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Noble Metals, Noble Metal Halides and Nonmagnetic Transition Metals PDF

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Ref. p. 12] 1.1 Historical remarks 1 1 Introduction 1.1 Historical remarks The photoelectric effect has been discovered already in 1887 by Heinrich Hertz [1887H], when he observed that sparking of a spark gap was enhanced by ultraviolet light. Subsequent work [1888H, 1899T, 1900L, 1902L] revealed that electrons were emitted whose maximum kinetic energy was proportional to the frequency of the incident light, and whose number was proportional to the light intensity. In 1905 Albert Einstein [1905E] published the quantum theory of the photoelectric effect, for which he received the Nobel Prize in 1921. Several reviews give an account of the early and the further history of photoelectron spectroscopy [32H, 77J, 78C1, 82S1, 82S2, 88M]. After more than 100 years since its discovery, we may state that the photoelectric effect and the many photoelectron spectroscopies based on it represent one of the most productive areas in solid state and surface science, with considerable impact also to today's technology. Modern photoemission spectroscopy, now representing one of the most important tools to investigate the electronic structures of atoms, molecules, solids and surfaces (including interfaces), started 20 to 30 years ago. Several important experimental developments contributed (among others) to the rapid progress of that field: The field of X-ray photoelectron spectroscopy (XPS) was pioneered by Kai Siegbahn and his group, mainly by the development of high-resolution, high-sensitivity electron spectrometers and intense soft X-ray line-sources (for details see Table 1, Section 1.3) [67S, 69S]. This work was awarded with the Nobel Prize in 1981 [82S1]. The field of ultraviolet photoelectron spectroscopy (UPS) was pushed forward mainly by three advances: First, the development of windowless high-intensity uv-lamps such as the HeI and the HeII line-sources (for details see Table 1, Section 1.3). Second, the advent of high- resolution, high sensitivity, electrostatic electron energy analyzers which allowed angle-resolved UPS investigations in reasonable times [82P, 83H, 84C]. Third, the availability of synchrotron radiation from "dedicated" storage rings as tunable, intense sources of linearly and/or circularly polarized photons [83K]. This instrumental progress allowed to develop experimental methods to measure both the energy and the momentum of the electrons, i.e. to map the electronic energy band structure along many k-space directions [82P, 83H, 84C, 92K, 95H1]. For the future we may predict further progress in the field of photoelectron and related spectroscopies. A new generation of dedicated sychrotron radiation sources is now available. These are based on magnetic insertion devices (wigglers, undulators) and improved monochromator concepts [97P1]. They supply us with very intense, high-brilliance radiation of simultaneously high energy-resolution and tunable polarization. These sources will allow measurements to be performed with photons in the energy range up to about 1 keV at high photon energy resolution (10...100 meV), high lateral resolution (10...100 nm) and spectroscopically relevant temporal resolution (pico- to nanoseconds). In conclusion, these sources will enable us to collect data like those presented in this volume at, however, much improved resolution and accuracy. This statement refers to core-level spectroscopy as well as to symmetry-resolved mapping of energy bands. We may summarize that after more than a century of photoemission studies [95B] the kinematics of the photoemission process is well understood. This refers to both one-photon photoemission [92K, 95H1] and two-photon photoemission [95F, 95S]. Provided good quality single-crystals as well as recipes to prepare surfaces with the desired stoichiometry and sufficient lateral order are available, the determination of