Tech Briefs, Electronic Components & Circuits... 97-11... National Aeronautics & Space Administration.... November 1997

61 Pages·1997·14.6 MB·English

by  National Aeronautics and Space Administration

Electronic Components and Circuits
Electronic Systems
Physical Sciences
Matheand minaformtatiion cScisenc es
November 1997
Avaiolf NAaSA bTecih Blrieifs tandy TSP ’s
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97-11
47 Machinery
53 Matheand minfaormtatiion cScisenc es
3|@#3l//e90l/ e0l e
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contained in this document, or warrants that such use will be free from privately owned rights.
ANT -: aa
NASA Tech Briefe,N overnb1d0r9 7

> 5
Electronic Components and
“=< - Circuits.
—-~ = ~
Hardware, Techniques, and Processes
7 Signal-Decay Technique for Determining Os of Power inductors
8 BidirEelecctrotnici Ciorcunit aBrleak er
G Slotted CarbonGr/idsC foar lron bAcceolernato rs
NASA Tech Bnets, Novernber 1997 5

Signal-Decay Technique for Determining Qs of Power Inductors
There are no switches in the test
inductor/capaciltoooprs.
An improved resonent-signel-decay
techrique hes been devesd fo measuring
@ectica iosses Fn quas-inem inductors of
the type hat we used n modem eectoric
POwerCr-ouias aund pthatp avle tyypica lly
Operated at tequencies up t about 100
i¢tz. The basic resonent-signel-decey
tectrique hes besn used since the ently
years of electrThoe enssiencce sof. t he
basic techrique is t comect an induc
wih a low-oss capacitor in a sinpie loop
resonart cro, apply a one-dhot pulsed
agra! t exits caciations at fhe resonance
feqaund maeasunre tche ryate o,f Ga cay
of the signal to determine the electical ines
in te Gad af the resonance tequarsy.
(Custdecoticmal assr ist eqvyres,sed in
terms of a resonance quailty factor, O =
wWa, vwrere f = te merrarce tequarcy
and a= the rate feckrocal ofc Charactaisic
Figure |. A One-Ghot Transient Signal ts Excited int he nductor-end-capactioy resonant loop by
momertary application of en ac signal Guring a tigger putes. The digits! cscioscape reconis fhe
renfing decaying ceciiaton
ing electrical losses are minwrized by avcid-
sco
4a00l
(MOaSve stF preEsent,T bust the) cou t is
configured and operated in such a wey that $s
the losses roduced by te MOSFET
{-
0 Us sanannnnnnn
-100
800,
300
#00
a5 7) Ge ge"
Tens Miliseconds
Four Ocselfiation was recorded in the crouf of Figure | with a test capacitor of
0.22 fF ard « tenfie-core inductor of 35.6 1.
and Scott S.G erbofe NrYMA inc., for
Lewls Research Center. Further infor-
mation is contained in a TSP jsee page 1}
7-3, 21000 BrookRoapd,a Clreveklan d,
Ohio 44135. Rater toL EW-16444.
>> 18m
cite fanennttaip—iip—
2 3smOsSWw a
Figure |. This Gidivections! Electronic Cireutt Greater cortains tower parts han do offer electonic circust breaters, yet is precise enough for
( onging purpose.
An @ecvonc crow bree és 18
Gesigned to tip a@ & noming direct ov- 2
rert of 5.6 A for more, Gapending on tern- °-
fu f °C
wr ——_
3 +28 °C
| rf ements
ac
ftRE b) trees...
Vie
‘Fr
ob i = aS aD i —= a ee a i
1 2s46867 © => 206M 7 1
Top Tene, ms
Figure 2. The Cirreult Greater te Wipped rio tsn-cf when the port fat represents ts open
ing condion tes on or above the curve tor the operaiing termpersture Note that fhe crroust isn ot
Wipped by large asrert pulses ghorte: an abou | ma.
the load current equals or excesds the below ther conducting treshoids. Thus,
Gesired tip level, the voRage across tis the MOSFETs ave turned off, interrupting
resistor equals of exceeds the turn-on the path for the load currert.
tveshold bese-to-ervonRaiget iofe orn e The latching croult inchudes a resistor/
of the 2N22non2 ta2neiAstor s. Capacitor Gsiay crout that mates the cr-
The turning on of ether 2N2222A non Gut Dreater inseriiive to © current surge
vaneistor causes the turn-on of tte shorter then abou | ms (ese Figure 2).
2N2907A pnp wansiswhticho irs, th e Onoe the circuit breaker has been tripped
actve semen of @ istching cro, When by overourTened rutrd, ft ig resett,h e
thus activated, the latching croutt lowers ticring Grout hokis fti n the “of” cond-
the voRages on the MOSFET gates ton. Reset is accomplished by tuning
NAGA “xh Briefs, Novernib1e9r9 7
of, then turing on te isolated 24-Vcc Corp. for Lewis Research Center.
Dower SUDDIy Further nformisa cotntaiinoed nfn @
This work wes done by Tomasz TSP jsee page1 }
Kacheisi of Rockwell intentional inguiies concenigr’tsn foir tnhe gcor n-
A Stotted Carbon/Carbeon Grid coutd be machined at relatively low cost. The grid would erode aiong the cents lines of the webs between the
stots. fis erosion pattern would delay svuctural tafure
gots inc arboryswcetas risb ano e:de n ess Ten 14 tet of moods’), i
gon of te cona t desorbed nn “on eppesrs that a siotted carborvcanr gbi d
AccsGrii,e Wirth aGontgatced sHol us* sould heve a operatHie o16n tgime s
(NPO- 19338), (WASA Tech Briefs, Vol. 20,
No. 1, Uenuary 1996), page 34. One rmee-
borvshecet.a Macrhinibng oin tnris p at-
tern would leave « large number of uno
ers ederncing across the 1.4 clarnete of
fhe gid, resufing in a substantinicraelas e
in te etifiness of the gid over that of a gid
wih a heagond pattern of crouéer holes.
The cost of machining the gid sts has
been estimtao tbee adbou t 1/6 that of
mactwing gid holes in a hexagone pat-
ten. The main reason for the decrease in
@s Cortered in the webs between sits. in Cost is tat for a gid of 8 given size e.g.
tvs case, eosion cornpistrtouaghl yth e @ Gamneter of 14 on anc tictvwes of 0.5
ticles would nol case immnedate mer) the nusniber of slots (about 50) woud
oructre thre, cote, i woud Gide be much emalier than the number of holes
each web into two narrower paraiel webs. (about 4,000).
i hes been estimated fal a peraiel-cot This work was done by John R. Brophy,
gid woud lest free Wres as borg os D. Kye Grown, Juergen Musie, and
would @ round-hole/hexagonel-pattern Coates E Gane of Cates) for NASA's
0 of the sane material, taking tis factor Jet Propuision Laboratory furthe nt.
in combiwithn thae ltoweri raote onf e ro- mation is cortained ina TSP isee page |)
gon of carborvcarbon jemected to be NPO- 19679