Table Of Content

n o n i o t i G.A. Battiston, R. Gerbasi, A. Gregori, M. Porchia, S. Cattarin, G.A. Rizzi PoafETtm fhieCoioifgOlrftVnfrm, aeepspDo cgnm:hclwta d pooa ts emus hrpms aoa ts uirtei on SB.MIoJ Ms..uGPlSc .g.MapCIG .hmr.arJ,a of. aubf hlarea,e,m y , UlTftapiryblrlamOayotpslrh;d uda gi luesensecp- reeoa dsdr i etai on infiltration TopefoxSf olgtiincyrluiCl acanmr carr psigombyhb fnrmiiscoyogovpnttnhr awiaoa ecpctlnsme olei idridt-c n efaelsl o w PPSDMBRMoe...ro.lt FJodirA..ticr.S i,hi, . sg zuteasi,n phosp/h1o,n4,a5t,e8 -naphthalenediimides sNeolvfe-lfoza ifisl rsmcseo mnbiluemd Zuniga-Romero. 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Z1.1L4. 109 105 95 86 80 72 66 61 53 47 40 36 28 17 10 1 ic MunekHa.t a Hara, K. HaneSd.a , YamaurMa., HirosSe., epitaxyb eam molebcyu lar grown semiconducmtaogrn eticd ial uted GaFeAs: Lee W.-J. Choi, D.-K. Nam, H.-J. sputteringr eacbtiyv e deposiftieldm s PZTo f phenosmhoernotan effecttsh eir and electrPotd/eTisin hilloofc ks Formation Selim M.S. MandouEhl, Z.S. filmsg el sol pentoxide vanoafd ium, propertiesP hysical Zhu W. Ko, J.S. Liu, W. Preparation and properties of multilayer Pb(Zr, Ti) O3/PbTiO; thin films for pyroelectric application A. A. Dieguez, Romano-Rodriguez, Faglia, Sberveglieri, Nelli, Gabetta, Cereda, J.R. E. G. G. G. Morante... P. The aging effect on SnO> — Au thin film sensors: electrical and structural characterization Vanderlick T.K. Quinn, J.A. Girard, K.P. multilayers Lanogfm uir—Blsotadbgielittty mechaTnhiec al Yang Zhang, R.-J. K.-Z. Investigationon monolayers and Langmuir-Blodgett films of atypical amphiphilic terbium complexes X.Z. Liu, Y.R. Li, B.W. Tao, A. Luo, J. Geerk . : Dll AI RAL LIME TANT EE IID ite The crystal perfection improvement of Y; Baz Cu; O7_, thin films by afterglow plasma process FNNDKTAMPP.lhi..neo. e.a gKhu mpaiaIglv re.aPlwaiunnaelarmcnl ignodtlyilrro hpatidpeeti—ospowhrk aornisyoeCst eosustl etn,D. Mergel, D. Buschendorf, S. Eggert, R. Grammes, B. Samset , taaeped anche cab hpune nicledibediiesnashiblatamiae ohr, ivladrd i o yoe oisnespeDbTdpciorarf,ar,rveyiy ueefinln s ean O afll dld ppscrm>aye aoiats rx N. Wakiya, T. Yamada, K. Shinozaki, N. Mizutanic. ......i.......... ite reh re bee ere teh Ritch DTW LS tveayiedt v ClHgS itfutYboowaeaereilhhonuinif Sytt(oii fOlnt ereZnn0wfm h,ar r0e t o1rC.J. Liang, D. Zhao, Z.R. Hong, R.G. Li, W.L. Li, J.Q. Yu PE BIEL ESLER SeR T 8 he ) p iExciplex emissions in bilayer and doped thin films containing a non-fluorescent gadolinium complex taxiaA.C. Arias, L.S. Roman, T. Kugler, R. Toniolo, M.S. Mertivia, 1.A. Hiimmelgen.................. ishibardusathtaisceatadlahaicacnncoann l The use of tin oxide thin films as a transparent electrode in PPV based light-emitting diodes C.O. El Moctar, K. Kambas, S. Marsillac, A. Anagnostopoulos, J.C. Bernéde, K. Benchouck 0000000000. ooccocecececesceceees deposited sequentially Optical properties of CuAlX> (X = Se, Te) thin films obtained by annealing