Goudonnet and M.
neling microscopy 42-44 (1992) 147 Neviére, Resolution of the photon
Chen, C.J., In situ testing and calibration scanning tunneling microscope: influ-
of tube piezoelectric scanners 42-44 (1992) 1653 ence of physical parameters 42-44 (1992) 422
Chen, R.-S., see Bai 42-44 (1992) 1079 De Grooth, B.G., see Putman 42-44 (1992) 1509
Chen, T., see Sarid 42-44 (1992) 610 De Grooth, B.G., see Putman 42-44 (1992) 1549
Ciraci, S., Atomic-scale tip-sample inter- De la Figuera, J., see Vazquez de Parga 42-44 (1992) 845
actions and contact phenomena 42-44 (1992) 16 De Lozanne, A.L., see Ehrichs 42-44 (1992) 1438
Ciraci, S., E. Tekman, M. Gokgedag, LP. De Rooij, N.F., see Buser 42-44 (1992) 1476
Batra and A. Baratoff, Adhesive en- Delaine, E., see Vesenka 42-44 (1992) 1243
ergy, force and barrier height be- Deputy, D., see Keller 42-44 (1992) 1481
tween simple metal surfaces 42-44 (1992) 163 DeRose, J.A., see Oden 42-44 (1992) 580
Ciraci, S., see Batra 42-44 (1992) 889 Derycke, I., see Vigneron 42-44 (1992) 250
Claeson, T., see Olin 42-44 (1992) 734 Descouts, P., see Jobin 42-44 (1992) 637
Coey, J.M.D., see Wiesendanger 42-44 (1992) 338 Descouts, P., see Emch 42-44 (1992) 1155
Cohen, L.F., see Rong 42-44 (1992) 333 Descouts, P., see Zenhausern 42-44 (1992) 1168
1688 Author index
Devoret, M.H., D. Esteve, H. Grabert, Enea, O., M. Rafai and A. Naudon,
G.-L. Ingold, H. Pothier and C. Scanning tunneling microscopy and
Urbina, On the observability of X-ray reflectometry of Pt and Pd thin
Coulomb blockade and single-elec- films prepared by DC sputtering 42-44 (1992) 572
tron tunneling 42-44 (1992) 22 Eng, L.M., H. Fuchs, K.D. Jandt and
Diaspro, A. and M. Aguilar, Proposal for J. Petermann, Investigating poly(1-
a new optical device to sense AFM butene) films by SFM/STM 42-44 (1992) 989
forces 42-44 (1992) 1668 Eng, L.M., H. Fuchs, S. Buchholz and
Dietz, P., see Kasper 42-44 (1992) 1181 J.P. Rabe, Ordering of didodecylben-
Dinelli, F., see Allegrini 42-44 (1992) 371 zene on graphite: a combined
Dobisz, E.A., see Marrian 42-44 (1992) 1309 SFM/STM study 42-44 (1992) 1059
Dransfeld, K., see Seifert 42-44 (1992) 379 Engel, A., see Schabert 42-44 (1992) 1118
Dumas, Ph., see Palmino 42-44 (1992) 928 Erlandsson, R., see Olsson 42-44 (1992) 73
Dunphy, J.C., D.F. Ogletree, M.B. Ermakov, A.V., see Adamchuk 42-44 (1992) 1602
Salmeron, P. Sautet, M.-L. Bocquet Ertl, G., see Schuster 42-44 (1992) 533
and C. Joachim, Tip-dependent con- Esteve, D., see Devoret 42-44(1992) 22
trast in STM imaging of adsorbed sul-
fur layers: theory and experiment 42-44 (1992) 490
Diirig, U., see Ziiger 42-44 (1992) 520
Diirig, U., see Michel 42-44 (1992) 1647 Fainchtein, R. and P.R. Zarriello, A
computer-controlled technique for
electrochemical STM tip fabrication 42-44 (1992) 1533
Eberle, K., see Radmacher 42-44 (1992) 968 Fedoseenko, S.1., see Adamchuk 42-44 (1992) 1602
Ebert, Ph., see Cox 42-44 (1992) 776 Feenstra, R.M., A.J. Slavin, G.A. Held
Ebert, Ph., G. Cox, U. Poppe and K. and M.A. Lutz, Edge melting of the
Urban, A STM study of the InP (110) Ge(111) surface studied by scanning
surface 42-44 (1992) 871 tunneling microscopy 42-44 (1992) 33
Efremov, V.V., P.N. Louskinovich and Fen, Z.D., see Tian 42-44 (1992) 460
V.1. Nikishin. Method for the experi- Fen, Z.D., see Mao 42-44 (1992) 464
mental investigation of tip profiles for Ferrante, J., see Bozzolo 42-44 (1992) 55
scanning tunneling microscopy 42-44 (1992) 1459 Ferrell, T.L., S.L. Sharp and R.J. War-
Eguchi, K., see Kishi 42-44 (1992) 1067 mack, Progress in photon scanning
Bhara, S., see Oshio 42-44 (1992) 744 tunneling microscopy 42-44 (1992) 408
Ehrichs, E.E., W.F. Smith and A.L. de Ferrell, T.L., see Thundat 42-44 (1992) 1083
Lozanne, Four-probe resistance mea- Ferrell, T.L., see Allison 42-44 (1992) 1088
