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Scanning Tunneling Microscopy I: General Principles and Applications to Clean and Absorbate-Covered Surfaces PDF

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Preview Scanning Tunneling Microscopy I: General Principles and Applications to Clean and Absorbate-Covered Surfaces

Springer Series in Surface Sciences Editor: Robert Gomer Springer Series in Surface Sciences Editors: G. Ert!, R. Gomer and D. L. Mills Managing Editor: H. K. V Lotsch Physisorption Kinetics 19 Desorption Induced by Electronic 'fransitions By H. J. Kreuzer, Z. W. Gortel DIET IV Editors: G. Betz, P. Varga 2 The Structure of Surfaces Editors: M. A. Van Hove, S. Y. Tong 20 Scanning Tunneling Microscopy I 3 Dynamical Phenomena at Snrfaces, Interfaces General Principles and Applications to Clean and Superlattices and Adsorbate-Covered Surfaces Editors: F. Nizzoli, K.-H. Rieder, R. F. Willis Editors: H.-J. Giintherodt, R. Wiesendanger 2nd edition 4 Desorption Induced by Electronic 'fransitions, DIET II 21 Surface Phonons Editors: W. Brenig, D. Menzel Editors: W. Kress, F. W. de Wette 5 Chemistry and Physics of Solid Surfaces VI 22 Chemistry and Physics of Solid Surfaces VIII Editors: R. Vanselow, R. Howe Editors: R. Vanselow, R. Howe 6 Low-Energy Electron Diffraction Experiment, Theory 23 Surface Analysis Methods in Materials Science and Surface Structure Determination Editors: D. J. O'Connor, B. A. Sexton, By M. A. Van Hove, W. H. Weinberg, C.-M. Chan R. St. C. Smart 7 Electronic Phenomena in Adsorption and Catalysis 24 The Structure of Surfaces III By v: F. Kiselev, O. V. Krylov Editors: S. Y. Tong, M. A. Van Hove, K. Takayanagi, X. D. Xie 8 Kinetics of Interface Reactions Editors: M. Gruuze, H. J. Kreuzer 25 NEXAFS Spectroscopy 9 Adsorption and Catalysis on Trausition Metals By J. StOhr and Their Oxides By V. F. Kiselev, O. v: Krylov 26 Semiconductor Surfaces and Interfaces ByW. Monch 10 Chemistry and Physics of Solid Surfaces VII Editors: R. Vanselow, R. Howe 27 Helium Atom Scattering from Surfaces Editor: E. Hulpke 11 The Structure of Surfaces II Editors: J. F. van der Veen, M. A. Van Hove 28 Scanning Thnneling Microscopy II 12 Diffusion at Interfaces: Microscopic Concepts Further Applications Editors: M. Grunze, H. J. Kreuzer, J. J. Weimer and Related Scanning Techniques Editors: R. Wiesendanger, H.-J. Giintherodt 13 .Desorption Induced by Electrouic 'fransitions, DIETll 29 Scanning Tunneling Microscopy III Editors: R. H. Stulen, M. L. Knotek Theory of STM and Related Scanning Probe Methods 14 Solvay Conference on Surface Science Editors: R. Wiesendanger, H.-J. Giintherodt Editor: F. W. de Wette 15 Surfaces and Interfaces of Solids 30 Concepts in Surface Physics ByH. Liith *) By M. C. Desjonqueres, D. Spanjaard 16 Atomic and Electronic Structure of Surfaces 31 Desorption Induced by Electronic 'fransitions Theoretical Foundations DIET V By M. Lannoo, P. Friedel Editors: A. R. Burns, E. B. Stechel, 17 Adhesion and Friction D. R. Jennison Editors: M. Grunze, H. J. Kreuzer 32 Scanning Tunneling Microscopy 18 Auger Spectroscopy and Electronic Structure and Related Techniques Editors: G. Cubiotti, G. Mondio, K. Wandelt By Bai Chun-Li H.-1. Giintherodt R. Wiesendanger (Eds.) Scanning Tunneling Microscopy I General Principles and Applications to Clean and Absorbate-Covered Surfaces Second Edition With Contributions by D. Anselmetti R. J. Behm P.J.M. van Bentum S. Chiang H.