Nuclear Instruments & Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms 1994: Vol B85 Index

17 Pages·1994·3.6 MB·English

NIM B
Nuclear Instruments and Methods in Physics Research B 85 (1994) 943-958
North-Holland
Beam interactions
with Materials & Atoms
Author index
Abel, F., see Szilagyi, E 85 (1994) 63
Achete, C.A., see Freire Jr., 85 (1994) 55
Achete, C.A., see Freire, Jr., 85 (19942)6 8
Agawa, Y., S. Seki, H. Yamakawa and M. Takai, Investigation of a duopigatron ion source for He** ion
production 85 (19947)2 2
Aihara, R., see Mimura, R 85 (1994) 756
Alay, J., see Brijs, B 85 (19943)0 6
Alay, J., see De Coster, W 85 (19949)1 1
Allen, M.G., see Bettiol, A.A 85 (19947)7 5
Almeida, F.J.D., see Davies, J.A : 85 (1994) 28
Alves, E., J.G. Correia, J.G. Marques, A.A. Melo, M.F. da Silva, J.C. Soares and H. Haas, The lattice site of
Au in Be after 24h Hg isotope implantation and decay 85 (19944)5 7
Amsel, G., see Battistig, G 85 (19943)2 6
Amsel, G., see Vickridge, 1.€ 85 (1994) 566
Amsel, G., see Battistig, G 85 (1994) 572
Andersson, M., see Johnston, P.N 85 (19949)0 7
Andreae, M.O., see Salma, I 85 (1994) 849
Angelova, St., see Miteva, V 85 (19943)4 0
Annegarn, H.J., see Salma, | 85 (1994) 849
Antolak, A.J., G.S. Bench and D.H. Morse, IMAP: a complete lon Micro-Analysis Package for the nuclear
microprobe 85 (19945)9 7
Arai, E., A. Zounek, M. Sekino, K. Takemoto and O. Nittono, Depth profiling of porous silicon surface by
means of heavy-ion TOF ERDA 85 (1994) 226
Aschenauer, E.C., see Horvath, D 85 (1994) 736
Ashbaugh, M.D., see Leavitt, J.A 85 (1994) 37
Assmann, W., P. Hartung, H. Huber, P. Staat, H. Steffens and Ch. Steinhausen, Setup for materials analysis
with heavy ion beams at the Munich MP tandem 85 (19947)2 6
Bachman, T., see Kaczanowski, J 85 (1994) 607
Banks, J.C., see Knapp, J.A 85 (1994) 20
Bardwell, J.A., see Lennard, W.N 85 (1994) 42
Barna, A., see Menyhard, M 85 (19943)8 3
Barradas, N.P., J.L. Leal, J.C. Soares, M.F. da Silva, P.P. Freitas, M. Rots, S.1. Molina and R. Garcia, /
comparative study of Co-—Re superlattices sputtered on glass and Si substrates by grazing angle of
incidence RBS, HRTEM, PAC, magnetic and transport properties studies 85 (19942)0 2
Battistig, G., G. Amsel, I. Trimaille, J.-J. Ganem, S. Rigo, F.C. Stedile and 1J.R. Baumvol, High resolution
low energy resonance depth profiling of ‘SO in near surface isotopic tracing studies 85 (19943)2 6
Battistig, G., G. Amsel, E. d’Artemare and A. L’Hoir, Multiple scattering induced resolution limits in grazing
incidence resonance depth profiling 85 (19945)7 2
Battistig, G., see Stedile, F.C 85 (1994) 248
Bauer, P., see Steinbauer, E 85 (19946)4 2
Baumvol, I.J.R., New trends in hard coatings technology 85 (19942)3 0
Baumvol, 1.J.R., see Stedile, F.C 85 (1994) 248
Baumvol, 1.J.R., see Battistig, G 85 (1994) 326
Bax, H., see Watjen, U 85 (19946)2 7
Beck, O., D. Kollewe, A. Kling, W. Heiland and F. Hesse, Lattice site location of iron in potassium niobate 85 (19944)7 4
Becker, H.W., see Stedile, F.C 85 (19942)4 8
Begrambekov, L.B., A.M. Zakharov, A.A. Pustobajev, M Suchadska, S. Katuza and V. Chodorek, Sputtering
and transformation of one phase Cu-—Ni alloy surfaces under ion bombardment 85 (19943)3 1
Behar, M., see Fichtner, P.F.P 85 (19945)7 9
Behrisch, R., see Kreissig, | 85 (1994) 71
Beier, Th., see Mommsen, H 85 (19948)9 0
0168-583X /94 /$07.00 © 1994 — Elsevier Science B.V. All rights reserved
944 Author index
Bench, G.S., see Antolak, A.J 85 (19945)9 7
Bender, H., see Brijs, B 85 (19943)0 6
Benka, O., A. Brandst6tter and E. Steinbauer, Elastic recoil detection analysis using ion-induced electron
emission for particle identification 85 (1994) 650
Benyaich, F., see Priolo, F 85 (1994) 159
Bergmaier, A., see Dollinger, G 85 (1994) 786
Bergmans, R.H., M. van de Grift, A.W. Denier van der Gon, R.G. van Welzenis, H.H. Brongersma, $.M
Francis and M. Bowker, Composition and structure of the Cug;Pd,,(110) (2 x 1) surface: a low energy ion
scattering investigation 85 (1994) 435
Bettiol, A.A., D.N. Jamieson, S. Prawer and M.G. Allen, lon beam induced luminescence from diamond and
other crystals from a nuclear microbeam 85 (19947)7 5
Beyer, G.P., S.B. Patel and J.A. Kilner, A SIMS study of the altered layer in Si using oO, primaries at various
