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Thin Solid Films 1998: Vol 333 Index PDF

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thin... pits” “ + EV Thin Solid Films 333 (1998) 295-296 Author Index of Volume 333 Alterkop, B., 150 Gould, R.D., 170 Ma, Y.-G., 224 Sanchez-Juarez, A., 196 cya, ™., Z5 Mackowski, J.M., 126 Scavarda do Carmo, L.C., Barreca, D., 35 Gupta, S.K., 176 Maguire, P.D., 114 157 Benqlilou-Moudden, H., 16 Gutmann, R.J., 219 Major, S., 9 Schdllhorn, B., 235 Berger, S., 264 Maleysson, C., 235 Scholz, R., 245 Blanc, J.P., 235 Hamilton, G., 77 Maruyama, T., 203 Schram, D.C., 29 Blondiaux, G., 16 Haupt, J., 278 Mathiasen, C., 50 Schuhmann, J., 95 Bottiger, J., 50 Higashi, M., 256 Mauricio, M.H.P., 157 Sharan, M.K., 287 Boxman, R.L., 150 Hon, M.-H., 108 McLaughlin, J.A., 114 Sharma, D., 176 Hormes, J., 41 Merkel, K.-H., 71 Sharon, M., 287 Cao, X., 41 Horowitz, G., 272 Meyer, S., 272 meen, J.<., 224 Caride, A.O., 157 Horsewell, A., 50 Mogensen, K.S., 50 Sheng, M., 71 Chang, I-S., 108 Hu, Y.Z., 219 Moon, W., 137 Shimazaki, Y. 5 Che, C.-M., 224 Mori, M., 60 Shin, J.-S., 142 Chen, X., 71 Inaki, Y., 5 Morley, S.M., 114 Shinyashiki, Y., 203 Cheung, T.-C., 224 Iriyama, K., | Murata, K., 256 Smith, G.B., 185 Chicault, R., 228 ito, 3., 5, 256 Musa, G., 95 Srinivasa, R.S., 9 Chow, T.P., 219 Ivanov, Z.G., 207 Mustata, I., 95 Stepantsov, E.A., 207 Claeson, T., 207 Muthe, K.P., 9 Straupe, C., 272 Coronell, D.G., 77 Jahan, F., 185 Stubhan, F., 71 Cremona, M., 157 Jain, A., 77 Nainaparampil, J.J., 88 mt £.., 22 Cyrille, M.C., 228 Jin, X., 13 Nakashima, K., 1 Niederwald, H.S., 191 Tae Ahn, B., 137 de Avillez, R.R., 157 Kaplan, R., 240 Nishi, Y., 60 Tae Baek, J., 137 de Graaf, A., 29 Kataby, G., 41 Nizawa, Y., 60 Takahashi, K., 256 Dekempeneer, E.H.A., 29 Kennedy, M., 191 Nunes, R.A., 157 Tamai, N., | Dhar, S., 20 Kiselev, N.A., 207 Tambo, T., 60 Dinescu, G., 29 Koltypin, Y., 41 Olsson, E., 207 Tatsuyama, C., 60 Dixit, M., 165 Komura, T., 256 Ortiz, A., 196 Tei, K., 103 Dwivedi, S.K., 165 Korenyi-Both, A., 88 Ozaki, Y., | Thomsen, N.B., 50 Kumar, A., 165 Tiburcio-Silver, A., 196 Egan, E.W., 77 Kumar, M., 287 Parkansky, N., 150 Tondello, E., 35 Ehrich, H., 95 Pauly, A., 235 Tsien, P.-H., 13 Elkashef, N., 9 Lamberton, R.W., 114 Pinard, L., 126 Tsuda, Y., 256 Eskildsen, S.S., 50 Lang, P., 272 Plon, J., 251 Lee, W.-J., 142 Popescu, A., 95 Ullrich, B., 134 Fehlberg, L.V., 157 Lenardi, C., 278 Felner, I., 41 Levasseur, A., 16 Rickards, J., 196 van de Sanden, M.C.M., Libardi, H., 82 Ristau, D., 191 29 Gadenne, M., 251 Lichinchi, M., 278 Rizzi, G.A., 35 van Ijzendoorn, L.J., 29 Gadenne, P., 251 Lam, 4... 24> Roddatis, V.V., 207 Vasiliev, A.L., 207 Garcia, I., 65 Lin, H., 71 Rosenbaum, R., 150 Vazquez, A.J., 65 Garnier, F., 272 Lo, T.-C., 13 Rothe, J., 41 Venkatraman, R., 77 Gedanken, A., 41 Longueville, J.L., 29 Roy, M.S., 176 Verma, A.L., | Germain, J.P., 235 Lopez, M.G., 170 Villegier, J.C., 228 Goldsmith, S., 150 Lotz, B., 272 Sabharwal, S.C., 9 Vinatier, P., 16 Gosele, U., 245 ca. 2 ao Sakata, J., 213 Vitali, R., 278 0040-6090/98/$ - see front matter © 1998 Elsevier Science S.A. All rights reserved. PII S0040-6090(98)01473-4 296 Author index Wang, X., 71 Woong Jang, T., 137 Yamamoto, M., 5 Zhang, M., 245 Wei, ¥4 20 Yang, G.-R., 219 Zhang, Z.-J., | Weitzman, B., 77 Yoneyama, M., | Zhao, Y.