Ultramicroscopy 1991: Vol 39 Index

6 Pages·1991·1.7 MB·English

Author index to volume 39
Abe, H., see Kinoshita 39 (19912)0 5 Hashimoto, M., see Hashimoto 39 (19911)7 1
Ai, R., M.1. Buckett, D. Dunn, T.S. Savage, Hetherington, C.J.D., see Hashimoto 39 (19911)7 1
J.P. Zhang and L.D. Marks, UHV mi- Hidaka, Y., see Ohnuki 39 (19911)9 7
croscopy of surfaces 39 (19913)8 7 Hiraga, K., see Shindo 39 (1991) 50
Alfredsson, V., see Terasaki 39 (19912)3 8 Hiraga, K., see Takeda 39 (1991) 180
Allen, C.W. and D.A. Smith, In situ study of Hirata, M., see Takeda 39 (1991) 180
effects of ion irradiation on solid-state Hirotsu, Y., see Nagakura 39 (19912)5 4
crystallization of cobalt disilicide thin Horiuchi, S., see Matsui 39(1991) 8
films 39 (19912)2 2 Horiuchi, S., Y. Matsui, Y. Kitami, M.
Arai, S., see Kuroda 39 (1991) 58 Yokoyama, S. Suehara, X.J. Wu, I. Mat-
sui and T. Katsuta, Ultra-high-resolution
Bando, Y., see Matsui 39(1991) 8 HVEM (H-1500) newly constructed at
Bovin, J.-O., see Terasaki 39 (19912)3 8 NIRIM. II. Applications to materials 39 (1991) 231
Brito, M.E., see Nagakura 39 (19912)5 4 Hua, G.-C., see Takeda 39 (1991) 180
Buckett, M.I., see Ai 39 (19913)8 7 Hua, G.-C., see Oshima 39 (1991) 160
Dunn, D., see Ai 39 (19913)8 7 Ikeda, K., see Sumida 39 (19913)1 3
Ikuta, T., see Hashimoto 39 (1991) 171
Ezawa, T. and E. Wakai, Radiation-induced Inoko, F., T. Hama, M. Tagami and T.
solute segregation in Al and Ni binary Yoshikawa, Grain boundary premelting
alloys under HVEM irradiation 39 (1991) 187 in thin foils of deformed copper bicrys-
tals 39 (1991) 118
Fujimura, A., see Suzuki 39 (1991) 92 Inui, H., A. Nakamura, M.H. Oh and M.
Fujita, H., K. Ura and H. Mori, Foreword to Yamaguchi, High-resolution electron mi-
High-Voltage Electron Microscopy 39 (1991) xiii croscope study of lamellar boundaries in
Fujita, H., see Komatsu 39 (1991) 105 Ti-rich TiAl polysynthetically twinned
Fujita, H., see Okabayashi 39 (1991) 306 crystals 39 (1991) 268
Fujita, H., see Nakayam 39 (1991) 329 Isoda, S., S. Moriguchi, H. Kurata, T.
Fujita, H., see Mori 39 (1991) 355 Kobayashi and N. Uyeda, A new 1000 kV
Fujita, H., Atom clusters — new applications HREM for organic crystal study 39 (1991) 247
of high-voltage electron microscopy “‘mi-
cro-laboratory” to materials science 39 (1991) 369
Jin, N.Y., see Seeger 39 (1991) 342
Fukumoto, K., see Kinoshita 39 (1991) 205
Jouffrey, B., Recent evolution of HVEM in
France 39 (1991) 21
Goringe, M.J., Some aspects of HVEM in
the study of materials 39 (1991) 100 Kamino, T., see Saka 39 (1991) 110
Katsuta, T., see Matsui 39(1991) 8
Hama, T., see Inoko 39 (1991) 118 Katsuta, T., see Yoshida 39 (1991) 45
Hanamura, T., R. Uemori, M. Tanino and Katsuta, T., see Horiuchi 39 (19912)3 1
H. Morikawa, Dynamic observation of Kifune, K., see Kitano 39 (19912)7 9
dislocation movement across twin bound- Kimoto, K., see Tanaka 39 (19913)9 5
aries in the lamellar structure of TiAl Kinoshita, C., H. Abe, K. Fukumoto, K.