angles of incidence 85 (1994) 370
Bharuth-Ram, K., see Connell, S.H. 85 (1994) 508
85 (1994) 383
85 (1994) 642
Biré, L.P., J. Gyulai, S. Bogen, L. Frey and H. Ryssel, Investigation of the effect of altered defect structure
produced by photon assisted implantation on the diffusion of As in silicon during thermal annealing 85 (19949)2 5
Biron, I., see Kiss, A.Z 85 (1994) 118
Blasser, S., J. Steiger and A. Weidinger, In-situ hydrogen charging of thin Nb films and depth profiling with
the 'H('5N, «y)'7C nuclear reaction 85 (1994) 24
i. es alee ce be ee eae Oe a OOS e a wee eee eee 85 (1994) 551
Bodart, F., see Soumoy, C 85 (19945)1 6
Bogdanovic, I., S. Fazini¢é, M. Jaksi¢é, G.W. Grime and V. Valkovié, Use of STIM in the proton microprobe
analysis of single particles 85 (1994) 732
Bogen, S., see Bird, L.P 85 (1994) 925
Bolse, W. and T. Weber, Consequence of the fractal nature of the collision cascade: end-of-range spikes in
ballistic systems 85 (1994) 188
Booker, G.R., see Yupu Li, : 85 (1994) 236
Borbély-Kiss, I., Zs. Fiilép, T. Gesztelyi, A.Z. Kiss, E. Koltay and Gy. Szab6, The PIXE-—PIGE method for the
classification of late Roman glass sealings 85 (1994) 836
Borglind, J., see Linnarsson, M.K. 85 (1994) 395
Bortels, G., see Steinbauer, E. 85 (1994) 642
Bossenger, M.G., see Connell, S.H 85 (1994) 508
Bottiger, J., N.G. Chechenin, N. Karpe and J.P. Krog, Diffusion in thin-film amorphous metallic alloys 85 (1994) 206
Boettiger, J., see Krog, J.P 85 (1994) 197
Bowker, M., see Bergmans, R.H 85 (1994) 435
Brandstotter, A., see Benka, O 85 (1994) 650
Breese, M.B.H., C.H. Sow, D.N. Jamieson and F. Watt, A comparison between MeV protons and a particles
for IBIC analysis 85 (19947)9 0
Breese, M.B.H., see Jamieson, D.N 85 (19946)7 6
Brijs, B., W. De Coster, H. Bender, J. Alay, P. Osiceanu and W. Vandervorst, Sputtering phenomena of CoSi,
under low energy oxygen bombardment 85 (1994) 306
Brijs, B., see De Coster, W 85 (1994) 911
Brongersma, H.H., see van den Oetelaar, L.C.A 85 (1994) 420
Brongersma, H.H., see Bergmans, R.H. 85 (1994) 435
Bubb, L.F., see Johnston, P.N 85 (19949)0 7
Bubb, L.F., see Studd, W.B 85 (1994) 929
Buiu, O., M. Gartner, R. Plugaru and M. Dumitru, Implanted damage evolution in sequential annealed
silicon 85 (1994) 933
Burger, P., see Steinbauer, FE 85 (1994) 642
Cacciato, A., see Priolo, F 85 (1994) 159
Cafmeyer, J., see Salma, | 85 (1994) 849
Calligaro, T., see Kiss, A.Z 85 (1994) 118
Campbell, J.L., W.J. Teesdale and J.A. Maxwell, Thickness measurement of titanium nitride layers on steel
using PIXE and proton backscattering 85 (1994) 108
Campisano, S.U., see Priolo, F 85 (1994) 159
Caplin, A.D., see Yupu Li, 85 (1994) 281
Cauz, D., see Horvath, D 85 (1994) 736
85 (1994) 911
Author index 945
‘hambouleyron, L., see Freire Jr., 85 (1994) 55
‘hamplin, R.S., see Leavitt, J.A 85 (1994) 37
‘hatellard, D., see Horvath, D 85 (19947)3 6
hater, R.J., see Yupu Li, 85 (1994) 236
‘hayahara, A., see Kinomura, A 85 (19946)8 9
hayahara, A., see Mokuno, Y 85 (19947)4 1
hayahara, A., see Kinomura, A 85 (19949)2 1
heang Wong, J.¢ J. Garcia Lopez, C. Ortega, J. Siejka and L.M. Mercandalli, Contribution of
techniques to the study of YBaCuO thin films with anomalous c-axis lattice parameter (1994) 171
heang Wong, J.C., see Garcia Lopez, J 5 (1994) 462
hechenin, N.G., see Krog, J.P 5 (1994) 197
hechenin, N.G., see Bottiger, J (1994) 206
heng, H.-S., H. Shen, F. Yang and J.-Y. Tang, Cross sections for non -Ruthe stood beshsenttesinn of *He from
five light elements 5 (1994) 47
hevallier, J., see Soumoy, ¢ 5 (1994) 516
hodorek, V., see Begrambekov, L.B (1994) 331
‘hoo, T.F., see Watt, F (1994) 708
‘hu, W.K., see Liu, J.R 5 (1994) 51
hu, W.K., see Liu, J.R 5 (1994) 780
hurms, C.L. and R. Pretorius, Three dimensional RBS on the Faure nuclear microprobe (1994) 699
liment-Font, A., E. Swietlicki and A. Revuelta, Characterization of the air pollution in the urban area of
Madrid 85 (1994) 830
ochrane, J.C., see Taylor, T $5 (1994) 904
ohen, D.D., see Johnston, P.N (1994) 907
ohen, D.D., see Hult, M (1994) 916
ohen, L.F., see Yupu Li, (1994) 281
onnell, S.H., E. Sideras-Haddad, K. Bharuth-Ram, C.G. Smallman, J.P.F. Sellschop and M.G. Bossenger,