-P., 219 Zironi, E.P., 196 Weng, H., 245 Wilde, J., 71 Zabinski, J.S., 88 Wittmann, J.C., 272 Yamaguchi, T., 256 Zhang, J., 13 Thin Solid Films 333 (1998) 297-301 Subject Index of Volume 333 Alkali halides Carrier lifetime Grazing incidence X-ray diffraction analysis of alkali fluor- Frequency-resolved photoconductivity in a-SiGe:H, 240 ide thin films for optical devices, 157 Cathodes Aluminum Amorphous lithium cobalt and nickel oxides thin films: pre- Effect of temperature and substrate on the growth behaviors paration and characterization by RBS and PIGE, 16 of chemical vapor deposited Al films with dimethylethy- CeO, lamine alane source, 137 Microstructure of yttrium stabilized ZrO, crystals with Aluminium nitride CeO, and SrTiO; intermediate layers, 207 Optical properties of AIN thin films correlated with sputter- Chalcogenides ing conditions, 25] Non-catalytic displacement plating (NCDP) of photosensi- Amorphous hydrogenated carbon tive semiconducting thin films, 287 Structure changes in a-C:H films in inductive CH,/Ar Chemical mechanical polishing plasma deposition, 103 XPS and AFM study of chemical mechanical polishing of Amorphous materials silicon nitride, 219 Amorphous lithium cobalt and nickel oxides thin films: pre- Chemical vapor deposition paration and characterization by RBS and PIGE, 16 Characterization of SiGe base layer in Si/SiGe heterojunc- Amorphous hydrogenated carbon nitride films deposited via tion bipolar transistor layer structure, 13 an expanding thermal plasma at high growth rates, 29 A chemical vapour deposition route to MoO;—Bi1,O; thin The adsorption of monolayer coatings on iron nanoparti- films, 35 cles: Mossbauer spectroscopy and XANES results, 41 Oxy-acetylene flame chemical vapour deposition of dia- The effect of post-deposition transverse current injection on mond film. Part II: the influence of deposition para- amorphous indium oxide film conductivity, 150 meters on diamond composition, 65 Amorphous SiGe:H Moisture-resistant properties of SiN, films prepared by Frequency-resolved photoconductivity in a-SiGe:H, 240 PECVD, 71 Angular selective windows Effect of temperature and substrate on the growth behaviors Investigation of angular selective optical properties of silver/ of chemical vapor deposited Al films with dimethylethy- titanium oxide cermet thin films, 185 lamine alane source, 137 Anisotropy Growth characteristics and electrical resistivity of chemical Investigation of angular selective optical properties of silver, vapor-deposited tungsten film, 108 titanium oxide cermet thin films, 185 Iron-iron oxide composite thin films prepared by chemical Uniaxially oriented polyamide films in-plane prepared by vapor deposition from iron pentacarbonyl, 203 vacuum deposition polymerization methods assisted by Coatings oblique ion irradiation, 213 Moisture-resistant properties of SiN, films prepared by Berkovich nanoindentation proceess PECVD, 82 Simulation of Berkovich nanoindentation experiments on Formation and characterization of multiphase film prop- thin films using finite element method, 278 erties of (Ti-Cr)N formed by cathodic arc deposition, Bismuth molybdates 88 A chemical vapour deposition route to MoO;—Bi,O; thin Coercivity films, 35 Iron—iron oxide composite thin films prepared by chemical Bismuth oxide vapor deposition from iron pentacarbonyl, 203 A chemical vapour deposition route to MoO;—B1,O; thin Composite film films, 35 Iron-iron oxide composite thin films prepared by chemical Bistable luminescence vapor deposition from iron pentacarbonyl, 203 Influence of thermal and electronic modifications of the Computer simulation GaAs bandgap on bistable luminescent light emitted Monte Carlo simulations of sputter deposition and step from a thin CdS film, 134 coverage of thin films, 77 Cadmium sulphide Condensation Influence of thermal and electronic modifications of the New sol-gel oxygen sensor based on luminescence cyclome- GaAs bandgap on bistable luminescent light emitted tallated platinum complexes, 224 from a thin CdS film, 134 Conductivity 0040-6090/98/$ - see front matter © 1998 Elsevier Science S.A. All rights reserved. PII S0040-6090(98)01474-6 Subject index The effect