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Nuclear Instruments & Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms 1997: Vol B132 Index PDF

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Preview Nuclear Instruments & Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms 1997: Vol B132 Index

Nuclear Instruments and Methods in Physics Research B 132 (1' 35-74 a NIM B Beam interactions with Materials & Atoms ELSEVIER Author index Abdel-Hamid, H.M., M.A. Hussein, H.M. Abou-Zeid and §.M. Morsy, Effect of ion bombardment on tt response of both LiF (TLD-100) and a home-made LiF:Mg,Cu,P phosphors (1997) 11 Abel, F., see Touati, A 32 (1997) 2 Abou-Zeid, H.M., see Abdel-Hamid, H.M 132 (1997) Acosta, E., see Sempau, J | (1997) Ager, F.J., see Blanco Rodriguez, P | (1997) Ahmed, M., M. Faiz, M. A. Al-Ohali and O. Fageeha, Depth profiling of a single cry superconductor using micro-PLXE technique 2 (1997) Aliotta, M., see Mehrhoff, M 1997) Al-Ohali, A.M., see Ahmed, M 132 (1997) Almeida, D.P., A.C. Fontes and F.C. Pontes, Multiple ionization of gases by collisions with electrons 1997) Angelescu, T., N. Ghiordanescu, N. Baljajeanu, V. Labau and A. Vasilescu, Intercomparison of photon dose measurements at the 8 MeV electron accelerator 32 (1997) Angelov, ( see Fauré, J 132 (1997) Aoki, Y., see Kudo, H (1997) Aoki, Y., see Taguchi, M 2 (1997) Artus, | see Cusco, R 32 (1997) Assmann, W., see Grigull, S 132 (1997) Azuma, T., T. Ito, K. Komaki, T. Tonuma, M. Sano, A. Kitagawa, E. Takada and H. Tawara, Relativistic heavy collision studies at HIMAC: X-rays from radiative electron capture into continuum and secondary electrons from binary encounter collisions 32 (1997) 2 Bailly-Despiney, I., see Touati, A 132 (1997) 2 Bakopoulos, Y., see Liritzis, I (1997) Baltateanu, N., see Angelescu, T (1997) Ball, J.¢ see Womble, P.¢ 132 (1997) Baptista, G.B., see Barros Leite, C.V 32 (1997) Baro, J., see Sempau, J 32 (1997) 3 Barabanenkov, M.Y., V.N. Mordkovich and V.V. Mikhnovich, On light suppre Vi formation photon assisted ion implantation of silicon 32 (1997) Barbot, J.F., see Schmidt, D.¢ 1997) Barna, R., see Torrisi, | 32 (1997) Barrachina, R.O., Post-collision interaction effects in the autoionization of atoms excited by ion impact 132 (1997) 2 Barros Leite, C.V., G.B. Baptista and J.A.M. Pereira, H* secondary ions emission stimulated by impact o energetic ions on heated target 32 (1997) Baumvol, I.J.R., see Mehrhoff, M (1997) Beck, B., see Church, D.A (1997) Becker, H.-W., see Mehrhoff, M (1997) Behar, M., see Fink, D hMhtMwwhm (1997) Benyaich, F., A. Makhtari, L. Torrisi and G. Foti, PIXE and XRF comparison for applications to sediments analysis | (1997) Berheide, M., see Mehrhoff, M 132 (1997) Bhave, T.M., S.V. Bhoraskar, P. Singh and V.N. Bhoraskar, Radiation induced yStallisation and enhancement in photoluminescence from porous silicon 132 (1997) 409 Bhoraskar, S.V., see Bhave, T.M 132 (1997) 409 Bhoraskar, V.N., see Bhave, T.M 32? (1997) 409 Bitensky, I.S., see de Castro, C.( 32 (1997) 561 0168-583X/97/$17.00 1997 Elsevier Science B.V. All rights reserved Blanchard, C.. see Schmidt, D.