intermetallic compound 39 (1991) 86 Nakai and K. Shinohara, Accumulation
Hashimoto, H., Y. Makita, Y. Yokota, T. and annihilation processes of cascades in
Ikuta, M. Hashimoto and C.J.D. Hether- metallic and nonmetallic crystals under
ington, Observations on quick fluctuation irradiation with ions and/or electrons 39 (1991) 205
of atom images of Si crystal lattice under Kinoshita, C., see Tomokiyo 39 (1991) 213
800 kV electron irradiation 39 (1991) 171 Kinoshita, C., see Nakai 39 (1991) 361
Elsevier Science Publishers B.V.
Kiritani, M., Mistory, present status ang tu- MOB AVUAUVN VE LS MBs. DEpe revives
ture of the contribution of high-voltage tor YBa,Cu,O,_, studied by high-reso-
electron microscopy to the study of radia- lution electron microscopy 39 (1991) 254
tion damage and defects in solids 39 (1991) 135 Naka, M., Aluminium/ ceramic interface
Kiritani, M., see Takeda 39 (1991) 180 structure and its related properties 39 (1991) 128
Kitami, Y., see Matsui 39(1991) 8 Nakai, K., see Kinoshita 39 (1991) 205
Kitami, Y., see Horiuchi 39 (1991) 231 Nakai, K., C. Kinoshita and A. Matsunaga,
Kitano, Y. and K. Kifune, HREM study of A study of amorphization and mi-
disclinations in MgCd ordered alloy 39 (1991) 279 crostructural evolution of graphite under
Kobayashi, T., see Isoda 39 (1991) 247 electron or ion irradiation 39 (19913)6 1
Komatsu, M. and H. Fujita, In situ investiga- Nakamura, A., see Inui 39 (1991) 268
tions of plastic deformation and pseudo- Nakamura, Y., see Nagakura 39 (19912)5 4
elasticity of zirconia ceramics 39 (1991) 105 Nakata, Y., T. Tadaki and K. Shimizu, Eval-
Kurata, H., see Isoda 39 (1991) 247 uation of accuracy in the ALCHEMI
Kuroda, K., C. Morita, S. Arai, N. Yokoi method 39 (1991) 72
and H. Saka, Convergent beam electron Nakayama, H., T. Nishino, K. Ueda, S.
diffraction in the high-voltage electron Takeno and H. Fujita, Surface wave exci-
microscope with continuously variable tation Auger electron spectroscopy of
reference voltage for lenses and align- Si(001) reconstructed surfaces 39 (1991) 329
ments 39 (1991) 58 Nishino, T., see Nakayama 39 (1991) 329
Kuroiwa, T., see Komokiyo 39 (1991) 213
Oh, M.H., see Inui 39 (1991) 268
Makita, Y., see Hashimoto 39 (1991) 171 Ohashi, T., see Saka 39 (1991) 110
Marks, L.D., see Ai 39 (1991) 387 Ohboshi, T., see Matsumura 39 (1991) 65
Matsui, I., see Matsui 39(1991) 8 Ohnuki, S., Y. Hidaka and H. Takahashi,
Matsui, I., see Yoshida 39 (1991) 45 In-situ observation of defect cluster for-
Matsui, I., see Horiuchi 39 (19912)3 1 mation in metal and alloy under elec-
Matsui, Y., S. Horiuchi, Y. Bando, Y. Ki- tron/ion dual-beam irradiation 39 (1991) 197
tami, M. Yokoyama, S. Suehara, I. Mat- Ohsuna, T., see Terasaki 39 (19912)3 8
sui and T. Katsuta, Ultra-high-resolution Ohtsuka, I., see Saka 39 (1991) 110
HVEM (H-1500) newly constructed at Oikawa, T., see Shindo 39 (1991) 50
NIRIM. I. Instrumentation 39(1991) 8 Okabayashi, H., A. Tanikawa, H. Mori and
Matsui, Y., see Horiuchi 39 (1991) 231 H. Fujita, HVEM observations of stress-
Matsumura, S., T. Ohboshi, K. Oki and Y. induced voiding in Al lines for LSI 39 (1991) 306
Tomokiyo, High-voltage electron diffrac- Oki, K., see Matsumura 39 (1991) 65
tion study of structure factors of Pd and Oku, T., see Shindo 39 (1991) 50
Pt 39 (1991) 65 Oshima, R. and G.C. Hua, Characterization