Perturbed angular distribution studies in natural, synthetic CVD and HPHT diamond ‘5 (1994) 508
‘onnell, S.H., see Sellschop, J.P.F (1994) l
onnell, S.H., see Rebak, M (1994) 243
onnell, S.H., see Storbeck, E.J (1994) 503
Cornelison, D.M., see Steele, B.E (1994) 414
Correia, J.G., see Alves, E (1994) 457
Courel, P., see Michaud, V (1994) 881
Cox, R.P., see Leavitt, J.A 5 (1994) 37
Darji, R., see Hdsler, W 5 (1994) 602
d’Artemare, E., see Battistig, G 5 (1994) 572
da Silva, M.F., see Barradas, N.P 5 (1994) 202
da Silva, M.F., see Alves, E 5 (1994) 457
Davies, J.A., F.J.D. Almeida, H.K. Haugen, R. Siegele, J.S. Forster and T.E. Jackman, Quantitative
calibration of intense (a, a) elastic scattering resonances for 2C at 5.50-5.80 MeV and for "°O at
7.30-—7.65 MeV $(1994) 28
DeCecco, P., see Horvath, D 5 (1994) 736
De Coster, W., B. Brijs, P. Osiceanu, J. Alay, M. Caymax and W ‘Vande rvorst Ton be:a m mixing and oxidation
of a Si/Ge-multilayer under oxygen bombardment. . . 5 (1994) 911
De Coster, W., see Brijs, B 5 (1994) 306
de Koning, M., see van Dijk, P.W.1 5 (1994) 551
Demortier, G. and Y. Morciaux, PIXE gadgets ee, ee 5 (1994) 112
Demortier, G., C. Steukers, N. Vandesteene and S. Mathot, IBA of Au—Al alloys 5 (1994) 311
Denier van der Gon, A.W., see Bergmans, R.H (1994) 435
Derry, T.E., see Spits, R.A 5 (1994) 347
de Voigt, M.J.A., see van Dijk, P.W.L 5 (1994) 551
de Voigt, M.J.A., see Klein, S.S (1994) 655
de Voigt, M.J.A., see Klein, $.S 5 (1994) 660
Ding, P.J., R. Talevi, W.A. Lanford, S$. Hymes and S.P. Murarka, U se of a ssteced uissbeem to study lateral
diffusion of interest to microelectronics 85 (1994) 167
Ding, P.J., W. Wang, W.A. Lanford, S. Hymes and S.P bGssaste Investigation of the mocheniom responsible
for the corrosion resistance of B implanted copper . . . 85 (1994) 264
Ditroi, F., see Vasvary, | 85 (1994) 255
946 Author index
Débeli, M., P.W. Nebiker, M. Suter, H.A. Synal and D. Vetterli, Accelerator SIMS for trace element
detection 85 (1994) 770
Dobrovodsky, J., see Kovac, P 85 (1994) 749
Dollinger, G., T. Faestermann, C.M. Frey, A. Bergmaier, E. Schwabedissen, Th. Fischer and R. Schwarz,
Depth microscopy at interfaces 85 (1994) 786
Doyle, B.L., see Knapp, J.A 85 (1994) 20
Dubois, C., see Dupuy, J.C 85 (1994) 379
Dumitru, M., see Buiu, O 85 (1994) 933
Dupuy, J.C., G. Prudon, C. Dubois, P. Warren and D. Dutartre, Depth resolution in SIMS study of boron
5-doping in epitaxial silicon 85 (1994) 379
Durand, C., see Mercier, F 85 (1994) 874
Dutartre, D., see Dupuy, J.C 85 (1994) 379
Duvanov, $.M., A.P. Kobzev, A.M. Tolopa and D.M. Shirokov, Investigation of the elements depth profiles in
surface layers of glass modified by ion beam assisted deposition 85 (1994) 264
Dytlewski, N., see Johnston, P.N 85 (19949)0 7
Dytlewski, N., see Hult, M 85 (19949)1 6
Eades, J., see Horvath, D 85 (1994) 736
Eckstein, W., see Mayer, M 85 (1994) 560
Egger, J.-P., see Horvath, D 85 (1994) 736
Elliman, R.G. and W.C. Wong, The role of strain in the crystallisation of Ge implanted (100) Si 85 (1994) 178
Elsener, K., see Horvath, D. 85 (1994) 736
Elstner, B., A. Sch6pke and B. Selle, RBS analysis of thin MoSi, films: Correlation between stoichiometry and
some features of sputtering 85 (1994) 297
Eugster, P., see Horvath, D 85 (1994) 736
Evelyn, A.L., D. Ila and G.M. Jenkins, RBS and Raman spectroscopy study of heat-treatment effect on
phenolformaldehyde resin 85 (19948)6 1
Fabris, A., see Krafcsik, I 85 (1994) 716
Faestermann, T., see Dollinger, G 85 (1994) 786
Fahy, M.R., see Sharma, V.K.M 85 (1994) 391
Fallico, G., see Priolo, F 85 (1994) 159
Farkas, L., see Krafcsik, I 85 (1994) 716
Farkas, L., see Kiss, L 85 (1994) 764
Fazinic¢, S., see Bogdanovié, | 85 (1994) 732
Fichtner, P.F.P., M.C. Herberts, P.L. Grande and M. Behar, Range parameters of Er, Ga and F implanted
into SiC films 85 (1994) 579
Fischer, Th., see Dollinger, G 85 (1994) 786
Flagmeyer, R., see Krause, H. 85 (1994) 494
Fleming, S.J. and C.P. Swann, Roman onyx glass: A study of production recipes and colorants, using PIXE
spectrometry 85 (1994) 864
Fleming, S.J., see Hamilton, E. 85 (1994) 856
Formisano, F., see Horvath, D 85 (1994) 736
85 (1994) 28
85 (1994) 268
Francis, S.M., see Bergmans, R.H. 85 (1994) 435