-J. Gtintherodt R. J. Hamers H. J. Hug H. van Kempen Y Kuk H. Rohrer R. Wiesendanger J. Wintterlin With 172 Figures Springer- Verlag Berlin Heidelberg New York London Paris Tokyo Hong Kong Barcelona Budapest Professor Dr. Hans-Joachim Giintherodt Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland Professor Dr. Roland Wiesendanger Institute of Applied Physics, Uniyersitllt Hamburg, Jungiusstrasse 11, 0-20355 Hamburg, Germany Series Editors Professor Dr. Gerhard Ertl Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 0-14195 Berlin, Germany Professor Robert Gomer, Ph.D. The James Franck Institute, The University of Chicago, 5640 Ellis Avenue, Chicago, IL 60637, USA Professor Douglas L. Mills, Ph.D. Department of Physics, University of California, Irvine, CA 92717, USA Managing Editor: Dr. Helmut K. V. Lotsch Springer-Verlag, TIergartenstrasse 17, 0-69121 Heidelberg, Germany ISBN-13:978-3-540-58415-5 e-ISBN-13:978-3-642-79255-7 DOl: 10.1007/978-3-642-79255-7 Cip data applied for. This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is per mitted only under the provisions of the German Copyright Law of September 9,1965, in its current version, and permission for use must always be obtained from Springer-Verlag. Violations are liable for prosecution under the German Copyright Law. © Springer-Verlag Berlin Heidelberg 1992, 1994 The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regula tions and therefore free for general use. 1YPesetting: Macmillan India Ltd., India SPIN 10478881 54/3140-543210-Printed on acid-free paper Preface to the Second Edition Since the first edition of "Scanning 'funneling Microscopy I" has been pub lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent develop ments will be given in an additional Chapter 9. The editors would like to thank all the contributors who have supplied up dating material, and those who have provided us with suggestions for further improvements. We also thank Springer-Verlag for the decision to publish this second edition in paperback, thereby making this book affordable for an even wider circle of readers. Hamburg, July 1994 R. Wiesendanger Preface to the First Edition Since its invention in 1981 by G. Binnig, H. Rohrer and coworkers at the IBM Zurich Research Laboratory, scanning tunneling microscopy (STM) has devel oped into an invaluable surface analytical technique allowing the investigation of real-space surface structures at the atomic level. The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur rent, which flows on application of a bias voltage, to sense the atomic and elec tronic surface structure with atomic resolution! Prior to 1981 considerable scepticism existed as to the practicability of this approach. In the past ten years the field of STM has grown rapidly and is still attract ing researchers from various other fields. This fact is reflected by the ever in creasing number of participants at STM conferences. STM's success is based on it being a powerful local probe, capable of imaging, measuring and manip ulating matter down to the atomic scale in almost any environment: in air, in inert gas atmospheres, in liquids, in ultrahigh vacuum, and from low tempera tures up to several hundred degrees centigrade. Due to its wide applicability, STM has been adopted by many different scientific disciplines including solid state physics, materials research, chemistry, biology, and metrology. The scope VI Preface has broadened even further since the development of related scanning tech niques which are referred to as "SXM" techniques where "X" stands for any kind of interaction between a sharp probe tip and a sample surface. The most developed SXM technique - apart from STM - is scanning force microscopy (SFM), invented in 1986 by G. Binnig, C.F. Quate and Ch. Gerber at Stanford University. SFM also allows the study of surfaces of bulk insulators down to the atomic level - a field where almost all conventional surface analytical techniques have failed. The whole class of SXM techniques facilitates the study of a wide range of nanometer-scale surface properties. The present book is the first of two volumes devoted to STM and related techniques. After an introduction to the field of STM (Chap. 1), H. Rohrer gives his personal historical view of the birth of STM (Chap. 2). The applica tions of STM covered by the