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Reflectance Spectroscopy: Principles, Methods, Applications PDF

371 Pages·1969·12.759 MB·English
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Gustav KortUm Reflectance Spectroscopy Principles, Methods, Applications Translated from the German by James E. Lohr, Philadelphia With 160 Figures Springer-Verlag New York Inc. 1969 Professor Dr. Gustav Kortum Institut f1ir Physikalische Chemie der Universitat 74 Tiibingen, WilhelmstraBe 56 lSBN-13: 978-3-642-88073-5 e-lSBN-13: 978-3-642-88071-1 DOT: 10.1007/978-3-642-88071-1 All rights reserved. No part of this book may be translated or reproduced in any form without written permission from Springer-Verlag. © by Springer-Verlag Berlin-Heidelberg 1969. Library of Congress Catalog Card Number 79-86181 Softcover reprint of the hardcover 1s t edition 1969 The use of general descriptive names, trade marks, etc. in this publication, even if the former are not especially identified, is not be taken as a sign that such names, as understood by the Trade Marks and Merchandise Act, may accordingly be used freely by anyone Title-No. 1605 Preface Reflectance spectroscopy is the investigation of the spectral composi tion of surface-reflected radiation with respect to its angularly dependent intensity and the composition of the incident primary radiation. Two limiting cases are important: The first concerns regular (specular) reflection from a smooth surface, and the second diffuse reflection from an ideal matte surface. All possible variations are found in practice between these two extremes. For the two extreme cases, two fundamentally different methods of reflectance spectroscopy are employed: The first of these consists in evaluating the optical constants n (refractive index) and x (absorption index) from the measured regular reflection by means of the Fresnel equations as a function of the wave length A. This rather old and very troublesome procedure, which is incapable of very accurate results, has recently been modified by Fahren fort by replacing the air-sample phase boundary by the phase boundary between a dielectric of higher refractive index (n1) and the sample (n2). If the sample absorbs no radiation and the angle of incidence exceeds a certain definite value, total reflection occurs. On close optical contact between the two phases, a small amount of energy is transferred into the less dense phase because of diffraction phenomena at the edges of the incident beam. The energy flux in the two directions through the phase boundary caused by this is equal, however, so that 'total reflection takes place. On the other hand, if the sample absorbs light, a fraction of the radiation energy transferred is lost, and the total reflection is attenuated. This phenomenon has proved extremely valuable in the evaluation of the absorption spectra of liquid and solid materials, especially in the infrared region ("internal" reflectance spectroscopy). It is described in Chapter VIII. The second method, diffuse reflectance from matte surfaces, assumes that the angular distribution of the reflected radiation is isotropic; that is, that the density of the reflected radiation (surface brightness) is directionally independent. This involves the validity of the Lambert Cosine Law. Two conceptions are possible for the occurence of this isotropic angular distribution: For particle diameters much greater than the wavelength, the radiation is partly reflected by means of regular reflection at elementary mirrors (crystal surfaces) inclined statistically at all possible angles to the macroscopic surface. It also partly penetrates into the inside of the sample where it then undergoes numerous reflec tions, refractions, and diffractions at the irregularly located particles, finally emerging diffusely from the surface. For particle diameters of IV Preface the order of the wavelength, scattering occurs. This scattered radiation is angularly distributed according to Mie's theory of single scattering at gases or colloids and is by no means isotropic. For multiple scattering, there is no theory at present. It can be shown qualitatively, however, that for a sufficiently large number and a sufficiently thick layer of closely packed particles, an isotropic scattering distribution can still be anticipated. This too can be confirmed by measurements made under suitable conditions. As no rigorous theory of multiple scattering exists, many authors have attempted to develop a phenomenological theory of absorption and scattering of such tightly packed particle layers. To describe radiation transfer in a simultaneously scattering and absorbing medium, one divides the radiation field into two or more opposing radiation paths and describes the change in radiation intensity in an increment ds by means of two constants, the absorption coefficient and the scattering coefficient. These constants are