¢ 32 (1997) 439 Blanco Rodriguez, P., A. Martin Sanchez Vera Tome ‘rrero abuis Roldan Garcia, D. Juanes Bart ver, F.J. Ager. M.F. da Silva and J.C. Soares i terization alpha sources prepared by direct iporation using Rutherford backscattering spectrometr Blanco N., see Cusco, R Blondiau x. G.. see Sastni, C.S Boerma D.O., see Langelaar, M.H Boruck L., see Mehrhoff, M Brandoli ni, F., N.H. Medina, M. De Poli, P. Pavan, M. Wilhelt ald and G. Pascovici, Stopping power of Nd ons in Pb determined ft ineshape analysis | yulomb excitatior Breemar M., see Langelaar, M.H Breese M.B.H., Beam bending using graded compositior Breese M.B.H., D.G. de Kerckhove, P.J.C. King, P.J.M S Ge,/Si crystals using planar channeling patterns Brissaud I ee asL agarde, G Brome C.R., see McKinsey, D.N Bronk T., see Reading, J.I Browt 1.G., see Liu Br M., see Tucoul \..S. Della-Negra and Y e yec, Backwarde t nergy bombardment « 1 surfa(c Leetste r Z.,. see Isabey J.. see Reinhold Busneng H.F., see Martinez Butterw rth. J.S.. see McKinse see Zhang \ see Touati, A 4.. see Schiettekatte G. Weinberg, J. McDonald and D. Schneider, Collisions and Jenneson Rothard, H D., see Macri, P.A 1, P.G. Rancoita, M. Rattaggi and A. Seidman, Frequency dependence on temperature of nductance in silicor J. Ibanez, N. Blanco onzalez-Diaz and L. Artis, Study of Si*-implanted and annealed InP by s of Raman spectroscopy G., see Torrisi, I r., M. Jaskola, A. Korman, S. Pszona, M. Sadowski, A. Szydiowski, On the interpretatioonf CR-39 355 and PM-500 track detector response to 14.9 MeV neutrons (Letter see Blanco Rodrigue see de Castro, C.( ( P. Leleux, D. Villers and M. Dosiere the yuugh transform to determine the center of tized X-ray diffraction patterns 2 214 132 199 see Croitoru, N 1s D.G D.. see Torrisi, | sce Brandolini, | Brunelle, A see Dunlop, A Dewald, A., see Brandolini, I Dobeli, M., P.W. Nebiker, R. Miihle and M off, M Spijker, O.W.V tf RbGd» Br>:Ce M., see Dammer, ¢ S.. see Tucoulo 1M *e McKinsey Schiilke, Mult udez-Varea, J.M.., see Sempau, J rero Calabuig, J.L., see Blanco Rodrigu P nk, D., R. Klett, M. Behar, G. Sanchez, J.R. Kaschny and W.G. Hertleir distribution after ion irradiation and thermal treatment yon, O.A., R. Gayet, J. Hanssen, P.A. Hervieux and R.D. Rivarolk isions of fast positrons with atoms (ions 4.C., see Almeida, D.P \.L., see Reading, J.F G., see Benyaich. | regenal, D., see Gonzalez, A.D reund, A., see Joensen, K.D reund, A.K., see Hoghej, P M.T., see Reinhold, C.O O.W.V., see Dorenbos, P M.E., G.H. Olivera, R.D. Rivarola ams way, R.B., see Liritzis, I H., D. Fang, F. Lu, J u, W onization cross section of Ar*, Kr*, In* and Ge yao, K.Y., and B.X. Liu, High current Ni-ion implantation Gartner, K Axial dechanneling in compound crystals with poi Garibotti, C.R., see Macri, P.A Gasaneo, G., see Macri, P.A Gayet, R., see Fojon, O.A Gayet, R.. see Martinez, A.f Ghiordanescu, N., see Angelesc sielen, C., see Nejedly, Z sObert, F., see Touati, A x0lub see McKinsey, D.N 4.D., D. Fregena A.D., see Suarez ralez-Diaz. G ee Cuscc sorenstein, P., see Dan Joensen nstein, P., see Hoghoj, P Mehrhoff, M Schiwietz, ¢ upled-channel calculations of the electronic see Rothard, H Kreissig, H. Huber, W. Assmann, I ement-dependent ERDA probing depths using different 1 systems see Church, D.A see Dorenbos, P see Isabey, R Gao, H see Joensen, K.D see McKinsey, D.N in, W. Zhuang and W. Wang, High energ gy ion implantation enhanced intermixed quantum well and their absorption chat ACTETISLICS IN IP assive e opptii ca Vaveg uides see He, Y.D see Fojon, O.A see Martinez, A. 1.W., M.H. Shapiro lombrello, Correcti and addendum to “The formation of clusters arge sputtering e icl. Instr. and Meth ncox and M Measurement of get tch rate ft lastic at short distance scale Ziemann, Change