Table Of Content

Thin Solid Films 266 (1995) 311-312 Author Index of Volume 266 Adams, D.P., 52 Edelman, F., 212 Koizumi, M., 182 Pedroviejo, J.J., 14 Agnihotri, O.P., 219 Englisch, U., 234 Komem, Y., 212 Perov, P.I., 278 Ameziane, E.L., 224 Kutakowska-Pawlak, B., 8 Pietsch, U., 234 Ando, Y., 292 Fan, X.W., 307 Pocock, P., 96 Angelova, A., 99 Farkas, J., 238 Lahmar, A., 58 Polyakov, V.I., 278 Ankner, J.F., 69 Feigin, L.A., 69 Laurent, J.-M., 20 Popovici, G., 278 Azizan, M., 224 Feng, Z.C., 1 Le Bellac, D., 94 Prelas, M.A., 278 Fessenden, R.W., 176 Lee, J.-Y., 129 Friedrich, L.J., 83 Lee, K.-Y., 129 Baarslag, P.C., 145, 152 Radhakrishnan, K., 302 Fukushima, H., 289 Lemperiere, G., 267 Baik, S., 205 Rahman, L., 96 Leon, H., 38 Balasubramanian, C., 62 Ramarotafika, H., 267 Gall, N.R., 229 Li, W.S., 307 Rao, D.R., 215 Banerjee, H.D., 215 Garcia-Moliner, F., 38 Li, Y.M., 307 Barberka, T.A., 234 Gengembre, L., 119 Lin, C., 173 Rathi, V.K., 219 Bardon, J.P., 58 Reiche, J., 102 Gheyas, S.I., 168 Loncierz, B., 274 Barrallier, L., 245 Gierlotka, D., 113 Lu, Y.M., 307 Rek, Z.U., 52 Batty, S.V., 96 Richardson, T., 96 Girija Vallabhan, C.P., 62 Baud, G., 198 Goudmand, P., 119 Maekawa, A., 263 Richmond, T., 133 Ben Taleb, A., 119 Ringsdorf, H., 289 Granqvist, C.G., 94 Majkrzak, C.F., 69 Berzina, T.S., 69 Grimblot, J., 119 Mangalaraj, D., 62 Rossukanyi, N.M., 278 Besse, J.P., 198 Roux, L., 245 Gupta, M., 219 Matsubara, T., 106 Bilello, J.C., 52 Rukovishnikov, A.I., 278 Matsushima, S., 106 Blonder, R., 254 Hafidi, K., 224 Matyja, P., 113 Rump, E., 289 Bonnet, J.-P., 20 Henda, R., 14 MetikoS-Hukovié, M., 31 Rut’kov, E.V., 229 Brett, M., 83 Heydenreich, J., 212 Miao, Y.B., 302 Brunel, M., 224 Higuchi, K., 89 Michalski, A., 110 Scheid, E., 14 Budniok, A., 113 Hiroike, T., 292 Miyashita, T., 292 Schelz, S., 133 Hofmann, D., 102 Miyazaki, T., 292 Schihler, N., 133 Hohne, U., 234 Morgan, H., 289 Scudeller, Y., 58 Carpio, R., 238 Hu, R., 1 Murri, R., 274 Serikawa, T., 263 Chao, S., 282 Huang, D.-R., 282 Mutel, B., 119 Shen, D.Z., 307 Chari, K.S., 219 Shi, X., 173 Chaudhuri, J., 189 Ichikawa, T., 263 Nakasone, M., 89 Chen, Y., 173 Shirakata, S., 106 Ijdiyaou, Y., 224 Narayandass, Sa.K., 62 Chernigov, L., 285 Slominsky, Yu., 285 Chi, Y.B., 307 Ionov, R., 99 Neerinck, D.G., 157 Smith, A., 20 Islam, R., 215 Nguyen Tan, T.A., 224 Cho, N.-H., 140 Smith, D.S., 20 Isomura, S., 106 Niedbala, J., 113 Choi, D.-J., 192 Smy, T., 83 Iyer, S.S., 212 Nihei, M., 182 Choi, J.-B., 129 Sobhanadri, J., 176 Niklasson, G.A., 94 Chopra, D.R., 298 Sokolowska, A., 110 Jacquet, M., 198 Nishio, M., 168 Chourasia, A.R., 298 Subramanian, V., 176 Jairath, R., 238 Nishiyama, N., 263 Clemente, R.R., 20 Sung, T., 278 Janietz, D., 102 Nowak, M., 258, 274 Cueff, R., 198 Sur6wka, J., 113 Jayakumar, S., 62 Swaminathan, S., 302 Oelhafen, P., 133 Daams, J.L.C., 145, 152 Kajioka, H., 89 Ogata, T., 168 Taylor, D.M., 289 Danes, F., 58 Kessler, F.R., 78 Ogawa, H., 168 Dehan, E., 14 Khasawinah, S., 278 Okada, G., 106 Temple-Boyer, P., 14 Thangaraj, R., 219 De Keijser, M., 157 Khomich, A.V., 278 Omanovié, S., 31 De Leeuw, D.M., 157 Kim, D.-J., 192 Onuki, J., 182 Thokala, R., 189 Dessaux, O., 119 Kim, H.-G., 140 Ortega, L., 224 Tin, C.C., 1 Dettmer, K., 78 Kim, H.-Y., 129 Tkachev, V., 285 De Veirman, A.E.M., 157 Kim, S., 205 Parfitt, L.J., 52 Tolmachev, A., 285 Dew, S.K., 83 Kim, Y.-W., 192 Park, J.-H., 129 Tontegode, A.Ya., 229 Dormans, G.J.M., 157 Kobayashi, K., 106 Patrat, G., 224 Torregrosa, F., 245 Elsevier Science S.A. 312 Author Index of Volume 266 Troitsky, V.I., 69 Van Veldhoven, P.J., 157 Wiesler, D.G., 69 Xue, Q., 48 Tsunooka, M., 263 Velasco, V.R., 38 Williams, J., 1 Yalisove, S.M., 52 Vink, T.J., 145, 152 Willner, I., 254 Yang, B.J., 307 Vehara, K., 263 Wode, S.-A., 78 Yoon, S.F., 302 Wu, K.-L., 282 Walrave, W., 145, 152 Van den Wang, B.