of post-deposition transverse current injection on PECVD PLZT ((Pb,La)(Zr.Ti)O;) thin films on Pt/SiO;, amorphous indium oxide film conductivity, 150 Si substrates and on Pt/Ti/SiO>/Si substrates, 142 Effect of photocrystallization on the photoconductivity ofa - Finite element method Simulation of Berkovich nanoindentation experiments on Sego Fe, 165 AC electrical properties of vacuum deposited Au-SiO,—-Au thin films using finite element method, 278 sandwich structures after electroforming, 170 Fluorescence Influence of periphal electron-withdrawing substituents on Excitation energy transfer in Langmuir—Blodgett films of 5- the conductivity of zinc phthalocyanine in the presence (4-N-octadecylpyridyl)-10,15,20-tri-p-tolylporphyrin on of gases. Part 2: oxidizing gases, 228 gold-evaporated glass substrates studied by _ time- Copper resolved fluorescence spectroscopy, | Adhesive metal films obtained by thermionic vacuum arc Fluorides (TVA) deposition, 95 Ion beam-assisted deposition of MgF, and YbF; films, 191 Crystalization Ge islands Effect of photocrystallization on the photoconductivity ofa - Growth temperature effect on the heteroepitaxy of InSb Sego Tex, 165 films on a Si(001) substrate covered with Ge islands, 60 Deposition process Gold Sputter deposition of gallium nitride films using a GaAs Excitation energy transfer in Langmuir—Blodgett films of 5- target, 9 (4-N-octadecylpyridyl)-10,15,20-tri-p-tolylporphyrin on Optical losses of multilayer stacks synthesized with silicon gold-evaporated glass substrates studied by _ time- oxynitride by r.f. magnetron sputtering, 126 resolved fluorescence spectroscopy, | Uniaxially oriented polyamide films in-plane prepared by Guided-mode resonance absorption vacuum deposition polymerization methods assisted by The adsorption of monolayer coatings on iron nanoparti- oblique ion irradiation, 213 cles: Méssbauer spectroscopy and XANES results, 82 Significance of substrate temperature on the properties of Heat treatment flash evaporated Culng7;Gay.2;Se, thin films, 235 Stresses in Al/TiW/S1(100) contacts during thermal cycling, Diamond 264 Oxy-acetylene flame chemical vapour deposition of dia- Heteroepitaxy mond film. Part II: the influence of deposition para- Growth temperature effect on the heteroepitaxy of InSb meters on diamond composition, 65 films on a Si(001) substrate covered with Ge islands, 60 Diamond-like carbon Heterostructures Monitoring laser-induced microstructural changes of thin Characterization of SiGe base layer in Si/SiGe heterojunc- film hydrogenated amorphous carbon (a-C:H) using tion bipolar transistor layer structure, 13 Raman spectroscopy, 114 Hydrogen Dielectric properties Growth characteristics and electrical resistivity of chemical AC electrical properties of vacuum deposited Au—SiO,—Au vapor-deposited tungsten film, 108 sandwich structures after electroforming, 170 Hydrogenated amorphous carbon (a-C:H) Elastic properties Monitoring laser-induced microstructural changes of thin Stresses in Al/TiW/S1(100) contacts during thermal cycling, film hydrogenated amorphous carbon (a-C:H) using 264 Raman spectroscopy, 114 Electrical properties and measurements Indium oxide The effect of post-deposition transverse current injection on The effect of post-deposition transverse current injection on amorphous indium oxide film conductivity, 150 amorphous indium oxide film conductivity, 150 AC electrical properties of vacuum deposited Au-SiO,-Au InSb sandwich structures after electroforming, 170 Growth temperature effect on the heteroepitaxy of InSb Electrical properties films on a Si(001) substrate covered with Ge islands, 60 Electrical, optical and photovoltaic effect in pyronine G (Y) Interface based thin film sandwich devices, 176 A comparative study on the