energies and energy bands is now almost routine using tunable photon sources. This business, however, is only the lower level of every spectroscopy. The higher and more sophisticated level concentrates on measurement and understanding of line shapes [98H, 98M, 99H, 99V, 00L, 00M] and peak intensities La nd o l t - B ö r ns t e in New Series III/23C1 2 1.2 Arrangement of data, 1.3 Definition of quantities [Ref. p. 12 [98M, 99M, 01P]. In the last few years photoelectron spectroscopy has progressed to a point [98H, 98P, 99V, 00R], where these quantities are no longer exclusively determined by experimental resolution constraints, but also by the "intrinsic" quantities like photohole-lifetime [98H, 00C2, 00P, 01G, 01Z, 02G, 02Z] and the lifetime of the excited electron [00C1, 00E, 00P, 02B]. Spoken more generally, the line shape may give detailed information on the dynamics of the solid as a correlated many-particle system, including electron-electron [97P3, 00C1, 00E] and electron-phonon [99H, 99P, 99V, 00L, 00R] interactions. This development opens up a completely new field which recently got additional impetus by the advent of two-photon photoelectron spectroscopies with time-resolution on the femtosecond scale [95H2, 96O, 97O, 97P2, 97P3, 97W, 98A, 98K, 00E, 00P]. Moreover, free-electron-lasers with high- intensity and high-brilliance specifications will be operating in the near future. We may therefore anticipate further progress in photoelectron and related spectroscopies. 1.2 Arrangement of data Each chapter has a separate introduction referring to special aspects of the materials under consideration. Within each chapter the organisation is as follows. First, general data (as far as available) are summarized on crystal structure, electronic configuration, work functions, plasmon energies, core level binding energies, valence band critical point energies, and other relevant quantities. Then diagrams are collected reproducing angle-integrated as well as angle-resolved valence-band and core level spectra, calculated energy bands and corresponding densities of states, and in particular experimental electron energy dispersion curves E(k). When considered necessary, also optical spectra and results obtained with other experimental techniques are shown to supplement the electronic structure information. Figures and tables within Chaps. 2.9, 2.10 and 2.11 are numbered consecutively through their subsections. In the tables of this volume, experimental errors are given in parentheses referring to the last decimal places. For example 1.23(45) stands for 1.23 ± 0.45 and 9.9(11) stands for 9.9 ± 1.1. 1.3 Definition of quantities Two features of photoemission spectroscopy (PES) and its time-reversed counterpart, inverse photoemission spectroscopy (IPES) are of particular interest: First, initial and final state energies of radiative transitions are directly determined by the experiment. Other methods, e.g. light absorption or reflection, can in general only determine the energy difference between initial and final state. Second, the electron momentum !k may be determined in angle-resolved experiments using single-crystal samples. The schematics of PES and IPES are shown in Fig. 1. PES and IPES can supply information on the electron energy eigenvalues E(k) and their dependence on the electron wave vector k. As is evident from Fig. 1, the combination of both techniques can investigate all energy bands below and above the Fermi level at EF. La nd o l t - B ö r ns t e in New Series III/23C1 Ref. p. 12] 1.3 Definition of quantities 3 Fig. 1. Schematics of photoemission (top) and inverse photoemission (bottom). The angles of photon (α) and electron (θ) are defined with respect to the surface normal. The shaded region of the energy band structure is accessible to the respective technique. Radiative transitions occur between initial state | i〉 and final state | f〉. It is not intended here to describe the techniques and theories of PES and IPES in detail, since many excellent reviewing articles and detailed monographs are available [70T, 72S, 77B, 77I, 78C1, 78C2, 78C3, 78F, 79B, 79C, 80W, 83D, 83S, 83W, 84B, 84D, 85D, 86H, 86S, 87B, 87L, 88S, 95S]. Therefore, only a very brief overview of the methods will be given. The typical PES [82P, 83H, 84C, 92K, 95H1] experiment is illustrated in Fig. 1. Photons of energy !