Table Of Content

INDEX FOR VOLUME 65 1/ ( 4 Béckenholt, Ulf. Mixed-effects anlsyses of rank-ordered data. 45-62 Bechger, Timo M., Verhelst, Norman D, & Verstralen, Huub, H.F.M. /dé f 1 gistic test models 3§7-—372 Béguin, A.A., & Glas, C.A.W. MCMC estimation and so m l-fitan multidimen IRT moe 514-562. Bentler, Peter M. (see Satorra, Albert) Bickel, Peter, Buyske, Steven, Chang, Huahua, & Ying, Zhiliang. On n m informat d matching difficulty vith ability. 69 Brusco, Michael J., & Cradit, J. Dennis. A Brusco, Michael J., & Stahl, Stephanie 1 ct wulti ctive nbinatorial data analysis. 5-24 3rusco, Michael J., & Stahl, Stephanie ympact inte rogra } ets of stimuli from confusion matrices. 405420 Buyske, Steven (see Bickel, Peter) Chang, Huahua (see Bickel, Pete Clarkson, Douglas B., & Gonzalez, Cradit, J. Dennis. (see Brusco De Boeck, Paul. (see I Douglas, Je Elliott, Peter. (see Robins, Garry Fox, Jean-Paul, & Glas, Cees A.W. B. Giudici, Paolo, & Stanghellini, Elena. Ba Glas, C.A.W. (see Béguin Glas, Cees A.W. (see Fo Gonzalez, Richard. (see Gordon, A.D., & Vichi Hancock, Gregory R. Eff ‘ ampl leterminatio 5 ‘ mimic approaches to between-grou »s fp | 5 tine of of meansI S ON ¢ Hemker, Bas T. On measureme? t properties of continual ), Edward Hak-sing. Testing for local dependency tr Jennrich, Robert |. A simple general procedure fo! Kamakura, Wagner A. (see Wedel, Michel) Laake, Petter. (see Skrondal, Anders) Lee, Sik-Yum. (see Zhu, Hong-Tu) Leenen, Iwin, Van Mechelen, Iven, & De Boeck, Paul. Models fe } j classe alysis. 389-404 Maydeu-Olivares, Albert. Limited information estimation and } d comparison under multiple } ideme i SadMNPUNL 209 227 Meijer, Rob R. (see Sijtsma, Klaas) Mendoza, Jorge L. (see Staffer, Joseph M.) Molenaar, Peter C.M., & Nesselroade, John R. Rotation in the dynamic f / f tivariate stationary time SETTLES 99. 107 Nesselroade, John R. (see Molenaar, Peter C.M.) Ogasawara, Haruhiko. Standard errors of fit indices using residuals i Pattison, Phlippa. (see Robins, Garry) Ponocny. Ivo. Nonparametric goodness-of-fit tests for the Rasch mod Robins, Garry, Pattison, Phlippa, & Elliott, Peter. Network models for si luence p) 61 Satorra, Albert. & Bentler, Peter M. A scaled chi-square test statistic f ? t st t s. 507-514. Segall, Daniel O. General ability measurement: An application of multid sio} tem response theory. 79 Sijtsma, Klaas, & Meijer, Rob R. The person response function as a toe son-fit res 1. 191-207 Skrondal, Anders, & Laake, Petter. Regression among factor scores. 563 Snijders, Tom A.B. Asymptotic null distribution of person fit statistics with estimated perso ter. 331-342. Staffer, Joseph M., & Mendoza, Jorge L. The proper sequence for correctit rrelation cot nts for range restriction and unreliability. 63-68. Stahl, Stephanie. (see Brusco, Michael J.) Stanghellini, Elena. (see Giudici, Paolo) Thissen, David. Psychometric engineering as art. 473-486 Van Mechelen, Iven. (see Leenen, win) Verheist, Norman D. (see Bechger, Timo M.) Verstralen, Huub H.F.M. (see Bechger, Timo M.) Vichi, M. (see Gordon, A.D.) 614 PSYCHOMETRIKA Wedel, Michel, & Kamakura, Wagner A. Factor analysis with (mixed) observed and family. 515-530 Wilcox, Rand R. Pairwise comparisons of trimmed means for two or more groups. 34 Ying, Zhiliang (see Bickel, Peter) Zhu, Hong-Tu, & Lee, Sik-Yum. A Bayesian analysis of infinite mixtures in the LISREI Notes and Comments Akkermans, Wies. (see Bechger, Timo) Bechger, Timo M. & Akkermans, Wies. A note of the equivalence of the graded respo 461-464 Reviews Ackerman, Terry. Review of Handbook of Modern Item Response Theory by Win an inden and Ronald K. Hambleton. 316—320 Kim, Jee-Seon. Review of Modeling Longitudinaaln d Multilevel Data by Todd D. Litth ai hnat and Jiirgen Baumert (Eds.). 311-31 Mellenbergh, Gideon. Review of The New Rules of Measurement: What every ps by Susan E. Embretson and Scott L. Hershberger (Ed.). 153-155. Wainer, Howard. Review of The Grammar of Graphics by Leland Wilkinson. 307 Errata Mendoza, Jorge L. (see Stauffer, Joseph M.) Stauffer, Joseph M. & Mendoza, Jorge L. The proper sequence for correction corn and unreliability. 593-594