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Springer Series in Optical Sciences 209 Michael Bukshtab Photometry, Radiometry, and Measurements of Optical Losses Second Edition Springer Series in Optical Sciences Volume 209 Founded by H. K. V. Lotsch Editor-in-chief William T. Rhodes, Florida Atlantic University, Boca Raton, FL, USA Series editors Ali Adibi, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA Toshimitsu Asakura, Hokkai-Gakuen University, Sapporo, Hokkaido, Japan Theodor W. Hänsch, Max-Planck-Institut für Quantenoptik, Garching, Bayern, Germany Ferenc Krausz, Garching, Bayern, Germany Barry R. Masters, Cambridge, MA, USA Katsumi Midorikawa, Laser Technology Laboratory, RIKEN Advanced Science Institute, Saitama, Japan Bo A. J. Monemar, Department of Physics and Measurement Technology, Linköping University, Linköping, Sweden Herbert Venghaus, Ostseebad Binz, Germany Horst Weber, Berlin, Germany Harald Weinfurter, München, Germany Springer Series inOptical SciencesisledbyEditor-in-ChiefWilliamT. Rhodes, Georgia Institute of Technology, USA, and provides an expanding selection of research monographs in all major areas of optics: – lasers and quantum optics – ultrafast phenomena – optical spectroscopy techniques – optoelectronics – information optics – applied laser technology – industrial applications and – other topics of contemporary interest. With this broad coverage of topics the series is useful to research scientists and engineers who need up-to-date reference books. More information about this series at http://www.springer.com/series/624 Michael Bukshtab Photometry, Radiometry, and Measurements of Optical Losses Second Edition 123 Michael Bukshtab Optoelectronics Research Centre University of Southampton Southampton UK ISSN 0342-4111 ISSN 1556-1534 (electronic) SpringerSeries inOptical Sciences ISBN978-981-10-7744-9 ISBN978-981-10-7745-6 (eBook) https://doi.org/10.1007/978-981-10-7745-6 LibraryofCongressControlNumber:2017962029 1stedition:©SpringerScience+BusinessMediaB.V.2012 2ndedition:©SpringerNatureSingaporePteLtd.2019 Thisworkissubjecttocopyright.AllrightsarereservedbythePublisher,whetherthewholeorpart of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission orinformationstorageandretrieval,electronicadaptation,computersoftware,orbysimilarordissimilar methodologynowknownorhereafterdeveloped. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publicationdoesnotimply,evenintheabsenceofaspecificstatement,thatsuchnamesareexemptfrom therelevantprotectivelawsandregulationsandthereforefreeforgeneraluse. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authorsortheeditorsgiveawarranty,expressorimplied,withrespecttothematerialcontainedhereinor for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictionalclaimsinpublishedmapsandinstitutionalaffiliations. ThisSpringerimprintispublishedbytheregisteredcompanySpringerNatureSingaporePteLtd. The registered company address is: 152 Beach Road, #21-01/04 Gateway East, Singapore 189721, Singapore Preface to the Second Edition The second edition of the book “Applied Photometry, Radiometry, and MeasurementsofOptical Losses”includes avastmajorityofmaterial publishedin its first edition in 2012, while also expanding and extending some of its sections. Due to continuous enhancement of measurement techniques and methodologies, this edition adds Chap. 12 on the Spectroscopic Interferometry, including FTIR, Brillouin Scattering, Frequency Comb, Terahertz Spectroscopies, plus upgrades paragraph 6.4 with techniques for Enhancement of Sensitivity and Mitigation of FluorescenceinRamanScattering.Theseadditionscouldbeseenasbroadeningthe scope of the book somewhat beyond commonly assigned subject areas of photo- metric and radiometric studies and expanding measurement techniques into far-infrared and even terahertz spectral regions, overlapping with spectral inter- ferometry,biomedicalandbiotechsensing,andmore;althoughsuchdevelopments, whileenhancingtechniquesandmethodsoflaserspectroscopy,exemplifyessential broadening of spectroradiometric methodologies via lasers or newer sources or detectors of optical radiation. Iwishtoexpressmysincereappreciationtoallreadersofthefirsteditionofthis book,and,especially,toJonathanBarlettaforpointingouttoanerroneoustypoin Eqs. (2.1)–(2.3). I sincerely appreciate the curtesy of David Wright for thoroughly reviewingsectionsofthenewlywrittenChap.12ofthe2ndeditionandamgrateful to Mikhail Smirnov for helpful suggestions. This edition is dedicated to my dearest and ever caring mother, to my dear brotherandtoAllaandRoberta,tomylovelydaughterandtoPierre,andtomytwo loveliest granddaughtersAnastasiaandLaetitia,andalsotothememoryofAvrush Shwartsman. Cranbury, CT, USA and Southampton, England Michael Bukshtab v Preface to the First Edition The broad variety of technical challenges has attracted the lasting attention of optical scientists and engineers to develop sensitive and accurate optical mea- surements – such as creating pure colors and making efficient laser systems or sensors. This interest resulted in the appearance of diverse measurement methods andtechnologies,oftenclaimingunprecedentedandevencontradictingresults,with theindividualattentionfocusedonachievingeitherhighspecularreflectance,direct transmittance, low absorptance, scattering, birefringence, or phase dispersion. Increasedusageoflasersandpulse-modulatedlightsourcesintensifiedtheinterest– as a result, an orientation dilemma exists. Publications on the subject (see [0.1– 0.47]) describe contrasting methods of measurements or implementations, and the methods can often appear to be different in terms of physical principles and real- ization conditions,but,atfirstsight,mayremainalmostindistinguishablefromthe standpoint of the accuracy and sensitivity achieved. In this book, the analysis of measurement methods and techniques is given not onlybythetotalityoflightsources,detectors,andrecordingsystems,butratherby detailed classification of the measurements performed and by the optimized con- ditions for therecognitionoftheoptical property examined,bytheobjectsandthe aims of the study, by the boundaries of applicability, by advantages and short- comings, and by the measurement methods, appropriate devices, and the exami- nation