ω impinge on the sample. If a photon is absorbed in an occupied state | i〉, at energy Ei below the Fermi level EF (Ei = 0 at EF), an electron is excited into an empty state | f〉 at energy Ef. Energy conservation requires Ef − Ei = !ω (The sign convention used in this volume is summarized in Fig. 2). If Ef > Evac, the energy of the vacuum level, the electron in the excited state may leave the sample. The emitted electrons are then analyzed with respect to their intensity, kinetic energy Ek, and other variables of interest like: direction and polarisation of incident light, emission direction of electrons with respect to incident photon direction and/or with respect to the crystal lattice coordinates, and (sometimes) the electron spin-polarization [85K, 86F, 94D]. PES gives thus information on the occupied states below EF and empty states above Evac. Energy conservation states that !ω = Ef − Ei = Ek + φ − Ei, where φ = Evac − EF is the work function. If φ is known [79H] or measured (the width of the experimental photoelectron distribution is given by !ω − φ, compare Fig. 3) both Ei and Ef are uniquely determined. IPES [83D, 83W, 84D, 85D, 86H, 86S, 88S] is illustrated in Fig. 1 (bottom). The electron at La nd o l t - B ö r ns t e in New Series III/23C1 4 1.3 Definition of quantities [Ref. p. 12 Ei = Ek + φ impinges on the crystal, penetrates the surface and enters the previously empty state | i〉 at Ei > Evac. By emission of a photon, the state at Ei is connected with state | f〉 at Ef ≥ EF = 0. The emitted photon of energy !ω is registered in an energy-resolving detector [84D, 86H, 86D, 86S]. Again, Ei and Ef are determined by the kinematics of the experiment. Fig. 2a. Sign convention for energies in case of Fig. 2b. Sign convention for energies in case of metallic samples, where the position of EF is clearly semiconductors and/or insulators, where in general the observed in the photoelectron spectra. If not stated upper valence band edge at EVBM (valence band otherwise, the energy zero is at EF. In the literature on maximum) is better defined in the experimental spectra PES, the term "binding energy" is often used, with the than the position of EF. If not stated otherwise, the convention that | Ei | = Eb ≥ 0. energy zero is at EVBM. In the literature on PES, the term "binding energy" is often used, with the convention that | Ei | = Eb ≥ 0. Most PES experiments measure an electron distribution curve (EDC), i.e. the number I(Ek) of emitted electrons, see Fig. 3. If !ω is sufficiently large, emission out of core levels is observable. The area of the corresponding peak (shaded in Fig. 3, and superimposed to a continuous background of inelastically scattered electrons) is proportional to the number of emitting atoms. Its energy Ei identifies the emitting element and very often ("chemical shift") also the chemical environment. Emission from occupied valence states in PES or into empty valence states in IPES yields information on the density of states. In general, however, even the angle-integrated EDC does not directly reflect the density of states D(Ei), as idealized in Fig. 3. In the following we will discuss this point for PES in some detail. Angle-integrated PES of bulk states can transparently be described by a three-step model [68S] (for more refined treatment we refer to [83H, 84C, 92K, 95H1]): photoexcitation of an electron, travelling of that electron to the surface, and escape through the surface into the vacuum. Beyond the low-energy cutoff at Evac travelling through the solid and escape are described by smooth functions of E and will not give rise to structure in I(Ek). Therefore primarily the photoexcitation process determines the shape of the EDC. For bulk states, where La nd o l t - B ö r ns t e in New Series III/23C1 Ref. p. 12] 1.3 Definition of quantities 5 crystal momentum !k is a quantum number conserved in the reduced zone scheme ("vertical transitions" in Fig. 1) we then find for the distribution of photoexcited electrons 3 2 . I(Ek, !