Technical digest: Symposium on optical fiber measurements, 2002

238 Pages·2002·15.2 MB·English

by  Williams, P.A.

NIST
Special Publication 988
Technical Digest:
Symposium on Optical Fiber
Measurements, 2002
Sponsored by the National Institute ofStandards and Technology
in cooperation with the IEEE Lasers and Electro-Optics Society
and the Optical Society ofAmerica
rhe
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NIST Special Publication 988
Technical Digest:
Symposium on Optical
Fiber Measurements, 2002
Digest ofa symposium sponsored by the
NIST
National Institute ofStandards and Technology
in cooperation with the
IEEE Lasers and Electro-Optical Society
and the Optical Society ofAmerica
September 24-26, 2002
National Institute ofStandards and Technology
Boulder, Colorado 80305
Opttccii SocietyofA/norico Edited by
P. A. Williams
G. W. Day
September 2002
U.S. Department ofCommerce
DonaldL. Evans, Secretary
Technology Administration
PhillipJ. Bond, UnderSecretaryfor Technology
National Institute ofStandards and Technology
ArdenL. Bement, Jr., Director
National Institute of Standards and Technology Special Publication 988
Natl. Inst. Stand. Technol. Spec. Publ. 988, 232 pages (September 2002)
CODEN: NSPUE2
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WASHINGTON: 2002
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PREFACE
This year has been a challenging one for the optical fiber telecommunications industry. In spite ofthat,
the 12th Symposium on Optical FiberMeasurements has seen a significant increase in the number of
submitted papers. This year, we are bulging at the seams, having accepted 51 papers (9 invited and 42
contributed). The international participation in SOFM remains strong with a little more than halfofthe
papers originating outside the United States.
Topically, the papers are more diverse than usual. Except forpolarization-mode dispersion, which fills
three sessions this year, there is a fairly even distribution across the measurement subjects ofnonlinear
behavior, fiber and waveguide geometry, group delay, dispersion, wavelength, polarization, multimode
fiber, and systems modeling.
Happy reading,
Paul Williams
Gordon Day
Boulder, Colorado
September, 2002
Exceptwhere attributedto NISTauthors,thecontentofindividual sectionsofthis volumehasnotbeen reviewedoreditedbythe
National InstituteofStandardsandTechnology. NISTtherefore acceptsnoresponsibility forcommentsorrecommendations
therein. The mentionoftradenames in this volumeby no means implies anyendorsementorrecommendationby the National
InstituteofStandards andTechnology.
iii
SYMPOSIUM COMMITTEE
G.W. Day, NIST, General Chair
P.A. Williams, NIST, Program Chair
A. Barlow, PerkinElmer
S.C. Fleming, Sydney University
D. Franzen, NIST
N. Gisin, University ofGeneva
M. Hackert
T.A. Hanson, Corning
A. Inenaga, JDS Uniphase
J. Jackel, Telcordia
K. Okamoto, NEL
W. Reed, OFS Fitel
G. W. Schinn, EXFO
C. Shaar, NetTest
NPL
J. Taylor,
K.K. Wong, Northstar Photonics
iv
CONTENTS
PREFACE
iii
SYMPOSIUM COMMITTEE
iv
TheUnique Measurement Challenges ofRaman Amplifiers (invited)
A. Evans, S. Gray, M. Muktoyuk, Corning, Inc. 1
P\^\nj\m\.\nxJ^CinYloQ\rJ\lnl cK\J\L ^-jtIi1T11n1iUillU^Ltt.pUH atlnllnLl ^nntitanpniic ^OpLavtC+Hplndtlilclrg AIVAApCcdioQUliliCr1p1m1Cp1n1tLc& cU\l"FtVip T1-mtiiIlIl
AVAV/aavVpCIICptIiIcUxLtUn TL^^pLtU^l.PTiilUnCpi'lnCpCp nv*f1 tLinltp. RIVautlnll^u'lnl (V^JTaalilTli QLtj"U\wpvp1y~ltl~iUiltlnl
N.R. Newbury, K.L. Corwin, National Institute ofStandards andTechnology 7
FiHprNonlinpar Copfficipnt lVfpasiirpmpnt Schpmp RaspH on FW1VT lVTptVind with
Externally Modulate DFB Laser Source
B. Batagelj, M. Vidmar, University ofLjubljana Laboratory ofOptical
Communications 11
r\. ^UllipallbUIl Ul olA 1 CX11111C|LitS 1UI INUIlllilCal V^UClllClCIll IVlCabUICIIlCIllc> Ul VallUUs
ijlllglc 1V1UUC WpLlLal riUClS
Y. Namihira, K. Miyagi, K. Kaneshima, University ofthe Ryukyus; M.
Tadakuma, Furukawa Electric Co. Ltd; C. Vinegoni, University ofGeneva; G.