of il properties during ion induced amorphization of Auln films Herr Hertlei Her Herviet Hiratsuka see Taguchi, M Hoghoj, P iegler, J. Susini, A.K orenstein and J.L. Wood, Focusing of hard X ! th a W/Si supermirrot Hogha)j, P.. see Joensen, K.D Hong, D.G.., see Liritzis, | Hu, W., see Gao, H Huber, H., see Grigull, S$ Huffman, P.R., see McKinsey, D.N Hussein, M.A., see Abdel-Hamid, H.M usco, R see Koizumi, H lizuka, S., see Li, Y Isabey, R.. M. Guelev, Z. Buchakliev., I Duverget L. Mako vicka, D. Klein and A. Chambaudet The use of the EGS4-PRESTA code fi yr the thermoluminescent dosemeter response simulation Ito, T., see Azuma, T Jaskola, M., see Czyzewski, 1 Jaskierowicz, G., see Dunlop, A Mereditt termined by scanning i Hogho Lappalainer c¢ Sigaud, G.M D., see Blancx sec UOvgaw : H see Breese, M.B.H see Azuma, T ZRRRRRRF R nd J.W.N. Tuvn. Sensit > + bo) Azuma, T ( z7yzewsk! see Mact e Dorenbos, P reissig, | see Grigull, § ristiansson, P.. and B.G. Martinsson, Photor Geterminatior see Mehrhoff, M see Tomaschko, ¢ S. Yamamoto, K. Narumi | targets bombarded wit M., see Kaczmarek, S.M abau, V., see Angelescu, T agarde, G., P. Midy and I. Brissaud umoreaux, S.K.. see McKinsey. D.N angelaar, M.H., M. Breeman, A.V. Mijiritskii and D.O. Boerma, Simulatior ippalainen, R., J. Jokinen, W.-M. Li, M. Rit M. Leskealnad E. Soininer grown SrS based thin film electroluminescent structures with ion beam m« ec, Y., see Brunelle, A Y C. Chang and T.Y. Ji, Optical emissions from an aluminum surt Leleux, P., see Dammer, ¢ Leskela, M., see Lappalainen, R L’Hoir, A., see Touati, A {uthor and R.J. MacDonald, The influence of inner-shell electron promotion on charge exchange processes in low energy ion scattering from surfaces T., and R.J. MacDonald, The study of ; is produced by electron promotion in Ne* ton-surface uttering M., see Lappalainen, R izuka and N. Sato, Control of sputtering in a modified magnetron-typed radio-frequency discharge lang Range parameters ol bismuth tons in polystyrene ingham, M., see Tucoulou, R iritzis and Y. Bakopoulos, Functional behaviour of solar bleached thermoluminescence in calcites iritzis. I.. R.B. Galloway and D.G. Hong, Single aliquot dating of ceramics by green light stimulation umunescence I rom quar t iu, B.X., see Gao, K.¥ D., see Zhang, I F.. O.R. Monteiro, K.M. Yu and I.G. Brown, Self-neutralized ion implantation into insulators X., see Zhang, I Gao, H Jenneson, P.M M.A. Kornberg Miraglia, C.R. Garibotti jasaneo and F.D hia, Double ration of heliu orrelated double continuur ave function see Benyaich see Isabey Rotshten ulation and experimental determination of dimensions of hardening ‘mpering zones in quenched U7A steel irradiated with a pulsed electron beam A.. see Blanco Rodriguez H.F. Busnengo aye Hanssen a! ivarola, Double electron capture in it intermediate and high collision energies ibt of capture into excited stat B.G., see Kristiansson The Brandt-Kitagawa heavy ion model: Embedding in the homogeneous electron AO *e Kaczmarek, S.M Y., see Taguchi, M E.H., see McKinsey, D.N ind E. Smolko, Target theory applied to swift heavy ions track grafting experiments McCarroll, R., see Opradolce, | McDonald, J., see Church, D.A McKinsey. D.N., C.R. Brome, J.S. Butterworth, R. Golub, K. Habicht, P.R. Huffman, S.K. Lamoreaux, C.E.H Mattoni and J.M. Doyle, Fluorescence efficiencies of thin scintillating films in the extreme ultraviolet spectral Medina see Brandolini, fF Mehrhofl M. Aliotta, 1.J.R. Baumvol, H.