Matsunaga, A., see Nakai 39 (1991) 361 of Czochralski Si crystals by HVEM 39 (1991) 160
Mihama, K., see Tanaka 39 (1991) 395
Mitome, M. and K. Takayanagi, Anomalous
surface structure of fine germanium par-
Phillipp, F., see Seeger 39 (1991) 32
ticles 39 (1991) 382
Phillipp, F., see Seeger 39 (1991) 342
Miyagawa, K., see Nagakura 39 (1991) 254
Mori, H., see Fujita 39 (1991) xiii
Mori, H., see Okabayashi 39 (1991) 306
Mori, H., see Yasuda 39 (1991) 321 Saka, H., see Kuroda 39 (1991) 58
Mori, H. and H. Fujita, Formation of non- Saka, H. and H. Teshima, Recent progress
equilibrium solid phases by high-energy in in-situ deformation experiments in
electron irradiation 39 (1991) 355 HVEM 39 (1991) 81
Moriguchi, S., see Isoda 39 (1991) 247 Saka, H., K. Sasaki, T. Ohashi, I. Ohtsuka,
Morikawa, H., see Hanamura 39 (1991) 86 T. Kamino and M. Tomita, In situ obser-
Morita, C., see Kuroda 39 (1991) 58 vations of solid—liquid interfaces 39 (1991) 110
Muto, S., see Takeda 39 (1991) 180 Sakata, T., see Yasuda 39 (1991) 321
Sasaki, J., see Nagakura 39 (1991) 254
Nagakawa, J., see Suzuki 39 (1991) 92 Sasaki, K., see Saka 39 (19911)1 0
Nagakura, S., Y. Hirotsu, J. Sasaki, K. Miya- Sato, A., see Suzuki 39 (1991) 92
gawa, Y. Nakamura and M.E. Brito, Savage, T.S., see Ai 39 (1991) 387
VETER, ‘- aiwu fs ruuupp, rigu-vuonage ICI@oa@anl, V., 1. \nouna, V. ALIOCUSsSON, J.°U.
electron microscopy in the Federal Re- Bovin, D. Watanabe and K. Tsuno, The
public of Germany: past, present and fu- study of zeolites by HVHREM 39 (19912)3 8
ture 39 (1991) 32 Teshima, H., see Saka 39 (1991) 81
Seeger, A., N.Y. Jin, F. Phillipp and M. Tomita, M., see Saka 39 (19911)1 0
Zaiser, The study of self-organization Tomokiyo, Y., see Matsumura 39 (1991) 65
processes in crystals by high-voltage elec- Tomokiyo, Y., T. Kuroiwa and C. Kinoshita,
tron microscopy 39 (19913)4 2 Defects occurring at or near surfaces in
Shimizu, K., see Nakata 39 (1991) 72 a-Al,O, during electron irradiation 39 (19912)1 3
Shindo, D., K. Hiraga, T. Oku and T. Tsuno, K., see Terasaki 39 (1991) 238
Oikawa, Quantification in high-resolu-
tion electron microscopy with the imag- Ueda, K., see Nakayama 39 (1991) 329
ing plate 39 (1991) 50 Uemori, R., see Hanamura 39 (1991) 86
Shinohara, K., see Kinoshita 39 (1991) 205 Ura, K., see Fujita 39 (1991) xiii
Shiraishi, H., see Suzuki 39 (1991) 92 Ura, K., Design concept of a new ultra-
Smith, D.A., see Allen 39 (1991) 222 high-voltage electron microscope at Osa-
Suehara, S., see Matsui 39(1991) 8 ka University 39(1991) 1
Suehara, S., see Horiuchi 39 (19912)3 1 Ura, K., see Yoshida 39 (1991) 45
Sumida, N. and K. Ikeda, Cross-sectional Ura, K., see Takaoka 39 (1991) 299
observations of gold-silicon reaction on Uyeda, N., see Isoda 39 (19912)4 7
silicon substrate in situ in the high-volt-
age electron microscope 39 (1991) 313 Van Landuyt, J., The evolution of HVEM
Suzuki, M., A. Fujimura, A. Sato, J. Na- application in Antwerp 39 (19912)8 7
gakawa, N. Yamamoto and H. Shiraishi,
In situ deformation of proton-irradiated Wakai, E., see Ezawa 39 (1991) 187
metals 39 (1991) 92 Watanabe, D., see Terasaki 39 (1991) 238
Wu, X.J., see Horiuchi 39 (1991) 231
Tadaki, T., see Nakata 39 (1991) 72
Tagami, M., see Inoko 39 (1991) 118 Yamaguchi, M., see Inui 39 (1991) 268
Takahashi, H., see Ohnuki 39 (1991) 197 Yamamoto, N., see Suzuki 39 (1991) 92