first volume include metals (Chap. 3 by Y. Kuk and Chap. 4 by J. Wintterlin and R. J. Behm), semiconductors (Chap. 5 by R. J. Hamers), layered materials (Chap. 6 by R. Wiesendanger and D. Anselmetti), molecular imaging (Chap. 7 by S. Chiang) and superconductors (Chap. 8 by P. J. M. van Bentum and H. van Kempen). The second volume will include fur ther applications of STM in fields such as electrochemistry, biology, and nanometer-scale surface modifications. It will also include the description and applications of related techniques. Finally we plan to present the detailed theory of SXM techniques in a third volume. Our first two volumes on STM and related techniques are intended for researchers and scientists in the various disciplines including physics, chemistry, biology and metrology, and also for graduate students. These two volumes should be helpful to those who are active in the field of STM as well as non-experts who have become interested in these novel techniques. Therefore, it has been the aim to include many representative results together with comprehensive lists of citations to help the reader to navigate through the rapidly growing number of publications in the field of STM. Even under graduate students or readers with little knowledge of the natural sciences should find the two volumes on STM exciting, with their description of a fascinating technique that allows us to visualize the beauty of nature on an atomic scale and the richness of structures at the submicron level. This aspect has surely played more than a chance role in stimulating the rapid development of the STM field. It is a pleasure for the editors to thank all the authors who have contributed to the first two volumes on STM and related techniques. We also acknowledge the pleasant collaboration with Springer-Verlag. Finally, we all thank the inven tors of STM and its relatives and also the manufacturers of the instruments for providing the foundation for the enormous development that has taken place during the past ten years. It is the hope of the editors that these two volumes on STM and related techniques will further stimulate both basic and applied research in this exciting field. Basel, October 1991 H.-J. Guntherodt R. Wiesendanger Contents 1. Introduction By R Wiesendanger and H.-J. Guntherodt (With 5 Figures) 1 1.1 Historical Remarks on Electron Tunneling . . . . . . . . . . . . . . . 1 1.2 STM and Related Techniques .......... -. . . . . . . . . . . . . . . 4 1.2.1 Local Proximal Probes. . . . . . . . . . . . . . . . . . . . . . . . . . 4 1.2.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 1.3 Development of the Field . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 1.4 Prospects for the Future . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 References .... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 2. The Rise of Local Probe Methods By H. Rohrer. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 3. STM on Metals By Y. Kuk (With 19 Figures). . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 3.1 Tunneling Tip . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 3.2 Tunneling Spectroscopies ............................ 20 3.2.1 Current Versus Gap Distance. . . . . . . . . . . . . . . . . . . . . 20 3.2.2 Electronic Structure by dI/dV. . . . . . . . . . . . . . . . . . . . . 22 3.3 Examples on Metal Surfaces. . . . . . . . . . . . . . . . . . . . . . . . . . 25 3.3.1 Surface Structures. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 3.3.2 Dynamics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 3.4 Conclusion. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 4. Adsorbate Covered Metal Surfaces and Reactions on Metal Surfaces By J. Wintterlin and RJ. Behm (With 22 Figures). . . . . . . . . . . . . 39 4.1 Imaging of Adsorbates by STM ....................... 40 4.1.1 Representation ofIndividual Adsorbates . . . . . . . . . . . . 