Frank, J.D., see Leavitt, J.A. 85 (1994) 37
Freire, Jr., F.L., D.F. Franceschini and C.A. Achete, RBS, ERDA and NR analyses of hard amorphous
a an 66 oe eke oe Sk eee eee er ee eee eb ee eee 85 (1994) 268
Freire Jr., F.L., C_.A. Achete, C.F.O. Graeff, 1. Chambouleyron and G. Mariotto, Study of annealed amor-
phous hydrogenated films by elastic recoil detection analysis 85 (1994) 55
Freitas, P.P., see Barradas, N.P 85 (19942)0 2
Frey, C.M., see Dollinger, G 85 (1994) 786
Frey, L., P. Pichler, I. Kasko, I. Thies, S. Lipp, N. Streckfuss, L. Gong and H. Ryssel, Practical aspects of ion
beam analysis of semiconductor structures 85 (1994) 356
Frey, L., see Biré, L.P 85 (1994) 925
Fried, M., see Lohner, T 85 (1994) 335
Fried, M., see Lohner, T 85 (1994) 524
Friedland, E., M. Hayes, S. Kalbitzer and P. Oberschachtsiek, Range parameters of "< implants in
semiconductor and metal targets 85 (1994) 272
Friedland, E., Annealing of radiation damage in MgO single crystals after krypton implantation 85 (1994) 316
Author index 947
Frése, D. and D. Kollewe, Production and analysis of buried nitride layers in Si/SiO, with ion beam methods . 85 (1994) 936
Fujii, K., see Kinomura, A 85 (1994) 689
Fujii, K., see Mokuno, Y 85 (1994) 741
Fujii, K., see Kinomura, A 85 (1994) 921
Fiilép, Zs., see Borbély-Kiss, I 85 (1994) 836
Ganem, J.-J., see Stedile, F.€ 85 (1994) 248
Ganem, J.-J., see Battistig, G 85 (1994) 326
Garcia, R., see Barradas, N.P 85 (1994) 202
Garcia Lépez, J., J.C. Cheang Wong, C. Ortega, J. Siejka, 1. Trimaille, A. Sacuto, G. Linker and O. Meyer,
Combination of IBA techniques and Raman spectroscopy to study defects in ‘50 labelled YBaCuO thin
85( 1994)46 2
Garcia Lépez, J., see Cheang Wong, J.C 85 (19941)7 1
Garg, M.L., see Mommsen, H 85 (19948)9 0
Gartner, K., see Wendler, E 85 (19945)2 8
Gartner, K., see Kaczanowski, J 85 (19946)0 7
Gartner, M., see Buiu, O 85 (19949)3 3
Geretschlager, M., see Steinbauer, E 85 (19946)4 2
Gesztelyi, T., see Borbély-Kiss, I 85 (19948)3 6
Gillin, W.P., see Kozanecki, A 85 (19941)9 2
Giuntini, L. and P.A. Mando, External beam RBS in an unenclosed helium environment 85 (19947)4 4
Gong, L., see Frey, L 85 (19943)5 6
Gorini, G., see Krafesik, I 85 (19947)1 6
Gorini, G., see Horvath, D 85 (19947)3 6
Grabmaier, B.C., see Kling, A 85 (19944)9 0
Graeff, C.F.O., see Freire Jr., F 85 (1994) 55
Grande, P.L., see Fichtner, P.F.P 85 (19945)7 9
Grey, R., see Kozanecki, A 85 (19941)9 2
Grime, G.W., see Bogdanovic, | 85 (19947)3 2
Grosman, A., see Morazzani, V 85 (19942)8 7
Grétzschel, R., see Kreissig, U 85 (1994) 71
Gyulai, J., see Lohner, T 85 (19945)2 4
Gyulai, J., see Biré, L.P 85 (19949)2 5
Haas, H., see Alves, E 85 (19944)5 7
Hamilton, E., C.P. Swann and S.J. Fleming, Roman influences on metalworking at the Titelberg (Luxembourg)
Compositional studies using PIXE spectrometry 85 (1994) 856
Hammar, M., B.E. Steele and I.S.T. Tsong, Impact-collision ion-scattering spectrometry studies of the
VC,y s(111)48 1)su rface 85 (19944)2 9
Hanekamp, L.J., see Lohner, T 85 (19943)3 5
Hanekamp, L.J., see Lohner, T 85 (1994) 524
Hara, S., see Takai, M 85 (19947)5 2
Harmon, J.F., J.M. Knox and G. Vizkelethy, Use of the “Be(a, n)'*C reaction for detection of beryllium . . . . 85 (1994) 33
Hartung, P., see Assmann, W 85 (19947)2 6
Hashimoto, A., see Tamura, M 85 (19944)0 4
Haugen, H.K., see Davies, J.A 85 (1994) 28
Hauser, P., see Horvath, D 85 (19947)3 6
Havranek, V., V. Hnatowicz, J. Kvitek and I. Obrusnik, PIXE-INP computer code for PIXE analyses of thin
and thick samples 85 (1994) 637
Hayes, M., see Friedland, E 85 (1994) 272
Heiland, W., see Beck, O 85 (1994) 474
Heimermann, D., see Mommsen, H 85 (1994) 890
Heitz, Ch., see Nekab, M 85 (1994) 123
Heitz, Ch., see Waksman, S.Y 85 (1994) 824
Hemment, P.L.F., see Yupu Li, 85 (1994) 236
Hennrich, F., see Mommsen, H 85 (1994) 890
Herberts, M.C., see Fichtner, P.F.P 85 (1994) 579
Hesse, F., see Beck, O 85 (19944)7 4
Hnatowicz, V., see Havranek, V 85 (19946)3 7
Hofer, W., see Weigand, P 85 (1994) 424
948 Author index
Hofsass, H., U. Wahl, M. Restle, C. Ronning and E. Recknagel, Lattice sites of ion implanted Li in indium
antimonide 85 (1994) 468
Hofsass, H., see Storbeck, E.J. 85 (1994) 503