-Y., 282 Zhang, X., 48 Meerakker, J.E.A.M., 145, Wei, J., 48 Xin, H., 173 Zou, S., 173 152 Werner, P., 212 Xu, H., 173 Zyrnicki, W., 8 a Me S3E4 VPSI ER EL Thin Solid Films 266 (1995) 313-317 Subject Index of Volume 266 Absorbance Cadmium telluride minority carrier lifetime in thin films of Zn3P, using micro- structural and optical properties of CdSe,Te,_, thin films wave and optical transient measurements, 176 grown by electron beam evaporation, 215 Adhesion Carbon X-ray photoelectron spectroscopy analysis of thermal and influence of surface carbon on the formation of silicon- plasma-treated steel substrates and their interface formed refractory metal interfaces, 229 with an aluminium layer, 58 Carrier lifetime Adsorption minority carrier lifetime in thin films of Zn;P, using micro- the tribological properties of ceramic coatings modified by wave and optical transient measurements, 176 molybdenum films under oil-lubricated conditions, 48 determining carrier lifetime using frequency dependence in Aluminium contactless photoelectromagnetic investigations of semi- X-ray photoelectron spectroscopy analysis of thermal and conductors, 274 plasma-treated steel substrates and their interface formed Chemical vapour deposition with an aluminium layer, 58 Raman and Rutherford backscattering analyses of cubic SiC thin film microstructure modelling through line-segment thin films grown on Si by vertical chemical vapor deposi- simulation, 83 tion, 1 high-reliability interconnection formation by a two-step preparation of c-axis oriented ZnO films by low-pressure switching bias sputtering process, 182 organometallic chemical vapor deposition, 106 Aluminium nitride the structure of heteroepitaxial lead titanate layers grown by calculated elastic constants of wide band gap semiconductor organometallic chemical vapour deposition, 157 thin films with a hexagonal crystal structure for stress effect of reactant depletion on the microstructure and pre- problems, 189 ferred orientation of polycrystalline SiC films by chemical Aluminium oxide vapor deposition, 192 calculated elastic constants of wide band gap semiconductor photo-processing of silicon nitride, 219 thin films with a hexagonal crystal structure for stress Coatings problems, 189 study of thin alumina coatings sputtered on polyethylene study of thin alumina coatings sputtered on polyethylene terephthalate films, 198 terephthalate films, 198 Conduction Amorphous materials control of electron transfer direction in an organic two-layer transformation of amorphous Sip,Gep, and Si films by laser diode based on a lightly-doped poly(3-methylthiophene)/9- annealing, 78 fluorenone derivatives junction, 263 Ni-P-NiO electrolytic layers as anode materials, 113 Copper decomposition and modulated structure formation during initial study on copper CMP slurry chemistries, 238 amorphous Si, _,Ge, crystallization, 212 Crystallization Annealing on the homogeneity of sputter-deposited ITO films. Part I. transformation of amorphous Sip ,Ge,g, and Si films by laser Stress and microstructure, 145 annealing, 78 decomposition and modulated structure formation during on the homogeneity of sputter-deposited ITO films. Part I. amorphous Si,_,Ge, crystallization, 212 Stress and microstructure, 145 J-aggregates of the thiatricarbocyanine dyes incorporated into Anodic oxidation LB films, 285 Ni—P-NiO electrolytic layers as anode materials, 113 Depletion Boron effect of reactant depletion on the microstructure and pre- photovoltaic effects in metal/semiconductor barrier structures ferred orientation of polycrystalline SiC films by chemical with boron-doped polycrystalline diamond films, 278 vapor deposition, 192 Boron nitride Deposition photovoltaic cell with an a-cBN layer, 110 comment on “Molecular organization of amphiphilic disc- growth of cubic boron nitride thin films by a field-ionization shaped penta-alkynes in LB mono- and multilayers”, D. source-assisted pulsed laser deposition, 173 Janietz, D. Hofmann and J. Reiche, Thin Solid Films, 244 (1994) 794, 99 Cadmium selenide reply to comment on “Molecular organization of amphiphilic structural and optical properties of CdSe,Te,_, thin films disc-shaped