40 4.1.2 Resolution and Corrugation in Closed Adlayers ...... 47 4.1.3 Spectroscopy of Adsorbates . . . . . . . . . . . . . . . . . . . . . . 50 4.2 Processes at the Metal-Gas Interface . . . . . . . . . . . . . . . . . . . 54 4.2.1 Adsorption, Dissociation, Surface Diffusion. . . . . . . . . . 54 4.2.2 Formation of Ordered Adsorbate Layers. . . . . . . . . . . . 58 4.3 Structure Modifications of Metal Surfaces ............... 60 4.3.1 Adsorbate-Induced Reconstructive Transformations ... 60 4.3.2 Oxidation Reactions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 68 VIII Contents 4.4 Epitaxial Growth of Metals on Metal Substrates . . . . . . . . . . 70 4.5 Conclusions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 References .... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 5. STM on Semiconductors By R.J. Harners (With 29 Figures). . . . . . . . . . . . . . . . . . . . . . . . . 83 5.1 Experimental Technique .. . . . . . . . . . . . . . . . . . . . . . . . . . . . 83 5.1.1 Topographic Imaging. . . . . . . . . . . . . . . . . . . . . . . . . . . 83 5.1.2 Tunneling Spectroscopy. . . . . . . . . . . . . . . . . . . . . . . . . 85 5.2 Scanning Tunneling Microscopy/Spectroscopy on Surfaces .. 87 5.2.1 Clean Group IV Semiconductors. . . . . . . . . . . . . . . . . . 87 5.2.2 Clean Compound Semiconductor Surfaces. . . . . . . . . . . 106 5.2.3 Adsorbates and Overlayers on Semiconductors . . . . . . . 113 5.2.4 Chemical Reactions on Semiconductor Surfaces. . . . . . . 119 5.3 Other Tunneling Techniques Applied to Semiconductors . . . . 120 5.3.1 Surface Photovoltage . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 5.3.2 Tunneling-Induced Luminescence . . . . . . . . . . . . . . . . . 123 5.3.3 Potentiometry. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124 5.3.4 Ballistic Electron Emission Microscopy (BEEM) . . . . . . 125 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 126 6. STM on Layered Materials By R. Wiesendanger and D. Anselrnetti (With 44 Figures) . . . . . . . 131 6.1 STM Studies of Graphite. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 132 6.1.1 Site Asymmetry, Energy-Dependent Corrugation, Tunneling Spectroscopy and Electronic Structure of the Graphite Surface ......................... 133 6.1.2 Giant Corrugations, Tip-Sample Interaction and Elastic Response of the Graphite Surface ........ 136 6.1.3 Anomalous STM Images. . . . . . . . . . . . . . . . . . . . . . . . 138 6.1.4 STM Imaging of Defects ............ , . . . . . . . . . . . . 140 6.1.5 STM Studies of Clusters on the Graphite Surface . . . . . 142 6.2 STM Studies of Graphite Intercalation Compounds. . . . . . . . 145 6.2.1 Donor Graphite Intercalation Compounds. . . . . . . . . . 149 6.2.2 Acceptor Graphite Intercalation Compounds. . . . . . . . 154 6.2.3 Interpretation and Comparison with Theoretical Predictions ..................... 154 6.3 STM Studies of Transition Metal Dichalcogenides . . . . . . . . . 157 6.4 STM Studies of Charge Density Waves. . . . . . . . . . . . . . . . . . 161 6.4.1 Charge Density Waves in Transition Metal Dichalcogenides . . . . . . . . . . . . . . . 161 6.4.2 Charge Density Wave Defects and Domains. . . . . . . . . 165 6.4.3 Charge Density Waves in Quasi-One-Dimensional Systems. . . . . . . . . . . . . . . . 170 6.5 STM Studies of High-Tc Superconductors ............... 172 Contents IX 6.6 Concluding Comments. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175 7. Molecular Imaging by STM By S. Chiang (With 19 Figures) . . . . . . . . . . . . . . . . . . . . . . . . . . . 181 7.1 Introduction to STM of Molecules. . . . . . . . . . . . . . . . . . . . . 181 7.2 STM of Chemisorbed Molecules in Ultrahigh Vacuum. . . . . . 182 7.2.1 Coadsorbed Benzene and CO on Rh(111) . . . . . . . . . . . 182 7.2.2 Copper-Phthalocyanine on Cu(loo) and GaAs (110) . . . 