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Thin Solid Films 1996: Vol 277 Index PDF

3 Pages·1996·0.64 MB·English
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Preview Thin Solid Films 1996: Vol 277 Index

Thin Solid Films 277 (1996) 197 Author Index of Volume 277 Elsevier Science S.A ELSEVIER Thin Solid Films 277 (1996) 198-199 Subject Index of Volume 277 Acetylene Electrical propeanrd mteaisureemsent s devifroam Mtattihiesosenn’s srule in continmeutaol ufislms , 192 of plasma processes in the production of fluorinated amorphous Electrochemistry hydrcaorbong fielms nfroam gltow ediscdharg es, 115 preparation and properties of spin-coated Nb,O, films by the sol-gel Adhesion process for electrochromic applications, 162 treatment of MoS, films by high-energy heavy ion beams, |28 Electron diffraction Aluminium transmission electron microscopy characteriosfa itoni obena m investigation of grain boundary chemistry in Al-Li 2195 welds using syntheFesSi,i lsayeersd, 90 Auger electron spectroscopy, 121 Electron scattering Amorphous materials devifroam Mtattihiesosenn’s srule in continmeutaol ufislm s, 192 Ar/H, sputtering deposition of 350 ym thick Si:H/SiO, _.:H Ellipsometry multilayers having flat interfaces for optical applications, | 32 characterizatioon f quasi-rugate filters using ellipsometric Anisotropy measurements,8 3 preparation of uniaxially oriented polyamide films by vacuum Epitaxy deposition polymerization, 180 transmission electron microscopy characteriosfa itoni obena m Auger electron spectroscopy syntheFesSi,i lsayeersd, 90 investigation of grain boundary chemistry in Al-Li 2195 welds using Auger electron spectroscopy, 121 Grain boundary invesoft griaing boaundtaryi cohemnist ry in Al-Li 2195 welds using Benzene Auger electron spectroscopy, 121 dynamic actinometric optical emission spectroscopy for the elucidation of plasma processes in the production of fluorinated amorphous Hardness hydrcaorbong fielms nfroam gltow ediscdharg es, 115 treatment of MoS, films by high-energy heavy ion beams, 128 Boron nitride High energy electron diffraction deposition of BN coatings by spraying a powder accelerated electro- crystallinity for epitaxial thin films of Bi-based oxide superconductor dynamically in a coaxial pulse plasma generator, 79 preapt laow rtempeeradtur e, 175 Cadmium selenide Insulators ion bombardment effect on electronic states in CdS fine particles, 169 time-dependent dielectric breakdown measurements on RPECVD and thermal oxides, 101 preparation of uniaxially oriented polyamide films by vacuum Interfaces deposition polymerization, 180 Ar/H, sputtering deposition of 350 ym thick Si:H/SiO,_.:H Coatings multilayers having flat interfaces for optical applications, 132 treatment of MoS, films by high-energy heavy ion beams, |28 stability of interfaces in Mo/Cu multilayered metallization, 138 optimum thickness determination to maximise the spectral selectivity lon bombardment of black pigmented coatings for solar collectors, 185 treatmoef nMotS, filmsby high-energy heavy ion beams, 128 Conductivity ion bombardment effect on electronic states in CdS fine particles, 169 Studies on metal contact to polyaniline films, 5 devifroam Mtattihiesosenn’s srule in continmeutaol ufislm s, 192 Langmuir—Blodgeftiltm s Copper ion bombardment effect on electronic states in CdS fine particles, 169 studies on metal contact to polyaniline films,5 Laser ablation stability of interfianc Meo/sCu multilayered metallization, 138 preparation of transition metal chalcogenide thin films by pulsed laser ablation,9 8 Deposition process Light scattering dielectric constaofn Tta,sO, thin films deposited by r-f. sputtering, | optimum thickness determination to maximise the spectral selectivity preparation of uniaxially oriented polyamide films by vacuum of black pigmented coatings for solar collectors, 185 deposition polymerization, 180 Luminescence Depth profiling ion bombardment effect on electronic states in CdS fine particles, 169 characterization of quasi-rugate filters using ellipsometric measurements, 83 Metal—oxide semiconductor structure Dielectrics time-dependent dielectric breakdown measurements on RPECVD and dielectric constants ofT a,O, thin films deposited by r.f. sputtering, | thermal oxides, 101 Elsevier Science S.A. Subject Index of Volume 27/7 Th in Solid Films 277 (1996) 198-199 Metals Semiconductors investigation of grain boundary