surements of nickel wires written with Ferrell, T.L., see Thundat 42-44 (1992) 1101
a scanning tunneling microscope / Ferrer, S., see Vazquez 42-44 (1992) 616
scanning electron microscope system 42-44 (1992) 1438 Finger, F., see Zimmermann-Edling 42-44 (1992) 1398
Eierdal, L., F. Besenbacher, E. Legs- Fischer, @., see Renner 42-44 (1992) 699
gaard and I. Stensgaard, Oxygen-in- Fischer, @., see Maggio-Aprile 42-44 (1992) 728
duced restructuring of Ni({110) stud- Fischer, @., see Kent 42-44 (1992) 1632
ied by scanning tunneling microscopy 42-44 (1992) 505 Fischer, U.Ch. and M. Zapletal, The
Eigler, D.M., see Zeppenfeld 42-44 (1992) 128 concept of a coaxial tip as a probe for
Elswijk, H.B. and EJ. van Loenen, scanning near field optical mi-
Chemisorption and kinetics of Sb on croscopy and steps towards a realisa-
Si(001) 42-44 (1992) 884 tion 42-44 (1992) 393
Emch, R., see Jobin 42-44 (1992) 637 Fitzgerald, E.A., see Grigg 42-44 (1992) 1616
Emch, R., F. Zenhausern, M. Jobin, M. Flores, F., see Levy Yeyati 42-44 (1992) 242
Taborelli and P. Descouts, Morpho- Frediani, C., see Allegrini 42-44 (1992) 371
logical difference between fibronectin Frey, T., see Lang 42-44 (1992) 715
sprayed on mica and on PMMA 42-44 (1992) 1155 Fries, Th., see Gottschalk 42-44 (1992) 1376
Emch, R., see Zenhausern 42-44 (1992) 1168 Frindt, R.F., see Qin 42-44 (1992) 630
Emelyanov, A.V., see Bashkin 42-44 (1992) 977 Frommer, J., see Meyer 42-44 (1992) 274
Endo, T., H. Yamada, T. Sumomogi, K. Frommer, J., see Overney 42-44 (1992) 983
Kuwahara, S. Morita and T. Kino, Fuchs, H., see Wang 42-44 (1992) 594
Atomic-resolution images of struc- Fuchs, H., see Schimmel 42-44 (1992) 683
tural defects on microcrystalline Fuchs, H., see Eng 42-44 (1992) 989
graphite 42-44 (1992) 674 Fuchs, H., see Eng 42-44 (1992) 1059
Author index 1689
Fuchs, H., Th. Schimmel, M. Lux-Steiner Gleiter, H., see Wang 42-44 (1992) 594
and E. Bucher, Investigating atomic- Glembocki, O.J., E.S. Snow, C.R.K. Mar-
scale structures generated with the rian, S.M. Prokes and D.S. Katzer,
STM 42-44 (1992) 1295 Nanoscale photovoltaic imaging using
Fujii, T., see Suzuki 42-44 (1992) 1553 the scanning tunneling microscope 42-44 (1992) 764
Fujisawa, T., see Yamamoto 42-44 (1992) 1422 Gmeiner, J., see Bar 42-44 (1992) 644
Fujishima, A., see Sakamaki 42-44 (1992) 599 Gobel, H.D., J.K.H. Hérber, Ch. Gerber,
Fukano, Y., see Sugawara 42-44 (1992) 1372 A. Leitner and T.W. Hansch, Molecu-
Fukuda, T., see Tokumoto 42-44 (1992) 816 lar structures of lipid monolayers on
Fukuda, T., see Miki 42-44 (1992) 851 ITO glass and on graphite imaged by
Fukuda, T., see Suzuki 42-44 (1992) 858 an STM 42-44 (1992) 1260
Géddenhenrich, T., U. Hartmann and C.
Gaisch, R., J.K. Gimzewski, B. Reihl, Heiden, Generation and imaging of
R.R. Schlittler, M. Tschudy and W.D. domains with the magnetic force mi-
Schneider, Low-temperature ultra- croscope 42-44 (1992) 256
high-vacuum scanning tunneling mi- Gokcedag, M., see Ciraci 42-44 (1992) 163
croscope 42-44 (1992) 1621 Goldie, K., see Schabert 42-44 (1992) 1118
Gallagher, M., see Sarid 42-44 (1992) 610 Golubok, A.O., see Davydov 42-44 (1992) 878
Garbarz, J., see Lacaze 42-44 (1992) 1037 Golubok, A.O., S.A. Vinogradova, S.Y.
Garcia, N., see Vu Thien Binh 42-44 (1992) 80 Tipisev, A.Y. Borisov, A.S. Taisova
Garcia, N., see Casero 42-44 (1992) 134 and O.V. Kolomytkin, STM/STS
Garcia, N., see Atlan 42-44 (1992) 154 study of photosynthetic bacterial
Garcia, R., J. Yuqiu, E. Schabtach and membrane 42-44 (1992) 1228
C. Bustamante, Deposition and imag- Golubok, A.O. and V.A. Timofeev, STM
ing of metal-coated biomolecules with combined with SEM without SEM ca-
the STM 42-44 (1992) 1250 pability limitations 42-44 (1992) 1558
Gardet, G., see Atlan 42-44 (1992) 154 Golubok, A.O., S.A. Masalov and N.A.