nucleation and growth of ECR- Electroless PECVD PLZT ((Pb,La)(Zr,Ti)O;) thin films on Pt/SiO,/ Non-catalytic displacement plating (NCDP) of photosensi- Si substrates and on Pt/Ti/SiO,/Si substrates, 142 tive semiconducting thin films, 287 Intermediate layers Ellipsometry Microstructure of yttrium stabilized ZrO, crystals with Optical properties of AIN thin films correlated with sputter- CeO, and SrTiO; intermediate layers, 207 ing conditions, 251 Ion bombardment Evaporation Atomic transport in Cu/Ge and Co/Ge systems during ion- Significance of substrate temperature on the properties of beam mixing, 20 flash evaporated Culnp 7;Gap 25Se> thin films, 235 Structure changes in a-C:H films in inductive CHy,/Ar Exciton plasma deposition, 103 Electrical, optical and photovoltaic effect in pyronine G (Y) Ion beam-assisted deposition of MgF, and YbF; films, 191 based thin film sandwich devices, 176 Iron Film Iron-iron oxide composite thin films prepared by chemical A comparative study on the nucleation and growth of ECR- vapor deposition from iron pentacarbonyl, 203 Subject index Iron oxide Nucleosides Iron-iron oxide composite thin films prepared by chemical Preparation of the nucleoside-containing nanolayered film vapor deposition from iron pentacarbonyl, 203 by the layer-by-layer deposition technique, 5 Iron pentacarbonyl Optical coatings Iron—iron oxide composite thin films prepared by chemical Optical losses of multilayer stacks synthesized with silicon vapor deposition from iron pentacarbonyl, 203 oxynitride by r.f. magnetron sputtering, 126 Langmuir—Blodgett films Investigation of angular selective optical properties of silver Excitation energy transfer in Langmuir—Blodgett films of 5- titanium oxide cermet thin films, 185 (4-N-octadecylpyridyl)-10,15,20-tri-p-tolylporphyrin on Ion beam-assisted deposition of MgF, and YbF; films, 191 gold-evaporated glass substrates studied by time- Optical device resolved fluorescence spectroscopy, | Grazing incidence X-ray diffraction analysis of alkali fluor- Laser irradiation ide thin films for optical devices, 157 Monitoring laser-induced microstructural changes of thin Optical properties film hydrogenated amorphous carbon (a-C:H) using Optical losses of multilayer stacks synthesized with silicon Raman spectroscopy, 114 oxynitride by r.f. magnetron sputtering, 126 Luminescence Influence of thermal and electronic modifications of the Influence of thermal and electronic modifications of the GaAs bandgap on bistable luminescent light emitted GaAs bandgap on bistable luminescent light emitted from a thin CdS film, 134 from a thin CdS film, 134 Investigation of angular selective optical properties ofs ilver, New sol-gel oxygen sensor based on luminescence cyclome- titanium oxide cermet thin films, 185 tallated platinum complexes, 224 Ion beam-assisted deposition of MgF, and YbF; films, 191 Mossbauer spectroscopy Electrical and optical properties of fluorine-doped ZnO thin The adsorption of monolayer coatings on iron nanoparti- films prepared by spray pyrolysis, 196 cles: Mossbauer spectroscopy and XANES results, 41 Optical properties of AIN thin films correlated with sputter- Merocyanine ing conditions, 251 Photocurrent increment in organic solar cell with mixed Optical spectroscopy solid of merocyanine and zinc porphyrin, 256 Optical properties of AIN thin films correlated with sputter- Metallization ing conditions, 251 Adhesive metal films obtained by thermionic vacuum arc Organic mixed film (TVA) deposition, 95 Photocurrent increment in organic solar cell with mixed Effect of temperature and substrate on the growth behaviors solid of merocyanine and zinc porphyrin, 256 of chemical vapor deposited Al films with dimethylethy- Organic solar cell lamine alane source, 137 Photocurrent