of copper, aluminum and chalcogen layers esPR ei I ins cisSsscsesircensessscusstomaaiantetestnayes A re NR no he dail siaiahaidh nenesinsenandeaibaaca tesprdetaieeespancsasiiextnaob eet Light emission from the double-barrier Al / Al,O; /Al / Al,O3 /Au_ tunnel junction a ee Ma, i I, hE NO I I pn cksn sctcndgddscesceanntssnatsacsoonepanscnsresnsncdicconseuesousvttnnerndbnaneccubassesnrsssiayeevoesersss impedancespectroscopy Investigation of the anodic oxide layer on 1050 and 2024T3 aluminium alloys by electron microscopy and electrochemical RE TEES DRT AD OREN RT SERED OL SP th RP ANCE eC eT EE Te FR Cee at Mechanical properties and fracture toughness of multilayer hard coatings using nanoindentation I a ca oa urls c adage desbn ppv a cabhnhodainaienn deen abba vend ettaiadoakdbdcondpeadinden evaporation Influence of residual stresses on the mechanical properties of TiC, Nj_, (x = 0, 0.15, 0.45) thin films deposited by arc I aL (sail aol py otcaenciuamaaadaeauidess apo aS Mh dated eda paaubits Growth mode of tin on a niobium substrate S.D. Wolter, JM. DeLucca, S.E. Mohney, R.S. Kern, C.P. Kuo......... RIN Rea AMO MN te eR Ee a CO a RE An investigation into the early stages of oxide growth on gallium nitride IDyaa sacs atya novlacliclorninnttebamuioasenconsstin Hydrophilicity of TiO, films prepared by liquid phase deposition I TL wc etn cna fo san nme ngndudonndacapeaedimcbeaty dessbxcabapek bsomnticnde Investigation of surface energy for organic light emitting polymers and indium tin oxide I i acaba hase ht can cael age ides socoe tsa odicioa notches cand oiennnens Kinny ivasb enna halt) qsiatiebsventatianenence siete The effects of hydrogen on the breakdown of passive films formed on Type 304 stainless steel Vi Contents 225 2 195 183 178 153 148 140 218 211 07 201 19] 167 161 132 e r u s t ERIE eee Sn 371 Voloufm e index Subject EP3VoiALf7unEo 1tdlR heuNoxm)r e 11id [Thin failure elevcitar omeairgolrnya tiolna yers coating antiT-riieNnf lectciroanoc fk s Effect 0-Erratum1 15] ccccccccccceccecscsocscoscsoccc ccccSslcsoeisKmc.ms icszaua censsanseHaeaeb aH.z aki, ThompGs.oE.n , SkePl. don, EchFe.v erria, electrolytteu ngstatseo idni um effichiieagnthc y InAosn oxides anoodfi c formaTthieo n nga Snijders,J .H.M. Marcdeelr, van C. GeerdiLn.cMk., DenissenC,. J.M. HildenVb.Dr.a nd, discharmgeer cury lao w-pwrietshs fuirlmes o xidthei onf Interaction EGI MEE SS OS eee ei ............ SzaPb.e lski PatrAy.k iejew, studyC arlo Mao nte surfaces:m odiofvieerd reactionCsa talytic cnsescocecesscesscoscenssccesesca cosssossesoPsisanmsceemcneve5eieDnase.eec esdeDseeneaslsa,va s M.D. Arat5,. Nix, W.D. HeiiBa. td, Rim, D.-K. films thinA l blanokne t hillocks theorfm al Microstruc Contents ARON sS ol aYm.m i Dame N lm T E i ey NEE MRE PE SbOeaEu? n anbeiacsar(200306)5 Fe itisbeccindes ............... BON EERCPI HCDW e ais y M 5 3 18 316 03 95 83 78 3 3 2 2 2 THOJAJZ3P|LsCrPeK ucANia.a. we. 1hsba tSt SDbe0a .neOce.k iog sedd, i,pMo p aidhstP s Vii