penta-alkynes in LB mono- and multilayers”, grown by electron beam evaporation, 215 102 Elsevier Science S.A. 314 Subject Index of Volume 266 photovoltaic cell with an a-cBN layer, 110 Germanium low-temperature deposition of II-VI compound semiconductors decomposition and modulated structure formation during by synchrotron radiation using metalorganic sources, 168 amorphous Si,_,Ge, crystallization, 212 high-reliability interconnection formation by a two-step Glow discharge optical spectroscopy switching bias sputtering process, 182 characterization of a d.c. titanium tetraisopropoxide/H,/N, deposition and characterization of PbTiO; thin films grown by plasma using emission spectroscopy, 8 radio frequency sputtering on MgO(100), 205 Diamond Heteroepitaxy photovoltaic effects in metal/semiconductor barrier structures the structure of heteroepitaxial lead titanate layers grown by with boron-doped polycrystalline diamond films, 278 organometallic chemical vapour deposition, 157 photoluminescence of ZnSe/Zn,_,Cd,Se strained superlattices Heterostructures under hydrostatic pressure, 307 a photoluminescence and X-ray diffraction analysis of InAlAs/ Dielectric properties InP heterostructures grown by molecular beam epitaxy, 302 structure and electrical properties of Pb(Zr,Ti)O; thin films Hydrogen deposited by reactive sputtering using multi-targets, 140 a study on the structural characterization of a-SiC:H films by Diffusion the gas evolution method, 129 neutron and X-ray reflectivity study of Ba salts of alternating bilayers of deuterated and hydrogenated stearic acid, 69 Doping Impedance spectroscopy photovoltaic effects in metal/semiconductor barrier structures thin oxide films on indium: impedance spectroscopy investiga- with boron-doped polycrystalline diamond films, 278 tion of reductive decomposition, 31 Indium thin oxide films on indium: impedance spectroscopy investiga- Elastic properties tion of reductive decomposition, 31 a photoluminescence and X-ray diffraction analysis of InAlAs/ calculated elastic constants of wide band gap semiconductor InP heterostructures grown by molecular beam epitaxy, 302 thin films with a hexagonal crystal structure for stress problems, 189 Indium oxide on the homogeneity of sputter-deposited ITO films. Part I. Electrical properties and measurements relation between solution chemistry and morphology of SnO,- Stress and microstructure, 145 Indium tin oxide based thin films deposited by a pyrosol process, 20 on the homogeneity of sputter-deposited ITO films. Part II. structure and electrical properties of Pb(Zr,Ti)O; thin films Etching behaviour, 152 deposited by reactive sputtering using multi-targets, 140 patterning of surfaces by photoisomerizable antibody-antigen photovoltaic effects in metal/semiconductor barrier structures monolayers, 254 with boron-doped polycrystalline diamond films, 278 Infrared spectroscopy Electrochemistry angular selectivity of the infrared transmittance through thin oxide films on indium: impedance spectroscopy investiga- obliquely sputter-deposited Ti-oxide-based films, 94 tion of reductive decomposition, 31 fabrication of ferrous stearate multilayer films by the Ni-P-NiO electrolytic layers as anode materials, 113 Langmuir—Blodgett method, 292 Electromigration Interfaces high-reliability interconnection formation by a two-step thin oxide films on indium: impedance spectroscopy investiga- switching bias sputtering process, 182 Electron transfer tion of reductive decomposition, 31 electron-phonon interaction and low-field drift mobility in a control of electron transfer direction in an organic two-layer polar semiconductor quantum well, 38 diode based on a lightly-doped poly(3-methylthiophene)/9- influence of surface carbon on the formation of silicon— fluorenone derivatives junction, 263 Epitaxy refractory metal interfaces, 229 investigation of the chain-chain interface in a lead-stearate deposition and characterization of PbTiO; thin films grown by multilayer using neutron reflectivity, 234 radio