Takaoka, A., see Yoshida 39 (1991) 45 Yasuda, H., T. Sakata and H. Mori, Struc-
Takaoka, A. and K. Ura, Stereoscopic obser- tural and valence electronic analysis of
vation and determination of surface ori- electron-irradiation-induced foreign-
entation of voids in_ stress-thermal- atom implantation by a combination of
migrated-aluminum lines of LSI with UHVEM and AES 39 (19913)2 1
UHVEM 39 (1991) 299 Yokoi, N., see Kuroda 39 (1991) 58
Takayanagi, K., see Mitome 39 (1991) 382 Yokota, Y., see Hashimoto 39 (1991) 171
Takeda, S., M. Hirata, S. Muto, G.-C. Hua, Yokoyama, M., see Matsui 39 (1991) 8
K. Hiraga and M. Kiritani, HRTEM ob- Yokoyama, M., see Horiuchi 39 (19912)3 1
servation of electron-irradiation-induced Yoshida, K., A. Takaoka, K. Ura, T. Katsuta
defects penetrating through a thin foil of and I. Matsui, Grooved fluorescent plate
germanium 39 (1991) 180 for parallel-detection electron energy loss
Takeno, S., see Nakayama 39 (1991) 329 spectroscopy in ultra-high-voltage elec-
Tanaka, N., K. Kimoto and K. Mihama, Ob- tron microscopy 39 (1991) 45
servations by HVEM of atomic clusteres Yoshikawa, T., see Inoko 39 (1991) 118
embedded in MgO crystals 39 (1991) 395
Tanikawa, A., see Okabayashi 39 (1991) 306 Zaiser, M., see Seeger 39 (1991) 342
Tanino, M., see Hanamura 39 (1991) 86 Zhang, J.P., see Ai 39 (1991) 387
Subject index to volume 39
Analytical microscopy High resolution
Quantification in high-resolution electron Ultra-high-resolution HVEM (H-1500) newly
microscopy with the imaging plate, constructed at NIRIM. I. Instrumenta-
Shindo, Hirage, Oku and Oikawa 39 (1991) 50 tion, Matsui, Horiuchi, Bando, Kitami,
Evaluation of accuracy in the ALCHEMI Yokoyama, Suehara, Matsui and Katsuta 39(1991) 8
method, Nakata, Tadaki and Shimizu 39 (1991) 72 Quantification in high-resolution electron
Cross-sectional observations of gold-silicon microscopy with the imaging plate,
reaction on silicon substrate in situ in the Shindo, Hiraga, Oku and Oikawa 39 (1991) 50
high-voltage electron microscope, Sum- Observations on quick fluctuation of atom
ida and Ikeda 39 (19913)1 3 images of Si crystal lattice under 800 kV
Structural and valence electronic analysis of electron irradiation, Hashimoto, Makita,
electron-irradiation-induced foreign-at- Yokota, Ikuta, Hashimoto and Hether-
om implantation by a combination of ington 39 (1991) 171
UHVEM and AES, Yasuda, Sakata and HRTEM observation of electron-irradiation-
Mori 39 (1991) 321 induced defects penetrating through a
Surface wave excitation Auger electron spec- thin foil of germanium, Takeda, Hirata,
troscopy of Si(001) reconstructed sur- Muto, Hua, Hiraga and Kiritani 39 (1991) 180
faces, Nakayama, Nishino, Ueda, Takeno Ultra-high-resolution HVEM (H-1500) newly
and Fujita 39 (1991) 329 constructed at NIRIM. II. Applications
to materials, Horiuchi, Matsui, Kitami,
Yokoyama, Suehara, Wu, Matsui and
Detectors, photographic and other Katsuta 39 (19912)3 1
Grooved fluorescent plate for parallel-detec-
The study of zeolites by HVHREM, Terasaki,
tion electron energy loss spectroscopy in
Ohsuna, Alfredsson, Bovin, Watanabe and
ultra-high-voltage electron microscopy, Tsuno 39 (1991) 238
Yoshida, Takaoka, Ura, Katsuta and
Degradation of the high-7, superconductor
Matsui 39 (1991) 45 YBa,Cu;0,_, studied by high-resolu-