Garnaes, J., H. Lindgreen, P.L. Hansen, Tarasov, Thermofield tip formation in
S.A.C. Gould and P.K. Hansma, UHV/STM combined field emission
Atomic force microscopy of ultrafine microscope 42-44 (1992) 1574
clay particles 42-44 (1992) 1428 Gomez, F., see Aguilar 42-44 (1992) 1329
Garzon, F.H., see Hawley 42-44 (1992) 705 Gémez-Rodriguez, J.M., see Asenjo 42-44 (1992) 933
Gaub, H.E., see Radmacher 42-44 (1992) 968 Gémez-Rodriguez, J.M., A. Asenjo, R.C.
Gauthier, S., see Rousset 42-44 (1992) 515 Salvarezza and A.M. Baré, Measuring
Gautier, F., H. Ness and D. Stoeffler, the fractal dimension with STM: ap-
Electronic structure of transition plication to vacuum-evaporated gold 42-44 (1992) 1321
metal tips and tip—surface interac- Gonzales, J.M., see Aguilar 42-44 (1992) 1329
tions 42-44(1992) 91 Gottschalk, G., Th. Fries, C. Becker and
Ge, Y., see Hu 42-44 (1992) 1394 K. Wandelt, Topography of sputtered
Gerber, Ch., see Gébel 42-44 (1992) 1260 Si(100) surfaces studied by STM in air 42-44 (1992) 1376
Gerner, E., see Seifert 42-44 (1992) 379 Goudonnet, J.P., see De Fornel 42-44 (1992) 422
Gerth, G., see Haefke 42-44 (1992) 290 Gould, S.A.C., see Garnaes 42-44 (1992) 1428
Gewirth, A.A., see Chen 42-44 (1992) 437 Grabert, H., see Devoret 42-44 (1992) 22
Giessibl, F.J. and G. Binnig, Investiga- Grafstrém, S., see Kemmer 42-44 (1992) 1345
tion of the (001) cleavage plane of Graham, J.J., see Oden 42-44 (1992) 580
potassium bromide with an atomic Gratz, A.J., see Hillner 42-44 (1992) 1387
force microscope at 4.2 K in ultra-high Greve, J., see Putman 42-44 (1992) 1509
vacuum 42-44 (1992) 281 Greve, J., see Putman 42-44 (1992) 1549
Gimzewski, J.K., see Berndt 42-44 (1992) 355 Griffith, J.E., see Grigg 42-44 (1992) 1504
Gimzewski, J.K., R. Berndt and R.R. Griffith, J.E., see Grigg 42-44 (1992) 1616
Schlittler, Observation of local pho- Grigg, D.A., P.E. Russell and J.E. Grif-
toemission using a scanning tunneling fith, Rocking-beam force-balance ap-
microscope 42-44 (1992) 366 proach to atomic force microscopy 42-44 (1992) 1504
Gimzewski, J.K., see Berndt 42-44 (1992) 528 Grigg, D.A., P.E. Russell, J.E. Griffith,
Gimzewski, J.K., see Gaisch 42-44 (1992) 1621 M.J. Vasile and E.A. Fitzgerald,
Girard, C., see Bouju 42-44 (1992) 430 Probe characterization for scanning
Girard, J.C., see Rousset 42-44 (1992) 515 probe metrology 42-44 (1992) 1616
1690 Author index
Griindler, W., Theoretical treatment of Hamada, E. and R. Kaneko, Micro-tribo-
mediated electron transfer in strong logical evaluations of a polymer sur-
electric fields 42-44 (1992) 191 face by atomic force microscopes 42-44 (1992) 184
Griindler, W. and N.H. Thong, Elec- Hanrieder, W., R. Mock and H. Meixner,
tronic structure of small lithium—am- The whip motion of ultra-thin tunnel-
monia clusters 42-44 (1992) 206 ing tips 42-44 (1992) 169
Griitter, P., see Albrecht 42-44 (1992) 1638 Hansch, T.W., see Gobel 42-44 (1992) 1260
Gryko, J. and R.E. Allen, Dimer switch- Hansen, P.L., see Garnaes 42-44 (1992) 1428
ing on Si( 100) 42-44 (1992) 793 Hansma, P.K., see Weisenhorn 42-44 (1992) 1125
Gu, M., see Hu 42-44 (1992) 1394 Hansma, P.K., see Kasper 42-44 (1992) 1181
Gu, Y., see Hu 42-44 (1992) 1394 Hansma, P.K., see Hillner 42-44 (1992) 1387
Guckenberger, R., see Hillebrand 42-44 (1992) 1255 Hansma, P.K., see Garnaes 42-44 (1992) 1428
Guckenberger, R., see Hacker 42-44 (1992) 1514 Hara, S., see Kaneko 42-44 (1992) 1542
Guéret, P., Dynamic polarization effects Harary, H.H., see Dagata 42-44 (1992) 1288
and tunneling time 42-44 (1992) Hartmann, T., see Hacker 42-44 (1992) 1514
Giinther, C., see Schréder 42-44 (1992) Hartmann, U., Intermolecular and sur-
Giintherodt, H.-J., see Meyer 42-44 (1992) face forces in noncontact scanning