186 7.2.3 Naphthalene on Pt(111) . . . . . . . . . . . . . . . . . . . . . . . . . 188 7.3 STM of Alkanes and Their Derivatives. . . . . . . . . . . . . . . . . . 191 7.3.1 Cadmium Arachidate and Other Langmuir-Blodgett Films. . . . . . . . . . . . . . . 191 7.3.i n-Alkanes on Graphite . . . . . . . . . . . . . . . . . . . . . . . . . . 194 7.3.3 Alkylbenzenes on Graphite. . . . . . . . . . . . . . . . . . . . . . . 195 7.4 STM of Liquid Crystals. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197 7.4.1 Alkylcyanobiphenyls............................ 197 7.4.2 Other Liquid Crystals. . . . . . . . . . . . . . . . . . . . . . . . . . . 199 7.5 STM of Polymers .................................. 200 7.5.1 PODA, PMMA, and PMPS on Graphite. . . . . . . . . . . 200 7.5.2 Polyethylene on Graphite ....................... 202 7.6 Other Molecules. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 202 7.7 Conclusions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 203 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 203 8. STM on Superconductors By P.J.M. van Bentum and H. van Kempen (With 21 Figures). . . . 207 8.1 Theory of Tunneling into Superconductors. . . . . . . . . . . . . . . 208 8.1.1 Coulomb Blockade. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 214 8.2 Low Temperature STM Spectroscopy on Classical Superconductors . . . . . . . . . . . . . . . . . . . . . . . . . 215 8.3 Vortices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 216 8.4 Organic Superconductors ............................ 220 8.5 STM Topography on High-T Superconductors. . . . . . . . . . . 221 c 8.5.1 Granularity and Growth Structures. . . . . . . . . . . . . . . . 221 8.5.2 Potentiometry. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 223 8.5.3 Incommensurate Modulation. . . . . . . . . . . . . . . . . . . . . 224 8.6 STM Spectroscopy on High-Tc Superconductors . . . . . . . . . . 226 8.6.1 Normal State Spectroscopy. . . . . . . . . . . . . . . . . . . . . . . 226 8.6.2 STM Spectroscopy of the Superconducting State. . . . . . 229 8.6.3 Energy Gap .................................. 230 8.7 Concluding Remarks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 238 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 239 Subject Index. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 243 X Contents 9. Recent Developments By Y. Kuk, J. Wintterlin, R. J. Behm, S. Chiang, H.-J. GUntherodt, H. J. Hug (With 13 Figures) ............... 243 9.1 STM on Metal Surfaces ............................... 243 9.2 Adsorption on Metal Surfaces ......................... 245 9.2.1 Dynamics of Surface Processes ................... 245 9.2.2 Adsorbate Structures ............................ 248 9.2.3 Adsorbate-Induced Reconstructions ............... 248 9.2.4 Phase 1tansitions ............................... 252 9.2.5 Metal-on-Metal Epitaxy .......................... 253 9.3 Molecular Imaging by STM ........................... 258 9.3.1 STM of Molecules on Metals in Ultrahigh Vacuum .. 258 9.3.2 Naphthalene, Azulene and Methylazulenes on Pt(l11) 259 9.3.3 Benzene on Pt(111) ............................. 262 9.3.4 Ethylene on Pt(111) ............................. 262 9.3.5 C on Au(111) and Cu(111) ...................... 265 60 9.3.6 Conclusions .................................... 267 9.4 STM on Superconductors ............................. 268 9.4.1 STM on Conventional Superconductors ............ 268 9.4.2 STM on High~ c Superconductors ................. 269 9.4.3 Scanning Probe Microscopy on High-Tc Superconductors ................................ 269 References .............................................. 269 Subject Index 277

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Since the first edition of "Scanning 'funneling Microscopy I" has been pub­ lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent d
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