Quantification in high-resolution electron
tion electron microscopy, Nagakura, Hi-
microscopy with the imaging plate,
rotsu, Sasaki, Miyagawa, Nakamura and
Shindo, Hiraga, Oku and Oikawa 39 (1991) 50 Brito 39 (1991) 254
High-resolution electron microscope study of
lamellar boundaries in Ti-rich TiAl
Diffraction and optical diffraction
polysynthetically twinned crystals, Jnui,
Convergent beam electron diffraction in the
Nakamura, Oh and Yamaguchi 39 (1991) 268
high-voltage electron microscope with
HREM study of disclinations in MgCd or-
continuously variable reference voltage
dered alloy, Kitano and Kifune 39 (1991) 279
for lenses and alignments, Kuroda,
UHV microscopy of surfaces, Ai, Buckett,
Morita, Arai, Yokoi and Saka 39 (1991) 58
Dunn, Savage, Zhang and Marks 39 (1991) 387
High-voltage electron diffraction study of
structure factors of Pd and Pt, Mat-
sumura, Ohboshi, Oki and Tomokiyo 39 (1991) 65
High voltage
Design concept of a new ultra-high-voltage
Electron energy loss spectroscopy electron microscope at Osaka University,
Grooved fluorescent plate for parallel-detec- Ura 39(1991) 1
tion electron energy loss spectroscopy in Ultra-high-resolution HVEM (H-1500) newly
ultra-high-voltage electron microscopy, constructed at NIRIM. I. Instrumenta-
Yoshida, Takaoka, Ura, Katsuta and tion, Matsui, Horiuchi, Bando, Kitami,
Matsui 39 (1991) 45 Yokoyama, Suehara, Matsui and Katsuta 39 (1991) 8
Elsevier Science Publishers B.V.
frey 39 (1991) 21 reaction on silicon substrate in situ in the
High-voltage electron microscopy in the high-voltage electron microscope, Sum-
Federal Republic of Germany: past, ida and Ikeda 39 (1991) 313
present and future, Seeger and Phillipp 39 (1991) 32 The study of self-organization processes in
Grooved fluorescent plate for parallel-detec- crystals by high-voltage electron mi-
tion electron energy loss spectroscopy in croscopy, Seeger, Jin, Phillipp and Zaiser 39 (1991) 342
ultra-high-voltage electron microscopy, Formation of non-equilibrium solid phases
Yoshida, Takaoka, Ura, Katsuta and by high-energy electron irradiation, Mori
Matsui 39 (1991) 45 and Fujita 39 (1991) 355
Convergent beam electron diffraction in the A study of amorphization and microstruc-
high-voltage electron microscope with tural evolution of graphite under elec-
continuously variable reference voltage tron or ion irradiation, Nakai, Kinoshita
for lenses and alignments, Kuroda, and Matsunaga 39 (19913)6 1
Morita, Arai, Yokoi and Saka 39 (1991) 58 Atom clusters — new applications of high-
High-voltage electron diffraction study of voltage electron microscopy “micro-
structure factors of Pd and Pt, Mat- laboratory” to materials science, Fujita 39 (1991) 369
sumura, Ohboshi, Oki and Tomokiyo 39 (1991) 65 Observations by HVEM of atomic clusters
Recent progress in in-situ deformation ex- embedded in MgO crystals, Tanaka, Ki-
periments in HVEM, Saka and Teshima 39 (1991) 81 moto and Mihama 39 (1991) 395
Some aspects of HVEM in the study of
materials, Goringe 39 (1991) 100
Historical
History, present status and future of the
Recent evolution of HVEM in France, Jouf-
contribution of high-voltage electron mi-
frey 39 (1991) 21
croscopy to the study of radiation dam-
High-voltage electron microscopy in the
age and defects in solids, Kiritani 39 (1991) 135
Federal Republic of Germany: past,
