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Simulation and the Monte Carlo Method: Solutions Manual to Accompany, Second Edition PDF

186 Pages·2008·7.321 MB·English
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Solutions Manual to Accompany Simulation and the Monte Carlo Method ■ICKNTKMWIAL BICINTINNIAL THE WILEY BICENTENNIAL-KNOWLEDGE FOR GENERATIONS (r~)ach generation has its unique needs and aspirations. When Charles Wiley first opened his small printing shop in lower Manhattan in 1807, it was a generation of boundless potential searching for an identity. And we were there, helping to define a new American literary tradition. Over half a century later, in the midst of the Second Industrial Revolution, it was a generation focused on building the future. Once again, we were there, supplying the critical scientific, technical, and engineering knowledge that helped frame the world. Throughout the 20th Century, and into the new millennium, nations began to reach out beyond their own borders and a new international community was born. Wiley was there, expanding its operations around the world to enable a global exchange of ideas, opinions, and know-how. For 200 years, Wiley has been an integral part of each generation's journey, enabling the flow of information and understanding necessary to meet their needs and fulfill their aspirations. Today, bold new technologies are changing the way we live and learn. Wiley will be there, providing you the must-have knowledge you need to imagine new worlds, new possibilities, and new opportunities. Generations come and go, but you can always count on Wiley to provide you the knowledge you need, when and where you need it! WILLIAM J. PESCE PETER BOOTH WILEY PRESIDENT AND CHIEF EXECUTIVE OFFICER CHAIRMAN OF THE BOARD Solutions Manual to Accompany Simulation and the Monte Carlo Method Second Edition Dirk P. Kroese University of Queensland Department of Mathematics Brisbane, Australia Thomas Taimre University of Queensland Department of Mathematics Brisbane, Australia Zdravko I. Botev University of Queensland Department of Mathematics Brisbane, Australia Reuven Y. Rubinstein Technion-Israel Institute of Technology Faculty of Industrial Engineering and Management Haifa, Israel BICENTENNIAL ÍI 1 β O 7 I« ¡©WILEY; I 2 O O 7 ! al Ir BICENTENNIAL WILEY-INTERSCIENCE A John Wiley & Sons, Inc., Publication Copyright © 2008 by John Wiley & Sons, Inc. All rights reserved. Published by John Wiley & Sons, Inc., Hoboken, New Jersey. Published simultaneously in Canada. No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, scanning, or otherwise, except as permitted under Section 107 or 108 of the 1976 United States Copyright Act, without either the prior written permission of the Publisher, or authorization through payment of the appropriate per-copy fee to the Copyright Clearance Center, Inc., 222 Rosewood Drive, Danvers, MA 01923, (978) 750-8400, fax (978) 750-4470, or on the web at www.copyright.com. Requests to the Publisher for permission should be addressed to the Permissions Department, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, (201) 748-6011, fax (201) 748-6008, or online at http://www.wiley.com/go/permission. Limit of Liability/Disclaimer of Warranty: While the publisher and author have used their best efforts in preparing this book, they make no representations or warranties with respect to the accuracy or completeness of the contents of this book and specifically disclaim any implied warranties of merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives or written sales materials. The advice and strategies contained herein may not be suitable for your situation. You should consult with a professional where appropriate. Neither the publisher nor author shall be liable for any loss of profit or any other commercial damages, including but not limited to special, incidental, consequential, or other damages. For general information on our other products and services or for technical support, please contact our Customer Care Department within the United States at (800) 762-2974, outside the United States at (317) 572-3993 or fax (317) 572-4002. Wiley also publishes its books in a variety of electronic formats. Some content that appears in print may not be available in electronic format. For information about Wiley products, visit our web site at www.wiley.com. Wiley Bicentennial Logo: Richard J. Pacifico Library of Congress Cataloging-in-Publication Data is available. ISBN 978-0-470-25879-8 CONTENTS Preface vii Acknowledgments ix I Problems 1 1 Preliminaries 1 2 Random Number, Random Variable, and Stochastic Process Generation 9 3 Simulation of Discrete-Event Systems 15 4 Statistical Analysis of Discrete-Event Systems 19 5 Controlling the Variance 25 6 Markov Chain Monte Carlo 31 7 Sensitivity Analysis and Monte Carlo Optimization 37 8 The Cross-Entropy Method 41 9 Counting via Monte Carlo 47 10 Appendix 51 11 Solutions 53 11 Preliminaries 55 12 Random Number, Random Variable, and Stochastic Process Generation 69 13 Simulation of Discrete-Event Systems 85 14 Statistical Analysis of Discrete-Event Systems 95 15 Controlling the Variance 105 16 Markov Chain Monte Carlo 123 17 Sensitivity