Optical information processing method and optical information processing apparatus

41 Pages·2014·3.34 MB·English

US008638646B2
(12) United States Patent (10) Patent N0.: US 8,638,646 B2
Kanatake et a]. (45) Date of Patent: Jan. 28, 2014
(54) OPTICAL INFORMATION PROCESSING (58) Field of Classi?cation Search
METHOD AND OPTICAL INFORMATION USPC ......... .. 369/4423, 44.32, 53.23, 53.28, 53.12
PROCESSING APPARATUS See application ?le for complete search history.
(56) References Cited
(75) Inventors: Yusuke Kanatake, Tokyo (JP); Tomo
Kishigami, Tokyo (JP); Yoshihiro
U.S. PATENT DOCUMENTS
Kiyose, Tokyo (JP); Nobuo Takeshita,
Tokyo (JP) 6,023,449 A * 2/2000 Chung .. 369/112.23
7,551,371 B2* 6/2009 Abe . . . . . . . . . . . . . .. 359/719
(73) Assignee: Mitsubishi Electric Corporation, 2002/0018406 A1* 2/2002 Yamada ........... .. 369/4423
2002/0114231 A1* 8/2002 Shirakawa et a1. 369/4432
Tokyo (JP)
2002/0150016 A1* 10/2002 Yasuda et a1. ............ .. 369/5322
2004/0136281 A1 7/2004 Yanagisawa et a1.
Notice: Subject to any disclaimer, the term of this 2005/0047291 A1* 3/2005 KuZe et a1. ............... .. 369/4432
patent is extended or adjusted under 35 (Continued)
U.S.C. 154(b) by 77 days.
FOREIGN PATENT DOCUMENTS
(21) Appl. No.: 13/128,031
JP 2002-324328 A 11/2002
(22) PCT Filed: Dec. 7, 2009 JP 2004-95106 A 3/2004
(Continued)
(86) PCT No.: PCT/JP2009/006670
Primary Examiner * Thomas Alunkal
§ 371 (00)’ (74) Attorney, Agent, or Firm * Birch, Stewart, Kolasch &
(2), (4) Date: May 6, 2011 Birch, LLP
(87) PCT Pub. No.: WO2010/067575 (57) ABSTRACT
An optical information processing method and apparatus per
PCT Pub. Date: Jun. 17, 2010
forms a light irradiating and receiving step, a signal process
(65) Prior Publication Data ing step, and an adjusting step of a spherical aberration and a
focus offset on the basis of shift amount of ?rst and second
US 2011/0235482 A1 Sep. 29, 2011
control devices and a performance evaluation value. The per
formance evaluation values for ?rst, second, third and fourth
(30) Foreign Application Priority Data
points in an X and y coordinate system are detected, in Which
an X-coordinate is one of the shift amount of the ?rst control
Dec. 10, 2008 (JP) ............................... .. 2008-314348 device and the shift amount of the second control device and
Oct. 2, 2009 (JP) ............................... .. 2009-230314 a y-coordinate is the other, the ?rst point, second and third
points having the same y-coordinate and different X-coordi
(51) Int. Cl.
nates With each other, the fourth point being provided on a
G11B 7/00 (2006.01)
?rst straight line passing through the ?rst point and being
(52) US. Cl.
different from the ?rst point.
USPC ................ .. 369/4432; 369/4423; 369/5312;
369/5323 24 Claims, 22 Drawing Sheets
40%|: 17
m“ “I 1
15 1 4 A}? 3 22
1s J =5 ( ) ( ) ( ----- h.‘ ' 12 LASER
_ DRIVER
LIGHT 20
REcEIvER
21 {r g
24
26 J l /
REPRODUCTION FOCUS ERROR TRACKING ERROR SERVO
3 EQUALIZER < SIGNAL SIGNAL SIGNAL SIGNAL
'_“'-_ _' GENERATOR GENERATOR ,4 GENERATOR GENERATOR
s2 31 l /27 23 24a 24b
REPRODUCTION REPRODUCTION TRACKING ERRoR
Focus SPHERICAL JITTER SIGNAL AMPLITUDE SIGNAL AMPLITUDE 28
OFFSET ABERRATION DETECTOR DETECTOR '' 25 DErEcToR
ADJUSTER ADJUSTER + + v
T__:._._ 0
CENTRAL CONTROL UNIT 29
US 8,638,646 B2
Page 2
(56) References Cited 2009/0080298 A1 * 3/2009 Yamasaki et a1. ........ .. 369/4423
U.S. PATENT DOCUMENTS FOREIGN PATENT DOCUMENTS
2005/0052964 A1 * 3/2005 Fujita et a1. .............. .. 369/4429 JP 2004-145987 A 5/2004
2005/0141363 A1 6/2005 Shimamoto et a1. JP 2005-196947 A 7/2005
2006/0062098 A1 * 3/2006 Miyake et a1. ........... .. 369/4411 JP 2006-139841 A 6/2006
2006/0104183 A1 * 5/2006 Kataoka et a1. ........ .. 369/11201 JP 2007-80423 A 3/2007
2007/0058501 A1 3/2007 Kurokawa et a1. JP 2007-87483 A 4/2007
2007/0064552 A1 3/2007 Kurokawa et a1. JP 2007-122815 A 5/2007
2007/0159951 A1 * 7/2007 Sagara ........................ .. 369/106 JP 2007-141377 A 6/2007
2008/0056077 A1 * 3/2008 . 369/4423
2009/0059742 A1 * 3/2009 Luyten et a1. ............ .. 369/4423 * cited by examiner

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