regarded as characteristic properties of the layer per unit thickness and may be determined from measurements of re flectance and transmittance on such layers. These two-constant theories lead in general to related formulas, the most general and comprehensive of which being that of Kubelka and Munk, which will be thoroughly treated in the course of this book. Under suitable conditions, this theory is particularly useful for representing experimental results. The importance of reflectance spectroscopy for quantitative and qualitative analysis of crystalline powders, pigments, and solid dyes, as well as for numerous problems concerning molecular structure, adsorp tion, catalysis at surfaces, Ligand Field Theory, kinetics of reactions at surfaces or of solid materials, photochemistry, the determination of optical constants (n and x), etc., has increased enormously in recent years. Actually, measurements of diffuse reflectance have been carried out over several decades, but the method was only rarely fully exploited, and in many cases was employed rather uncritically. The purpose of the present book is to investigate theoretically and demonstrate by means of experimental results the capabilities of diffuse and internal reflectance spectroscopic techniques. The effects of ex ternal parameters such as particle size, regular parts of reflection, con centration of absorbing components, moisture content, effect of addi tional phase boundaries such as covering glasses, etc, on the results obtained from these techniques will also be demonstrated. The conclusion must be that reflectance spectroscopy deserves its proper place among other spectroscopic methods and is capable of solving numerous problems only difficultly or not at all soluble by other available methods. TUbingen, August 1968 G. KortUm Contents Chapter I. Introduction Chapter II. Regular and Diffuse Reflection . . . . 5 a) Regular Reflection at Non-Absorbing Media 5 b) Total Reflection ............ 13 c) Regular Reflectance at Strongly Absorbing Media 21 d) Definition and Laws of Diffuse Reflection 25 e) Experimental Investigation of Diffuse Reflection at Non- Absorbing Materials . . . . . . . . . . . . . 33 f) Diffuse Reflectance at Absorbing Materials 55 g) Dependence of Remission Curves on Particle Size 58 Chapter III. Single and Multiple Scattering . . . . . . 72 a) Rayleigh Scattering ............. 73 b) Theory of Scattering at Large Isotropic Spherical Particles 81 c) Multiple Scattering ................ 94 d) The Radiation-Transfer Equation . . . . . . . . .. 100 Chapter IV. Phenomenological Theories of Absorption and Scattering of Tightly Packed Particles . . . . . . . . 104 a) The Schuster Equation for Isotropic Scattering ..... 104 b) The Kubelka-Munk Exponential Solution . . . . . 106 c) The Hyperbolic Solution Obtained by Kubelka and Munk . 116 d) Use of Directed Instead of Diffuse Irradiation . . . .. 127 e) Consideration of Regular Reflection at Phase Boundaries. 130 f) Absolute and Relative Measurements . . . . . . . .. 137 g) Consideration of Self-Emission or Luminescence . . .. 150 h) Attempts at a Rigorous Solution of the Radiation-Transfer Equation . . . . . . . . . . . . . . . . . . . . . . 156 i) Discontinuum Theories ............... 163 Chapter V. Experimental Testing of the "Kubelka-Munk" Theory. 170 a) Optical Geometry of the Measuring Arrangement .... 170 b) The Dilution Method ................ 175 c) Concentration Dependence of the "Kubelka-Munk" Function F(Roo) . . . . . . . . . 178 d) The Typical Color Curve . . . . . . . . . . . 186 e) Influence of Cover Glasses .......... 189 f) Scattering Coefficients and Absorption Coefficients 191 VI Contents g) Influence of Scattering Coefficients on the "Typical Color" Curve" . . . . . . . . . . . . . . . . . . . . .. 210 h) Particle-Size Dependence of the Kubelka-Munk Function. 213 Chapter VI. Experimental Techniques 217 a) Test of the Lambert's Cosine Law 217 b) The Integrating Sphere . . . . . 219 c) Measuring Apparatus ..... 221 d) Measurements with Linearly Polarized Radiation 231 e) The Measurement of Fluorescent Samples 232 f) Influence of Moisture on Reflectance Spectra 234 g) Preparation of Samples for Measurement . . 237 h) Adsorption from the Gas Phase and from Solution 242 i) Measurements in the Infrared 245 k) Discussion of Errors . . . . . . . . . . . . . 250 Chapter VII. Applications ..... . . . . . . . . 253 a) The Spectra of Slightly Soluble Substances, or Substances that are Altered by Dissolution. . . . . . . . . ... . . 253 b) Spectra of Adsorbed Substances . . . . . . . . . . . . 256 Acid-Base Reactions between Adsorbed Substance and the Adsorbent . . . . . . . 257 Charge Transfer Complexes . 262 Redox Reactions ..... 265 Reversible Cleavage Reactions 266 Surface Area Determination of Powders 270 Establishment of Equilibria and Orientation at Surfaces 273 Photochemical Reactions . . . 