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Thin Solid Films 1994: Vol 240 Table of Contents PDF

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THIN SOLID FILMS VOLUME 240, NUMBERS 1-2, MARCH 15, 1994 Contents Synthesis and Characterization Studies on the preparation and characterization of chemically deposited Ag,S films from an acidic bath............. ] S. S. Dhumure and C. D. Lokhande (Kolhapur, India) Growth and ellipsometric studies of periodic and Cantor aperiodic amorphous Ge/Si superlattices .................. 7 K. Jarrendahl (Link6ping, Sweden), B. Pécz (Budapest, Hungary), J.-E. Sundgren and H. Arwin (Linképing, Sweden) study Of microstructure Of Gpitaxinl MUTberOres TOMS . ww. cece eee c neces eeseesntevbserssensseseetess 14 W. B. Zhao, X. D. Zhang, Z. Y. Ye, J. L. Zhang, C. Y. Li, D. L. Yin, Z. N. Gu, X. H. Zhou and Z. X. Jin (Beijing, China) Structural investigation of bulk and thin film PLZT using X-ray absorption spectroscopy...............00eeeeeeees 22 R. B. Greegor, F. W. Lytle (Seattle, WA, USA) and A. Y. Wu (Taiwan, Taiwan) Plasma deposition of hydrogenated amorphous carbon: growth rates, properties and structures.................000. 28 N. Fourches and G. Turban (Nantes, France) Defects in amorphous and solid phase epitaxial silicon ......... 0... ccc ccc cece cece cece cent e ee eeteeeeeenes 39 G. Radnoczi, M.-A. Hasan and J.-E. Sundgren (Link6ping, Sweden) es Gener 00 GID POD ON i 6 inh 444 40 ond Reserve ne hen c4 Wess che cebeawd ones beaBEREReeaees 41 X. D. Wang, U. Mazur, K. W. Hipps and J. T. Dickson (Pullman, WA, USA) Low-dimension structural properties and microindentation studies of ion-beam-sputtered multilayers of Ag/AI films... 52 C. Kim, S. B. Qadri (Washington, DC, USA), M. R. Scanlon and R. C. Cammarata (Baltimore, MD, USA) en Oe Ss erin seu dhs eee eeh pda ween bbe e4e SEs P peas sehen bene ebeewes 56 J. Moser and F. Lévy (Lausanne, Switzerland) On the synthesis of Fe—C compounds under the influence of laser radiation.....0.0 .ce.ce. c.e e.e .e.e e.e e.e0ns 60 A. Amulevicius, M. Balciiiniené, Br. Petrétis and R. Pileckis (Vilnius, Lithuania) X-ray photoelectron spectroscopic studies on pyrolysis of thin films of plasma-polymerized acrylonitrile ............. 66 A. H. Bhuiyan (Dhaka, Bangladesh), S. V. Bhoraskar and S. Badrinarayanan (Pune, India) The composition and conductivity of electrodeposited Bi-Te alloy films ....0.... 0..0. c.cc c.ece .ce.e .ee ee ns 70 M. Takahashi, Y. Katou, K. Nagata and S. Furuta (Aichi, Japan) Surfaces, Interfaces and Colloidal Behaviour Considerations on the adsorbed water concentration of sulfuric porous aluminium oxide.........0.00.0.s. .ee.e 73 E. Palibroda and P. Marginean (Cluj Napoca, Romania) Metallurgical, Protective and Hard Layers The use of Raman Scattering to study disorder in pulsed laser deposited MoS, films....0..2..0.0.. c.e ee. e.e e.e e es 76 N. T. McDevitt (Dayton, OH, USA), J. S. Zabinski and M. S. Donley (Wright Patterson AFB, OH, USA) Mechanical propertics Of mamocomuposite thin GIS... ow... ccc cere ce sn cere ecereuecesseessesneonsesesscene 82 R. C. Cammarata (Baltimore, MD, USA) On the aluminium hard anodization and the critical value V* of the barrier layer voltage...............e.e.e0 e0e e 88 E. Palibroda and E. Indrea (Cluj Napoca, Romania) Surface physical and chemical changes of pure iron after molybdenum ion implantation and their effects on the tribotogical behaviour I: Pliysical and ChemICH! BMALYEIS........ 6c ccc ccc ce ree cesvesnecescsencsseccseesceeocess 92 D. Yang, X. Zhang, Q. Xue (Gansu, China), X. Ding and W. Lin (Beijing, China) Improved tribological properties of sputtered MoS, films through N* implantation ......00..00.0 c.ee .ee e.ee .ee ns 97 H. Liu and X. Zhang (Lanzhou, China) Elsevier Sequoia Vi Mechanics and Nanomechanics of Thin Layers Tribology of ultra-thin MoS, platelets on mica: studies by scanning force microscopy .........ce.ce. e.ee. e.ee0 e ee 101] L. Scandella, A. Schumacher, N. Kruse, R. Prins (Zurich, Switzerland), E. Meyer, R. Lithi, L. Howald and H.