frequency sputtering on MgO(100), 205 Etching X-ray photoelectron study of TiN/SiO, and TiN/Si interfaces, 298 on the homogeneity of sputter-deposited ITO films. Part II. Ion implantation Etching behaviour, 152 phase analysis, microhardness and tribological behaviour of Ti-6AI-V after ion implantation of nitrogen in connection with its application for hip-joint prosthesis, 245 Ferroelectrics Ion plating the structure of heteroepitaxial lead titanate layers grown by waveforms of arc-like Ti vapor discharge current and voltage, organometallic chemical vapour deposition, 157 89 Field ionization growth of cubic boron nitride thin films by a field-ionization source-assisted pulsed laser deposition, 173 Langmuir-Blodgett films Fourier transform infrared spectroscopy neutron and X-ray reflectivity study of Ba salts of alternating growth of cubic boron nitride thin films by a field-ionization bilayers of deuterated and hydrogenated stearic acid, 69 source-assisted pulsed laser deposition, 173 a novel technique for the preparation of Langmuir—Blodgett films, 96 comment on “Molecular organization of amphiphilic disc- Gas chromatography shaped penta-alkynes in LB mono- and multilayers”, D. a study on the structural characterization of a-SiC:H films by Janietz, D. Hofmann and J. Reiche, Thin Solid Films, 244 the gas evolution method, 129 (1994) 794, 99 Subject Index of Volume 266 315 reply to comment on “Molecular organization of amphiphilic the specific adsorption of streptavidin to a tetrabiotinylated disc-shaped penta-alkynes in LB mono- and multilayers”, porphyrin monolayer at the air—water interface, 289 102 Neutron scattering investigation of the chain—chain interface in a lead-stearate neutron and X-ray reflectivity study of Ba salts of alternating multilayer using neutron reflectivity, 234 bilayers of deuterated and hydrogenated stearic acid, 69 J-aggregates of the thiatricarbocyanine dyes incorporated into investigation of the chain-chain interface in a lead-stearate LB films, 285 multilayer using neutron reflectivity, 234 the specific adsorption of streptavidin to a tetrabiotinylated Nickel oxide porphyrin monolayer at the air-water interface, 289 Ni-P-NiO electrolytic layers as anode materials, 113 Laser ablation growth of cubic boron nitride thin films by a field-ionization Optical coating relation between solution chemistry and morphology of SnO,- source-assisted pulsed laser deposition, 173 Laser irradiation based thin films deposited by a pyrosol process, 20 Optical properties optical recording characteristics of Sb,Se, thin films using a optical and structural properties of SiO, and SiN, materials, CW-Ar?* laser, 62 14 Luminescence optical recording characteristics of Sb2Se; thin films using a photoluminescence of ZnSe/Zn,;_,Cd,Se strained superlattices CW-Ar* laser, 62 under hydrostatic pressure, 307 structural and optical properties of CdSe,Te,_, thin films grown by electron beam evaporation, 215 Magnetic properties and measurements linear distribution of intensity of radiation reflected from and fabrication of ferrous stearate multilayer films by the transmitted through a thin film on a thick substrate, 258 Langmuir—Blodgett method, 292 Optical spectroscopy Magnetization transformation of amorphous Sip,Gep, and Si films by laser quantitative determination of the oxygen partial pressure effect annealing, 78 on the perpendicular magnetization of TbFeCo thin films, minority carrier lifetime in thin films of Zn3P, using micro- 282 wave and optical transient measurements, 176 Metallization linear distribution of intensity of radiation reflected from and characterization of mixed zinc-oxidized zinc thin films transmitted through a thin film on a thick substrate, 258 deposited by a cold remote nitrogen plasma, 119 J-aggregates of the thiatricarbocyanine dyes incorporated into high-reliability interconnection formation by a two-step LB films, 285 switching bias sputtering process, 182 Organic substances Microhardness comment on “Molecular organization