Giintherodt, H.-J., see Wiesendanger 42-44 (1992) force microscopy 42-44 (1992) 59
Giintherodt, H.-J., see Scandella 42-44 (1992) Hartmann, U., see Géddenhenrich 42-44 (1992) 256
Giintherodt, H.-J., see Maguire 42-44 (1992) Hartmann, U., see Berthe 42-44 (1992) 696
Giintherodt, H.-J., see Overney 42-44 (1992) Hashizume, T., M. Taniguchi, K. Motai,
Giintherodt, H.-J., see Schabert 42-44 (1992) 1118 H. Lu, K. Tanaka and T. Sakurai,
Guo, C.X. and D.J. Thomson, Material Oxygen adsorption on Ag(110) stud-
transfer between metallic tips and ied by the FI-STM 42-44 (1992) 553
surface in the STM 42-44 (1992) 1452 Hashizume, T., see Ichimiya 42-44 (1992) 910
Guthold, M., see Vesenka 42-44 (1992) 1243 Hashizume, T., see Mera 42-44 (1992) 915
Hatanaka, K., see Kishi 42-44 (1992) 1067
Hawley, M.E., 1.D. Raistrick, R.J. Houl-
Haase, O., R. Koch, M. Borbonus and ton, F.H. Garzon and M. Piza, The
K.H. Rieder, Carbidic and graphitic effect of sputter deposition conditions
carbon on Ni(771): aspects for cataly- on growth mechanism and mi-
sis 42-44 (1992) 541 crostructure of YBa,Cu,0,_, thin
Haberern, K.W., see Pashley 42-44 (1992) 1281 films on NdGaO, substrates studied
Hiaberle, W., J.K.H. Hoérber, F. Ohne- by scanning tunneling microscopy 42-44 (1992) 705
sorge, D.P.E. Smith and G. Binnig, In Hayakawa, M., see Yamamoto 42-44 (1992) 1422
situ investigations of single living cells He, J., see Jin 42-44 (1992) 1340
infected by viruses 42-44 (1992) 1161 Heckl, W.M. and G. Binnig, Domain
Haberle, W., see Ohnesorge 42-44 (1992) 1236 walls on graphite mimic DNA 42-44 (1992) 1073
Hachiya, T. and K. Itaya, In situ scanning Heckl, W.M., see Ohnesorge 42-44 (1992) 1236
tunneling microscopy of underpoten- Hefti, A., see Schabert 42-44 (1992) 1118
tial deposition in aqueous solution. Heiden, C., see Gdddenhenrich 42-44 (1992) 256
Ill. Silver adlayers on Au(111) 42-44 (1992) 445 Heiden, C., see Berthe 42-44 (1992) 696
Hacker, B., A. Hillebrand, T. Hartmann Held, G.A., see Feenstra 42-44 (1992) 33
and R. Guckenberger, Preparation Herrmann, K.-H., see Kasper 42-44 (1992) 1181
and characterization of tips for scan- Hertel, 1.V., see Zimmermann-Edling 42-44 (1992) 1366
ning tunneling microscopy of biologi- Hetrick, J., see Zheng 42-44 (1992) 1303
cal specimens 42-44 (1992) 1514 Heyvaert, I., see Stockman 42-44 (1992) 1317
Haefke, H., see Meyer 42-44 (1992) 274 Hidber, H.R., see Jung 42-44 (1992) 1446
Haefke, H., E. Meyer, L. Howald, U.D. Hiesgen, R. and D. Meissner, Problems
Schwarz, G. Gerth and M. Krohn, of roughness measurements using
Atomic surface and lattice structures STM 42-44 (1992) 1403
of AgBr thin films 42-44 (1992) 290 Hietschold, M. and H. Sbosny, Simple
Hagan, H.P., P.A. Campbell, K.W. Smith, model for the topographic imaging
R.J. Turner and D.G. Walmsley, process in a scanning tunneling mi-
Temporal behaviour of nanofeatures croscope 42-44 (1992) 200
on Au 42-44 (1992) 587 Hillebrand, A., T. Scheybani, W.
Hale, L.R., see Dahn 42-44 (1992) 1222 Wiegrabe and R. Guckenberger, Re-
Author index 1691
duction by ion-milling of surface cor- Hunt, E.R., see Pappas 42-44 (1992) 679
rugation of thin amorphous carbon Hwang, R.Q., see Schroder 42-44 (1992) 475
films for biological specimen sub-
strates in scanning tunneling mi-
Ichimiya, A., T. Hashizume, K. Ishiyama,
croscopy 42-44 (1992) 1255
K. Motai and T. Sakurai, Homo-epi-
Hillebrand, A., see Hacker 42-44 (1992) 1514
taxial growth on the Si(111)7 x 7 sur-
Hillner, P.E., S. Manne, A.J. Gratz and
face 42-44 (1992) 910
P.K. Hansma, AFM images of disso-
Ida, T., see Sugawara 42-44 (1992) 1372
lution and growth on a calcite crystal 42-44 (1992) 1387
Ikeda, K., K. Takamuku, K. Yamaguchi,
Hipp, M., see Marti 42-44 (1992) 345
R. Itti, N. Koshizuka and S. Tanaka,
Hipp, M., H. Bielefeldt, J. Colchero, O.