-J. Giintherodt (Basel, Switzerland) Wear, friction and sliding speed correlations on Langmuir—Blodgett films observed by atomic force microscopy ...... 105 R. M. Overney, H. Takano, M. Fujihira (Yokohama, Japan), E. Meyer and H.-J. Gintherodt (Basel, Switzerland) Electronics, Optics and Opto-electronics Non-destructive thickness determination of thin cobalt and cobalt disilicide layers on silicon substrates.............. 110 E. Roca (Barcelona, Spain), J. Vanhellemont, R. J. Schreutelkamp and J. Vermeiren (Leuven, Belgium) Seances Gemsmenone th WNGUr-eVEOTRIE Chin CUNT, TID ow occ kkk ok ceeds been Me bole tales ta ok emasemennner ee 114 V. V. Kindyak, A. S. Kindyak, V. F. Gremenok and A. A. Kutas (Minsk, Belarus) Characterization of Al-doped n-type ZnSe prepared under a zinc-rich growth condition by low-pressure organometallic ee NOD SECURING, 4 «5 5 00.5 LIAS VOTE IONS A IE a dhe es RS Ue es I 116 M. Y. Yeh, S. J. Guo, H. D. Huang and M. K. Lee (Taiwan, Taiwan) Study of the Lorentz—Lorenz law and the energy loss of *He ions in titanium oxide films ...................00005. 121 FE. E. Khawaja, F. Bouamrane, F. Al-Adel, A. B. Hallak, M. A. Daous and M. A. Salim (Dhahran, Saudi Arabia) Langmuir-—Blodgett, Biological and Related Films Kinetic study of diacetylene polymerization in mono- and multilayers of the Langmuir—Blodgett type............... 131] V. N. Kruchinin, S. M. Repinsky, L. L. Sveshnikova (Novosibirsk, Russian Federation), I. M. Koshkina, E. M. Auvinen and I. N. Domnin (Petrodvoretz, Russian Federation) Relationship between staphylococcal protein A distribution and surface pressure of protein-containing phospholipid films 138 B. Lu, Y. Bai and Y. Wei (Nanjing, China) Thin Film Devices, Sensors and Actuators Memory switching in amorphous Ge—Si—TI chalcogenide semiconductor films.......0 .ccc. c.ec.e. e.ee. e.e .eee s 143 M. F. Kotkata, M. A. Afifi, H. H. Labib, N. A. Hegab and M. M. Abdel-Aziz (Cairo, Egypt) Influence of wettability on the properties of thin porous platinum films as gates of metal—oxide—semiconductor devices IL, 2.5 ofV ida a oi Ae 4 DUS wedi eenielels ch bien Hebe Aie.cd «ce sighebidaaadls jebndiin mhesadhe dA 147 E. Hedborg, F. Winquist and I. Lundstrom (Linkoping, Sweden) Condensed Matter Film Behaviour Dependence of the a-Si:H defect density of states on the magnetic field profile of an electron cyclotron resonance aa a tba eNO eRe eA ROHS Oe RE ee 44 wb eo vba ewe oe 4 09 EE OED ABIROIUh.2 DEE. BUTE eel. ee 152 F. S. Pool (Pasadena, CA, USA), J. M. Essick (Los Angeles, CA, USA), Y. H. Shing (Pasadena, CA, USA) and R. T. Mather (Los Angeles, CA, USA) eeee Oe e e eee re er ee ee re 157 F. Hide, K. Nito and A. Yasuda (Yokohama, Japan) The photoresponse of high resistance anatase TiO, films prepared by the decomposition of titanium isopropoxide .... 163 M. A. Rashti and D. E. Brodie (Waterloo, Ont., Canada) Te eke hed hee YEE RARE RED KNK O he nh ee 04 bobo s beak eo 2 SOU BWks SRORIRGUGNEH. Me eeNeegesy leat 169 Nc Ar Sa eS ae og Baek a a eke EASE REESE RE EERE DED OSES OO 8 OO 170 an emer Sieh es eek ee Eee Se EAP DD RGD BA OEEEADES SENSE TEE OS SG OHS 171 iS nih adie kaeed a NeW hws bCASs HMO ee RNA OS e+ Os eo ean OER eReed, Os Jape ol seveded, eos 172 The publisher encourages the submission of articles in electronic form thus saving time and avoiding rekeying errors. A leaflet describing our requirements is available from the publisher upon request.

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