Noise in Physical Systems: Proceedings of the Fifth International Conference on Noise, Bad Nauheim, Fed. Rep. of Germany, March 13–16, 1978

344 Pages·1978·8.65 MB·English

by  A. van der Ziel (auth.)

Springer Series in Electrophysics
Volume 2
Edited by WalterEngl
Springer Series in Electrophysics
Editors: G.Ecker W.Engl L.B.Felsen K.S.Fu T.S.Huang
Volume 1 Structural Pattern Recognition
By T. Pavlidis
Volume 2 Noise in Physical Systems
Editor: D. Wolf
NNooiissee iinn
PPhhyyssiiccaall SSyysstteemmss
PPrroocceeeeddiinnggss ooff tthhee FFiifftthh IInntteerrnnaattiioonnaall CCoonnffeerreennccee
oonn NNooiissee,, BBaadd NNaauuhheeiimm,, FFeedd.. RReepp.. ooffGGeerrmmaannyy,,
MMaarrcchh 1133--1166,, 11997788
EEddiittoorr DDiieettrriicchh WWoollff
WWiitthh 118822 FFiigguurreess
SSpprriinnggeerr--VVeerrllaagg
BBeerrlliinn HHeeiiddeellbbeerrgg GGmmbbHH 11997788
Professor Dr. Dietrich Wolf
Universität Frankfurt, Institut für Angewandte Physik
Robert-Mayer-Strasse 2-4, D-6000 Frankfurt a. M. 1, Fed. Rep. of Germany
Series Editors:
Professor Dr. Günter Ecker Professor Leopold B. Felsen, PhD
Ruhr-Universität Bochum Polytechnic Institute ofNew Yo rk
Theoretische Physik, Lehrstuhl I 333 Jay Street
Universitätsstrasse 150 Brooklyn, NY 11201, USA
D-4630 Bochum-Querenburg
Fed. Rep. ofGermany
Professor Dr. Walter Engl Professor King Sun Fu, PhD
Professor Thomas S. Huang, PhD
Institut für Theoretische Elektrotechnik
Rhein.-Westf. Technische Hochschule School ofElectrical Engineering
Templergraben 55, D-51 00 Aachen Purdue University
Fed. Rep. ofGermany West Lafayette, IN 47907, USA
Organization
Fifth International Conference on Noise in Physical Systems
International Advisory Board
P. Mazzetti, Torino (Italy) R. J. van Overstraeten, Louvain (Belgium)
M. Savelli, Montpellier (France) H. Sutcliffe, Salford (England)
H. Thomas, Basel (Switzerland) K. M. van Vliet, Montreal (Canada)
A. van der Ziel, Minneapolis (USA) R. J. J. Zijlstra, Utrecht (Netherlands)
Program and Organizing Committee
Chairman: C. Heiden, Gießen
Members: H. Bittei, Münster W. Grosse-Nobis, Münster
R. Müller, München F. Schlögl, Aachen L. Storm, Münster
D. Wolf, Frankfurt a. M.
ISBN 978-3-642-87642-4 ISBN 978-3-642-87640-0 (eBook)
DOI 10.1007/978-3-642-87640-0
This work is subject to copyright. All rights are reserved. whether the whole or part of
the material is concerned, specifically those of translation, reprinting, re-use of illustrations,
broadcasting. reproduction by photocopying machine or similar means, and storage in da ta
banks. Under 954 of the German Copyright Law where copies are made for other than
private use, a fee is payable to the publisher, the amount of the fee to be determined by agreement·
with the publisher.
© by Springer-Verlag Berlin Heidelberg 1978
Originally published by Springer-Verlag Berlin Heidelberg in 1978
Softcover reprint of the hardcover 1st edition 1978
The use of registered names, trademarks, etc. in this pnblication does not imply, even in
the absence of a specific statement, that such names are exempt from the relevant protcctive
laws and regulations and therefore free for general use.
2153/3130-543210
Preface
Noise in physical systems - as a consequence of the corpuscular nature of
matter - conveys information about microscopic mechanisms determining the
macroscopic behavior of the system. Besides being a source of information,
noise also represents a source of annoying disturbances which affect
information transMission along a physical system. Therefore, noise analysis
can promote our insight into the behavior of a physical system, as well as
our knowledge of the natural constraints imposed upon physical-information
transmission channels and devices.