Scanning tunneling microscopy of
Marti and J. Mlynek, A stand-alone
Bi-O surfaces of Bi2212 supercon-
scanning force and friction micro- ductors 42-44 (1992) 738
scope 42-44 (1992) 1498 Inacker, O., see Kasper 42-44 (1992) 1181
Hirono, S., see Tanimoto 42-44 (1992) 1275
Ingold, G.-L., see Devoret 42-44 (1992)
Hofer, R., see Jung 42-44 (1992) 1446
Inkin, V.N., see Bashkin 42-44 (1992)
Hogervorst, A.C.R., see Hoogenraad 42-44 (1992) 1004
Irwin, J.C., see Qin 42-44 (1992)
Homma, Y., see Suzuki 42-44 (1992) 940
Ishiyama, K., see Ichimiya 42-44 (1992)
Hoogenraad, F.G.C., A.C.R. Hogervorst,
Isshiki, N., H. Kageshima, K. Kobayashi
P.M.L.O. Scholte and F. Tuinstra,
and M. Tsukada, First-principles sim-
Schottky-barrier formation in con-
ulation of STM/STS of Si(100) re-
ducting polymers 42-44 (1992) 1004 constructed surfaces 42-44 (1992)
Ho6rber, J.K.H., see Haberle 42-44 (1992) 1161
Itaya, K., see Hachiya 42-44 (1992)
H6rber, J.K.H., see Gébel 42-44 (1992) 1260 Itoh, M., see Tanaka 42-44 (1992)
Horn-von Hoegen, M., see Kéhler 42-44 (1992) 832
Itoh, M., see Udagawa 42-44 (1992)
Houlton, R.J., see Hawley 42-44 (1992) 705 Itti, R., see Ikeda 42-44 (1992) 738
Howald, L., see Meyer 42-44 (1992) 274 Ivanov, Z.G., see Olin 42-44 (1992) 734
Howald, L., see Haefke 42-44 (1992) 290 Iwasaki, H., see Niwa 42-44 (1992) 1360
Howald, L., see Overney 42-44 (1992) 983 Iwatsuki, M., see Tokumoto 42-44 (1992) 816
Howald, L., see Brodbeck 42-44 (1992) 1580 Iwatsuki, M., see Miki 42-44 (1992) 851
Howells, S., see Sarid 42-44 (1992) 610
Iwawaki, F., H. Kato, M. Tomitori and
Howie, A., see Castell 42-44 (1992) 1490
O. Nishikawa, STM study of geomet-
Hu, J., M. Gu, L. Zhang, Y. Xu, X. Yao,
ric and electronic structures of Ge
Z. Wang, Z. Huang, M. Li, Y. Gu, Y.
dimers on Si(001) 42-44 (1992) 895
Ge, Y. Li and Z. Wang, STM studies
Iwawaki, F., M. Tomitori and O.
of uncovered SiO, nanometer-par-
Nishikawa, STM study of initial stage
ticles 42-44 (1992) 1394 of Ge epitaxy on Si(001) 42-44 (1992) 902
Huang, G., see Bai 42-44 (1992) 1079
Huang, YJ., J. Slinkman and C.C.
Williams, Modelling of impurity Jacobson, K.B., see Allison 42-44 (1992) 1088
dopant density measurement in semi- Jandt, K.D., see Eng 42-44 (1992) 989
conductors by scanning force mi- Jericho, M.H., see Mulhern 42-44 (1992) 1214
croscopy 42-44 (1992) 298 Jin, Y., J.Q. Qian, J. Wei, J.E. Yao,
Huang, Z., see Hu 42-44 (1992) 1394 Sh.M. Liu, X.L. Yang, X.W. Wang,
Huang, Z.-H. and R.E. Allen, Influence Zh. Wang, W.Sh. Ma, G.Y. Shang
of STM tip on electronic structure: and J. He, Investigation of 10.6 mi-
Si(100) dimers 42-44 (1992) 97 crometer laser-induced damage on Cu
Hiibner, B., H.W.P. Koops, H. Pagnia, N. mirrors and Au-coated mirrors (Cu
Sotnik, J. Urban and M. Weber, Tips substrate) with STM 42-44 (1992) 1340
for scanning tunneling microscopy Joachim, C., see Sautet 42-44 (1992) 115
produced by electron-beam-induced Joachim, C., see Dunphy 42-44 (1992) 490
deposition 42-44 (1992) 1519 Jobin, M., M. Taborelli, R. Emch, F.