ω) ≈ ∑ ∫ d k |〈f | p | i〉| · δ1 δ2 (1) i, f where δ1 = δ{Ef(k) − Ei(k) − !ω} and δ2 = δ{Ef(k) − φ − Ek}, and the k-space integral is to be extended only over occupied states | i〉. The δ1-function assures energy conservation, while δ2 selects from all transitions possible with photons of energy !ω only those that are registered by the electron energy analyser. If we take for the moment the transition matrix element Mfi = 〈f | p | i〉 to be constant, eq. (1) reduces to the so-called energy distribution of the joint density of states 3 . I (Ek, !ω) ≈ ∑ ∫ d k · δ1 δ2 (2) i, f Fig. 3. Illustration of the fact that in angle-integrated PES the density of occupied states D(Ei) is often approximately reflected in the emitted electron energy distribution curve I(Ek). We will then expect that at low photon energies (typically !ω < 20 eV) the angle-integrated EDC does generally not reflect the density of occupied states, since only few final states for photoexcitation are available. However, at increasing !ω, the number of accessible final states increases and the intensity modulation through these | f〉 states becomes less important. The EDC will then progressively become a replica of the initial density of states (DOS), as long as Mfi = constant. If Mfi is not constant, the EDC represents the initial DOS modulated by the matrix element varying in k-space. Similar considerations are applicable to IPES. The experimental method for mapping Ei(k) is angle-resolved PES, with vacuum-ultraviolet excitation radiation [82P, 83H, 84C]. While Ei and Ef are easily determined, a problem [82P, 83H, 84C, 92K, 95H1] arises with k. Upon penetration of a single-crystal surface by an electron only k , the wave- || vector component parallel to the surface, is conserved and directly obtainable from the kinematical 2 l/2 l/2 parameters: k || = sinθ (2m/! ) Ek , where m is the free electron rest mass. The investigation of bulk states E (k , k ) requires additional information on k which is not conserved. In most PES experiments || ⊥ ⊥ reasonable assumptions were therefore made (e.g. "free-electron-like", i.e. parabolic final state bands [82P, 83H, 84C, 92K, 95H1]) to extract k from one EDC. However, several (albeit time-consuming and ⊥ tedious) "absolute" methods may also be applied to determine the full wave-vector (k , k ) experimentally || ⊥ from at least two ECD's viewing the k-space from different directions. A detailed discussion of such methods has been presented in [82P, 83H, 84C, 92K, 95H1]. For a most elegant new strategy of band mapping, which provides full control of the three-dimensional k-vector, see [00S, 01S]. La nd o l t - B ö r ns t e in New Series III/23C1 6 1.3 Definition of quantities [Ref. p. 12 Photoelectric cross sections at 1.5 keV for atomic levels are shown in subvolume a, see Fig. 3 of section 2.5 (see also Fig. 13 of section 2.8 in subvolume b). Data for other excitation energies can be found in [81G, 76S]. Calculated partial photoionization cross sections in the energy region 0...1500 eV are given for all elements Z = 1...103 in [85Y]. A list of line sources commonly used in laboratory PES is given in Table 1. Table 1. Commonly used line sources for photoelectron spectroscopy [78C1]. Source Energy Relative Typical intensity at Linewidth [eV] intensity the sample [meV] –1 [photons s ] 12 He I 21.22 100 1 ⋅ 10 3 Satellites 23.09, 23.75, 24.05 < 2 each a 11 He II 40.82 20 ) 2 ⋅ 10 17 a 48.38 2 ) a Satellites 51.0, 52.32, 53. 