In recent years the continuous scientific and technical interest in noise
problems has led to a remarkable progress in the understanding of noise
phenomena. This progress is reflected by the rich material presented at the
Fifth International Conference on Noise in Physical Systems.
The conference papers originally published in these proceedings cover
the various aspects of today's noise research in the fields of solid-state
devices, l/f-noise, magnetic and superconducting materials, measuring
methods, and theory of fluctuations. Each session of the conference was
introduced by one or two invited review lectures which are included in
these proceedings in full length. The 12 invited papers and more than 40
contributed papers on specific topics (only three of them have been omitted
from the proceedings since they will be published elsewhere) provide a
comprehensive survey of the current state-of-the-art and recent advances of
noise analysis.
The conference held in Bad Nauhei~, F.R. Germany, from 13-16 March 1978,
was organized under the auspices of the German Physical Society (DPG) and
supported by the German Science Foundation (DFG), the "Hessische Kultus
minister", the Section Hessen-Mittelrhein-Saar of the DPG, and the Low
Temperature Section of the Solid-State Physics Division of the DPG. The
Bad Nauheim conference has been the fifth in a sequence of noise conferences.
previously held in Nottingham (England) 1968, Toulouse (France) 1971,
Gaihsville (USA) 1973, and Noordwijkerhout (Netherlands) 1975.
An International Advisory Board assisted the Program ·and Organization
Committee, the members of which are listed on the opposite page. I would
like to thank them for their fruitful cooperation. Special acknowledgement
has to be given to the conference chairman C. Heiden for his excellent
preparation and local arrangements. Finally, I thank Dr. H. Lotsch, who
suggested publication of the conference papers in the Springer Series in
EZectrophYBics.
July 1978 Dietrich Wolf
v
Contents
I. Noise in Semiconductor Devices
Limiting Noise in Solide State Devices. By A. van der Ziel .......... 2
Generation-Recombination Noise. By R. MUller........................ 13
An Accurate Expression for the Noise Figure of Bipolar Transistors
Including Crowding Effect. By J. Caminade, G. Le Gac, and
G. Blasquez .......................................•............... 26
An Accurate Noise Analysis in MESFET Including Hot Carrier Effects
By J. Graffeuil, J.F. Sautereau, G. Blasquez, and P. Rossel ....... 30
Noise in MESFETs in the Range of 1-100 MHz. By A. Sodini, M. Savelli,
G. Lecoy, and D. Rigaud ........................................... 34
On the Influence of the Extended Space Charge Region in Avalanche
Photodiodes. By G. Lecoy, C. Maille, D. Ratsira, and R. Alabedra 38
Photon-Counting Statistics of Cathodo-Luminescence Light Emitted by
ZnS:Ag. By J. Timmermans and R.J.J. Zijlstra ..................... 42
Acoustoelectric Fluctuations in Photoconducting CdS. By P.A. Gielen
and R.J.J. Zijlstra ............................................... 49
Large Signal Low Frequency Noise in Impatt Diodes in the Presence of
a Saturation Current. By R. Perichon and E. Constant ............. 56
Physical Sources of Burst Noise. By G. Blasquez and J. Caminade ..... 60
A Burst Noise Model for Integrated Bipolar Transistors with Anomalous
I-V Characteristics. By G. Doblinger .......................•.•... 64
II. Hot Carrier Noise
Survey of Noise of Hot Carriers: Some Experimental and Theoretical
Aspects. By J.P. Nougier ......................................... 72
Non-Ohmic Transport Fluctuations in Semiconductors.