Characterization of Czochralski Si crystals
present and future, Seeger and Phillipp 39 (1991) 32
by HVEM, Oshima and Hua 39 (1991) 160
The evolution of HVEM application in
Observations on quick fluctuation of atom
Antwerp, Van Landuyt 39 (1991) 287
images of Si crystal lattice under 800 kV
electron irradiation, Hashimoto, Makita,
Yokota, Ikuta, Hashimoto and Hether-
Instrumentation
ington 39 (1991) 171
Design concept of a new ultra-high-voltage
Radiation-induced solute segregation in Al
electron microscope at Osaka University,
and Ni binary alloys under HVEM irradi-
Ura 39(1991) 1
ation, Ezawa and Wakai 39 (1991) 187
Ultra-high-resolution HVEM (H-1500) newly
Ultra-high-resolution HVEM (H-1500) newly
constructed at NIRIM. I. Instrumenta-
constructed at NIRIM. II. Applications
tion, Matsui, Horiuchi, Bando, Kitami,
to materials, Horiuchi, Matsui, Kitami,
Yokoyama, Suehara, Matsui and Katsuta 39(1991) 8
Yokoyama, Suehara, Wu, Matsui and
Ultra-high-resolution HVEM (H-1500) newly
Katsuta 39 (1991) 231
constructed at NIRIM. II. Applications
The study of zeolites by HVHREM, Terasaki,
to materials, Horiuchi, Matsui, Kitami,
Ohsuna, Alfredsson, Bovin, Watanabe and
Yokoyama, Suehara, Wu, Matsui and
Tsuno 39 (1991) 238
Katsuta 39 (1991) 231
A new 1000 kV HREM for organic crystal
A new 1000 kV HREM for organic crystal
study, Isoda, Moriguchi, Kurata, Kobayas-
study, Isoda, Moriguchi, Kurata, Kobayas-
hi and Uyeda 39 (1991) 247
hi and Uyeda 39 (1991) 247
The evolution of HVEM application in
Antwerp, Van Landuyt 39 (1991) 287
Stereoscopic observation and determination Methods and techniques
of surface orientation of voids in stress- In situ deformation of proton-irradiated
thermal-migrated-aluminum lines of LSI metals, Suzuki, Fujimura, Sato, Na-
with UHVEM, Takaoka and Ura 39 (1991) 299 gakawa, Yamamoto and Shiraishi 39 (1991) 92
HVEM observations of stress-induced void- In situ investigations of plastic deformation
ing in Al lines for LSI, Okabayashi, and pseudo-elasticity of zirconia ceram-
Tanikawa, Mori and Fujita 39 (1991) 306 ics, Komatsu and Fujita 39 (1991) 105
aanses GOCUeAWED snneEWErepry, sveneenceren 200
Yew UCYeMpiicits
Design concept of a new ultra-high-voltage rotsu, Sasaki, Miyagawa, Nakamura and
electron microscope at Osaka University, Brito 39 (1991) 254
Ura 39(1991) 1 HVEM observations of stress-induced void-
Ultra-high-resolution HVEM (H-1500) newly ing in Al lines for LSI, Okabayashi,
constructed at NIRIM. I. Instrumenta- Tanikawa, Mori and Fujita 39 (1991) 306
tion, Matsui, Horiuchi, Bando, Kitami, Structural and valence electronic analysis of
Yokoyama, Suehara, Matsui and Katsata 39(1991) 8 electron-irradiation-induced foreign-at-
Convergent beam electron diffraction in the om implantation by a combination of
high-voltage electron microscope with UHVEM and AES, Yasuda, Sakata and
continuously variable reference voltage Mori 39 (1991) 321
for lenses and alignments, Kuroda, The study of self-organization processes in
Morita, Arai, Yokoi and Saka 39 (1991) 58 crystals by high-voltage electron mi-
Recent progress in in-situ deformation ex- croscopy, Seeger, Jin, Phillipp and Zaiser 39 (1991) 342
periments in HVEM, Saka and Teshima 39 (1991) 81 Formation of non-equilibrium solid phases
Ultra-high-resolution HVEM (H-1500) newly by high-energy electron irradiation, Mori