systems themselves. The main considerations are given to measurements of the optical properties of highly reflecting mirrors for laser resonators and high-resolutioninterferometers,transparentopticalcrystals,glasses,andfibers,and the materials for their fabrication. Substantial features for studying weakly absorbingliquidsandgases,includingairpollutions,areexaminedaswell.Inspite of the existence of a fairly ample literature on radiometry and light measurements, eventheconventionalmaterialisrevisitedfromthepointofexecutingthemethods of photometric and radiometric measurements. Analyzed techniques are separated by determination of the parameters and extents of radiation and the optical prop- erties of bodies and substances in that radiation. Special attention is given to approachesinvolvinglaserradiation.Thehighspectraldensityoflaserlightandthe broad dynamics of modern photodetectors permit one to perform experiments vii viii PrefacetotheFirstEdition which are incompatible with routine radiometric and photometric methodologies, reaching sensitivity or accuracy unattainable with conventional approaches. At the same time, high spatial and temporal coherence, and sometimes unavoidable instabilities of laser radiation, complicate the measurement processes. This book provides an analysis of and solutions to the various measurement situations and describes ways to design some nontrivial equipment. The sequence adopted for the analysis in the second part of the book reflects developmentprocessesfortheadvancedlowopticallossmeasurementtechnologies– fromtheconventionalspectrophotometricmethods,reachingupto10−3–10−5cm−1 sensitivity, to modern techniques, sensing losses down to 10−6 cm−1 and lower. Certain advanced methods may not necessarily lead to increasing sensitivity for a given study of optical loss and the accuracy of detection, while the increased diversityofoptical-examinationtechniquesbeingdevelopedcouldbecausedbythe difficultiesindetectingchangesofopticalcharacteristicsatlevelsofthousandthsand millionthsofthemeasuredextents.Thechallengesareenhancedbydependenciesof measured optical losses notonly on theproperties of analyzed objects, but also on specific measurement conditions, such as light wavelength, its angle of incidence andstateofpolarization,viewingandirradiationconditions,etc.Athighexposureto laser light, the expected outcome can be influenced by the power extents of an incident beam of such laser radiation. The results of measurements may also be dependentonthespatialconfigurationusedtostudysamplesurfacesandlocalization ofthelightbeamitself.Anydesirableincreaseofmeasurementaccuracy,achieved by some decrease of locality, could make informativity higher only by way of not resolvingthus concealed nonuniformity of theobject being studied. Traditional photometric methods do not possess extremely high sensitivity without special measures being taken, but they allow one to obtain information about the characteristics of an object under study as a whole by a direct mea- surement. Application of laser light with low divergence and high power density enables spatial and spectral selectivity of conventional measurements, thus expandingtheprospectsoflow-lossdetection.Exceptionally,highsensitivitytothe bulkorsurfaceabsorptionmayberealizedbyfocusingalaserbeamintotheobject being studied, while registering changes of the object’s temperature, its index of refraction, or noticing laser-induced birefringence. Under certain conditions, the process of stimulated emission of light is characterized by high sensitivity to selective optical losses introduced into a laser resonator, but it could be obstructed even by low-reflecting surfaces of the object being studied. Furthermore, the tasks of identifying absolute optical losses remain challenging and may require added comparisons with known standards. Consequently,thisbookstartsbyderivingthemainradiometricandphotometric laws,definitions,andassumptions,andanalyzingapparentlysimplemethodologies, followed by more complex and sensitive optical techniques, while highlighting, within the bounds of every method, the exact features of each measurement pro- cedure. The methods for low-loss detection – from interferometric, calorimetric, resonator, polarization, phase-shift and ring-down decay, wavelength- and frequency-modulation to pulse-separation, resonant, multipass, emissive, and PrefacetotheFirstEdition ix colorimetric ones – are analyzed and compared for the applicability of studying free-space and polarization optics, fibers, and waveguides. Ultimately, the content returns to the direct laser and spectroradiometric methods, but executed with the knowledge sequentially accumulated by experience of precision optical measure- ments. Every section of the book is completed with a description of the major results obtained by the most characteristic experiments. Acknowledgements from the First Edition Iexpressmysinceregratitudeandappreciationtoallthepeoplewhohelpedinthis vast book journey: my family and my lovely daughter, every teacher, friend, and colleague–overseasandintheUSA–whosesupportandencouragementmadethe quarter-century-long project possible. Let me also thank those who, one way or another, opposed that effort – without certain resistance, my commitment could havelackedsomewillpowertoovercomechallengesalongtheway.Specialthanks to my distinguished colleagues Prof. Leonid Glebov of CREOL and Dr. Kent Rochford of NIST Boulder Laboratories for supporting the proposal for this book with Springer, to Prof. H. Weber of Berlin Technical University for helpful sug- gestions and remarks, to Robert Nicolet and Kevin Viteri, to the language editor of the book manuscript and to members of editorial staff of Springer Science. Let me also extend my appreciation to libraries and librarians – The Library of the Russian Academy of Sciences (BAN), the libraries of Case Western Reserve University and Massachusetts Institute of Technology, and Westport Public Library, as well as to The Optical Society for its Optics InfoBase as my main reference source. I dedicate this work to the memory of my teacher and doctorate adviser Andrei A. Wolkenstein. Cranbury Village, Connecticut Michael Bukshtab xi

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