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Preview Spin injection in a single metallic nanoparticle: a step towards nanospintronics

APL Spin injection in a single metallic nanoparticle: a step towards nanospintronics A. Bernand-Mantel, P. Seneor, N. Lidgi, M. Mun˜oz,∗ V. Cros, S. Fusil,† K. Bouzehouane, C. Deranlot, A. Vaures, F. Petroff, and A. Fert Unit´e Mixte de Physique CNRS/Thales and Universit´e Paris-Sud 11 91767, Palaiseau, France 6 (Dated: February 3, 2008) 0 We have fabricated nanometer sized magnetic tunnel junctions using a new nanoindentation 0 technique in order to study the transport properties of a single metallic nanoparticle. Coulomb 2 blockadeeffectsshowclearevidenceforsingleelectrontunnelingthroughasingle2.5nmAucluster. n The observed magnetoresistance is the signature of spin conservation during the transport process a through a non magnetic cluster. J 9 PACSnumbers: 85.75.-d,75.47.-m,73.63.-b 1 ] Spintronics debuted with the discovery of giant Co 20 ci magnetoresistance[1] effect in magnetic multilayers in Insulator 10 s which a single dimension was reduced to the nanome- - Co 0 trl tteurresrawnigteh.twoTrheidsuficeedlddiwmaesnstiohnens liekxetnenadneodwirteos[2s]trauncd- Resist Co Y(nm)-10 m nanopillars[3, 4] or nanotubes[5]. Today, a challenge -20 t. for spintronics is the study of spin transport proper- Al2O3 Au -30 a ties in structures based on 0D elements in which the Co 0 100 200 300 400 X(nm) m three dimensions have been reduced. In particular, we - have in mind systems in which the reduction of the size FIG. 1: Left: Schematic cross-section of thewhole patterned d leads to both Coulomb blockade and spin accumulation structure showing the top/bottom Co electrodes and the 2D n effects[6, 7, 8]. Transport studies on systems including assembly of nanoparticles embedded in a thin alumina layer. o c mesoscopic islands[9, 10, 11] or granularfilms[12, 13, 14] The circle represents the zone zoomed in the bottom draw- [ have paved the way to understanding the effect of con- ing. Right: Cross section of an AFM tapping mode scan of finement on charge and spin transport properties in a nanoindent before filling with the Co top electrode. The 1 metallic nano-objects. However, so far, very few tech- effectivenanocontact cross section is less than 10nm. v niques allowto contacta single isolatednanometer sized 9 3 object[15, 16, 17] to study the effect of confinement on 4 spin transport. to form the first tunnel barrier. Then, an ultrathin layer 1 of Au (0.2 nm nominal thickness) is deposited on top of Inthis letterwe presenttheexperimentalachievement 0 the bilayer. The 3D growth (see [18]) of the sputtered 6 of a new technique allowingus to inject anddetect spins goldontopofaluminaproducesaself-formednanoparti- 0 ina singleisolatednanometersizedcluster. We thenob- cleslayer. Aplaneviewtransmissionelectronmicroscopy / tain information on both spin and single electron trans- t (TEM) picture of the Au nanoparticles 2D self-assembly a port in the nanoparticle. In this technique, a ferromag- m netic nanocontactwith a cross sectionof ∼5−10 nm in is shown in Figure 2. The size distribution of the Au nanoparticles is characterized by a 2 nm diameter mean - diameteriscreatedonabilayerassociatingacobaltlayer d value and a 0.5 nm standard deviation with a density of andanultrathinaluminalayerinwhicha2Dassemblyof n 1.7 1012 cm−2. Finally, the Au clusters are capped by gold nanoparticles is embedded (see Fig 1 for a sketch). o another Al layer (0.6nm) subsequently oxidized in pure As we will show, this structure allows the tunneling of c : electrons into and out of a single Au nanoparticle. O2 with the same process used to form the first tunnel v barrier. This creates a Co/Al2O3 bilayer with Au nan- i The whole structure is elaborated in a sputtering sys- oclusters embedded in the thin alumina layer. X tem (base pressure 5×10−8 mbar) with Ar gas at a dy- To define an electrical contact on a single cluster r namic pressure of 2.5×10−3 mbar. The deposition of a we use a 4 steps process combining AFM and optical a bilayer of Co(15nm)/Al(0.6nm) is followed by the oxi- lithographic techniques (for further technical details see dization of the Al layer in pure O2 (50 mbar for 10 min) Ref[19]). Forthefirststep,aphotoresistlayerof35nmis spin coated over the whole Co/Al2O3/Au/Al2O3 struc- ture. Then, contact zones are defined using a second photoresist layer and a standard UV lithography pro- ∗Now at Laboratorio de F´isica de Sistemas Pequen˜os y Nanotec- cess. During the second step a conductive boron doped nolog´ia, Consejo Superior de Investigaciones Cient´ificas, Serrano diamond AFM tip is used to nanoindent the thin resist. 