of amphiphilic disc- phase analysis, microhardness and tribological behaviour of shaped penta-alkynes in LB mono- and multilayers”, D. Ti-6AI4V after ion implantation of nitrogen in connection Janietz, D. Hofmann and J. Reiche, Thin Solid Films, 244 with its application for hip-joint prosthesis, 245 (1994) 794, 99 Microstructure reply to comment on “Molecular organization of amphiphilic microstructure and residual stress of very thin Mo films, 52 disc-shaped penta-alkynes in LB mono- and multilayers”, Microwave methods 102 minority carrier lifetime in thin films of Zn,P2 using micro- control of electron transfer direction in an organic two-layer wave and optical transient measurements, 176 diode based on a lightly-doped poly(3-methylthiophene)/9- fluorenone derivatives junction, 263 Molecular structure Organometallic vapour deposition comment on “Molecular organization of amphiphilic disc- characterization of a d.c. titanium tetraisopropoxide/H,/N2 shaped penta-alkynes in LB mono- and multilayers”, D. plasma using emission spectroscopy, 8 Janietz, D. Hofmann and J. Reiche, Thin Solid Films, 244 preparation of c-axis oriented ZnO films by low-pressure (1994) 794, 99 organometallic chemical vapor deposition, 106 reply to comment on “Molecular organization of amphiphilic Orientation disc-shaped penta-alkynes in LB mono- and multilayers”, effect of reactant depletion on the microstructure and pre- 102 ferred orientation of polycrystalline SiC films by chemical Molybdenum vapor deposition, 192 the tribological properties of ceramic coatings modified by Oxygen molybdenum films under oil-lubricated conditions, 48 quantitative determination of the oxygen partial pressure effect Monolayers on the perpendicular magnetization of TbFeCo thin films, patterning of surfaces by photoisomerizable antibody-antigen 282 monolayers, 254 the specific adsorption of streptavidin to a tetrabiotinylated Partial pressure porphyrin monolayer at the air—-water interface, 289 quantitative determination of the oxygen partial pressure effect Multilayers on the perpendicular magnetization of TbFeCo thin films, a novel technique for the preparation of Langmuir—Blodgett 282 films, 96 Patterning fabrication of ferrous stearate multilayer films by the patterning of surfaces by photoisomerizable antibody—antigen Langmuir—Blodgett method, 292 monolayers, 254 Phase analysis Nanostructures phase analysis, microhardness and tribological behaviour of electron-phonon interaction and low-field drift mobility in a Ti-6AIM4V after ion implantation of nitrogen in connection polar semiconductor quantum well, 38 with its application for hip-joint prosthesis, 245 316 Subject Index of Volume 266 Phase transitions Rutherford backscattering spectroscopy optical recording characteristics of Sb2Se, thin films using a Raman and Rutherford backscattering analyses of cubic SiC CW-Ar* laser, 62 thin films grown on Si by vertical chemical vapor deposi- decomposition and modulated structure formation during tion, 1 amorphous Si, _,Ge, crystallization, 212 photoluminescence of ZnSe/Zn,_,Cd,Se strained superlattices Semiconductors under hydrostatic pressure, 307 low-temperature deposition of II-VI compound semiconductors Photoelectromagnetic effect by synchrotron radiation using metalorganic sources, 168 determining carrier lifetime using frequency dependence in determining carrier lifetime using frequency dependence in contactless photoelectromagnetic investigations of semicon- contactless photoelectromagnetic investigations of semiconductors, 274 ductors, 274 Photoelectron spectroscopy photovoltaic effects in metal/semiconductor barrier structures surface study of plasma- and UV-polymerized styrene films with boron-doped polycrystalline diamond films, 278 using scanning force microscopy and in-situ photoelectron Silicon spectroscopy, 133 decomposition and modulated structure formation during Photoluminescence amorphous Si,_,Ge, crystallization, 212 a photoluminescence and X-ray diffraction analysis of InAlAs/ the