Hud, N.V., see Allen 42-44 (1992) 1095 Zenhausern and P. Descouts, Hy-
Huerta-Garnica, M., see Rousset 42-44 (1992) 515 droxylation and crystallization of elec-
Huffman, D.R., see Sarid 42-44 (1992) 610 tropolished titanium surface 42-44 (1992) 637
Hug, H.J., see Jung 42-44 (1992) 1446 Jobin, M., see Emch 42-44 (1992) 1155
Hughes, G., see Moriarty 42-44 (1992) 956 Jobin, M., see Zenhausern 42-44 (1992) 1168
1692 Author index
Jung, T.A., A. Moser, H.J. Hug, D. Brod- interpretation of STM images of ad-
beck, R. Hofer, H.R. Hidber and U.D. sorbates 42-44 (1992) 122
Schwarz, The atomic force micro- Kent, A.D., see Renner 42-44 (1992) 699
scope used as a powerful tool for Kent, A.D., see Maggio-Aprile 42-44 (1992) 728
machining surfaces 42-44 (1992) 1446 Kent, A.D., Ch. Renner, Ph. Nieder-
Jusko, O., see Kéhler 42-44 (1992) 832 mann, J.-G. Bosch and @. Fischer, A
low-temperature scanning tunneling
microscope with in-situ sample cleav-
Kado, H., see Masaki 42-44 (1992) 1148 ing 42-44 (1992) 1632
Kado, H., K. Yokoyama and T. Tohda, A Kharkevich, S.1., see Bashkin 42-44 (1992) 977
novel ZnO whisker tip for atomic Kiejna, A., Potential barrier for the
force microscopy 42-44 (1992) 1659 metal—vacuum—metal tunneling elec-
Kagawa, Y., see Masai 42-44 (1992) 1194 trons 42-44 (1992) 231
Kageshima, H., see Isshiki 42-44 (1992) 109 Kiener, A., see Ohnesorge 42-44 (1992) 1236
Kajimura, K., see Mizutani 42-44 (1992) 236 Kino, T., see Endo 42-44 (1992) 674
Kajimura, K., see Bando 42-44 (1992) 1627 Kirschner, J., see Schmid 42-44 (1992) 483
Kaldis, E., see Lang 42-44 (1992) 715 Kishi, E., H. Matsuda, R. Kuroda, K.
Kamihara, Y., see Sugawara 42-44 (1992) 1372
Takimoto, A. Yamano, K. Eguchi, K.
Kamo, M., see Maguire 42-44 (1992) 689 Hatanaka and T. Nakagiri, Barrier-
Kaneko, R., see Hamada 42-44 (1992) 184 height imaging of fatty acid Lang-
Kaneko, R., see Suzuki 42-44 (1992) 940 muir-—Blodgett films 42-44 (1992) 1067
Kaneko, R., see Sugawara 42-44 (1992) 1372 Kitamura, N., see Sugimura 42-44 (1992) 468
Kaneko, R., S. Oguchi, S. Hara, R. Mat- Klein, J., see Rousset 42-44 (1992) 515
suda, T. Okada, H. Ogawa and Y.
Kliese, R., B. R6ttger, D. Badt and H.
Nakamura, Atomic force microscope
Neddermeyer, Real-time STM inves-
coupled with an optical microscope 42-44 (1992) 1542
tigation of the initial stages of oxygen
Kanisawa, K., see Tanimoto 42-44 (1992) 1275 interaction with Si(100)2 x 1 42-44 (1992) 824
Karpinski, J., see Lang 42-44 (1992) 715 Knall, J., see Wilson 42-44 (1992) 801
Kasemo, B., see Olin 42-44 (1992) 567 Knoll, W., see Weisenhorn 42-44 (1992) 1125
Kasper, K., K.-H. Herrmann, P. Dietz, Kobayashi, K., see Isshiki 42-44 (1992) 109
P.K. Hansma, O. Inacker, H.-D. Kobayashi, K., see Tsukada 42-44 (1992) 360
Lehmann and Th. Rintelen, Investi- Koch, R., see Haase 42-44 (1992) 541
gation of dialysis membranes with
Kohler, U., O. Jusko, B. Miiller, M.
atomic force microscopy 42-44 (1992) 1181
Horn-von Hoegen and M. Pook,
Kataoka, T., see Oshio 42-44 (1992) 310
Layer-by-layer growth of germanium
Kato, H., see Iwawaki 42-44 (1992) 895
on Si(100): strain-induced morphol-
Katzer, D.S., see Glembocki 42-44 (1992) 764 ogy and the influence of surfactants 42-44 (1992) 832
Keller, D.J., see Keller 42-44 (1992) 1173 Kohler, U., see Palmino 42-44 (1992) 928
Keller, D.J., see Vesenka 42-44 (1992) 1243
Kolbe, W.F., D.F. Ogletree and M.B.