Homma, Y., see Tomita, M 85 (1994) 399
Homman, N.P.-O., see Yang, C. 85 (1994) 808
Fee tee 6 oe ce OP ROO OO Cee REDS SR ES RO UR REO RO RO 688 85 (1994) 689
Horino, Y., see Mokuno, Y 85 (1994) 741
Horino, Y., see Kinomura, A 85 (1994) 921
Horvath, D., E.C. Aschenauer, D. Cauz, D. Chatellard, P. DeCecco, J. Eades, J.-P. Egger, K. Elsener, P
Eugster, F. Formisano, G. Gorini, P. Hauser, F. Kottmann, I. Krafcsik, V. Lagomarsino, G. Manuzio, J
Missimer, R. Poggiani, L.M. Simons, G. Testera, G. Torelli and F. Waldner, Deceleration of MeV
antiprotons and muons to keV energies — the anticyclotron. A progress report 85 (1994) 736
Hésler, W. and R. Darji, On the nonlinearity of silicon detectors and the energy calibration in RBS 85 (1994) 602
Hrubéin, L., J. Huran, R. Sandrik, A.P. Kobzev and D.M. Shirokov, Application of the ERD method for
hydrogen determination in silicon (oxy)nitride thin films prepared by ECR plasma deposition 85 (1994) 60
Hsieh, C.H., see Lin, E.K 85 (1994) 869
Hsu, C.M., see Sharma, V.K.M 85 (1994) 391
85 (1994) 726
S.R. Walker, RBS and recoil spectrometry analysis of CoSi, formation on GaAs 85 (1994) 916
Hult, M., see Johnston, P.N 85 (1994) 907
Huran, J., see Hrub¢éin, | 85 (1994) 60
Hiittel, H.-G., see Mommsen, H 85 (1994) 890
Hymes, S., see Ding, P.J 85 (1994) 167
Hymes, S., see Ding, PJ 85 (1994) 260
Ihmsen, H., see Mommsen, H 85 (19948)9 0
Ikoma, N., see Tamura, M 85 (19944)0 4
TE eS eee eee ee ee ee a Cee LT eee 85 (1994) 68
Ila, D., see Williams, E.K 85 (19945)3 7
Ila, D., see Evelyn, A.L. 85 (19948)6 1
Ila, D., see Taylor, T 85 (19949)0 4
Ishida, T., see Kido, Y. 85 (19944)8 4
Ivan, A., see Ivanov, E.A. 85 (19942)9 3
Ivanov, E.A., D. Plostinaru, G. Nicolescu and A. Ivan, Simultaneous microanalysis of nitrogen and oxygen on
silicon using NRA with a cyclotron 85 (1994) 293
Ivanov, P., see Miteva, V 85 (1994) 340
nS ne se ee ebs oe ae ne eae SOKO Oe SRE NORE ROA eee eee 85 (1994) 28
Jacobson, L., C.A. Pineda, D. Morris and M. Peisach, PIXE analysis of pottery from the northern Cape
Province of South Africa 85 (1994) 901
JakSi¢é, M., see Bogdanovié, | 85 (1994) 732
Jamieson, D.N., M.B.H. Breese and A. Saint, Focused MeV light ion beams for high resolution channeling
contrast imaging 85 (1994) 676
Jamieson, D.N., see Bettiol, A.A 85 (1994) 775
Jamieson, D.N., see Breese, M.B.H 85 (1994) 790
Jans, S., S. Kalbitzer, P. Oberschachtsiek and J.P.F. Sellschop, '°N Doppler spectroscopy of 'H on diamond . . 85 (1994) 321
Jarrendahl, K., see Menyhard, M 85 (1994) 383
Jelinek, B., see Weigand, P 85 (1994) 424
Jenkins, G.M., see Evelyn, A. 85 (1994) 861
Jeynes, C., see Kozanecki, A 85 (1994) 192
Johansson, L., see Yang, C 85 (1994) 808
Johnston, P.N., S.R. Walker, I.F. Bubb, D.D. Cohen, N. Dytlewski, M. Hult, H.J. Whitlow, C. Zaring, M
Ostling and M. Andersson, Mass and energy dispersive recoil spectrometry of Si Ge, _, grown by electron
beam evaporation 85 (1994) 907
Johnston, P.N., see Hult, M 85 (1994) 916
Johnston, P.N., see Studd, W.B 85 (1994) 929
Kaczanowski, J., A. Turos, K. Gartner, T. Bachman and W. Wesch, Evaluation of atomic displacement in ion
implanted GaAs 85 (1994) 607
Kaczanowski, J., see Wesch, W 85 (1994) 533
4uthor index 949
Kalbitzer, S., see Friedland, E 85 (19942)7 2
Kalbitzer, S., see Jans, $ 85 (19943)2 1
KatuZa, S., see Begrambekov, L.B 85 (19943)3 1
Karpe, N., see Krog, J.P 85 (19941)9 7
Karpe, N., see Bottiger, J 85 (19942)0 6
Karpuzov, D., see Miteva, \ 85 (19943)4 0
Karpuzov, D., see Tzanev, S 85 (1994) 443
Kasko, I., see Frey, I 85 (19943)5 6
Katayama, I., see Oura, K 85 (19944)3 9
Khanh, N.O., see Lohner, 85 (19943)3 5
Khanh, N.O., see Lohner, T 85 (19945)2 4
Kido, Y., T. Ishida, E. Nakai, M. Saeki, J.N akata and K. Takahei, Lattice location of Er in GaAs determined
from Monte Carlo simulation of ion channeling spectra 85 (19944)8 4
Kilner, J.A., see Yupu Li, 85 (19942)3 6
Kilner, J.A., see Yupu Li, 85 (19942)8 1
Kilner, J.A., see Beyer, G.P 85 (1994) 370
Kimura, H., see Sayama, H 85 (1994) 703
Kinomura, A., Y. Horino, Y. Mokuno, A. Chayahara, M. Kiuchi, K. Fujii, M. Takai and Y.-F
Three-dimensional analysis of locally deposited silicon oxide on ferrite by a combination of microprobe
RBS and PIXI ie Rie cies 5 (1994) 689