-W. Becker, M. Berheide, L. Borucki, J. Domke, F. Gorris, $ Kubsky, N. Piel, G. Roters, C. Rolfs and W.H. Schulte, Gamma-ray detection with a 4x Nal spectrometer for material analysis Melo. W.S.. see Sigaud. G.M Me W.S., see Sant’ Anna, M.M Meoli, P.J.. see Galassi, M.E Meredith, P., see Jenneson, P.M Meverhof, W.E.. see Sant’ Anna, M.M 132 (1997) Midy, P., see Lagarde, G 132 (1997) Mijiritskii, A.V., see Langelaar, M.H | 1997) Mikhnovich, V.V., see Barabanenkov, M.\ 132 (1997) Miraglia, J.E., see Macri, P.A 132 (1997) 2 Miwa, S., see Kobayashi, H 132 (1997) Monteiro, O.R., see Liu, I 2 (1997) Montenegro, f see Sant’ Anna, M.M 132 (1997) see Sigaud, G.M see Barabanenk M.Y see Kaczmarek, S.M see Abdel-Hamid, H.M *¢ Tucoulou, R Dobeli, M Narayanan, K.I rumi, H guchi, M ido, H e Narayanar K.1 yavakumar, K.G.M. Nair, B. Sundarakkann ytical absorption studies d P. Walter see Brandolini see Brandolini, I 4.M., see Barros Leit K.A., see Womble R.D., see Opradolce see Mehrhoff, M A.. see Schiettekatte ta. P.G see ( romor hawa, G.S.. and H.S M.., see Croitoru I.F.. T. Bronk an tons on helium M.. see Lappalainen, R R.D., see Fojon, O.A R.D., see Galassi, M.E R.D., see Martinez, A.I V.D., Momentum distributions 1 Garcia, C., see Blanco Rodriguez C., see Mehrhoff, M oshchupkin, D.V., see Tucoulou, R 742 duthor index Ross, G.G., see Schiettekatte, I (1997 ) Roters, G., see Mehrhoff, M » (1997 ) Rothard, H., J.-P. Grandin, M. Jung, A. Clouvas, J.-P. Rozet and R. 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Gonzalez, Low-energy electrons produced in ion—atom collisions (1997 ) 241 Sugak, D.J., see Kaczmarek, S.M > (1997 ) Sundarakkannan, B., see Narayanan, K.I (1997 ) 61 Sundholm, D., see Nordlund, K (1997 ) 45 Susini, J., see Joensen, K.D., (199 ) 221 duthor index Susini, J., see Hoghoj, P (1997) Susuki, Y., see Ogawa, H (1997) Suter, M., see Dobeli, M (1997) 5 Swiatek, W, Neural networks based analysis of radiometric data aw(1w99w7) 7 Szydowski, A., see Czyzewski, T vsW)NN NhwM (N199 7) aguchi, M., see Koizumi, H 2 (1997) aguchi, M., Y. Aoki, H. Namba, R. Watanabe, Y. Matsumotaond H. Hiratsuka, Fast fluorescence decay of naphthalene induced by Ar ion irradiation (1997) 135 akada, E., see Azuma, T (1997) 246 ang, J., see Gao, H (1997) 364 awara, H., see Azuma, T (1997) 246 eesdale, W.J., see Nejedly Z (1997) 489 omaschko, C., K.-H. Herrmann, J. Kashammer, R. Kiigler, C.S choppmann and H. 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Persons, Calculations of neutron transport through a simulated waste matrix (1997) Wood, J., see Dan Joensen, K (1997) 2 Wood, J. see Hoegho} P (1997) 5 Wu, S., see Gao, H (1997) W ] W see Gao H aw w(1w99w7) Wiinsch, R., see Rothard, H 7) WNNNM N(w1 N9W97N) 359 Xie, D., D. Zhu, D. Cao and Z. Zhou, A study of single crystal zirconia implanted with platinum ions 2 (1997) 425 Yamamoto, S., see Kudo, H (1997) 4) Yang, F., see Gao, H (1997) 364 744 Yang, S., see Zhang, | Yao, T., see Kobayashi, H Yoshida, H., see Koizumi, H Yoshida, K., see Ogawa, H Yu, K.M., see Liu, I Zhang, F., Z. Zheng, D. Liu, Y. Mao, Y. Chen, Z. Zhou, S. Yang u, Synthesiso f titanium dioxide films by ion beam enhanced deposition Zheng, Z., see Zhang, I Zhou, Z., see Xie, D Zhou, Z see Zhang, I Zhu, D., see Xie, D Zhuang, W.. see Han. D Ziegler, E., see Joensen, K.D Ziegler, E., see Hoghoj, P Ziegk r, | sec Tucoulou R Ziemann see Heinz, B

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