By R.J.J. Zijlstra ................................................ 90
Monte Carlo Calculation of Non-Steady State Hot Electron Noise in
Very Short Channel n-Si and n-GaAs Devices. By J. Zimmermann,
Y. Leroy, A. Kaszynski, and B. Carnez ............................. 101
VII
Hot Carrier Noise in GaAs Epilayer for FET. By J. Graffeuil,
J.F. Sautereau, and J.C. Martin ................................... 106
Effect of Hot Carriers on the Thermal Noise of p-Type Silicon and in
SCLC Single Injection Diodes. By J.P. Nougier, D. Gasquet,
J.C. Vaissiere, and H.R. Bilger................................... 110
Fluctuation Spectra Near the Threshold of a Current Instability
By M. BUttiker and H. Thomas...................................... 115
III. Iff-Noise
Iff-Noise. By D. Wolf ........................•...................... 122
Current Noise in Thick Film Resistors. By T.M. Chen ................. 134
Iff-Noise in Single Injection Diodes. By T.G.M. Kleinpenning ........ 140
Iff-Noise in Hall Voltage. By H.M.J. Vaes and T.G.M. Kleinpenning 144
Iff-Noise in Indium Antimonide. By J. Sikula, B. Koktavy, and
P. Vasina ......................................................... 148
Bulk Iff-Noise in MOS Transistors at Low Drain-Source Voltages
By L.K.J. Vandamme and A.H. de Kuijper ............................ 152
Temperature and Substrate Dependence of Iff-Noise in Continuous Metal
Films. By P. Dutta, P.M. Horn, and J.W. Eberhard................. 157
Isomorphism of Non-Lorentzian Noises and Phase Transitions of Second
Order. By M. Mikulinsky and S. Fishman ........................... 160
Variance Noise Simulations. By A. Ambrozy ........................... 165
Amplitude Distribution of Iff-Noise. By P.H. Handel and D. Wolf 169
Low Frequency Noise and Deep Traps in Schottky Barrier Diodes
By A.J. Grant, A.M. White, and B. Day ............................. 175
Surface Influence on Iff-Noise in Bipolar Transistors
By M. Stoisiek and D. Wolf........................................ 181
Noise in a Semiconductor Device Working Under Critical Conditions
By D. Berl an, P. Vi ktorovitch, and G. Kamari nos ................... 187
IV. Noise in Magnetic Materials
Magnetization Noise and Power Loss in Magnetic Materials
By P. Mazzetti ...•................................................ 192
Stationarity and Behaviour of Barkhausen Noise in Magnetic Thin Films
By N.J. Wiegman, R. ter Stege, and A.H. de Kuyper ................. 199
VIII
Analysis of Soft Magnetic Material by Means of Barkhausen Noise
Cross Spectra. By W. Grosse-Nobis and K. Jansen .....•...•.•.....• 204
V. Noise in Superconductors and Superconducting Devices
Noise Limitations of the dc SQUID. By J. Clarke ....•..............•. 210
Theory of Fiux-Flow Noise in Superconductors. By J.R. Clem •..•...... 214
Noise in the Flux-Tube Nucleation of the Current-Induced Resistive
State of Type-r Superconductors. By K.P. Selig, D.E. Chimenti,
and R. P. Huebener .....•...........................•....•.......... 223
On the Time Behavior of Local Flux-Flow Noise in Niobium and Vanadium
Foils. By H. Dirks and C. Heiden .•.•............................. 229
Cross Correlation Measurements on Moving Vortex Arrays
By K. Beckstette and C. Heiden ............•....................... 234
VI. Noise Measuring Techniques
Noise Thermometry with Conventional Electronics. By L. Storm ........ 240
Noise Thermometry Using Josephson Junctions. By R.J. Soulen, Jr .•... 249
On the Theory of the Resistive-SQUID-Thermometer. By S.N. Erne 260
Anomalous Noise Automatic Measurements in Driven Ferroelectrics
By M. Jannin ...................................................... 266
Determination of Viscoelastic Properties of Some Nematics by Noise
Measurements. By D.C. van Eck and R.J.J. Zijlstra ................ 270
VII. Theory
Instabilities and Fluctuations in Systems Far from Thermodynamic
Equilibrium. By H. Thomas........................................ 278
Noise in Nonlinear Optics. By A. Stahl •............................. 297
Noise Effects in the Locking of Supermodes (Statistical Effects in
Laser Modelocking). By H.A. Haus •.....•..........•....•.......... 304
Reconciliation of Photon Noise Statistics and Electron Statistics in
a Solid in Equilibrium with the Radiation Field.
By K.M. van Vliet, R.J.J. Zijlstra, and N.G. van Kampen ...•.....•. 309
Noise Due to Reduction and Multiplication Processes
By K.M. van Vl iet ................................................. 314
On the Use of a General Equation for Markov Processes in Linear and
Nonlinear Noise Theory. By A.A. Walma ............................ 318
Fluctuation of Level-Crossing Time Intervals of Noise. By T. Mimaki
and D. Wolf ....................................................... 323
Information, Critical Fluctuations and Phase-Transition-Like
Phenomena in Open Nonlinear Chemical Systems. By G. Czajkowski .,. 327
Theory of Avalanche Noise. By K.M. van Vliet and L.M. Rucker ........ 333
Index of Contributors ............................................... 337
x