increment in organic solar cell with mixed Stresses in Al/TiW/Si(100) contacts during thermal cycling, solid of merocyanine and zinc porphyrin, 256 264 Organic substances Molybdemum oxide Uniaxially oriented polyamide films in-plane prepared by A chemical vapour deposition route to MoO;—Bi,O; thin vacuum deposition polymerization methods assisted by films, 35 oblique ion irradiation, 213 Morphology Organometallic vapor deposition Sexithiophene thin films epitaxially oriented on polytetra- Effect of temperature and substrate on the growth behaviors flouroethylene substrates: structure and morphology, 272 of chemical vapor deposited Al films with dimethylethy- Multilayers lamine alane source, 137 Preparation of the nucleoside-containing nanolayered film Influence of periphal electron-withdrawing substituents on by the layer-by-layer deposition technique, 5 the conductivity of zinc phthalocyanine in the presence Optical losses of multilayer stacks synthesized with silicon of gases. Part 2: oxidizing gases, 228 oxynitride by r.f. magnetron sputtering, 126 (Pb,La)(Zr,Ti)O; (PLZT) Nanostructures A comparative study on the nucleation and growth of ECR- The adsorption of monolayer coatings on iron nanoparti- PECVD PLZT ((Pb,La)(Zr,Ti)O3;) thin films on Pt/SiO;/ cles: Mossbauer spectroscopy and XANES results, 41 Si substrates and on Pt/Ti/SiO>/Si substrates, 142 Nitrides Photoconductivity Sputter deposition of gallium nitride films using a GaAs Effect of photocrystallization on the photoconductivity of a- target, 9 Sego Fer, 165 Amorphous hydrogenated carbon nitride films deposited via Frequency-resolved photoconductivity in a-SiGe:H, 240 an expanding thermal plasma at high growth rates, 29 Photovoltaic effect Nuclear reaction Electrical, optical and photovoltaic effect in pyronine G (Y) Electrical and optical properties off luorine-doped ZnO thin based thin film sandwich devices, 176 films prepared by spray pyrolysis, 196 Photocurrent increment in organic solar cell with mixed Nucleation solid of merocyanine and zinc porphyrin, 256 A comparative study on the nucleation and growth of ECR- Physical vapor deposition PECVD PLZT ((Pb,La)(Zr.Ti)O3) thin films on Pt/SiO, Monte Carlo simulations of sputter deposition and step Si substrates and on Pt/Ti/Si0>,/Si substrates, 142 coverage of thin films, 77 300 Adhesive metal films obtained by thermionic vacuum arc Atomic transport in Cu/Ge and Co/Ge systems during ion- (TVA) deposition, 95 beam mixing, 20 Plasma diagnostics Defect distribution and evolution in He’ implanted Si stu- Structure changes in a-C:H films in inductive CHy,/Ar died by variable-energy positron beam, 245 plasma deposition, 103 Saturation magnetization Plasma enhanced chemical vapor deposition Iron—iron oxide composite thin films prepared by chemical Residual stress determination in PECVD TiN coatings by vapor deposition from iron pentacarbonyl, 203 X-ray diffraction: a parametric study, 50 Self-assembly films A comparative study on the nucleation and growth of ECR- Preparation of the nucleoside-containing nanolayered film PECVD PLZT ((Pb,La)(Zr,Ti)O;) thin films on Pt/SiO,/ by the layer-by-layer deposition technique, 5 Si substrates and on Pt/Ti/SiO,/Si substrates, 142 Self-assembly monolayers Plasma processing and deposition The growth of TiO, thin films on mixed self-assembly mono- Amorphous hydrogenated carbon nitride films deposited via layers from solution, 25 an expanding thermal plasma at high growth rates, 29 Semiconductors Moisture-resistant properties of SiN, films prepared by Sputter deposition of gallium nitride films using a GaAs PECVD, 71 target, 9 Adhesive metal films obtained by thermionic vacuum arc Characterization of SiGe base layer in Si/SiGe heterojunc- (TVA) deposition, 95 tion