278 c) Kinetic Measurements . . . . . 281 d) Spectra of Crystalline Powders 285 e) Dynamic Reflectance Spectroscopy 288 f) Analytical Photometric Measurements 290 g) Color Measurement and Color Matching 301 Chapter VIII. Reflectance Spectra Obtained by Attenuated Total Reflection . . . . . . . . . . . . . . . . . 309 a) Determination of the Optical Constants n and x 309 b) Internal Reflection Spectroscopy 313 c) Methods . . . . . . . . . . . . . . . 319 d) Applications ............. 329 Appendix: Tables of the Kubelka-Munk-Function 337 Tables of sinh-l x; cosh-1 x; coth-1 x 350 Subject Index 357 Chapter I. Introduction The term absorption spectroscopy is used to denote the qualitative or quantitative measurement of the absorbance of a material as a func tion of the wavelenght or wavenumber. With quantitative measurements using a parallel beam of light the so-called "transmittance" of a plane- parallel layer, / = - T(l) (1) /0 is measured, where / and /0 denote the radiation flux after and before the transmission of the radiation through the absorbing layer 1. Even a measurement of this order of simplicity, however, involves certain com plications. If a continuous beam of light enters into a homogeneous medium bounded by plane-parallel windows, it is partially reflected at each phase boundary, while within the medium it is partially absorbed and partially scattered. If we are dealing with gases or dilute solutions, the energy loss due to reflection at the phase boundaries can be eliminated to a large extent by suitable experimental measures: the radiation is allowed to pass successively through two identical cells, one of which contains the ab sorbing solution or gas, and the other the non-absorbing solvent, or air at the same pressure. The reflection losses are then identical to within a very small difference due to the different refractive indices of the dilute solutions and the solvent, or of the two gases. This small difference usually lies well within the limits of errors of the measuring methods. For concentrated solutions, pure liquids or transparent solids (crystals, glasses, foils, etc.) for which the foregoing is not true, the reflection losses at the phase boundaries can be eliminated by irradiating the absorbing material in various layer thicknesses 2. The intensity ratio A/I/o then, 90rresponding to the difference in the layer thick ness, gives the true transmittance, since the reflection losses for both measurements are identiCal. In this case, when the reflection losses have been eliminated, the value of T defined by means of Eq. (1) is called the "true" or "internal" transmittance. It is not possible, on the other hand, to eliminate the radiation loss caused by scattering by the dissolved molecules or by scattering differ- 1 For methods of spectroscopic measurement see KortUm, G.: Kolorimetrie, Photometrie und Spektrometrie (Colorimetry, photometry and spectrometry), 4th edition. Berlin-Gottingen-Heidelberg: Springer 1962. 2 Schachtschabel, K.: Ann. Physik 81 (4), 929 (1926). 1 KortUm, Reflectance Spectroscopy 2 I. Introduction ences by different gases, but these errors also lie within the limits of error of the measuring methods, provided that we are concerned with genuine moleculary dispersed solutions, and provided that the trans mittance does not drop below ca. 0.03 %. Very large errors arise, however, through scattering in colloidal solutions, where radiation losses due to absorption and scattering cannot be separated because the scattering depends on the shape, and particularly on the size and concentration of the collodial particles as well as on the wavelength of the radiation, and can only be evaluated theoretically in simple cases (see p. 81 ff.). The difficulties become still greater when attempts are made to obtain from scattered transmission the absorption spectrum of solid powdered materials such as pigments, suspensions, substances adsorbed at solid surfaces, etc. Recently, infrared spectra of adsorbed molecules have often been obtained directly in this way. Because of the indefinite layer thickness, however, only qualitative results can be expected from such experiments. That satisfactory results can be obtained in this way depends upon the scattering coefficients being relatively low and the particles being small compared with the wavelength of the radiation used. This is particularly true in the range of medium and long-wave infrared radiation By immersing the powder to be investigated in a suitable 3. non-absorbing liquid of similar refractive index, it is possible to largely remove the radiation loss due to scattering. This procedure has often been employed in the infrared using such immersion liquids as paraffm, perfluorokerosine, Nujol, and others. Apart from the frequently encounter ed difficulty in finding suitable liquids, the indefinite thickness of the layer traversed remains a problem, so that this method also only gives qualitative results. The so-called KBr-method brought some progress. 