Kinomura, A., Y. Horino, Y. Mokuno, A. Chayahara, M Kiuchi K Fujii M. Takai, T. Lohner, H. Ryssel and
R. Schork, Observation of local SIMOX layers by microprobe RBS (1994) 921
Kinomura, A., see Mokuno, Y 5 (1994) 741
Kinomura, A hye M ; was ‘ peeene aes 5 (1994) 752
Kiss, A.Z.., I Biron T. Calligaro and J Setemen Thick target yields of deuteron induced gamma-ray emission
from light elements . . (1994) 118
Kiss, A.Z., see Borbély-Kiss, I 5 (1994) 836
Kiss, L., I. Krafesik and L. Farkas, Computer sinutation to calculate current distributions and emittance
patterns of ion beams for synthesis of electric lenses (1994) 764
Kitoh, K., see Matsunami, N (1994) 556
Kiuchi, M., see Kinomura, A 5 (1994) 689
Kiuchi, M., see Mokuno, Y 5 (1994) 741
Kiuchi, M., see Kinomura, A 5 (1994) 921
Klein, S.S., H.A. Rijken, P.W.L. van Dijk and M J A. de Voigt High resolution elastic recoil depth profiling
using alpha-particle beams: CERDA-TOF 5 (1994) 655
Klein, S.S., H.A. Rijken, H.P.T. Tolsma and M.J.A. de Voigt, Elastic recoil selection by guise shape analysis (1994) 660
Kling, A., D. Kollewe and B.C. Grabmaier, Dependence of the ‘Li(p, a)"He minimum yield on the
Mg-concentration for proton channeling in LINbO, :M g 5 (1994) 490
Kling, A., see Beck, O 5 (1994) 474
Knapp, J.A., J.C. Banks and B.I (1994) 20
Knolle, W., see Vogt, J 5 (1994) 104
Knox, J.M., see Harmon, J.I §(1994) 33
Kobzev, A.P., see Hrubéin, | §(1994) 60
Kobzev, A.P., see Duvanov, $.M 85 (1994) 264
Kollewe, D., see Beck, O 85 (19944)7 4
Kollewe, D., see Kling, A 85 (1994) 490
Kollewe, D., see Steinecke 85 (19945)2 0
Kollewe, D., see Frése, D 85 (1994) 936
Koltay, E., The application of PIXE 85 (1994) 75
Koltay, E., see Borbély-Kiss, I 85 (1994) 836
Kotai, E., Computer methods for analysis and simulation of RBS and RD. A.s pectra 85 (19945)8 8
Kotai, E., see Lohner, T 85 (19943)3 5
Kotani, N., see Sayama, H 85 (19947)0 3
Kottmann, F., see Horvath, D , 85 (19947)3 6
Kovaé, P., M. Paviovié and J. Dobrovodsky, A 0.9 MV accelerator for materials research at the STU Bratis
lava pe Sans 85 (1994) 749
Kozanecki, A., B.J. Sealy, C. Jeynes, W.P. Gillin and R. Grey Interdiffusion ond thermally induced strain
relaxation in GaAs/In, »Gay,As/GaAs single quantum well structures 85 (1994) 192
Krafcsik, I., L. Farkas, A. Zimmer, C. Rossi, A. Fabris, G. Gorini and R. Poggiani, Beam parameters and
characterization technique 85 (19947)1 6
Krafcsik, 1., see Horvath, D 85 (19947)3 6
950 Author index
Krafesik, I., see Kiss, I 85 (1994) 764
Kral, J. and J. Voltr, lon beam equipment modification for external beam operation 85 (1994) 760
Krause, H., R. Flagmeyer, J. Vogt and K. Pinkert, The use of PIXE /channeling for the localization of zinc in
85 (1994) 494
Kreissig, U., R. Grétzschel and R. Behrisch, Simultaneous measurement of the hydrogen isotopes H, D, T and
*He with HIERD 85 (1994) 71
Krog, J.P., J. Bottiger, N.G. Chechenin and N. Karpe, Measurements of self-diffusion of Ni and interdiffusion
in thin-film amorphous Ni-Zr using RBS 85 (1994) 197
Krog, J.P., see Bottiger, J 85 (1994) 206
Kuduk, R., J. Zuk and D Maczka, Continuum optical radiation produced by Ar* and Kr* bombardment of
semiconductor and metal targets 85 (1994) 794
Kul’ment’ev, A.1., V.E. Storizhko and O.I. Zabashta, Resonant nuclear reaction analysis with high depth
resolution 85 (1994) 633
Kundrak, J., see Vasvary, L 85 (1994) 255
Kuznetsov, A.Yu., V.N. Mordkovich and A.F. Vyatkin, RBS studies of nickel behavior in silicon, amorphized
with nickel ions 85 (19949)4 0
Kvitek, J., 85 (19946)3 7
Lagomarsino, V., see Horvath, D 85 (1994) 736
Lanford, W.A., see Ding, P.J 85 (1994) 167
Lanford, W.A., see Ding, PJ 85 (1994) 260
Latuszynski, A.a nd D. Maczka, Application of radioactive ion beams in the study of implanted layers 85 (1994) 798
Leal, J.L., see Barradas, N.P 85 (1994) 202
Leavitt, J.A., L.C. McIntyre Jr., R.S. Champlin, J.O. Stoner Jr., Z. Lin, M.D. Ashbaugh, R.P. Cox and J.D
Frank, Quantification of beryllium in thin films using proton backscattering 85 (1994) 37
Lebedev, S.G., Theoretical study of ion beam modification of carbon foils 85 (1994) 276
Lee, C., see Takai, M 85 (1994) 752
Lee, M.J., see Yupu Li, 85 (1994) 281
Leech, P.W., see Studd, W.B 85 (1994) 929