Keller, D.J., D. Deputy, A. Alduino and
Salmeron, Atomic force microscopy
K. Luo, Sharp, vertical-walled tips for
imaging of T4 bacteriophages on sili-
SFM imaging of steep or soft samples 42-44 (1992) 1481 con substrates 42-44 (1992) 1113
Keller, E., see Magonov 42-44 (1992) 1009 Kolomytkin, O.V., see Golubok 42-44 (1992) 1228
Keller, R.W., DJ. Keller, D. Bear, J. Kondo, S., see Masai 42-44 (1992) 1194
Vesenka and C. Bustamante, Elec- Koops, H.W.P., see Hiibner 42-44 (1992) 1519
trodeposition procedure of E. coli Koshizuka, N., see Ikeda 42-44 (1992) 738
RNA polymerase onto gold and de- Krohn, M., see Haefke 42-44 (1992) 290
position of E. coli RNA polymerase Kudoh, Y., see Suzuki 42-44 (1992) 940
onto mica for observation with scan- Kuroda, R., see Kishi 42-44 (1992) 1067
ning force microscopy 42-44 (1992) 1173 Kurumizawa, T., see Yamamoto 42-44 (1992) 1422
Kemmer, H., S. Grafstrém, M. Neitzert, Kusao, K., see Yamamoto 42-44 (1992) 1422
M. Wortge, R. Neumann, C. Traut- Kuwahara, K., see Endo 42-44 (1992) 674
mann, J. Vetter and N. Angert, Scan-
Kwetkus, B.A. and K. Sattler, A STM/
ning tunneling microscopy of surface
STS and XPS study of oxidized metal
modifications induced by UNILAC powders 42-44 (1992) 749
heavy-ion irradiation 42-44 (1992) 1345
Kenkre, V.M., F. Biscarini and C. Busta-
mante, Theoretical framework for the Labani, B., see Bouju 42-44 (1992) 430
Author index 1693
Lacaze, E., J. Garbarz, V. Quillet, M. Liu, Sh.M., see Jin 42-44 (1992) 1340
Schott, M.C. Pham, J. Moslih and P.C. Lotz, B., see Stocker 42-44 (1992) 1141
Lacaze, STM of conducting polymer Louskinovich, P.N., see Efremov 42-44 (1992) 1459
thin films formed by electropolymer- Lu, H., see Hashizume 42-44 (1992) 553
ization on graphite and gold 42-44 (1992) 1037 Lucas, A.A., see Vigneron 42-44 (1992) 250
Lacaze, P.C., see Lacaze 42-44 (1992) 1037 Luo, K., see Keller 42-44 (1992) 1481
Lzgsgaard, E., see Ruan 42-44 (1992) 498 Liithi, R., see Meyer 42-44 (1992) 274
Lezgsgaard, E., see Eierdal 42-44 (1992) 505 Liithi, R., see Brodbeck 42-44 (1992) 1580
Laloyaux, Th., see Vigneron 42-44 (1992) 250 Lutz, C.P., see Zeppenfeld 42-44 (1992) 128
Lamb, L.D., see Sarid 42-44 (1992) Lutz, M.A., see Feenstra 42-44 (1992) 33
Lambin, Ph., see Vigneron 42-44 (1992) 250 Lux-Steiner, M., see Schimmel 42-44 (1992) 683
Lang, H.P., V. Thommen-Geiser and R. Lux-Steiner, M., see Fuchs 42-44 (1992) 1295
Wiesendanger, Scanning tunneling
microscopy study of ternary alkali- Ma, W.Sh., see Jin 42-44 (1992) 1340
metal graphite intercalation com- Ma, Z., C. Zhu, J. Shen and S. Pang,
pounds 42-44 (1992) Behavior of small metal clusters on
Lang, H.P., see Maguire 42-44 (1992) solid crystal surfaces 42-44 (1992) 1350
Lang, H.P., J.P. Ramseyer, D. Brodbeck, Machida, K., see Masaki 42-44 (1992) 1148
T. Frey, J. Karpinski, E. Kaldis and MacRae, C.M., Ultra-thin metal films for
Th. Wolf, Atomic resolution of imaging low-conductivity surfaces by
single-crystalline Y,Ba,Cu,,,Oi4,,, scanning tunneling microscopy 42-44 (1992) 1337
(n=0, 1, 2) and laser-ablated thin Maeda, K., see Mera 42-44 (1992) 915
film Y,Ba,Cu,0, HT.SC by STM 42-44 (1992) 715 Maggio-Aprile, I., A.D. Kent, Ph. Nie-
Lanyi, §. and M. Owvold, Improved dermann, Ch. Renner, L. Antog-
wide-range bimorph scanners 42-44 (1992) 1664 nazza, L. Miéville, O. Brunner, J.-M.
Laschinski, R., see Wang 42-44 (1992) 594 Triscone and @. Fischer, Studies of
Laukhina, E.E., see Magonov 42-44 (1992) 1009 the surface structure of YBa,Cu,0,
Lausmaa, J., see Olin 42-44 (1992) 567 thin films using STM 42-44 (1992) 728
Leatherbarrow, R.J., see Wells 42-44 (1992) 1200 Magonov, S.N., see Bar 42-44 (1992) 644
Lee, 1, E.D.T. Atkins and M.J. Miles, Magonov, S.N., G. Bar, E. Keller, E.B.
Visualization of the algal polysaccha- Yagubskii, E.E. Laukhina and H.-J.
ride carrageenan by scanning tun- Cantow, Surface analysis of organic
nelling microscopy 42-44 (1992) 1107 superconductors by scanning probe
Lehmann, H.-D., see Kasper 42-44 (1992) 1181 techniques: STM and AFM 42-44 (1992) 1009
Lei, H.N., see Troyon 42-44 (1992) 1564 Magonov, S.N., see Stocker 42-44 (1992) 1141
Leitner, A., see Gobel 42-44 (1992) 1260 Maguire, H.G., M. Kamo, H.P. Lang and
Lévy, F., see Renner 42-44 (1992) 699 H.-J. Giintherodt, Localised structure
Levy Yeyati, A. and F. Flores, Theory of of homoepitaxial diamond 42-44 (1992) 689
photovoltaic effect in STM: applica- Manne, S., see Hillner 42-44 (1992) 1387
tion to graphite 42-44 (1992) 242 Mao, B.W., see Tian 42-44 (1992) 460
Lewis, A., see Lieberman 42-44 (1992) 399 Mao, B.W., J.H. Ye, X.D. Zhuo, J.Q.