constructed at NIRIM. II. Applications and Fujita 39 (1991) 355
to materials, Horiuchi, Matsui, Kitami, A study of amorphization and microstruc-
Yokoyama, Suehara, Wu, Matsui and tural evolution of graphite under elec-
Katsuta 39 (19912)3 1 tron or ion irradiation, Nakai, Kinoshita
A new 1000 kV HREM for organic crystal and Matsunaga 39 (1991) 361
study, /soda, Moriguchi, Kurata, Koba-
yashi and Uyeda 39 (19912)4 7
Atom clusters — new applications of high- Surfaces, clusters, interfaces and particles
voltage electron microscopy “micro- Dynamic observation of dislocation move-
laboratory” to materials science, Fujita 39 (19913)6 9 ment across twin boundaries in the
lamellar structure of TiAl intermetallic
Radiation damage and contamination compound, Hanamura, Uemori, Tanino
In situ deformation of proton-irradiated and Morikawa 39 (1991) 86
metals, Suzuki, Fujimura, Sato, Na- In situ observations of solid—liquid inter-
gakawa, Yamamoto and Shiraishi 39 (1991) 92 faces, Saka, Sasaki, Ohashi, Ohtsuka,
History, present status and future of the Kamino and Tomita 39 (1991) 110
contribution of high-voltage electron mi- Grain boundary premelting in thin foils of
croscopy to the study of radiation dam- deformed copper bicrystals, Jnoko,
age and defects in solids, Kiritani 39 (1991) 135 Hama, Tagami and Yoshikawa 39 (1991) 118
HRTEM observation of electron-irradia- Aluminum/ceramic interface structure and
tion-induced defects penetrating through its related properties, Naka 39 (1991) 128
a thin foil of germanium, Takeda, Hirata, High-resolution electron microscope study of
Muto, Hua, Hiraga and Kiritani 39 (1991) 180 lamellar boundaries in Ti-rich TiAl
Radiation-induced solute segregation in Al polysynthetically twinned crystals, Jnui,
and Ni binary alloys under HVEM irradi- Nakamura, Oh and Yamaguchi 39 (1991) 268
ation, Ezawa and Wakai 39 (1991) 187 Stereoscopic observation and determination
In-situ observation of defect cluster forma- of surface orientation of voids in stress-
tion in metal and alloy under electron/ thermal-migrated-aluminum lines of LSI
ion dual-beam irradiation, Ohnuki, Hi- with UHVEM, Takaoka and Ura 39 (1991) 299
daka and Takahashi 39 (1991) 197 Surface wave excitation Auger electron spec-
Accumulation and annihilation processes of troscopy of Si(001) reconstructed sur-
cascades in metallic and nonmetallic faces, Nakayama, Nishino, Ueda, Takeno
crystals under irradiation with ions and Fujita 39 (1991) 329
and/or electrons, Kinoshita, Abe, Fuku- Atom clusters — new applications of high-
moto, Nakai and Shinohara 39 (1991) 205 voltage electron microscopy ‘“micro-
Defects occurring at or near surfaces in a- laboratory” to materials science, Fujita 39 (1991) 369
Al,O, during electron irradiation, Tomo- Anomalous surface structure of fine germa-
kiyo, Kuroiwa and Kinoshita 39 (1991) 213 nium particles, Mitome and Takayanagi 39 (1991) 382
In situ study of effects of ion irradiation on UHV microscopy of surfaces, Ai, Buckett,
solid-state crystallization of cobalt disili- Dunn, Savage, Zhang and Marks 39 (1991) 387
cide thin films, Allen and Smith 39 (1991) 222 Observations by HVEM of atomic clusters
Degradation of the high-7, superconductor embedded in MgO crystals, Tanaka, Ki-
YBa,Cu,0,7_, studied by high-resolu- moto and Mihama 39 (1991) 395