4 This involves grinding the finely divided powder under investigation with an excess of solid potassium bromide (or silver chloride) and pressing the mixture under high pressure into transparent plates whose absorbance is measured relative to a plate of the same thickness made from the pure dilution material. The limitation of this procedure for quantitative evalua tion arises from radiation losses which are not completely removable, partly due to the difference in refractive index in the sample and dilution medium, partly to the inadequate distribution of the sample, and partly also to traces of moisture which are very difficult to remove 5. 3 This is the reason for the well-known ability of infrared radiation to penetrate through mist and haze. 4 Stimson, M. M., and M. J. O'Donnell: J. Am. Chern. Soc. 74, 1805 (1952). Schiedt, U., and H. Reinwein: Z. Naturforsch. 7b, 270 (1952); 8b, 66 (1953). 5 See, for example, Lejeune, R., and G. Duyckaerts: Spectrochim. Acta 6, 194 (1954). I. Introduction 3 The condition that the particle dimensions must be small compared with the wavelength is no longer true in the short-wave infrared and especially not in the visible and ultraviolet region. Scattering then ex ceeds absorption so greatly that it is no longer possible to obtain a useful transmission spectrum without taking account of scattering. The question therefore arises whether it is possible from the measured trans mittance or diffuse reflectance of a simultaneously scattering and ab sorbing layer, or from one of these measurements alone, to obtain the absorption spectrum of the material under investigation. This question is not merely of theoretical interest, but of the greatest practical importance for the characterizing and standardizing of in dustrial products of all kinds (pigments, synthetic plastics, textiles, papers, paints, etc.); that is, for the quantitative physical analysis of "color". In addition, the solution of this problem could facilitate the investigation of numerous other problems for which hitherto suitable methods have been lacking. Examples which may be mentioned are: the kinetic investigation of reactions between solid materials, color changes of solid materials under the influence oftemperature and pressure (thermochromism and piezochromism), the influence of the adsorption of molecules on solid ,phases on their spectrum, the catalytic influence of solid surfaces on the reactivity of adsorbed molecules with gases or with the surface itself, the photochemistry of adsorbed materials, the quantitative analysis of mixed solid materials, the quantitative analysis of paper and thin-layer chromatograms, etc. To separate the effect of scattering from absorption on the spectro scopic composition of the radiation flux reflected or transmitted by a scattering and absorbing layer, a number of theories have been developed, all of which commence with the transmittance and reflectance of mono chromatic radiation in an infinitesimal layer. The differential equations used are then integrated over the total thickness of the"layer. This leads to suitable formulas which may be tested experimentally, provided that the initial equations are not too complicated, that is, do not contain so many constants which must later be evaluated from the measurements as to be impracticable. This means that simplifying assumptions which can never be exactly fulfilled in practice must be made. This necessarily limits the applicability of the formulas developed. In the majority of the theories, only two constants are introduced, the absorption coefficient and the scattering coefficient, by means of which transmittance and reflectance of a layer of finite thickness may be expressed. These so-called two-constant theories lead in general to similar formulas which may frequently be converted into each other by interrelating the parameters used. They are intended to provide a solution for the problem mentioned above: that is, to determine from the reflectance and scattered trans- 1* 4 I. Introduction mittance of a simultaneously absorbing and scattering layer the ab sorption spectrum of the substance in question. They prove in practice to be useable in this way when suitable measuring conditions are main tained. In particular success has been achieved in obtaining the so-called "typical color curve" of the material in question from the diffuse reflectance of an "infinitely thick" layer (semi-infinite medium) which is no longer transparent. The curve obtained is frequently in agreement with the true spectrum after a parallel-displacement in the ordinate. By this means, it is possible not only to obtain the quantitative physical analysis of pigments, but also to approach the solution of numerous problems of the kind already referred to above.

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