144,28006Madrid,Spain †AlsoatUniversit´ed’Evry, Bat. des Sciences, ruedupereJarlan, Theconductancebetweentheconductivesampleandthe 91025Evry,France AFM tip is monitored in real time. In the late stage of 2 500 1x1015 (cid:15)(cid:16)(cid:5)(cid:3) 400 1x1015 (cid:15)(cid:2)(cid:5)(cid:3) 300 -2Density (m)468xxx111000111444 dV(nS) 120000 (cid:0)(cid:4)(cid:1)(cid:5)(cid:2)(cid:3)(cid:3) 2x1014 dI/ 0 0 -100 10 nm 0,0 0,5 1,0 1D,i5ame2t,e0r (n2m,5) 3,0 3,5 4,0 -200 (cid:6)(cid:7)(cid:8)(cid:9)(cid:10)(cid:11)(cid:12)(cid:7)(cid:13)(cid:14)(cid:0)(cid:1)(cid:2)(cid:3) -400 -200 0 200 400 FIG. 2: Left: Binarized plane view of self-assembled Au Voltage (mV) nanoparticles observed by TEM. See Ref. [18] for further in- formation on the binarization process. Right: Size distribu- FIG.3: Differentialconductancecurvesat,190K,120K,60K tion of the same self-assembly. Fitting gaussian (bold line), and4.2KforaCo/Al2O3/Au0.2nmnominal/Al2O3/Co/Au parameters are 2 nm mean diameter and 0.54 nm standard nanocontact. Monte-Carlo simulation (plain line) at 4.2 K deviation. and with a background charge offset Q0/e=0.4. The other simulationparametersareC1=0.4aF,C2=1.14aF,R2=3R1. the nanoindentation a tunneling current is established between the tip and the sample. The exponential thick- the conductance curves. At 4.2 K, the Coulomb block- nessdependenceallowstopreciselycontroltheendofthe ade peaks are clearly visible, with an equal spacing of indentation process. The tip is then retracted and the Vs ≃140mV between peaks. As the highestcapacitance sampleisleftwithananometerscaleholeonthesurface. governsthepeakspacing,weextractCmax=1.14aFfrom After this nano-indentation process, the holes can be in- Vs through Cmax=e/Vs. This parameter is used as an spectedbytappingmodeAFMusingultrasharptips. On inputfor the singlenanoparticleMonte-Carlosimulation figure 1, we show the cross section of a typical hole after (MOSES) [24] which faithfully reproduces the peaks of enlargementby a 30 s O2 plasma etch. Onthe crosssec- the 4.2 K conductance curve in Figure 3. In this sim- tion one can see that the contact area section is in the ulation, the structure is modelized as two tunnel junc- 10 nm range. The samples presented in this letter use a tions in series. Using C2=Cmax=1.14 aF and T=4.2 K, shorterenlargingplasmaetchof20sgivingholessections the best fitting parameters for the two tunnel junctions below the 10 nm range. However, due to a tip nominal are C1=0.4 aF, R2=3R1 and a background charge of radius of 5 nm, holes having a contact cross-section be- Q0/e=0.4. AV2 termis addedtothe simulatedcurveto low 10 nm can not be properly imaged[19]. From the take into account the quadratic variation of the tunnel nanoparticles density of 1.7 1012.cm−2 and assuming a conductanceversusvoltage[21]. The chargingenergyEC disc shape area for the contact surface, there is an av- of the nanoparticle can then be calculated assuming the erage of 0.3-1.2 nanoparticles per nanocontact hole for nanoparticle total capacitance is CT=C1+C2. One finds holes diameter in the 5-10 nm range. The next step, is EC =e2/2CT ≃50 meV which is in agreementwith the thefillingoftheholebyasputteredCo15nm/Au50nm fading of the Coulomb blockade features above 120 K. counter electrode, just after a short O2 plasma. Finally Using electrostatic simulations and the capacitances ex- we use standard optical lithography and ion beam etch- tracted from the fit, we can determine the nanoparticle ing techniques to define the top electrode. This allows diametertobe ≃2.5nminexcellentagreementwiththe us toobtainasingle clusterper nanocontactwitha high average size determined by TEM. expectation value. In Figure 4, I(V) and dI/dV curves at 4.2 K of the The patterned samples were measured in a variable same sample are shown after a sweep at higher voltage. temperature cryostatfrom 4.2 K to 300 K. On Figure 3, A change in the background charge has occurred. The onecanseethedI/dV(V)curvesofananopatternedsam- curves are almost symmetric in voltage bias which re- ple at different temperatures. Above 