Table Of Content

Volume 376, | November 2000 www.elsevier.com/locate Contents Camphoric carbon soot: a new target for deposition of diamond-like carbon films by pulsed laser ablation S.M. Mominuzzaman, T. Soga, T. Jimbo and M. Umeno A method of studying carbon particle distribution in paint films M. Mozetié, A. Zalar, P. Panjan, M. Bele, S. Pejovnik and R. Grmek Titanium nitride thin films obtained by a modified physical vapor deposition process P. LeClair, G.P. Berera and J.S. Moodera Application of mathematical morphology in measurement of droplet size distribution in dropwise condensation N. Maiti, U.B. Desai and A.K. Ray Water absorption characteristics of fluorinated silicon oxide films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition using SiH,, SiF, and O, K.-M. Byun and W.-J. Lee High temperature materials for thin-film thermocouples on silicon wafers K.G. Kreider and G. Gillen Growth mechanisms of crystallites in the mixed-phase silicon films deposited by low-pressure chemical vapor deposition H. Wee, C. Lee and S.-C. Shin Low-temperature epitaxial growth of Si by electron cyclotron resonance chemical vapor deposition J. Platen, B. Selle, I. Sieber, S. Brehme, U. Zeimer and W. Fuhs Growth kinetics of sputtered amorphous carbon thin films: composition studies and phenomenological model S. Logothetidis, P. Patsalas, M. Gioti, A. Galdikas and L. Pranevicius Pd—Ag alloy films prepared by metallorganic chemical vapor deposition S.-Y. Lu and Y.-Z. Lin Evaluation of precursors for chemical vapor deposition of ruthenium K.C. Smith, Y.-M. Sun, N.R. Mettlach, R.L. Hance and J.M. White CuAu-I type ordering and orientation domains in tetragonal Zn,_,,Cu,In,S> films (0.78 <x< 1) crystallized on (001) gallium phosphide by pulsed laser deposition G. Wagner, D. Oppermann, K. Bente, J. Lenzner and M. Lorenz Reaction of Si(111) surface with acetone T. Takami, S. Ishidzuka, Y. Igari, H. Range and I. Kusunoki Structure and morphology of high quality indium-doped ZnO films obtained by spray pyrolysis M. Miki- Yoshida, F. Paraguay-Delgado, W. Estrada-Lépez and E. Andrade Deposition of MgO thin films by modified electrostatic spray pyrolysis method S.G. Kim, J.Y. Kim and H.J. Kim Effect of surface impurities on the Cu/Ta interface L. Chen, N. Magtoto, B. Ekstrom and J. Kelber A novel process and thermodynamic mechanisms of air gap formation for ULSI application K.-M. Chang, J.-Y. Yang, L.-W. Chen and M.H. Tseng Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering H.Y. Wong, C.W. Ong, R.W.M. Kwok, K.W. Wong, S.P. Wong and W.Y. Cheung Preparation of hard super-hydrophobic films with visible light transmission A. Nakajima, K. Abe, K. Hashimoto and T. Watanabe Manufacturing, structure and high temperature corrosion of palladium-modified aluminide coatings on nickel-base superalloy M38 D. He, H. Guan, X. Sun and X. Jiang Loe Wear resistance of carbon nitride thin films formed by ion beam assisted deposition T. Hayashi, A. Matsumuro, M. Muramatsu, M. Kohzaki and K. Yamaguchi Microstructures and properties of PVD aluminum bronze coatings W. Liang, X. Xiaolei, X. Jiujun and H. Zukun An effective diffusion barrier metallization process on copper W.W. So, S. Choe, R. Chuang and C.C. Lee __. Dependence of microstructure and nanomechanical properties of amorphous carbon nitride thin films on vacuum annealing M. Bai, K. Kato, N. Umeharab, Y. Miyake, J. Xu and H. Tokisue Vi Contents Fractal character of circumferences of polishing-induced pull outs of plasma sprayed Cr3C2—NiCr coatings J.F. Li and C.X. Ding Improvement of secondary electron emission property of MgO protective layer for an alternating current plasma display panel by addition of TiO R. Kim, Y. Kim and J.-W. Park Phase formation in aluminium implanted titanium and the correlated modification of mechanical and corrosive properties I. Tsyganov, E. Wieser, W. Matz, A. Miicklich, H. Reuther, M.T. Pham and E. Richter . Micromechanics study of thermomechanical characteristics of polycrystal shape-memory alloy films Y.M. Jin and G.J. Weng Double-layer anti-reflection coating using MgF> and CeO) films on a crystalline silicon substrate S.E. Lee, S.W. Choi and J. Yi Electronic properties of the space charge layer of in situ prepared copper phthalocyanine thin films exposed to oxygen J. Szuber and L. Grzadziel Polarized electroluminescence from a uniaxially oriented polysilane thin film Y. Ichino, N. Takada, N. Tanigaki, A. Kaito, M. Yoshida, S. Yokokawa and H. Sakurai ........ Qualitative evaluation of pyroelectric mechanisms in Langmuir—Blodgett films containing a cyclic polysiloxane substituted with aliphatic side chains using Fourier transform infrared (FTIR) spectroscopy W.H. Abd. Majid, T.H. Richardson, D. Lacey and A. Topacli PbBr-based layered perovskite film using the Langmuir—Blodgett technique M. Era and S. Oka Influence of composition on the electrical and optical properties of GenBi, Mai films H. El-Zahed and A. El-Korashy Microcrystalline silicon phase in silicon oxide thin films developed by photo-CVD technique T. Jana and S. Ray Studies on the formation of microcrystalline silicon with PECVD under low and high working pressure G. Lihui and L. Rongming ; Indium tin oxide films prepared by radio frequency magnetron sputtering method :at aa low processing temperature K. Zhang, F. Zhu, C.H.A. Huan and A.T.S. Wee Critical exponents of diamond films: possible influence of spatially correlated noise M. Cattani and M.C. Salvadori Energy-resolved photon flux dependence of the steady state photoconductivity ;inn hydrogenated amorphous silicon: implications for the constant photocurrent method J.A. Schmidt, R.R. Koropecki, R.D. Arce, RA. Rubinelli and R.H. Buitrago Author Index Subject Index For information on Thin Solid Films, please visit our website at: www.elsevier.nl/locate/tsf The publisher encourages the submission of articles in electronic form thus saving time and avoiding rekeying errors. A leaflet describing our requirments is available from the Publisher upon request.