Li, M., see Hu 42-44 (1992) 1394 Mu, Z.D. Fen and Z.W. Tian, A new
Li, Y., see Oden 42-44 (1992) 580 method of STM tip fabrication for
Li, Y., see Yang 42-44 (1992) 1031 in-situ electrochemical studies 42-44 (1992) 464
Li, Y., see Hu 42-44 (1992) 1394 Marchevsky, M.V., see Volodin 42-44 (1992) 757
Libioulle, L., see Vigneron 42-44 (1992) 250 Mariani, T., see Allegrini 42-44 (1992) 371
Lichtenberger, D.L., see Sarid 42-44 (1992) 610 Marrian, C.R.K., see Glembocki 42-44 (1992) 764
Lieberman, K. and A. Lewis, Superreso- Marrian, C.R.K. and E.A. Dobisz, High-
lution optical imaging with a high- resolution lithography with a vacuum
brightness subwavelength light source 42-44 (1992) 399 STM 42-44 (1992) 1309
Linder, A., J. Colchero, H.-J. Apell, O. Marti, O., see Linder 42-44 (1992) 329
Marti and J. Mlynek, Scanning force Marti, O., A. Ruf, M. Hipp, H. Biele-
42-44 (1992) 329
microscopy of diatom shells feldt, J. Colchero and J. Mlynek, Me-
42-44 (1992) 1133
Linder, A., see Apell chanical and thermal effects of laser
Lindgreen, H., see Garnaes 42-44 (1992) 1428 irradiation on force microscope can-
Lindsay, S.M., see Oden 42-44 (1992) 580 tilevers 42-44 (1992) 345
Lio, A., see Allegrini 42-44 (1992) 371 Marti, O., see Apell 42-44 (1992) 1133
1694 Author index
Marti, O., see Hipp 42-44 (1992) 1498 Miranda, R., see Vazquez de Parga 42-44 (1992) 845
Martin-Gago, J.A., see Vazquez 42-44 (1992) 616 Miyashita, M., see Suzuki 42-44 (1992) 1553
Masai, J., T. Shibata, Y. Kagawa and S. Mizutani, W., M. Shigeno, K. Kajimura
Kondo, Imaging of subunit complex- and M. Ono, Tunneling through a
es of thermophilic bacterium H*- deformed potential 42-44 (1992) 236
ATPase with scanning tunneling mi- Mlynek, J., see Linder 42-44 (1992) 329
croscopy 42-44 (1992) 1194 Mlynek, J., see Marti 42-44 (1992) 345
Masaki, N., K. Machida, H. Kado, K. Mlynek, J., see Apell 42-44 (1992) 1133
Yokoyama and T. Tohda, Molecular- Mlynek, J., see Hipp 42-44 (1992) 1498
resolution images of aspirin crystals Mock, R., see Hanrieder 42-44 (1992) 169
with atomic force microscopy 42-44 (1992) 1148 Moiseev, Yu.N., V.1. Panov, S.V. Savi-
Masalov, S.A., see Golubok 42-44 (1992) 1574 nov, I.V. Yaminsky, P. Todua and D.
Masuhara, H., see Sugimura 42-44 (1992) 468 Znamensky, Atomic force and scan-
Mathiez, Ph., see Palmino 42-44 (1992) 928 ning tunneling microscopy of comb-
Matsuda, H., see Kishi 42-44 (1992) 1067 like cholesteric liquid crystalline poly-
Matsuda, R., see Kaneko 42-44 (1992) 1542 mer LB films 42-44 (1992) 304
Matsushiro, M., see Suzuki 42-44 (1992) 1553 Moiseev, Yu.N., V.I. Panov, S.V. Savi-
McBride, S.E., see Strozewski 42-44 (1992) 388 nov, S.I. Vasil’ev and I.V. Yaminsky,
McGonical, G.C., see Yackoboski 42-44 (1992) 963 AFM and STM activities at Advanced
McInnes, D.A., see Wilson 42-44 (1992) 801 Technologies Center 42-44 (1992) 1596
McLean II, W., see Tench 42-44 (1992) 668 Molinas-Mata, P., see Zegenhagen 42-44 (1992) 952
Meissner, D., see Hiesgen 42-44 (1992) 1403 Moller, M., see Stocker 42-44 (1992) 1141
Meixner, H., see Hanrieder 42-44 (1992) 169 Montelius, L., M.-E. Pistol and L.
Menshikov, O.D., see Bashkin 42-44 (1992) 977 Samuelson, Low-temperature lumi-
Mera, Y., T. Hashizume, K. Maeda and nescence due to minority carrier in-
T. Sakurai, FI-STM investigation of jection from the scanning tunneling
the Si(111)2 x 1 cleaved surface 42-44 (1992) 915 microscope tip 42-44 (1992) 210
Metaxas, C., see Zajac 42-44 (1992) 998 Moriarty, P. and G. Hughes, An investi-
Meyer, E., L. Howald, R.M. Overney, D. gation of the early stages of native
Brodbeck, R. Liithi, H. Haefke, J. oxide growth on chemically etched
Frommer and H.-J. Giintherodt, and sulfur-treated GaAs(100) and
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