Pietra, Pirelli Labs Innovation; K. Kawanami, Muroran Institute ofTechnology 15
Monitoring the Optical Network (invited)
Randy Giles, LucentTechnologies Advanced Photonics Research 19
Burial Depth Measurement torIon-Exchanged Glass Waveguides with Different
Widths
P. Madasamy, University ofArizona-Tucson Optical Sciences Center M. Morell,
;
NP Photonics; D. Geraghty, S. Honkanen, N. Peyghambarian, University of
Arizona-Tucson Optical Sciences 25
MFD A
Accuracy of and Measurements Using Far-Field Scanning
eff
A.J. Barlow, R. Castle, Perkin Elmer Optoelectronics; A.G. Hallam, Halcyon
Optical Services 29
Mode-Field Diameter and "Spot Size" Measurements ofLensed andTapered
Specialty Fibers
J.L. Guttman, PHOTON, Inc. 33
Anomalies in Online Fibre Measurements andTheir Implications forFibre Array
Manufacture
S.H. Law, T.N. Phan, Australian Photonics CRC; G.W. Barton, University of
Sydney Department ofChemical Engineering; M.J. Barton, J. Elsey, Australian
Photonics CRC 37
Performance Characterization ofComponents with Group Delay Fluctuations
M. Eiselt, C.B. Clausen, R.W. Tkach, Celion Networks 41
High-Resolution Group Delay Measurements ofa Hydrogen Cyanide Gas Cell Using
Low-Coherence Interferometry
S.D. Dyer, R.J. Espejo, P.A. Williams, National Institute ofStandards and
Technology 45
V
Group Delay and Spectral Response ofFree Space Optics Mux/Demux Measurement
Using OLCR
X. Chapeleau,LPIO Universite de Nantes, NetTest; D. Leduc, C. Lupi, R. Le Ny,
C. Boisrobert, LPIO Universite de Nantes 49
High Accuracy Relative Group Delay Measurements ofa Chirped Grating (NIST
Telecom Round Robin)
X. Chapeleau, D. Leduc, LPIO Universite de Nantes; M. Wicks, National Physics
Laboratory, UK; R. Le Ny, C. Boisrobert, LPIO Universite de Nantes 53
Direct Dispersion Slope Measurement by Mach-Zehnder Interferometer on Short
Length Optical Fibre
CRC
Y.C. Zhao, S. Fleming, Australian Photonics J/
Dispersion Measurements on Multiple Kilometer-Length Few-Mode Fibers with an
RF Spectrum Analyzer
J.W. Nicholson, S. Ramachandran, S. Ghalmi, M.F. Yan, OFS Laboratories 01
Group-Delay Measurements withRF Optical Frequency Scanning
M.C. Santos, J. Prat, M. Solar, Universitat Politecnica de Catalunya Dept. of
SCi'gnal1 rAT,1h_eory a_n^dJ /C"""Iommunic'atii"o-n_s 65
Optical Waveform and Q-FactorMeasurement Using Optical Sampling forUltra-
TDM
High Speed Systems (invited)
H. Takara, I. Shake, S. Kawanishi, NTTNetworkInnovation Laboratories 69
Frequency-Controlled Supercontinuum Lightwave Source Applied to Optical
Measurements with High Frequency Accuracy
K. Mori, T. Morioka, A. Takada, E. Yamazaki, NTT Network Innovation
Laboratories 75
Recent Developments ofExcited-State Optical Frequency Standards for
Telecommunications
D.A. Humphreys, C. Campbell, F. Bernard, P. Patel, National Physical
UK
Laboratory, 79
FiberBragg Gratings as Wavelength References -Development and Characterization
E.G. Grosche, Physikalisch-Technische Bundesantalt; J. Meissner, Advanced
Optics Solutions 83
Simultaneous Measurement or Transverse Strain andTemperature Using FBG
Written in HiBi Fiber