bipolar transistor layer structure, 13 Platinum Effect of photocrystallization on the photoconductivity ofa - New sol-gel oxygen sensor based on luminescence cyclome- Seg Fer, 165 tallated platinum complexes, 224 Influence of periphal electron-withdrawing substituents on Polymers the conductivity of zinc phthalocyanine in the presence Uniaxially oriented polyamide films in-plane prepared by of gases. Part 2: oxidizing gases, 228 vacuum deposition polymerization methods assisted by Non-catalytic displacement plating (NCDP) of photosensi- oblique ion irradiation, 213 tive semiconducting thin films, 287 Polytetraflouroethylene Sensors Sexithiophene thin films epitaxially oriented on polytetra- New sol-gel oxygen sensor based on luminescence cyclome- flouroethylene substrates: structure and morphology, tallated platinum complexes, 224 272 Influence of periphal electron-withdrawing substituents on Positron spectroscopy the conductivity of zinc phthalocyanine in the presence Defect distribution and evolution in He’ implanted Si stu- of gases. Part 2: oxidizing gases, 228 died by variable-energy positron beam, 245 Sexithiophene thin films Process parameters Sexithiophene thin films epitaxially oriented on polytetra- Residual stress determination in PECVD TIN coatings by flouroethylene substrates: structure and morphology, X-ray diffraction: a parametric study, 50 siz Pyronine Si(001) Electrical, optical and photovoltaic effect in pyronine G (Y) Growth temperature effect on the heteroepitaxy of InSb based thin film sandwich devices, 176 films on a Si(001) substrate covered with Ge islands, Radiaton damage 60 Atomic transport in Cu/Ge and Co/Ge systems during ion- Silicon nitride beam mixing, 20 Moisture-resistant properties of SiN, films prepared by Raman scattering PECVD, 71 Oxy-acetylene flame chemical vapour deposition of dia- XPS and AFM study of chemical mechanical polishing of mond film. Part II: the influence of deposition para- silicon nitride, 219 meters on diamond composition, 65 Silicon oxide Monitoring laser-induced microstructural changes of thin AC electrical properties of vacuum deposited Au-SiO,-Au film hydrogenated amorphous carbon (a-C:H) using sandwich structures after electroforming, 170 Raman spectroscopy, 114 Silver-silver oxide films Recombination The adsorption of monolayer coatings on iron nanoparti- Frequency-resolved photoconductivity in a-SiGe:H, 240 cles: Méssbauer spectroscopy and XANES results, 82 Reflection high-energy electron diffraction Solar cells Growth temperature effect on the heteroepitaxy of InSb Significance of substrate temperature on the properties of films on a Si(001) substrate covered with Ge islands, 60 flash evaporated Culng 75;Gap.2sSe> thin films, 235 Residual stress Solar control glazing Residual stress determination in PECVD TiN coatings by Investigation of angular selective optical properties of silver/ X-ray diffraction: a parametric study, 50 titanium oxide cermet thin films, 185 Grazing incidence X-ray diffraction analysis of alkali fluor- Sputtering ide thin films for optical devices, 157 Sputter deposition of gallium nitride films using a GaAs Rutherford backscattering spectroscopy target, 9 Amorphous lithium cobalt and nickel oxides thin films: pre- Amorphous lithium cobalt and nickel oxides thin films: pre- paration and characterization by RBS and PIGE, 16 paration and characterization by RBS and PIGE, 16 Subject index 301 Monte Carlo simulations of sputter deposition and step Characterization of SiGe base layer in Si/SiGe heterojunc- coverage of thin films, 77 tion bipolar transistor layer structure, 13 SrTiO; Defect distribution and evolution in He” implanted Si stu- Microstructure of yttrium stabilized ZrO, crystals with died by variable-energy positron