Lehmann, D., see Vogt, J 85 (1994) 104
Lennard, W.N., G.R. Massoumi, I.V. Mitchell, H.T. Tang, D.F. Mitchell and J.A. Bardwell, Measurements of
thin oxide films of SiO, /Si(100) 85 (1994) 42
L’Hoir, A., see Battistig, G 85 (1994) 572
I, oats oo ee ae ce ial wi bi et ee a ee ae ee ae ace eo ewe be ee ae 85 (1994) 414
Liew, S.C., K.K. Loh and S.M. Tang, Application of an iterative maximum-likelihood algorithm in PIXE depth
profiling of trace elements 85 (1994) 621
Liew, S.C., see Osipowicz, T 85 (1994) 499
Liew, S.C., see Watt, F 85 (1994) 708
Lin, E.K., C.T. Shen, Y.C. Yu, C.W. Wang, C.H. Hsieh and S.C. Wu, External-beam PIXE analysis of ancient
chinese coins 85 (1994) 869
85 (1994) 37
Lin Chen Lu, , see Lohner 85 (1994) 524
Linker, G., see Garcia Lépez, J 85 (1994) 462
Linnarsson, M.K., B.G. Svensson, Z.F. Paska and J. Borglind, Influence of layer thickness and primary ion on
profile broadening during sputtering of Al, <Ga, <As/GaAs structures 85 (1994) 395
Linnarsson, M.K., see Svensson, B.G. 85 (1994) 363
Lipp, S., see Frey, L 85 (1994) 356
Liu, J.R., Z.S. Zheng, Z.H. Zhang and W.K. Chu, RBS and ERD analysis using lithium ions 85 (1994) 51
Liu, J.R., Z.S. Zheng, N. Yu and W.K. Chu, ’Li-induced reactions for light elements analysis 85 (1994) 780
Loh, K.K., see Osipowicz, T 85 (1994) 499
Loh, K.K., see Liew, S.C 85 (19946)2 1
Loh, K.K., see Watt, F 85 (1994) 708
Loh, K.K., see Orlic, I 85 (19948)4 0
Lohner, T., E. Kotai, N.Q. Khanh, Z. Téth, M. Fried, K. Vedam, N.V. Nguyen, L.J. Hanekamp and A
van Silfhout, lon-implantation induced anomalous surface amorphization in silicon 85 (1994) 335
Lohner, T., Z. Téth, M. Fried, N.Q. Khanh, G.Q. Yang, Lin Chen Lu, S. Zou, L.J. Hanekamp, A. van Silfhout
and J. Gyulai, Comparative investigation of damage induced by diatomic and monoatomic ion implantation
in silicon 85 (1994) 524
85 (1994) 752
85 (19949)2 1
Author index 951
Lu, Y.-F., see Kinomura, A 85 (1994) 689
Lundberg, N., see Hult, M 85 (1994) 916
Macias, V.M., see Miranda, J 85 (1994) 886
Maczka, D., see Kuduk, R 85 (1994) 794
Maczka, D., see Latuszyfski, A 85 (1994) 798
Madhusoodanan, K.N., see Wendler, 85 (1994) 528
Maenhaut, W., see Salma, | 85 (1994) 849
Mahunka, I., see Vasvary, I 85 (1994) 255
Malmoavist, K.G., lon beam analysis for the environment 85 (1994) 84
Malmavist, K.G., see Yang, ¢ ee ee 85 (1994) 808
Mando, P.A., Advantages and limitations of external beams in applications to arts & archeology, geology and
environme ental problems 85 (19948)1 5
Mando, P.A., see Giuntini, I 85 (19947)4 4
Manuzio, G., see Horvath, D 85 (1994) 736
Marais, T.K., E. Taylor, M. Ndwandwe, B. Spoelstra and R. Pretorius, Prediction and characterization of
compound phase formation at Ge-metal interfaces in thin film structures 85 (19941)8 3
Mariotto, G., see Freire Jr., F.1 85 (1994) 55
Marques, J.G., see Alves, E 85 (19944)5 7
Marsh, C.D., see Yupu Li, 85 (19942)3 6
Massoumi, G.R., see Lennard, W.N 85 (1994) 42
Mathot, S., see Demortier, G 85 (19943)1 1
Matsunami, N. and K. Kitoh, Non-Gaussian energy loss distribution of light ions in thin films 85 (19945)5 6
Maxwell, J.A., see Campbell, J.1 85 (19941)0 8
Mayer, M., B.M.U. Scherzer and W. Eckstein, Trapping and reflection coefficients for deuterium in graphite
at low energy and oblique incidence 5 (1994) 560
Mboweni, R.C.M., C.A. Pineda, M. Peisach and A.E. Pillay, A PIXE study of abnormal X-rays from binary
fluorides with protons in the range 0.4-2 MeV 5 (1994) 138
McIntyre Jr., L.C., see Leavitt, J.A 5 (1994) 37
McPhail, D.S., see Sharma, V.K.M (1994) 391
Melo, A.A., see Alves, I (1994) 457
Menyhard, M., A. Barna, A. Sulyok, K. Jarrendahl, J.-I Sundesen ond jp Bier sack, Low energy ion mixing
in Si—-Ge multilayer system (1994) 383
Mercandalli, L.M., see Cheang Wong, J.¢ _ (1994) 171
Mercier, F., N. Toulhoat, P. Trocellier and ( Dead, Characterization of organic matter / minerals associa
tions in oilfield rocks using the nuclear microprobe 5 (1994) 874
Meyer, O., see Turos, A 5 (1994) 448
Meyer, O., see Garcia Lopez, J 5 (1994) 462
Michaud, V Toulhoat, P Trocellier and P. Courel, Elemental and isotopic ‘distributions of boron and
lithium in tourmalines using nuclear microprobe 5 (1994) 881
Mikhailov, S.N., see van den Oetelaar, L.C.A (1994) 420