00 < 1 ) each 11 Ne I 16.85 100 8 ⋅ 10 16.67 a Ne II 26.9 20 ) a 27.8 10 ) a 30.5 3 ) Satellites 34.8, 37.5, 38.0 <2 each 11 Ar I 11.83 100 6 ⋅ 10 a 11.62 80...40 ) a Ar II 13.48 16 ) a 13.30 10 ) 11 Y M ζ 132.3 100 3 ⋅ 10 450 12 Mg K α1, 2 1253.6 100 1 ⋅ 10 680 Satellites K α3 1262.1 9 K α4 1263.7 5 12 Al K α1, 2 1486.6 100 1 · 10 830 Satellites K α3 1496.3 7 K α4 1498.3 3 a ) Relative intensities of the lines depend on the conditions of the discharge. Values given are therefore only approximate. Photoelectron spectroscopies and related or complementary techniques are looking through a particular surface into the bulk of a solid material. Therefore unavoidably surface and bulk information are superimposed in the experimental data. Although this volume concentrates on the electronic bulk properties (for detailed information on the surface electronic and geometric properties see Landolt- Börnstein III/24a-d) careful inspection of the spectra as well as sufficient understanding of the literature quoted in this volume require some understanding of the surface as well. To support the reader we reproduce the relevant bulk and surface Brillouin zones in Figs. 4 - 10. For further details concerning unit cells, reciprocal lattices and first Brillouin zones see Landolt-Börnstein III/13c, p.451. La nd o l t - B ö r ns t e in New Series III/23C1 Ref. p. 12] 1.3 Definition of quantities 7 Fig. 4. fcc(100). (Bottom) Bulk Brillouin zone (BBZ) Fig. 5. fcc(110). (Bottom) BBZ and (top) SBZ showing and (top) Surface Brillouin zone (SBZ) showing the the projection of the bulk onto the (110) surface. projection of the bulk onto the (001) surface. The bulk vectors are given by ΓX = [1,0,0] (2π/a), ΓL = [½, ½, ½] (2π/a), ΓK = [¾, ¾, 0] (2π/a), ΓW = [1,½,0] (2π/a) where a is the lattice constant. Fig. 6. fcc(111). (Bottom) BBZ and (top) SBZ showing the projection of the bulk onto the (111) surface. La nd o l t - B ö r ns t e in New Series III/23C1 8 1.3 Definition of quantities [Ref. p. 12 Fig. 7. bcc(100). (Bottom) BBZ and (top) SBZ showing the projection of the bulk onto the (001) surface. The bulk vectors are given by ΓH = [0,0,2] (π/a), ΓN = [1,1,0] (π/a), ΓP = [1,1,1] (π/a) where a is Fig. 8. bcc(110). (Bottom) BBZ and (top) SBZ the lattice constant. showing the projection of the bulk onto the (110) surface. ← Fig. 9. bcc(111). (Bottom) BBZ and (top) SBZ showing the projection of the bulk onto the (111) surface. La nd o l t - B ö r ns t e in New Series III/23C1 Ref. p. 12] 1.3 Definition of quantities 9 Fig. 10. hcp(0001). (Bottom) BBZ and (top) SBZ showing the projection of the bulk onto the (0001) surface. Fig. 11. hcp(1010). (Bottom) BBZ and (top) SBZ showing the projection of the bulk onto the (1010) surface. La nd o l t - B ö r ns t e in New Series III/23C1 10 1.4 Frequently used symbols 1.4 Frequently used symbols Symbol Unit Property a, b, c Å lattice parameters −1 −1 DOS eV atom , density of states −1 −1 −1 eV atom spin , −1 −1 atom Ry e C elementary charge E eV, Ry energy Eb binding energy (Eb ≥ 0) EF Fermi energy Ef final state energy (of radiative transition), (Ef ≥ 0) Eg energy gap, band gap Ei initial state energy (of radiative transition), (Ei ≤ 0 in PES, Ei > 0 in IPES), electron incidence energy Ek kinetic (photoelectron) energy Evac vacuum energy level EVBM energy of valence band maximum ∆E eV energy resolution fi Phillips ionicity −1 I arb. units, counts s intensity in spectral distribution −1 k Å wavevector (of electrons) k||, k⊥ wavevector components parallel and perpendicular to the surface kF Fermi surface radius −1 NOS electrons atom number of states R reflectivity T K, °C temperature Z atomic number −1 α cm absorption coefficient α deg angle of incidence of photons in PES, photon emission angle in IPES Γ center of Brillouin zone Γe, Γh inverse life time of electrons, holes ε2 imaginary part of dielectric constant q deg angle of incidence of electrons in IPES, electron emission angle in PES −1 ν s frequency hν eV photon energy σ b cross section −1 σ s optical conductivity φ eV work function φ = Evac − EF −1 ω rad s circular frequency ωp plasmon frequency !ω eV photon energy La nd o l t - B ö r ns t e in New Series III/23C1

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