Analysis and Monte Carlo Optimization 145 18 The Cross-Entropy Method 151 19 Counting via Monte Carlo 177 20 Appendix 187 v PREFACE The only effective way to master the theory and practice of Monte Carlo simulation is through exercises and experiments. For this reason, we (RYR and DPK) included many exercises and algorithms in Simulation and the Monte Carlo Method, 2nd Edition (SMCM2), Wiley & Sons, New York, 2007. This companion volume to SMCM2 is written in the same style and contains a wealth of additional material: worked solutions for the over 180 problems in SMCM2, lots of Matlab algorithms and many illustrations. Like SMCM2, this solution manual is aimed at a broad audience of students, instructors and researchers in engineering, physical and life sciences, statistics, computer science and mathematics, as well as anyone interested in using Monte Carlo simulation in his or her study or work. One of the main goals of the book is to provide a comprehensive solutions guide to instructors, which will aid student assessment and stimulate further student development. In addition, the book offers a unique complement to SMCM2 for self-study. All too often a stumbling block for learning is the unavailability of worked solutions and actual algorithms. The problem set includes the major topics in Monte Carlo simulation. Starting with exercises that review various important concepts in probability and optimization, the book covers a wide range of exercises in random variable/process generation, discrete-event simulation, statistical analysis of output data, variance reduction techniques, Markov chain Monte Carlo, simulated annealing, sensitivity analysis, cross-entropy methods, and Monte Carlo counting techniques. The original questions from SMCM2 have been added for easy reference. More difficult sections and exercises are marked with an asterisk (*) sign. Our choice of using Matlab was motivated by its ease of use and clarity of syntax. Reference numbers to SMCM2 are indicated in boldface font. For example, Defini- tion 1.1.1 refers to the corresponding definition in SMCM2, and (1.7) refers to equation (1.7) in SMCM2, whereas Figure 1.1 refers to the first numbered figure in the present book. DIRK KROESE, THOMAS TAIMRE, ZDRAVKO BOTEV AND REUVEN RUBINSTEIN Brisbane and Haifa July, 2007 vii ACKNOWLEDGMENTS We thank Gareth Evans for providing the code for Problem 3.8. This book was supported by the Australian Research Council, under Grants DP056631 and DP055895. Thomas Taimre acknowledges the financial support of the Australian Research Council Centre of Excellence for Mathematics and Statistics of Complex Systems. DPK, TT, Z1B, RYR ix PARTI PROBLEMS Solutions Manual for SMCM, 2nd Edition. By D.P. Kroese, T. Taimre, Z.I. Botev, and R.Y. Rubinstein 1 Copyright © 2007 John Wiley & Sons, Inc. CHAPTER 1 PRELIMINARIES Probability Theory 1.1 Using the properties of the probability measure in Definition 1.1.1: A probability P is a rule that assigns a number 0 < Ψ(Α) < 1 to each event A, such that Ρ(Ω) = l and such that for any sequence Ai, A,... of disjoint events t 2 prove the following results. (a) F(Ac) = l-F(A). (b) Ψ(Α U B) = P(i4) + P(JB) - P(i4 Π B). 1.2 Prove the product rule (1.4): For any sequence of events A\, A,..., A , 2 n Ψ(Αι · · · Λ„) = ?(Αι) Ψ(Α | Αι) Ψ(Α | Λι A) · · · Ρ(Λ \A · · · Λ -ι) , 2 3 7 η X η using the abbreviation Λ1Λ2 · · - Ak = Ai Π Λ2 Π · · · O Λ*. for the case of three events. Solutions Manual for SMCM, 2nd Edition. By D.P. Kroese, T. Taimre, Z.I. Botev, and R.Y. Rubinstein 1 Copyright © 2007 John Wiley & Sons, Inc. 2 PRELIMINARIES 1.3 We draw three balls consecutively from a bowl containing exactly five white and five black balls, without putting them back. What is the probability that all drawn balls will be black? 1.4 Consider the random experiment where we toss a biased coin until heads comes up. Suppose the probability of heads on any one toss is p. Let X be the number of tosses required. Show that X ~ G(p). 1.5 In a room with many people, we ask each person his/her birthday, for example, May 5. Let N be the number of people queried until we get a "duplicate" birthday. (a) Calculate F(N > π), π = 0,1,2,.... (b) For which n do we have F(N ζ η) 3* 1/2? (c) Use a computer to calculate E[N]. 1.6 Let X and Y be independent standard normal random variables, and let U and V be random variables that are derived from X and Y via the linear transformation /£7\ _ /sin a —cosa\ fX\ \VJ ~~ \cosa sin a ) \Y) (a) Derive the joint pdf of U and V. (b) Show that U and V are independent and standard normally distributed. 1.7 Let X ~ Εχρ(λ). Show that the memoryless property holds: ¥{X>t + s\X>t) = ¥(X>s) foralls,t>0. 1.8 Let X\, Xi, X$ be independent Bernoulli random variables with success probabilities 1/2,1/3, and 1/4, respectively. Give their conditional joint pdf, given that X\ +X2 +Xz = 2. 1.9 Verify the expectations and variances in Table 1.1 below. Table 1.1 Expectations and variances for some well-known distributions. Dist. E[X] Var(X) Dist. E[X] Var(X) Βίη(π,ρ) ηρ np(l - p) Gamma(α, λ) - ^ Χ-ψ- Ν(μ,σ2) μ σ* Ροί(λ) λ X Beta(a,/3) ^ (o+wt+o+ti i^f- Weib(a,A) m£l Sßfsl - (Eü^)2 Εχρ(λ) I

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