chemistry in Al-Li 2195 welds using studies on metal contact to polyaniline films, 5 on some important care to take when making ical properoftT iiO,e fsil ms measuon sremiecondmuctoer tnhint filmss, 155 contAua anid Ang meitaln pargticl es, 147 Molybdenum transmission electron microscopy characteriosfa itoni obena m stability of interfaces in Mo/Cu multilayered metallization, 138 syntheFesSi,i lsayeersd, 90 Multilayers stability of interfaces in Mo/Cu multilayered metallization, 138 design and fabrication of a double bandstop rugate filter grown by plasmac-hemeicanl vhapoar dnepocsiteiond, 1 44 Silicon oxide Niobium time-dependent dielectric breakdown measurements on RPECVD and preparation of transition metal chalcogenide thin films by pulsed laser thermal oxides, 101 ablation9,8 design and fabrication of a double bandstop rugate filter grown by plasmac-hemeicanl vhapoar dnepocsiteiond, 1 44 preparation and properties of spin-coated Nb,O, films by the sol-gel Solar cells process for electrochromic applications, 162 sol-gel preparation and photoelectrochemical properties of TiO, films containing Au and Ag metal particles, 147 Optical coatings Sputtenng charaocf qtuasie-rugrate ifilztersa usting ielloipsonmet ric dielectric constants of Ta,O, thin films deposited by r.f. sputtering, | measurements,8 3 on some important care to take when making spectrophotometric Ar/H, sputtering deposition of 350 ym thick Si:H/SiO_,, : H measuon sremiecondmuctoer tnhint filmss, 155 multilayers having flat interfaces for optical applications, | 32 Stress Ar/H, sputtering deposition of 350 wm thick Si:H/SiO,_.:H design and fabrication of a double bandstop rugate filter grown by plasmac-hemeicanl hvapaor ndepocsiteiond, 1 44 multilayers having flat interfaces for optical applications, 132 Opucal properties Sulphur on some important care to take when making spectrophotometric preparation of transition metal chalcogenide thin films by pulsed laser measuon sremiecondmuctoer tnhint filmss, !55 ablation9, 8 preparation and properties of spin-coated Nb,O, films by the sol-gel Sulphur hexafluoride process for electrochromic applications, 162 optimum thickness determination to maximise the spectral selectivity of plasma processes in the production of fluorinated amorphous of black pigmented coatings for solar collectors, 185 hydrogenated carbon films from glow discharges, 115 Superconductivity crystallinity for epitaxial thin films of Bi-based oxide superconductor prepared at low temperature1,7 5 deposition of BN coatings by spraying a powder accelerated electro- Surface defects dynamically in a coaxial pulse plasma generator, 79 on some important care to take when making spectrophotometric time-dependent dielectric breakdown measurements on RPECVD and measuon sremiecondmuctoer tnhint filmss, 155 thermal oxides, 101 Surface plasmons dynamic actinometric optical emission spectroscopy for the elucidation sol-gel preparation and photoelectrochemical properties of TiO, films of plasma processes in the production of fluorinated amorphous contAu aand iAg mnetali parnticlges, 147 hydrcaorbogn fielms nfroam gltow ediscdharg es, 115 design and fabrication of a double bandstop rugate filter grown by Tantalum plasma-cheemincalh vaaponr cdepeosidtio n, 144 dielectric constants of Ta,O, thin films deposited by r.f. sputtering, | Polymers Titanium oxide studies on metal contact to polyaniline films, 5 sol-gel preparation and photoelectrproopecrthiese mofi TicO,a flil ms preparation of uniaxially oriented polyamide films by vacuum contAua andi Agn meital npargticl es, 147 deposition polymerization, 180 Transmeleictsrons miicroosncop y transmission electron microscopy characterisation of ion beam syntheFesSi,i lsayeersd, 90 Reflection spectroscopy optimum thickness determination to maximise the spectral selectivity of black pigmented coatings for solar collectors, 185 X-ray diffraction crystallinity for epitaxial thin films of Bi-based oxide superconductor deviations from Matthiessen’s rule in continuous metal films, 192 prepared at low temperature1,7 5 Rutherford backscattering spectroscopy X-ray photoelectron spectroscopy crystallinity for epitaxial thin films of Bi-based oxide superconductor preparation and properties of spin-coated Nb,O, films by the sol-gel preapt laow rtempeeradtur e, 175 process for electrochromic applications, 162

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