beam, 245 CeO, and SrTiO; intermediate layers, 207 Traps Stress Electrical, optical and photovoltaic effect in pyronine G (Y) Structure changes in a-C:H films in inductive CHy,/Ar based thin film sandwich devices, 176 plasma deposition, 103 Tribology Stresses in Al/TiW/Si(100) contacts during thermal cycling, Amorphous hydrogenated carbon nitride films deposited 264 via an expanding thermal plasma at high growth rates, 29 Structure Formation and characterization of multiphase film proper- Sexithiophene thin films epitaxially oriented on polytetra- ties of (Ti-Cr)N formed by cathodic are deposition, 88 flouroethylene substrates: structure and morphology, Tungsten 272 Growth characteristics and electrical resistivity of chemical Surface plasmon measurements vapor-deposited tungsten film, 108 Preparation of the nucleoside-containing nanolayered film Tungsten hexaflouride by the layer-by-layer deposition technique, 5 Growth characteristics and electrical resistivity of chemical Surface plasmon resonance vapor-deposited tungsten film, 108 The adsorption of monolayer coatings on iron nanoparti- Vacancies cles: Mossbauer spectroscopy and XANES results, 82 Defect distribution and evolution in He’ implanted Si stu- Surface roughness died by variable-energy positron beam, 245 XPS and AFM study of chemical mechanical polishing of XANES spectroscopy silicon nitride, 219 The adsorption of monolayer coatings on iron nano-parti- Surface structure cles: Méssbauer spectroscopy and XANES results, 41 Excitation energy transfer in Langmuir—Blodgett films of 5- X-ray absorption (4-N-octadecylpyridyl)-10,15,20-tri-p-tolylporphyrin on Oxy-acetylene flame chemical vapour deposition of dia- gold-evaporated glass substrates studied by time- mond film. Part II: the influence of deposition para- resolved fluorescence spectroscopy, | meters on diamond composition, 65 Texture X-ray diffraction Residual stress determination in PECVD TiN coatings by Characterization of SiGe base layer in Si/SiGe heterojunc- X-ray diffraction: a parametric study, 50 tion bipolar transistor layer structure, 13 Thin films Residual stress determination in PECVD TIN coatings by A chemical vapour deposition route to MoO;—B1,O; thin X-ray diffraction: a parametric study, 50 films, 35 Growth temperature effect on the heteroepitaxy of InSb Non-catalytic displacement plating (NCDP) of photosensi- films on a Si(00l) substrate covered with Ge islands, tive semiconducting thin films, 287 60 TiN/HSS Grazing incidence X-ray diffraction analysis of alkali fluor- Simulation of Berkovich nanoindentation experiments on ide thin films for optical devices, 157 thin films using finite element method, 278 X-ray photoelectron spectroscopy Titanium Electrical and optical properties off luorine-doped ZnO thin Monte Carlo simulations of sputter deposition and step films prepared by spray pyrolysis, 196 coverage of thin films, 77 XPS and AFM study of chemical mechanical polishing of Titanium dioxide silicon nitride, 219 The growth of TiO; thin films on mixed self-assembly mono- Yttrium stabilized ZrO, crystals layers from solution, 25 Microstructure of yttrium stabilized ZrO, crystals with Titanium nitride CeO, and SrTiO; intermediate layers, 207 Formation and characterization of multiphase film proper- Zinc oxide ties of (Ti-Cr)N formed by cathodic arc deposition, 88 Electrical and optical properties of fluorine-doped ZnO thin Titanium nitride coatings films prepared by spray pyrolysis, 196 Residual stress determination in PECVD TiN coatings by Zinc porphyrin X-ray diffraction: a parametric study, 50 Photocurrent increment in organic solar cell with mixed Transmission electron microscopy solid of merocyanine and zinc porphyrin, 256

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