Mimura, R., H. Sawaragi, R. Aihara and M. Takai, Developme nt of a 200 kV FIB system for non destructive
three-dimensional near surface analysis 0 e0 eae ‘nie (1994)7
Miranda, J., A. Oliver, G. Vilaclara, R. Rico-Montiel, V.M. Macias, J.L. Ruvalcaba and M.A. Zenteno,
Analysis of diatomite sediments from a paleolake in central Mexico using PIXE, X-ray tomography and
X-ray diffraction 5 (1994) 886
Miranda, J., see Rodriguez-Fernandez, | (1994) 150
Missimer, J., see Horvath, D (1994) 736
Mitchell, D.F., see Lennard, W.N (1994) 42
Mitchell, 1.V., see Lennard, W.N (1994) 42
Miteva, V., D. Karpuzov, P. Ivanov and St. Angelova, Stoichiometry effects at Cu—Ni alloy surfaces during 5
keV Ar ion sputtering at room temperatures 85 (1994) 340
Mohadjeri, B., see Svensson, B.G 85 (1994) 363
Mokuno, Y., Y. Horino, A. Kinomura, A. Chayahara, M. Kiuchi, K. Fujii and M. Takai, MeV hoo ion
microprobe PIXE for the analysis of the materials surface 85 (1994) 741
Mokuno, Y., see Kinomura, A 85 (19946)8 9
Mokuno, Y., see Kinomura, A 85 (19949)2 1
Molina, S.1., see Barradas, N.P 85 (1994) 202
Mommsen, H., Th. Beier, M.L. Garg, D. Heimermann, F. Hennrich, HL Saensen and H.-G. Hiittel, PIXE
analysis of Bronze and Iron Age weapons from Bactria 85 (1994) 890
952 Author index
Morazzani, V., A. Grosman, C. Ortega, S. Rigo and J. Siejka, Contribution of IBA techniques to the study of
porous silicon films 85 (1994) 287
Morciaux, Y., see Demortier, G 85 (1994) 112
Mordkovich, V.N., see Kuznetsov, A. Yu. 85 (1994) 940
Morioka, H., see Oura, K 85 (1994) 344
Morishita, H., see Oura, K 85 (1994) 439
Morishita, Y., see Tamura, M. 85 (19944)0 4
Morris, D., see Jacobson, L 85 (1994) 901
Morse, D.H., A data acquisition system for scanning microbeam analysis 85 (1994) 693
Morse, D.H., see Antolak, A.J. 85 (1994) 597
Muralev, V.A., Scattering of heavy ions in crystals 85 (1994) 584
Murarka, S.P., see Ding, P.J 85 (19941)6 7
Murarka, S.P., see Ding, PJ 85 (1994) 260
Naitoh, M., see Oura, K 85 (1994) 344
Nakai, E., see Kido, Y 85 (19944)8 4
Nakata, J., see Kido, Y 85 (19944)8 4
85 (1994) 183
Nebiker, P.W., see Dobeli, M. 85 (1994) 770
Nejedly, Z., see Potocéek, V 85 (1994) 611
Nejim, A., see Yupu Li, 85 (19942)3 6
Nekab, M., A. Pape and Ch. Heitz, A study of the ionization of Al, Si, S, Sc, Ti and V by Ar ions in the energy
range 1-5 MeV 85 (19941)2 3
Neshev, I., see Tzanev, S 85 (19944)4 3
Nguyen, N.V., see Lohner, T 85 (19943)3 5
rn aah ob be Cae + Od OOS OAR Oe bb a eee eee eee eeaes 85 (19942)9 3
Nittono, O., see Arai, E 85 (19942)2 6
Nowicki, L., see Turos, A 85 (19944)4 8
85 (1994) 272
Oberschachtsiek, P., see Jans, S 85 (1994) 321
Obrusnik, I., see Havranek, V. 85 (1994) 637
Ohkouchi, S., see Tamura, M 85 (19944)0 4
Ohno, Y., see Sayama, H 85 (1994) 703
Oliver, A., see Rodriguez-Fernandez, L 85 (1994) 150
Oliver, A., see Miranda, J 85 (19948)8 6
Olivier, C. and H.L. Van Niekerk, On the use of LiF as non- and analyte spike for the determination of
fluorine by PIGE 85 (1994) 128
Orlic, Ii., , F. Watt, K.K. Loh and S.M. Tang, Nuclear microscopy of single aerosol particles 85 (19948)4 0
Orlic, I., see Sow, C.H 85 (1994) 133
Orlic, L., see Osipowicz, T 85 (19944)9 9
Orlic, L., see Watt, F 85 (19947)0 8
Ortega, C., see Cheang Wong, J.C 85 (1994) 171
Ortega, C., see Morazzani, V 85 (1994) 287
Ortega, C., see Garcia Lopez, J 85 (19944)6 2
Osiceanu, P., see Brijs, B 85 (1994) 306
Osiceanu, P., see De Coster, W 85 (1994) 911
Osipowicz, T., S.C. Liew, K.K. Loh, I. Orlic, S.M. Tang and Th. Weber, Reconstruction of Ar depth profiles
from PIXE measurements 85 (19944)9 9
Osipowicz, T., see Sow, C.H 85 (19941)3 3
Osipowicz, T., see Watt, F 85 (19947)0 8
Ostling, M., see Johnston, P.N 85 (19949)0 7
Ostling, M., see Hult, M 85 (19949)1 6
Oura, K., M. Naitoh, H. Morioka, M. Watamori and F. Shoji, Elastic recoil detection analysis of coadsorption
of hydrogen and deuterium on clean Si surfaces 85 (1994) 344
Oura, K., Y. Tanaka, H. Morishita, F. Shoji and 1.K atayama, Low energy ion scattering study of hydrogen-
induced reordering of Pb monolayer films on Si(111) surfaces 85 (1994) 439
Pape, A., see Nekab, M 85 (19941)2 3
Pape, A., see Waksman, S.Y 85 (1994) 824
Paska, Z.F., see Linnarsson, M.K 85 (1994) 395