formation of sputtered Ta/a-Si and a-Si/Ta interfaces in InP heterostructures grown by molecular beam epitaxy, 302 a-Si/Ta/a-Si/c-Si structure, 224 Photo-processing influence of surface carbon on the formation of silicon- photo-processing of silicon nitride, 219 refractory metal interfaces, 229 Photovoltage Silicon carbide photovoltaic cell with an a-cBN layer, 110 Raman and Rutherford backscattering analyses of cubic SiC Physical vapour deposition thin films grown on Si by vertical chemical vapor deposi- thin film microstructure modelling through line-segment simu- tion, 1 lation, 83 a study on the structural characterization of a-SiC:H films by waveforms of arc-like Ti vapor discharge current and voltage, the gas evolution method, 129 89 calculated elastic constants of wide band gap semiconductor Plasma processing and deposition thin films with a hexagonal crystal structure for stress characterization of a d.c. titanium tetraisopropoxide/H,/N2 problems, 189 plasma using emission spectroscopy, 8 effect of reactant depletion on the microstructure and pre- waveforms of arc-like Ti vapor discharge current and voltage, ferred orientation of polycrystalline SiC films by chemical 89 vapor deposition, 192 photovoltaic cell with an a-cBN layer, 110 Silicon nitrides characterization of mixed zinc-oxidized zinc thin films optical and structural properties of SiO, and SiN, materials, deposited by a cold remote nitrogen plasma, 119 14 surface study of plasma- and UV-polymerized styrene films photo-processing of silicon nitride, 219 using scanning force microscopy and in-situ photoelectron Silicon oxide spectroscopy, 133 optical and structural properties of SiO, and SiN, materials, Polishing 14 initial study on copper CMP slurry chemistries, 238 X-ray photoelectron study of TiN/SiO, and TiN/Si interfaces, Polymers 298 surface study of plasma- and UV-polymerized styrene films Sputter deposition using scanning force microscopy and in-situ photoelectron angular selectivity of the infrared transmittance through spectroscopy, 133 obliquely sputter-deposited Ti-oxide-based films, 94 study of thin alumina coatings sputtered on polyethylene on the homogeneity of sputter-deposited ITO films. Part II. terephthalate films, 198 Etching behaviour, 152 Sputtering Radiation structure and electrical properties of Pb(Zr,Ti)O; thin films low-temperature deposition of II-VI compound semiconductors deposited by reactive sputtering using multi-targets, 140 by synchrotron radiation using metalorganic sources, 168 study of thin alumina coatings sputtered on polyethylene Raman scattering terephthalate films, 198 Raman and Rutherford backscattering analyses of cubic SiC deposition and characterization of PbTiO; thin films grown by thin films grown on Si by vertical chemical vapor deposi- radio frequency sputtering on MgO(100), 205 tion, 1 Steel Rectification X-ray photoelectron spectroscopy analysis of thermal and control of electron transfer direction in an organic two-layer diode based on a lightly-doped poly(3-methylthiophene)/9- plasma-treated steel substrates and their interface formed with an aluminium layer, 58 fluorenone derivatives junction, 263 Reflection spectroscopy Strain linear distribution of intensity of radiation reflected from and the structure of heteroepitaxial lead titanate layers grown by transmitted through a thin film on a thick substrate, 258 organometallic chemical vapour deposition, 157 Residual stress Stress microstructure and residual stress of very thin Mo films, 52 on the homogeneity of sputter-deposited ITO films. Part I. R.f. magnetron sputtering Stress and microstructure, 145 influence of a d.c. substrate bias on the resistivity, composi- Structural characteristics tion, crystallite size and microstrain of WTi and WTi-N a study on the structural characterization of a-SiC:H films by films, 267 the gas evolution method, 129 Subject Index of Volume 266 317 deposition and characterization of PbTiO; thin films grown by phase analysis, microhardness and tribological behaviour of radio frequency sputtering on MgO(100), 205 Ti-6AI-V after ion implantation of nitrogen in connection Structural properties with its application for hip-joint prosthesis, 245 optical and structural properties of SiO, and SiN, materials, 14 Wetting optical recording characteristics of Sb2Se, thin films using a thin film microstructure modelling through line-segment simu- CW-Ar?