I. Abe, Universidade de Aveiro Dept. de Fisica, Centro Federal de Educacao
Tecnologica do Parana; M.W. Schiller, Centro Federal de Educacao Tecnologica
do Parana; R. Nogueira, Universidade de Aveiro Dept. de Fisica, Instituto de
Telecomunicacoes; P. Lopes, Universidade de Aveiro Dept. de Fisica; 0. Frazao,
J.L. Santos, INESC Porto; J.L. Pinto, Universidade de Aveiro Dept. de Fisica,
Instituto de Telecomunicacoes; H.J. Kalinowski, Centro Federal de Educacao
Tecnologica do Parana 87
A Simple and Direct Method to Estimate Long Period Grating Parameters
K. Thyagarajan, M. Das, M.N. Satyanarayan, Indian Institute ofTechnology
Dept. ofPhysics 91
A Simplified Model ofModal Dispersion in Multimode Fiber (invited)
A.J. Ritger, OFS Fiber Optics Division; S.E. Golowich, Bell Laboratories 95
vi
DMD
Measurement and Simulation on Short Length, 850-nm Laser-Optimised, 50
GIMM
/xm Core Diameter, Optical Fibres
F.J. Achten, Draka Fibre Technology; M. Bingle, Eindhoven University of
EM
Technology, Software and Systems; B.P. de Hon, Eindhoven University of
Technology; M.J.N, van Stralen, Draka Fibre Technology 101
Determination ofSkew in Multimode Ribbon Fibers
A.J. Barlow, PerkinElmer Optoelectronics; M.J. Hackert, Corning, Inc. 11A05C
rnase imaging ivieinoas ior upucai noer i^naracierizauon
/\. is-ODens, universny 01 ivieiDourne ocnooi 01 rnysics, \j. rjaxier, in. uragomir,
Victoria University School ofCommunications and Informatics; S.T. Huntington,
University ofMelbourne School ofChemistry; E. Ampem-Lassen, M.L. Michna,
K.A. Nugent, University ofMelbourne School ofPhysics 109
Measurement or Fiber Birefringence Using Lyot-Sagnac Interferometer
L.a. rum, Y.vj. Han, K.M. oova, J.U. is.ang, Johns Hopkins university Dept. 01
Electrical and Computer Engineering, U.C. Paek, Y. Chung, Kwangu Institute of
Science and Technology Dept. ofInformation and Communication 113
Determination 01 the Degree 01 Polarization Based on a Coherent Quantum
Measurement
M. Legre, M. Wegmiiller, N. Gisin, University ofGeneva Group ofApplied
Physics 117
Visualizing the Limitations ofFour-State Measurement ofPDL and Results ofa Six-
State Alternative
R.M. Craig, National Institute ofStandards andTechnology 121
Four-State Measurement Method for Polarization Dependent Wavelength Shift
W.C. Swann, S.D. Dyer, R.M. Craig, National Institute ofStandards and
Technology 125
Measurement ofDispersion in Photonic Bandgap Fibers (invited)
J. Jasapara, OFS Laboratories 129
Counting Modes in Optical Fibres with Leaky Modes
A. Argyros, I.M. Bassett, Australian Photonics CRC 135
Measurement 01 Multipath Interference and Resulting Optical Communication System
Penalty (invited)
D.L. Craig, M.G. Taylor, W. Zheng, J. Fowlkes, H.P. Sardesai 139
Predicting MPI in Raman Optical Amplifiers by Measuring the Rayleigh
Backscattering Coefficient
P.B. Gaarde, Y. Qian, S.N. Knudsen, B. Palsdottir, OFS Fitel Denmark 143
Measurement ofMultimode Resonances in Hexagonal Micro-Pillar Optical Cavities
N. Ma, A.W. Poon, Hong Kong University ofScience andTechnology Dept. of
Electrical and Electronic Engineering 147
Measurement Requirements for Optical and Optoelectronic Model Verification,