190 K the conduc- flects the very low offset of the new background charge. tancecurvepresentstunnellikefeatureswithoutanyevi- A simulation curve using the same set of parameters as dence ofCoulombblockade. At120K,shoulderscharac- before, except for a smaller charge offset of Q0/e=0.07, teristic of Coulomb blockade start to appear in the con- is also shownon the figure. A clearevidence that we ob- ductance curve and get more pronounced as tempera- serve single electron tunneling through a single isolated ture is lowered. Considering a single nanoparticle, for nanoparticleisthatthesamesetofjunctionsparameters Coulomb blockade to be observed at 120 K, the charg- are used to obtain an excellent fit of our data with two ingenergyEC ofthe nanoparticlehastobe greaterthan different background charges. about kT120K which suggest that the charging energy Wenowfocusonspindependenttransportinthesam- is at least ≃ 10 meV. Below 60 K an asymmetry in ple. In figure 5, we present a R(H) curve showing evi- the shoulder position, typical of the presence of a non denceoftunnelmagnetoresistance(TMR).Due toshape zeroQ0 backgroundoffsetcharge[20], canbe observedin anisotropy, the top ”cone” and the bottom plane mag- 3 15 netic electrodes have distinct coercive fields. Therefore Data 10 Simulation itenablestheswitchingfromparalleltoanti-parallelcon- figurationsfortheelectrodesmagnetizations. Theoccur- 5 rence of TMR is a direct proof of spin dependent trans- A) 0 port in the nanostructure,which indicates spin injection n fromone electrode intothe clusterandspindetectionby I( -5 the second electrode. As the nanoparticle is non mag- netic,the observation of TMR means that spin informa- -10 tion is conserved in the transport process through the nanoparticle. ThesignoftheTMReffect,whichrulesout -15 S imulation direct tunneling between the two magnetic electrodes, Data can be understood in the framework of spin accumula- 150 tiononthenon-magneticnanoclusterintheco-tunneling regime as discussed in references[22, 23]. S) n100 V( d dI/ 50 In summary, we have developed an original process to investigate the spin transport properties of a single nanoparticleandprovidedevidenceforitssuccessfulreal- 0 -200 -100 0 100 200 isation. Ourapproachpavesthewayforamorein-depth Voltage (mV) studyofmagneto-Coulombphenomenainnanosizedclus- ters. FIG.4: Top: I(V)curve(-(cid:4)-)measuredat4.2Kforthesam- pleshowninfigure3afterachangeinthebackgroundcharge. Thelineisasimulationusingtheparametersgiveninthefig- ure 3 caption but with Q0=0.07 e. Bottom: dI/dV(V) curve (-(cid:4)-) obtained from the derivative of the above I(V) curve. The line represents thedifferentiation of thesimulation. 650 )640 WM e (630 c n a620 st si e610 R Acknowledgments 600 -90 -60 -30 0 30 60 90 Magnetic field (Oe) FIG. 5: Resistance versus magnetic field obtained at 20 mV We acknowledge the support of the EU through the and 4 K for thesample of figures 3 and 4. Nanotemplates project (NMP-CT-2004-505955). [1] M. N. Baibich, J. M. Broto, A. Fert, F. nguyen van 401, 572 (1999). Dau, F. Petroff, P. Etienne, G. Creuzet, A. Friedrich, [6] J.BarnasandA.Fert,Phys.Rev.Lett.80,1058(1998). and J. Chazelas, Phys. Rev.Lett. 61, 2472 (1988). [7] H. Imamura, S. Takahashi, and S. Maekawa, Phys. Rev. [2] L. Piraux, J. George, J. Despres, C. Leroy, E. 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Hanna and M. Tinkham, Phys. Rev. B 44, 5919 tani,K.Takanashi,S.Takahashi,S.Maekawa,andH.Fu- (1991). jimori, NatureMat. 4, 57 (2005). [21] R. D. W.F. Brinkman and J. Rowell, J. Appl.Phys. 41, [14] L. F. Schelp, A. Fert, F. Fettar, P. Holody, S. Lee, J. L. 1915 (1970). Maurice, F. Petroff, and A. Vaures, Phys. Rev. B 56, [22] J. Martinek, J. Barnas, S. Maekawa, H. Schoeller, and R5747 (1997). G. Schon,Phys.Rev. B 66, 014402 (2002). [15] D. C. Ralph, C. T. Black, and M. Tinkham, Phys. Rev. [23] I. Weymann, J. Konig, J. Martinek, J. Barnas, and Lett.74, 3241 (1995). G. Schon,Phys.Rev. B 72, 115334 (2005). [16] R. Desmicht, G. Faini, V. Cros, A. Fert, F. Petroff, and [24] Monte-Carlo Single-Electronics Sim- A.Vaures, Appl.Phys. Lett.72, 387 (1998). ulator (MOSES), available at [17] J. Von Delft and D. Ralph,Phys. Rep. 345, 61 (2001). http://hana.physics.sunysb.edu/software/MOSES.htm [18] J.Carrey,J.-L.Maurice,F.Petroff,andA.Vaures,Phys. Rev.Lett. 86, 4600 (2001).

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