* laser, 62 lation, 83 structure and electrical properties of Pb(Zr,Ti)O; thin films WTi films influence of a d.c. substrate bias on the resistivity, composi- deposited by reactive sputtering using multi-targets, 140 tion, crystallite size and microstrain of WTi and WTi-N structural and optical properties of CdSe,Te,_, thin films grown by electron beam evaporation, 215 films, 267 WTIi-N films Superlattices influence of a d.c. substrate bias on the resistivity, composi- photoluminescence of ZnSe/Zn,_,Cd,Se strained superlattices tion, crystallite size and microstrain of WTi and WTi-N under hydrostatic pressure, 307 films, 267 Surface diffusion thin film microstructure modelling through line-segment simu- X-ray diffraction lation, 83 comment on “Molecular organization of amphiphilic disc- Surface melting shaped penta-alkynes in LB mono- and multilayers”, D. transformation of amorphous Sip,Geo,, and Si films by laser Janietz, D. Hofmann and J. Reiche, Thin Solid Films, 244 annealing, 78 (1994) 794, 99 Surface morphology reply to comment on “Molecular organization of amphiphilic relation between solution chemistry and morphology of SnO,- disc-shaped penta-alkynes in LB mono- and multilayers”, based thin films deposited by a pyrosol process, 20 102 Surface roughness fabrication of ferrous stearate multilayer films by the surface study of plasma- and UV-polymerized styrene films Langmuir-Blodgett method, 292 using scanning force microscopy and in-situ photoelectron a photoluminescence and X-ray diffraction analysis of InAlAs/ spectroscopy, 133 InP heterostructures grown by molecular beam epitaxy, 302 X-ray photoelectron spectroscopy X-ray photoelectron spectroscopy analysis of thermal and plasma-treated steel substrates and their interface formed with an aluminium layer, 58 Tantalum characterization of mixed zinc-oxidized zinc thin films depos- the formation of sputtered Ta/a-Si and a-Si/Ta interfaces in ited by a cold remote nitrogen plasma, 119 a-Si/Ta/a-Si/c-Si structure, 224 the formation of sputtered Ta/a-Si and a-Si/Ta interfaces in Tin oxide a-Si/Ta/a-Si/c-Si structure, 224 relation between solution chemistry and morphology of SnQ,- X-ray photoelectron study of TiN/SiO, and TiN/Si interfaces, based thin films deposited by a pyrosol process, 20 298 Titanium X-ray scattering waveforms of arc-like Ti vapor discharge current and voltage, neutron and X-ray reflectivity study of Ba salts of alternating 89 bilayers of deuterated and hydrogenated stearic acid, 69 the structure of heteroepitaxial lead titanate layers grown by investigation of the chain-chain interface in a lead-stearate organometallic chemical vapour deposition, 157 multilayer using neutron reflectivity, 234 Titanium nitride X-ray total reflection X-ray photoelectron study of TiN/SiO, and TiN/Si interfaces, the formation of sputtered Ta/a-Si and a-Si/Ta interfaces in 298 a-Si/Ta/a-Si/c-Si structure, 224 Titanium oxide angular selectivity of the infrared transmittance through Zinc obliquely sputter-deposited Ti-oxide-based films, 94 low-temperature deposition of II-VI compound semiconductors Transmittance by synchrotron radiation using metalorganic sources, 168 angular selectivity of the infrared transmittance through Zinc oxide obliquely sputter-deposited Ti-oxide-based films, 94 preparation of c-axis oriented ZnO films by low-pressure Tribology organometallic chemical vapor deposition, 106 the tribological properties of ceramic coatings modified by characterization of mixed zinc-oxidized zinc thin films molybdenum films under oil-lubricated conditions, 48 deposited by a cold remote nitrogen plasma, 119