Validation, and Calibration (invited)
J. Morikuni, P. Mena, B.K. Whitlock, R. Scarmozzino, RSoft Design Group, Inc. 151
Photon-Counting OTDR at Telecom Wavelength: High-Resolution and Long-
Distance Measurements
F. Scholder, A. Fougeres, J.-D. Gautier, C. Barreiro, A. Haldimann, H. de
Riedmatten, M. Wegmiiller, N. Gisin, University ofGeneva Group ofApplied
Physics 157
OTDR
Coherent Speckle in Direct-Detection
S.G. Murdoch, NetTest 161
PMD
Full Measurement ofthe Spatial Distribution of Using Backscatter
A.J. Rogers, S.V. Shatalin, University ofSurrey Dept. ofElectronic Engineering 165
Polarisation Mode Dispersion in Restricted Optical Bandwidth: An Evaluation of
Measurement Techniques
UK
S. Harris, D. Ives, National Physical Laboratory, 169
A/teasiirement and A/fitiPation oflVTnltmle Reflection Fffects on the Differential frroim
Delay Spectrum ofOptical Components
PA. Williams, J.D. Kofler, National Institute ofStandards and Technology 173
x-Shifted All-Fire Sagnac Loop for Characterization ofFemtosecond Polarization
Mode Disnersion
E. Simova, I. Golub, Institute forMicrostructural Sciences 177
TVT_<J;oitl*Iilo^" TLitlYlirJnKnJLTtlau-nlplfV*V Sulaalm1T1iL/l1i1n1cliri, tIVoJ .A/cYcopOctsO:O tUhIpt PLt.lflikp,p^tlQo nUlfPJ.lIVVXfi-O/ oUlnl u^YIovlcWtlplml P1pCrIfLVXJ^krlTllnualniVp^pW
invitpH
f1111VIWlCvljl
1VV . Tl—i. TlC\uat11h1, Tli^UJloUrltWhLwupL^Lflpm11 TUT1nUivVptlrQoiiltvV D!LpvV_nl-tH. a\JfL PJLn^lc.nn11p1prV_iir11n1Tti SUpvilpvtlilpvpvqO a&1n1HU /AlnUnUlIiIpvHU
Mathematics; Gino Biondini, Ohio State University Department ofMathematics 181
TUnlvVpCQotiLIcL£y,tnlt11iUr>v1nlQo nv'n11 tLhUpC PIXpClaIdtirvn1 RUtpLfWwtptplnl P111VVT1T\"_)J (V/^Un^plflflivpliWplnltl Qdlnllril fV_^daUHlICp T11ncltofIldlll!i*dtUi4fJv1n1 V1pvid*lr
i11n1 T^Vp-nL4tLl^TjVr1h1pV X1pCllvpllVcvlolml PJ.i1hL/pVrl P1lIaCXnlLtv
H.-J. Tessmann, D. Breuer, H.M. Foisel, H. Reiner, H. Cremer, Deutsche
Telekom 187
Pulsed Measurement ofPolarization-Mode-Dispersion in Field-Installed Optical
Fibers
A.O. Kleivstul, Telenor R&D; A.S. Sudbo, University Graduate Center-UniK 191
DGD
Analysis and Comparison ofMeasured Data on Buried Single-Mode Fibers
C Allen P K Kondamuri Universirv ofKansas Lightwave Communication
Svstems Laboratorv D L Richards D C Hat?ue Snrint Cornoration 195
Statistical Evaluation ofPolarization-Dependent Losses and Polarization-Mode
DJ—i'1sJnL/eLr1sJi1UoIn1 i11n1 aCIn11 IllnlsOtLadlllieWdU PJ.ilhUevlrNlieWtlwWUolrIkV
CJ.K. Richardson, University ofMaryland Laboratory forPhysical Sciences; R.J.
Runser, M.Goodman, Laboratory forTelecommunication Sciences and Telecordia
Technologies; L. Mercer, Naval ResearchLaboratory 199
Programmable Polarization Mode Dispersion Generation (invited)
J.N. Damask, P.R. Myers, T.R. Boschi, YAFO Networks 203
Measurement ofDifferential Group Delay Profiles in Fibers and in LiNb03
PMD
Distributed Compensator
S. Bhandare, D. Sandel, R. Noe, University ofPaderborn Dept. ofOptical
Commmunication and High-Frequency Engineering; H. Hermann, H. Suche, W.
Sohler, University ofPaderborn Dept. ofApplied Physics 209
viii